共查询到15条相似文献,搜索用时 62 毫秒
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运用莱卡显微镜、X射线衍射仪及电化学测试系统等仪器设备,对(Sn-9Zn)-xBi(x=0,1,3和5)钎料组织性能进行研究.结果表明:当x小于5时,Bi可明显影响(Sn-9Zn)-xBi钎料中富Zn相尺寸及分布,钎料的熔化温度随Bi含量的增加而降低至188℃;钎料的润湿性随Bi含量增加而得到改善,其中以x在1~3为最... 相似文献
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Sn-9Zn合金无铅钎料用助焊剂研究 总被引:9,自引:1,他引:9
通过测量润湿面积和润湿角,研究不同助焊剂对Sn-9Zn焊料润湿性的影响。结果表明:助焊剂对Sn-9Zn焊料润湿性影响很大,由乳酸、聚乙二醇和SnCl2所构成的助焊剂与Sn-9Zn焊料有很好适应性;同时扫描电镜和能谱分析也表明焊料与Cu基体界面的IMC为Cu5Zn8相,比Sn-37Pb焊料具有更高的剪切强度。 相似文献
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采用自制的压入蠕变装置,研究了共晶型Sn-3.7Ag-0.9Zn无铅钎料合金在333~418K,压入应力为34.1~75.3MPa时的压入蠕变性能,并获得其稳态压入蠕变速率的本构方程;利用XRD和SEM对合金蠕变前后的成分和微观组织进行了分析。结果表明:Sn-3.7Ag-0.9Zn无铅钎料合金的应力指数n为4.6,蠕变激活能Qc为82.03kJ/mol,材料的结构常数A为1.74×10–5,其压入蠕变机制主要是由位错攀移运动控制的蠕变;金属间化合物Ag3Sn、AgZn提高了合金的抗压入蠕变性能。 相似文献
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稀土改性的Sn-58Bi低温无铅钎料 总被引:1,自引:0,他引:1
研究了微量稀土对Sn-58Bi低温钎料的改性作用.试验添加质量分数为0.1 ?组混合稀土的无铅材料,并对比Sn-58Bi和Sn-58Bi0.5Ag合金.观察了钎料显微组织的变化并做了定量分析,采用DSC测试了钎料的熔化温度,同时测量了钎料的润湿性能、接头强度与硬度.结果表明,微量稀土添加细化了Sn-58Bi钎料合金的显微组织,对钎料的熔化温度几乎没有影响,能显著改善Sn-58Bi钎料的润湿性能和接头剪切强度,而且改善的程度优于添加微量Ag对Sn-58Bi钎料的作用. 相似文献
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Ag对Sn-Pb电子钎料合金性能的影响 总被引:2,自引:0,他引:2
研究了Ag的合金化对Sn-Pb钎料合金材料性能的影响。并从钎料的润湿性能,机械性能及抗腐蚀性能等方面讨论了Ag的有利作用,研究表明,在一些特定条件下的电子元件的焊接,Sn-Pb-Ag钎料可部分地或全部地替代昂贵的遗金属钎料合金。 相似文献
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《电子元件与材料》2017,(3):59-62
向Zn20Sn高温无铅钎料中添加微量铈镧混合稀土(RE),研究了RE的添加量对该钎料合金显微组织及性能的影响。结果表明,添加微量RE的合金显微组织中出现含RE的金属间化合物(IMC)。随着RE的添加,形状各异的IMC的数量显著增加。RE质量分数为0.5%~1.0%的合金的固相线温度不变,而液相线温度略有降低。当RE质量分数为0.5%时,钎料在Cu基板上的铺展面积最大,比Zn20Sn钎料提高了57.6%。但随着RE的继续添加,钎料的润湿性降低。当RE质量分数超过0.1%时,钎料的显微硬度和电阻率随着RE含量的增加而增大。综合考虑,合适的RE添加量为质量分数0.5%。 相似文献
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微合金化对Sn-9Zn基无铅钎料润湿性能的影响 总被引:7,自引:2,他引:7
熔炼制备了纯的以及含微量Al、Mg、Ti、Bi、重稀土Y、混合轻稀土RE和一种富P非金属活性组元NM的Sn-9Zn基合金,通过测量这些合金以及商用Sn-37Pb焊料在铜基板上的铺展面积比较了它们对铜的润湿性能。结果表明Al、Ti和 Mg不利于提高合金在铜上的润湿性或附着力;Y的改善作用不大;而Bi、RE和NM则能明显改善Sn-9Zn合金对铜的润湿性。在此基础上进一步研究了RE和NM含量对Sn-9Zn润湿性能的影响。以铺展面积衡量,本研究所达到的最佳改善效果使Sn-9Zn合金对铜的润湿性由Sn-37Pb焊料润湿性水平的45.4%提高到了70.3%。 相似文献
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The morphological evolution of Sn-9wt.%Zn solder under electromigration at a current density of about 105 A/cm2 was examined. Sn extrusion was observed, suggesting that Sn is the dominant moving species under electromigration. In contrast,
Zn appeared to be immobile. It was also found that the microstructure of the solder had a significant effect on the electromigration
behavior. For the solder with fine Zn precipitates, the surface morphology of the solder was almost unchanged except for the
formation of Sn extrusion sites at␣the anode side after electromigration. However, for the solder with coarse Zn precipitates,
more Sn extrusion sites were observed, and they were located not only at the anode side but also within the solder. Coarse
Zn precipitates appeared to block Sn migration, thus Sn migration was intercepted in front of the Zn precipitates. The Sn
