中能质子在Si和GaAs中导致的非电离能损研究

非电离能损(NIEL)引起的位移损伤效应是空间装置失效的原因之一. 运用改进的Monte Carlo程序SHIELD, 建立了质子的NIEL计算手段, 模拟计算了能量范围在10—400MeV的中能质子在硅和砷化镓中的NIEL的大小和分布.     

质子照相中基于能量损失的密度重建

提出了一种质子能量在中高能时利用能量损失进行密度重建的方法,并利用Bethe-Bolch公式给出了利用能量损失进行密度重建的方程及条件.针对1.6 GeV的质子能量,通过定量计算常见材料的阻止本领,得出质子能量在1.45–1.6 GeV范围内时,材料的阻止本领的变化率小于1%,可近似为常数.最后,通过理论计算和Geant 4模拟,得出质子能量在1.6 GeV时,可以对面密度为113 g/cm²的缩比法国实验客体进行密度重建.     

低能质子在半导体材料Si 和GaAs中的非电离能损研究

非电离能损(NIEL)引起的位移损伤是导致空间辐射环境中新型光电器件失效的主要因素.由于低能时库仑相互作用占主导地位，一般采用Mott-Rutherford微分散射截面，但它没考虑核外电子库仑屏蔽的影响.为此，本文采用解析法和基于Monte-Carlo方法的SRIM程序计算了考虑库仑屏蔽效应后低能质子在半导体材料Si,GaAs中的NIEL，SRIM程序在计算过程中采用薄靶近似法, 并与其他作者的计算数据和实验数据进行了比较.结果表明：用SRIM程序计算NIEL时采用薄靶近似法处理是比较合理的，同时考虑库仑     

低能质子在半导体材料Si 和GaAs中的非电离能损研究

非电离能损(NIEL)引起的位移损伤是导致空间辐射环境中新型光电器件失效的主要因素.由于低能时库仑相互作用占主导地位,一般采用Mott-Rutherford微分散射截面,但它没考虑核外电子库仑屏蔽的影响.为此,本文采用解析法和基于Monte-Carlo方法的SRIM程序计算了考虑库仑屏蔽效应后低能质子在半导体材料Si,GaAs中的NIEL,SRIM程序在计算过程中采用薄靶近似法, 并与其他作者的计算数据和实验数据进行了比较.结果表明：用SRIM程序计算NIEL时采用薄靶近似法处理是比较合理的,同时考虑库仑 关键词： 低能质子 非电离能损 硅 砷化镓     

近地轨道质子和α粒子入射InP产生的位移损伤模拟

磷化铟(InP)材料具有禁带宽度大、电子迁移率高、耐高温、抗辐照等优点,是制备航天器电子器件的优良材料.近地轨道内的质子和α粒子对近地卫星威胁巨大,其在InP电子器件中产生的位移损失效应是导致InP电子器件电学性能下降的主要因素.本文使用蒙特卡罗软件Geant4研究近地轨道的质子与α粒子分别经过150μm二氧化硅和2.54 mm铝层屏蔽后,在500/1000/5000μm InP材料中产生的非电离能量损失(non-ionizing energy loss, NIEL)、平均非电离损伤能随深度分布以及年总非电离损伤能.研究发现:低能质子射程短且较易发生非电离反应,入射粒子能谱中低能粒子占比越大,材料厚度越小, NIEL值越大;计算质子和α粒子年总非电离损伤能,质子的年总非电离损伤能占比达98%,表明质子是近地轨道内产生位移损伤的主要因素;α粒子年总非电离损伤能占比小,但其在InP中的NIEL约为质子的2—10倍,应关注α粒子在InP中产生的单粒子位移损伤效应.本文计算为InP材料在空间辐射环境的应用提供了参考依据.     

