首页 | 本学科首页   官方微博 | 高级检索  
相似文献
 共查询到20条相似文献,搜索用时 15 毫秒
1.
高光洁度玻璃基片的表面散射和体散射测量   总被引:3,自引:1,他引:3       下载免费PDF全文
 提出了一种利用总积分散射(TIS)测量K9玻璃基片表面散射和体散射的实验方法。首先采用磁控溅射技术在基片表面沉积厚度为几十nm的金属Ag薄膜,然后将基片的表面和体区分开考虑,通过TIS测得了基片上下表面的均方根粗糙度, 进而求得基片的总散射和表面散射,最后计算得到了体散射。分别利用TIS和原子力显微镜(AFM)测量了3个样品上表面所镀Ag膜的均方根粗糙度,两种方法所得的均方根粗糙度的数值相差不明显,差值分别为0.08,0.11和0.09 nm, 表明TIS和AFM的测量结果相一致。利用该方法测得3块K9玻璃基片的总散射分别为6.06×10-4,5.84×10-4和6.48×10-4,表面散射介于1.25×10-4~1.56×10-4之间,由此计算得到的体散射分别为3.10×10-4,3.30×10-4和3.61×10-4。  相似文献   

2.
3.
Ruipeng Guo 《Optik》2011,122(21):1890-1894
An experimental investigation of a modified Beckmann-Kirchhoff scattering theory applied in an in-process optical measurement of surface quality is described. The proposed theory describes the scattered light intensity distribution from a surface with the additional layers, and can be employed to analyze the surface characteristics in in-process measurement. Based on light scattering principle and machine vision method, the surface roughness is extracted to testify the correction of the modified Beckmann-Kirchhoff scattering theory. The experimental apparatus consists of a collimated laser diode, a beam splitter, a screen, a measuring lens and a camera. Test specimens with different surface roughness are studied. The results obtained demonstrate the feasibility of in-process optical measurement of surface quality using the modified model.  相似文献   

4.
We calculate the diffusion thermopower for a degenerate two-dimensional electron gas in real lattice-mismatched semiconductor quantum wells (QWs) at low temperatures. We consider explicitly two scattering mechanisms: (i) the surface roughness-induced piezoelectric effect, a new important scattering source, arising due to a large fluctuating density of roughness-induced piezoelectric charges and (ii) the surface roughness. The scattering parameter p of energy dependence of the momentum relaxation time and the diffusion thermopower Sd, of each of the mechanisms separately and also when both the mechanisms are combined, are calculated as a function of electron concentration and well width. The diffusion thermopower, as a function of electron concentration, due to piezoelectric field shows a change in sign for lower concentrations. Interestingly, the diffusion thermopower, due to this mechanism, as a function of well width also shows a change in sign and it is dominant for larger well widths. The numerical calculations are presented for In0.2Ga0.8As/GaAs and AlN/GaN QWs. The piezoelectric mechanism is expected to be very important in systems with large piezoelectric constant and lattice mismatch.  相似文献   

5.
I. Ahmad  M. R. Arafah 《Pramana》2006,66(3):495-505
Elastic scattering of 800 MeV/c pions by12C has been studied in the diffraction model with a view to determine pion optical potential by the method of inversion. Finding an earlier diffraction model analysis to be deficient in some respects, we propose a Glauber model based parametrization for the elasticS-matrix and show that it provides an exceedingly good fit to the pion-carbon data. The proposed elasticS-matrix gives a closed expression for the pion-12C optical potential by the method of inversion in the high energy approximation.  相似文献   

6.
It is known that weak interactions of two solitary waves in generalized nonlinear Schrödinger (NLS) equations exhibit fractal dependence on initial conditions, and the dynamics of these interactions is governed by a universal two-degree-of-freedom ODE system [Y. Zhu J. Yang, Universal fractal structures in the weak interaction of solitary waves in generalized nonlinear Schrödinger equations, Phys. Rev. E 75 (2007) 036605]. In this paper, this ODE system is analyzed comprehensively. Using asymptotic methods along separatrix orbits, a simple second-order map is derived. This map does not have any free parameters after variable rescalings, and thus is universal for all weak interactions of solitary waves in generalized NLS equations. Comparison between this map’s predictions and direct simulations of the ODE system shows that the map can capture the fractal-scattering phenomenon of the ODE system very well both qualitatively and quantitatively.  相似文献   

