铀铌合金热氧化过程的AES研究

在超高真空下，室温下，通入高纯O2，清洁铀铌合金表面就会吸附O2，并解离与表面铀原子结合生成UO2，与表面铌原子结合生成NbO，继续氧化成为Nb2O5；但在高温(673K)时，反应情况截然不同，在氧化过程中，表面上的Nb基本保持为金属态的Nb，U也不能完全氧化为UO2。利用AES研究真空热处理对铀铌合金表面层的影响，将有助进一步丰富铀铌合金的氧化腐蚀机理。     

Ar^2＋离子和H2,O2分子碰撞过程中激发态的研究

在Ar~(2 )离子和H_2,O_2分子碰撞实验研究中,发现这两个碰撞体系都存在三个激发通道:(1)双电子俘获激发通道,(2)单电子俘获激发通道,(3)靶直接激发通道。实验结果得到了ArⅠ,ArⅡ和HⅠ,OⅠ的发射截面,并分别比较了Ar~(2 ) H_2,Ar~(2 ) O_2,He~(2 ) H_2,He~(2 ) O_2碰撞体系的发射截面。     

直流磁控溅射制备氧化钒薄膜

讨论了在低温下以高纯金属钒作靶材,用直流磁控溅射的方法制备出了氧化钒薄膜。通过设计正交试验,分析了氩气和氧气的流量比,溅射功率,工作压强,基底温度对氧化钒薄膜沉积速率和电阻温度系数TCR的影响,采用RTP-500型快速热处理机对氧化钒薄膜样品进行了退火热处理,实验结果表明:当Ar与O2的比例为100:4,溅射功率为120W,工作压强为2Pa时,所获得薄膜TCR较大,都在-2%/K附近,最高的可达-3.6%/K。     

铀与UO2表面铝薄膜生长行为的俄歇电子能谱分析

主要利用俄歇电子能谱（AES）原位分析了室温下铀与UO2表面铝薄膜的生长行为。在俄歇电子能谱仪超高真空室中，利用Ar^＋枪溅射铝靶，使其沉积到铀基体上，然后利用电子枪适时采集表面俄歇电子能谱，原位分析铝薄膜的生长过程。在UO2表面沉积铝膜时，先往真空室中充入氧气，将清洁铀表面氧化成UO2，然后再溅射铝靶原位沉积制备铝薄膜。     

额定压强下O_2/Ar比对ZnO:Al薄膜导电性能的影响

采用射频磁控溅射法在石英玻璃基片上制备出ZnO:Al薄膜,并对薄膜在不同O2/Ar比状态下的沉积厚度、结晶性能和导电性能之间的关系进行了探讨。测试结果表明:在0.2Pa的额定压强下,Ar流量越大,薄膜的厚度越大,XRD峰越强,薄膜的电阻率(ρ)值越低。在纯氩气状态下溅射时,制得的薄膜具有最大的厚度值,约为2.06μm,并具有最强的XRD峰,ρ同时也达到最小值,阻值为2.66×10-4Ω.cm。研究表明:结晶性能的提高对薄膜ρ的降低起到了关键作用,而厚度的增加也会使电阻率下降。     

射频反应磁控溅射法制备的氟化类金刚石薄膜摩擦特性研究

以高纯石墨做靶,CHF3和Ar气为源气体,采用射频反应磁控溅射法在不同流量比条件下制备了氟化类金刚石(F-DLC)薄膜.利用原子力显微镜、纳米压痕仪、拉曼光谱和红外光谱、摩擦磨损测试仪对薄膜的表面形貌、硬度、键结构以及摩擦性能做了具体分析.表面形貌测试结果表明,制备的薄膜整体均匀致密,表现出了良好的减摩性能.当CHF3与Ar气流量比r为1:6时,所得薄膜的摩擦系数减小至0.42,而纳米压痕结果显示,此时薄膜的硬度也最高.拉曼和红外光谱显示,随着r的增加,薄膜中的F浓度呈上升趋势,薄膜中的芳香环比例减小.研究表明,F原子的键入方式是影响F-DLC薄膜摩擦系数的一个重要因素,CF2反对称伸缩振动强度的减弱和CC中适量碳氢氟键的形成都能导致薄膜具有相对较低的摩擦系数.     

第一性原理研究Zr的掺杂对Xe在UO_2中溶解能力的影响

Zr既是反应堆中核燃料组件的包壳材料,也是核燃料UO_2的一种裂变产物,不可避免地会掺杂到UO_2中,对其性质等产生一定的影响.本文通过第一性原理密度泛函理论计算,研究了Zr掺杂所引起的Xe在UO_2中溶解能力的变化.首先应用引入Hubbard U修正的广义梯度近似密度泛函计算了U,O间隙和空位缺陷的形成能,结果与文献值符合,验证了计算方法的可靠性.在此基础上对Zr掺杂后空位缺陷的形成能及Xe吸附到空位缺陷所需的结合能的变化情况进行了研究.结果表明,Zr的掺杂会增加空位缺陷的形成能,减小大部分Xe吸附的结合能,且空位缺陷形成能的变化量普遍更大,从而在整体上增加了Xe在UO_2中的溶解能.说明在UO_2中,Zr掺杂主要是通过增加缺陷的形成难度而减弱了Xe在其中的溶解能力.     