300 eV—1GeV质子在硅中非电离能损的计算

非电离能损(NIEL)引起的位移损伤是导致空间辐射环境中新型光电器件失效的主要因素.引起质子在硅中NIEL的作用机理有库仑相互作用和核相互作用,质子能量范围从位移损伤阈能到1 GeV.当质子能量位于低能区时,库仑相互作用占主导地位,采用解析方法和TRIM程序计算NIEL;当质子能量位于高能区时,NIEL主要来自质子与靶原子核的弹性和非弹性相互作用,使用MCNPX/HTAPE3X进行模拟仿真计算由核反应引起的NIEL.实现了能量范围为300 eV—1 GeV的质子入射硅时NIEL的计算.计算结果表明,MCNPX/HTAPE3X可用于计算高能质子在材料中产生的反冲核所引起的NIEL,结合解析方法和TRIM程序可计算得到由于库仑相互作用引起的NIEL.     

空间重离子入射磷化铟的位移损伤模拟

磷化铟(InP)具备电子迁移率高、禁带宽度大、耐高温、耐辐射等特性,是制备空间辐射环境下电子器件的重要材料.随着电子器件小型化,单个重离子在器件灵敏体积内产生的位移损伤效应可能会导致其永久失效.因此,本文使用蒙特卡罗软件Geant4模拟空间重离子(碳、氮、氧、铁)在InP材料中的输运过程,计算重离子的非电离能量损失(n...     

CCD质子辐照损伤效应的三维蒙特卡罗模拟

针对空间质子诱发CCD性能退化问题,开展了CCD质子辐照效应的三维蒙特卡罗模拟研究。采用三维蒙特卡罗软件Geant4模拟计算了不同能量质子在Si和SiO₂中的射程及Bragg峰,分析了不同能量质子在材料中能量沉积的过程,并将模拟结果与相关数据进行对比,模拟误差在5%以内。根据质子与材料相互作用的物理过程,选取了合适的Lindhard分离函数,添加合适的物理过程,模拟计算了不同能量质子在SiO₂中的电离能量损失和Si中的非电离能量损失,并将结果与国外相关数据进行对比。根据CCD的生产工艺参数,建立了单个像元的三维模拟模型,确定了质子辐照损伤的灵敏体积,模拟计算了不同能量质子在像元灵敏体积内的电离能量沉积与非电离能量沉积,分析了CCD不同能量质子的辐照损伤差异产生的机理。结合粒子输运计算结果与CCD质子辐照实验结果,分析了质子辐照诱发CCD辐射敏感参数退化的物理机制。     

重离子在碳化硅中的输运过程及能量损失

利用蒙特卡罗方法,模拟计算了不同线性能量传输(liner energy transfer,LET)的重离子在碳化硅中的能量损失,模拟结果表明:重离子在碳化硅中单位深度的能量损失受离子能量和入射深度共同影响;能量损失主要由初级重离子和次级电子产生,非电离能量损失只占总能量损失的1％左右;随着LET的增大,次级电子的初始角...     

碳化硅中惰性气体离子辐照引起缺陷的研究

综述了有关碳化硅材料中惰性气体离子引起辐照缺陷研究的进展。包括借助多种方法对氦离子辐照的碳化硅中氦泡集团形成的剂量阈值的实验研究,基于过冷固体假设对氦泡阈值的理论解释,不同剂量氦泡的两种形态及其机理的研究,以及重惰性气体离子（Ne,Xe）辐照下缺陷演化的特点。This paper gives a review of our recent studies on the defect production in silicon carbide induced by energetic inert-gas-ion irradiation. The work includes the study of the dose threshold for helium bubble formation by combining TEM, RBS-channeling and PAS, the theoretical analysis of the dose threshold for bubble formation based on the Frozen-Matrix assumption, two types of bubble arrangement at different dose regions and the study of damage um-ion production behavior in the case of irradiation with heavier inert-gas-ions （ Ne, Xe） as a comparison to heliirradiation.     

Heavy quark energy loss in proton proton collisions at LHC

A promising probe to study deconfined matter created in high energy nuclear collisions is the energy loss of (heavy) quarks. Experiments at the Relativistic Heavy Ion Collider (RHIC) have shown that heavy quarks, i.e. charm and bottom quarks show a remarkable high momentum suppression, comparable to light quarks. In this exploratory study we investigate the energy loss of heavy quarks in high multiplicity proton proton collisions at LHC energies. We will find a small, however non-negligible energy loss of high momentum charm quarks.     