7.
提出了一种利用总积分散射(TIS)测量K9玻璃基片表面散射和体散射的实验方法。首先采用磁控溅射技术在基片表面沉积厚度为几十nm的金属Ag薄膜,然后将基片的表面和体区分开考虑,通过TIS测得了基片上下表面的均方根粗糙度, 进而求得基片的总散射和表面散射,最后计算得到了体散射。分别利用TIS和原子力显微镜(AFM)测量了3个样品上表面所镀Ag膜的均方根粗糙度,两种方法所得的均方根粗糙度的数值相差不明显,差值分别为0.08,0.11和0.09 nm, 表明TIS和AFM的测量结果相一致。利用该方法测得3块K9玻璃基片的总散射分别为6.06×10-4,5.84×10-4和6.48×10-4,表面散射介于1.25×10-4~1.56×10-4之间,由此计算得到的体散射分别为3.10×10-4,3.30×10-4和3.61×10-4。  相似文献   

8.
The three-dimensional structure of the calcite (104)-water interface has been determined with surface X-ray scattering. Nine crystal truncation rods (including specular and non-specular rods) were measured providing both vertical and lateral sensitivity to the interfacial structure. The results reveal that calcite is nearly ideally terminated with a single surface hydration layer that includes two inequivalent water molecules having distinct heights of 2.3 ± 0.1 and 3.5 ± 0.2 Å, each with a well-defined lateral registry with respect to the calcite surface. No additional layering of water is observed beyond this surface hydration layer. Small displacements in the outer two calcium carbonate layers were also observed. These results are compared with previous experimental and computational results.  相似文献   

9.
In this paper, we demonstrate the use of nano-engineered Ir/IrO2 nanofibers (NFs) as substrates for surface-enhanced Raman scattering (SERS). We employed the electrospinning and annealing process to fabricate the IrO2 nanofibers featuring of interconnected nanoparticles. The obtained IrO2 NFs were subjected to reduction process as a function of time (5–180 min). IrO2 NFs were fully converted to Ir metal after 120 min of reduction. The resulting structures were examined as SERS substrates using rhodamine 6G (R6G) molecule excited by 632.8 nm laser. A distinct Raman signal of R6G was identified and its intensity gradually increased as a function of the reduction time of IrO2 NFs. UV/vis spectrum of Ir NFs showed increase of absorption at 632.8 nm, concluding that the enhanced Raman signal is due to the electromagnetic field enhancement at the Ir metal. This work is the first to report the nano-engineering of Ir/IrO2 nanofibers for a SERS application.  相似文献   

10.
低频液体表面波衍射条纹的不对称性   总被引:2,自引:3,他引:2  
苗润才  董军  祁建霞  李芳菊 《光子学报》2006,35(12):1921-1924
实验上实现了低频液体表面波的光衍射,当表面波波长远大于入射光波波长时,得到了稳定、清晰的衍射图样,并首次发现了衍射条纹具有明显的不对称分布.理论上对表面波衍射的近似条件进行了分析,得出了各级衍射条纹角宽度的解析表达式,解释了衍射条纹的非对称分布.衍射图样的不对称分布具有普遍规律,可观察的明显程度与表面波的波长和光波波长的比值有关,在能观察到衍射效应的条件下,当表面波波长远大于光波波长,非对称分布越明显,当表面波波长远接近光波波长时,衍射条纹可近似的看成是对称分布的.  相似文献   

11.
In this article, we study resonances and surface waves in π+–p scattering. We focus on the sequence whose spin-parity values are given by . A widely-held belief takes for granted that this sequence can be connected by a moving pole in the complex angular momentum (CAM)-plane, which gives rise to a linear trajectory of the form , which is the standard expression of the Regge pole trajectory. But the phenomenology shows that only the first few resonances lie on a trajectory of this type. For higher Jp this rule is violated and is substituted by the relation JkR, where k is the pion-nucleon c.m.s. momentum, and R1 fm. In this article we prove: (a) Starting from a non-relativistic model of the proton, regarded as composed by three quarks confined by harmonic potentials, we prove that the first three members of this π+–p resonance sequence can be associated with a vibrational spectrum of the proton generated by an algebra . Accordingly, these first three members of the sequence can be described by Regge poles and lie on a standard linear trajectory. (b) At higher energies the amplitudes are dominated by diffractive scattering, and the creeping waves play a dominant role. They can be described by a second class of poles, which can be called Sommerfeld’s poles, and lie on a line nearly parallel to the imaginary axis of the CAM-plane. (c) The Sommerfeld’s pole which is closest to the real axis of the CAM-plane is dominant at large angles, and describes in a proper way the backward diffractive peak in both the following cases: at fixed k, as a function of the scattering angle, and at fixed scattering angle θ=π, as a function of k. (d) The evolution of this pole, as a function of k, is given in first approximation by JkR.  相似文献   