Al/Al_2O_3复合薄膜的制备及表面等离子体共振性能研究

为了探究氧化层对金属薄膜表面等离子体共振(SPR)特性的调制作用,实验采用直流磁控溅射技术,通过控制沉积功率和沉积时间制备不同厚度的金属铝基薄膜,而后调控退火时间和温度得到相应的铝/氧化铝(Al/Al203)复合薄膜。采用X射线衍射仪(XRD)、原子力显微镜(AFM)、紫外-可见-近红外分光光度计及拉曼光谱仪分别表征样品的结构、表面形貌及SPR特性。XRD测试结果表明,随着金属铝基薄膜厚度的增加,Al/Al203复合薄膜由非晶态转变为较低表面能方向择优生长,薄膜结晶质量提高。其吸收光谱在220 nm附近处出现由双层复合薄膜SPR吸收峰,830 nm附近的峰对应金属铝膜的本征吸收峰。以罗丹明B为例的拉曼光谱测试结果表明,拉曼散射强度随着铝薄膜厚度增加表现为先增强后减弱的趋势,当铝膜厚度为14.5 nm时,表面增强拉曼散射(SERS)效果最显著。实验结果表明,氧化铝膜层对不同厚度的金属铝基薄膜的SPR特性有很好的调制作用,氧化铝化学性质稳定,对样品起到很好的保护作用。     

Cu掺杂SnO_2/TiO_2复合薄膜的制备及性能研究

制备Cu掺杂的纳米Sn O2/Ti O2溶胶,采用旋涂法在载玻片上镀膜,经干燥、煅烧制得Cu掺杂的Sn O2/Ti O2薄膜,通过对比实验探讨掺杂比例、条件、复合形式等对结构和性能的影响。采用XRD、SEM、EDS、UVVis等测试手段对样品进行表征,并以甲基橙为探针考察了其光催化降解性能。XRD测试结果显示薄膜的晶型为锐钛矿型,结晶度较高。SEM谱图显示薄膜表面无明显开裂,粒子分布均匀,粒径约为20 nm。EDS测试结果表明薄膜材料中含有Cu元素,谱形一致。UV-Vis吸收光谱表明Cu掺杂以及Sn O2/Ti O2的复合使得在近紫外区的光吸收比纯Ti O2明显增强。光催化实验表明Cu掺杂后使得Sn O2/Ti O2复合薄膜对甲基橙的光催化降解效率进一步提高,Sn O2/Ti O2复合薄膜的光催化活性在10%Cu掺杂时达到最高。     

氧气含量对射频磁控溅射方法制备的NiO∶Cu/ZnO异质pn结的光电性能的影响

利用磁控溅射方法改变氧气含量制备了一系列NiO∶Cu/ZnO异质pn结。实验结果表明,氧含量对NiO∶Cu/ZnO异质pn结电学影响很大。相对于纯氩溅射,引入一定氧气(O2/(Ar+O2)比例为30%)后,NiO∶Cu/ZnO异质pn结的整流特性明显得到改善。与此同时,NiO∶Cu/ZnO异质pn结的光透过率也从40%增大到80%。这可能是由于氧气的轻量引入致使NiO∶Cu/ZnO异质pn结的结晶得到改善,薄膜内缺陷减少所致。进一步提高氧气含量,直到O2/(Ar+O2)比例至80%后,异质结的整流特性有所削弱,这可能是由于过多氧气的引入造成薄膜缺陷再次增多,进而影响到异质结的整流特性。这一结论得到了EDS、XRD、AFM和UV结果的支持。     

Growth of oxide films onto cleavage faces of crystalline UC

Thin films of uranium oxide, formed by treating cleavage faces of single-crystal UC in purified oxygen, were measured with the help of two optical methods based on ellipsometry. The characteristics of fine-scale oxidation were thus determined at 5 temperatures in the range from 60 °C to 160 °C. In the main, the isothermal growth of the oxide layer appears to be parabolic, with thickness increasing linearly in the square root of the oxidation time; the rate-constant of the process is thermally activated. Both features are indicative of a diffusion-limited process, in which the reaction proceeds by way of oxygen migration through the growing film. In this frame, a qualitative argument indicates that the observed heat of activation can be connected to the migration energy of the oxygen atoms (or ions) in the oxide layer. The estimate for the latter is 25 kcal/mol, in good agreement with the data from diffusion experiments in UO₂.     