PECVD SiC optical waveguide loss and mode characteristics

We report the fabrication of single mode SiC (silicon carbide) waveguides and the measurement of their propagation loss. By studying the effect of sidewalls scattering loss due to surface roughness and by reducing it, minimal propagation loss of 2.3 dB/cm for the TM polarization is measured in the visible at 0.633 μm. This loss can be used as a benchmark for further development of SiC microphotonic components and circuit for sensor systems in harsh environment.     

Antiproton and proton energy loss straggling at keV energies

The slowing-down process of point-like charged particles in matter has been investigated by measuring the energy straggling for antiprotons and protons in Al, Ni and Au. A comparison with binary theory shows good agreement for Al and Au. For Ni, experimental data are not as convincing. In particular for the aluminum target, the Barkas-like effect of reduced energy straggling for antiprotons compared to protons is visible in the experimental data and a nearly velocity-proportional straggling is found, in good agreement with binary theory.     

Potential reduction interior point algorithm unfolding of neutron energy spectrum measured by recoil proton method

A reconstruction algorithm for unfolding neutron energy spectra has been developed, based for the first time on the potential reduction interior point algorithm. This algorithm can be easily applied to neutron energy spectrum reconstruction in the recoil proton method. We transform the neutron energy spectrum unfolding problem into a typical nonnegative linear complementarity problem. The recoil proton energy spectrum and response matrix at angles of 0^o and 30^o are generated by the Geant4 simulation toolkit. Several different neutron energy test spectra are also employed. It is found that this unfolding algorithm is stable and provides efficient, accurate results.     

Determination of the thickness and density of the ion bombardment induced altered layer in SiC by means of reflection electron energy loss study

The steady state surfaces of ion bombarded 3C-, 4H- and 6H-SiC samples were studied by means of reflected electron energy loss spectroscopy (REELS). The REELS exhibit a well-defined loss peak in the region of about 20 eV. The position of the maximum of the loss peak depends on the bombarding ion energy (decreasing with increasing ion energy), and on the primary electron beam energy (increasing with increasing primary energy). This behavior can be explained if we suppose that the plasmon energy in the altered layer (produced by ion bombardment) is different from that of the unaltered bulk. In this case the measured loss peak is the sum of two overlapping plasmon peaks. With modeling the system as a homogeneous altered layer and a homogeneous unaltered substrate the plasmon energy in the altered layer was derived to be 19.8 eV. The large change of the plasmon energy with respect to the bulk value of 23 eV is explained by a thin low density overlayer on the surface of the sample produced by the ion bombardment.     

Non-ionizing energy loss calculations for modeling electron-induced degradation of Cu(In,Ga)Se_2 thin-film solar cells

The lowest energies which make Cu,In,Ga,and Se atoms composing Cu(In,Ga)Se_2(CIGS) material displaced from their lattice sites are evaluated,respectively.The non-ionizing energy loss(NIEL) for electron in CIGS material is calculated analytically using the Mott differential cross section.The relation of the introduction rate(k) of the recombination centers to NIEL is modified,then the values of k at different electron energies are calculated.Degradation modeling of CIGS thin-film solar cells irradiated with various-energy electrons is performed according to the characterization of solar cells and the recombination centers.The validity of the modeling approach is verified by comparison with the experimental data.     

利用质子能损检测气体靶区有效靶原子密度的实验研究

准确测量气态靶区的有效靶原子密度能够提升离子与气体和离子与等离子体靶相互作用实验结果的精度和对物理过程的认识.实验中利用离子加速器引出的100 ke V质子束穿过一定长度的氢气靶,对质子的剩余能量进行了精确测量,获得了在气体靶内的质子能损数据,结合已有的能损研究结果,重新标定了气体靶区内的有效靶原子密度.分别比较了能损、电离型真空计IonIVac ITR 90和薄膜电容型真空计Varian CDG-500的实验测量结果,对比了修正后的电离型真空计有效气压曲线,结果发现质子束能损的测量方式具有原位、高准确性、在线监测等突出优势,为诊断气态靶有效原子密度提供了新的方法.