atoms accumulated there, which led to its extrusion. The blocking effect was found to depend strongly on the size and orientation
of the Zn precipitates. 相似文献
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The Sn-3.5Ag and Sn-3.5Ag-0.2Co-0.1Ni lead-free solders were investigated on common electronics substrates, namely, organic
solderability preservative (OSP) and electroless Ni/immersion Au (ENIG) surface finishes. The formation of Kirkendall voids
at the interfacial region during isothermal solid aging was explored. For the Sn-3.5Ag-0.2Co-0.1Ni/OSP solder joint, the Kirkendall
voids were present after isothermal solid-state aging at higher temperature (e.g., 150°C); however, the size of voids did
not change remarkably with prolonged aging time due to the depressed Cu3Sn layer growth. For ENIG surface finishes, the 0.2Co-0.1Ni additions seemed to enhance the longitudinal groove-shaped voids
at the Ni3P layer; however, void formation at the solder/Ni3Sn4 interface was effectively reduced. This might be attributed to the reduced Sn activity in the solder matrix and the suppressed
Ni-P-Sn layer formation. 相似文献
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We have studied the microstructure of the Sn-9Zn/Cu joint in soldering at temperatures ranging from 230°C to 270°C to understand
the growth of the mechanism of intermetallic compound (IMC) formation. At the interface between the Sn-9Zn solder and Cu,
the results show a scallop-type ε-CuZn4 and a layer-type γ-Cu5Zn8, which grow at the interface between the Sn-9Zn solder and Cu. The activation energy of scallop-type ε-CuZn4 is 31 kJ/mol, and the growth is controlled by ripening. The activation energy of layer-type γ-Cu5Zn8 is 26 kJ/mol, and the growth is controlled by the diffusion of Cu and Zn. Furthermore, in the molten Sn-9Zn solder, the results
show η-CuZn grains formed in the molten Sn-9Zn solder at 230°C. When the soldering temperature increases to 250°C and 270°C,
the phase of IMCs is ε-CuZn4. 相似文献
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Yun-Hwan Jo Joo Won Lee Sun-Kyoung Seo Hyuck Mo Lee Hun Han Dong Chun Lee 《Journal of Electronic Materials》2008,37(1):110-117
A combination solder of Sn-3.0Ag-0.5Cu (numbers are all in weight percent unless specified otherwise) wrapped by Sn-57Bi-1Ag
was tested for application to three-dimensional (3-D) multistack packaging. The experimental variables controlled were the
reflow peak temperatures (170, 185, 200, and 230°C), the reflow cycles (up to four times), and the mask which controls the
amount of Sn-57Bi-1Ag solder paste (two sizes). We demonstrate and evaluate the combination solder structure, focusing on
microstructural changes and the shear strength. The degree of mixing in the combination solder, which is enhanced by an increase
in the reflow peak temperature, is independent of the number of reflow cycles. The ball shear strength and the lab shear strength
both increased with increases in the reflow peak temperatures. This behavior is explained by the amount of the brittle Bi
phase that constitutes the eutectic Sn-Bi phase. 相似文献