An examination of the initial oxidation of a uranium-base alloy (U–14.1 at.% Nb) by O2 and D2O using surface-sensitive techniques

The corrosion resistance of uranium is greatly enhanced by alloying with niobium. In this study the initial stages of corrosion of a specific uranium-base alloy (U–14.1 at.% Nb) by O₂ or D₂O have been examined using the surface specific techniques of X-ray photoelectron spectroscopy (XPS), thermal programmed desorption (TPD), static secondary-ion mass spectroscopy (SSIMS), and sputtered neutrals mass spectroscopy (SNMS). XPS studies of the U–14.1 at.% Nb surface following oxidation using O₂ at 300 K indicate production of a thin oxide overlayer of stoichiometric UO_2.0 intermixed with Nb₂O₅. The same stoichiometry is exhibited for uranium when the oxide is prepared at 500 K with O₂; although, niobium is much less oxidized exhibiting a mixture of NbO and Nb. Contrary to previous XPS literature, SNMS depth profiling studies reveal that oxidation by O₂ is much greater (as judged by oxide layer thickness) than that exhibited by D₂O. An oxide layer thickness of less than 20 Å was created using D₂O as an oxidant at 300 K with exposures >3500 L (oxide layers created from O₂ are significantly greater at much smaller exposures). Formation of a critical density of Nb₂O₅ is suggested to be responsible for the enhanced corrosion resistance by preventing diffusion of O⁻ (O²⁻) or OD⁻/OH⁻ into the oxide/metal interface region. The domains of stability of hydroxyl formation have also been followed using TPD, SSIMS and XPS. Maximal surface hydroxyl concentrations (Θ_rel=0.30) are obtained at a surface temperature of 175 K for these experimental conditions.     

磁控溅射制备W掺杂VO2/FTO复合薄膜及其性能分析

为了获得相变温度低且热致变色性能优越的光学材料, 室温下在F:SnO₂ (FTO)导电玻璃基板表面沉积钨钒金属膜, 再经空气气氛下的热氧化处理, 制备了W掺杂VO₂/FTO复合薄膜, 利用X射线光电子能谱、X射线衍射和扫描电镜对薄膜的结构和表面形貌进行了分析. 结果表明: 高温热氧化处理过程中没有生成W, F, V混合氧化物, W以替换V原子的方式掺杂. 与采用相同工艺和条件制备的纯VO₂/FTO复合薄膜相比, W掺杂VO₂薄膜没有改变晶面取向, 仍具有(110)晶面择优取向, 相变温度下降到35 ℃左右, 热滞回线收窄到4 ℃, 高低温下的近红外光透过率变化量提高到28%. 薄膜的结晶程度明显提高, 表面变得平滑致密, 具有很好的一致性, 对光电薄膜器件的设计开发和工业化生产具有重要意义. 关键词： W掺杂 2')" href="#">VO₂ FTO导电玻璃 磁控溅射     

In situ X-ray photoelectron spectroscopy study of the oxidation of CuGaSe2

The thermal and native oxidation of CuGaSe₂ thin films was studied by in situ X-ray photoelectron spectroscopy (XPS). The special design of the XPS chamber allowed to measure XP-spectra under oxidizing gas atmospheres at pressures of up to 5 mbar (in situ) or in ultra high vacuum (UHV). During thermal oxidation, the formation of predominantly Ga₂O₃ and some amount of SeO₂ were observed, but no copper oxides could be detected in the near surface region of the thin films. The same oxides were found after native oxidation in air under ambient conditions. Only after long term native oxidation for longer than 4 months Cu(OH)₂ was detected. An additional sodium oxide compound formed at the thin film surface, Na_xO and Na₂CO₃ after thermal and native oxidation, respectively. The amount of these sodium oxide compounds depends on the Na content on the as prepared surface. The formation of SeO₂ under humid conditions at 100 °C was found to depend on the surface composition of the thin film.     

磁控溅射沉积铝/贫铀与金/贫铀镀层的界面研究

采用磁控溅射技术沉积制铝/贫铀/铝(Al/DU/Al)、金/贫铀/金(Au/DU/Au) "三明治" 薄膜样品. 利用高分辨扫描电镜、 X射线衍射仪、X射线光电子能谱仪、 扫描俄歇微探针对Al/DU/Al, Au/DU/Au样品的Al/DU, Au/DU界面行为进行表征与研究. 结果表明: 沉积态DU层以柱状晶生长; Al/DU界面扩散明显, 物理扩散过程中伴随着Al, DU化学反应形成Al₂U, Al₃U金属化合物; 金属化合物的形成导致界面处Al 2p电子结合能向高能端移动, U 4f电子向低能端移动; 微量O在Al/DU界面处以Al₂O₃及铀氧化物形式存在; DU镀层中以铀氧化形式存在; 沉积态的Au/DU界面扩散为简单的物理扩散, 团簇效应导致Au/DU界面处Al 2p, U 4f电子结合能均向高能端移动; 在Au/DU界面及DU镀层中, 微量O以铀氧化物形式存在; Al/DU界面扩散强于Au/DU; 相同厚度的Al, Au保护镀层, Al镀层保护效果优于Au镀层. 关键词： Al/DU界面 Au/DU界面 磁控溅射 界面扩散     

Growth of AlN on clean and oxidised polycrystalline iron: an Auger study

The growth of aluminium nitride (AlN) thin films on clean and oxidised polycrystalline iron was studied by Auger electron spectroscopy. The films of AlN were deposited by reactive RF sputtering (argon + nitrogen atmosphere). On clean iron, a modelisation of the Auger peak-to-peak intensities evidences a Stranski-Krastanov growth mode (one layer followed by island formation) with an interfacial layer made of iron nitride covered by the AlN. Results on oxidised iron suggested the growth of a two-phase film with stoichiometry gradient of the (AlN)_x(Al₂O₃)_1−x form, x increasing with the film thickness. Grains of AlN in the layer were shown to favour the diffusion of oxygen from the substrate to the film until thicknesses of about 80 monolayers are reached. The presence of grains of both phases supports the hypothesis of an island growth mode for this interface.     

Low temperature fabrication of vanadium oxide films for uncooled bolometric detectors

Vanadium oxide films with temperature coefficient of resistant of −2.6% K⁻¹ have been fabricated on Si₃N₄-film-coated Si substrates by ion beam sputtering in a controlled Ar/O₂ atmosphere, at a relatively low growth temperature of 200 °C. The as-deposited films show no semiconductor-to-metal phase transitions even heated up to 150 °C. X-ray diffractometry shows that the main compound of the VO_x film is a metastable phase of vanadium dioxide (VO₂(B)) and the VO₂(B) film can be transformed into VO₂ film by post-growth annealing at 450 °C in flowing Ar atmosphere.     

2018年2期电子期刊

光诱导功能退化是胶体量子点在应用中面临的主要挑战之一,本文针对这一问题研究了使用磁控溅射沉积SiO₂薄膜形成钝化层来提高CdSe/ZnS量子点发光稳定性的方法。首先,通过三正辛基膦辅助连续离子层吸附反应方法合成了615 nm发光的红色CdSe/ZnS量子点。然后将量子点旋涂在SiO₂/Si基片上,再通过磁控溅射方法在量子点上沉积了厚度为20 nm的SiO₂薄膜作为钝化层。使用连续波激光光源分别在空气气氛和真空条件下照射样品,研究了经过不同照射时间后钝化和未钝化量子点的稳态光致发光光谱。结果表明,随着照射时间的延长,没有SiO₂钝化的量子点的PL强度显著降低、PL峰值发生蓝移、FWHM不断增大。对比研究发现,由于SiO₂薄膜能够阻挡空气中的水和氧,减缓了量子点表面的光诱导氧化现象,因此显著提高了CdSe/ZnS量子点的稳定性。     

基于FTO/VO2/FTO结构的VO2薄膜电压诱导相变光调制特性

采用直流磁控溅射和后退火工艺在掺氟的SnO₂(FTO)导电玻璃衬底上制备VO₂薄膜, 研究了不同退火时间和不同比例的氮氧气氛对VO₂薄膜性能的影响, 对VO₂薄膜的结晶取向、表面形貌、表面元素的相对含量和透过率随波长变化进行了测试分析, 结果表明在最佳工艺条件下制备得到了组分相对单一的VO₂薄膜. 基于FTO/VO₂/FTO结构在VO₂薄膜两侧的透明导电膜上施加电压并达到阈值电压时, 观察到了明显的电流突变. 当接触面积为3 mm×3 mm时, 阈值电压为1.7 V, 阈值电压随接触面积的增大而增大. 与不加电压的情况相比, FTO/VO₂/FTO结构在电压作用下高低温的红外透过率差值可达28%, 经反复施加电压, 该结构仍保持性能稳定, 具有较强的电致调控能力.     

不同环境中X射线激光Yb靶表面氧化研究

 用电子束蒸发方法淀积制备X射线激光稀土元素Yb薄膜靶,将薄膜靶在不同的环境气氛中进行氧化。用X射线光电子谱(XPS)、俄歇电子谱(AES)和X射线衍射(XRD)方法研究了Yb薄膜靶表面氧化层的元素价态、组分和微观结构。发现薄膜表面氧化层中存在分层结构,干燥空气中储存的Yb薄膜表面氧化层由表及里的组分依次为化学吸附水、氢氧化物、氧化物及金属元素。表面氢氧化物和氧化物以非晶态形式存在。潮湿空气中水分是薄膜靶氧化速率增加的主要原因。