12.
This paper focuses on how the scattering theory can be applied to the analysis of the surface characteristics in an in-process optical measurement. The mean scattered intensity distributions from a surface without and with the additional layers are presented based on the modified Beckmann–Kirchhoff scattering theory. The results show that the introduction of the additional layers only affects rough surfaces. The light scattered from a rough surface under the additional layers seems to be scattered from a bare rough surface with a different surface parameter in the small angle approximation. The experiment is conducted with pixel gray value measurement along the main direction of light scattering stripe to verify the theoretical analysis. The experimental curves can well fit the proposed model, which testifies the correction of the modified Beckmann–Kirchhoff scattering theory.  相似文献   

13.
The interface roughness and interface roughness cross-correlation properties affect the scattering losses of high-quality optical thin films. In this paper, the theoretical models of light scattering induced by surface and interface roughness of optical thin films are concisely presented. Furthermore, influence of interface roughness cross-correlation properties to light scattering is analyzed by total scattering losses. Moreover, single-layer TiO2 thin film thickness, substrate roughness of K9 glass and ion beam assisted deposition (IBAD) technique effect on interface roughness cross-correlation properties are studied by experiments, respectively. A 17-layer dielectric quarter-wave high reflection multilayer is analyzed by total scattering losses. The results show that the interface roughness cross-correlation properties depend on TiO2 thin film thickness, substrate roughness and deposition technique. The interface roughness cross-correlation properties decrease with the increase of film thickness or the decrease of substrates roughness. Furthermore, ion beam assisted deposition technique can increase the interface roughness cross-correlation properties of optical thin films. The measured total scattering losses of 17-layer dielectric quarter-wave high reflection multilayer deposited with IBAD indicate that completely correlated interface model can be observed, when substrate roughness is about 2.84 nm.  相似文献   

14.
The scattering process of cylindrical waves, radiated by a line source, from a parabolic reflector is investigated with the MTPO/Malyughinetz hybrid method. The geometrical optics and diffracted waves are evaluated asymptotically from the radiation integral. The scattered, diffracted and geometrical optics waves are plotted numerically for different impedance values.  相似文献   

15.
Generation of 2D surface plasmon interference patterns using a 3D metal-dielectric diffraction structure is studied. The potential application field is surface plasmon interference nanolithography aimed at fabrication of 3D periodic structures. The considered structure consists of a 3D dielectric diffraction grating with a metal film applied in the substrate region. The diffraction grating is designed to transform the incident wave into a set of surface plasmons that generate 2D interference pattern underneath the metal film. The configuration of the interference patterns is analyzed theoretically. It is shown by simulations within the rigorous electromagnetic theory that high-contrast interference patterns with the period 2.5-3.5 times smaller than the incident wave length can be produced. The configuration of the calculated patterns coincides with theoretically estimated ones. At the interference maxima electric field intensity exceeds incident wave intensity by an order of magnitude. The ways to control the form and period of the interference pattern by changing polarization and length of the incident wave are presented.  相似文献   

16.
The use of finite difference schemes to compute the scattering of acoustic waves by surfaces made up of different materials with sharp surface discontinuities at the joints would, invariably, result in the generations of spurious reflected waves of numerical origin. Spurious scattered waves are produced even if a high-order scheme capable of resolving and supporting the propagation of the incident wave is used. This problem is of practical importance in jet engine duct acoustic computation. In this work, the basic reason for the generation of spurious numerical waves is first examined. It is known that when the governing partial differential equations of acoustics are discretized, one should only use the long waves of the computational scheme to represent or simulate the physical waves. The short waves of the computational scheme have entirely different propagation characteristics. They are the spurious numerical waves. A method by which high wave number components (short waves) in the wave scattering process is intentionally removed so as to minimize the scattering of spurious numerical waves is proposed. This method is implemented in several examples from computational aeroacoustics to illustrate its effectiveness, accuracy and efficiency. This method is also employed to compute the scattering of acoustic waves by scatterers, such as rigid wall acoustic liner splices, with width smaller than the computational mesh size. Good results are obtained when comparing with computed results using much smaller mesh size. The method is further extended for applications to computations of acoustic wave reflection and scattering by very small surface inhomogeneities with simple geometries.  相似文献   

17.
Through the methods such as measurements of contact angle and surface tension, calculations of surface energy and interfacial interaction free energy, and four weak hydrophilic substances (WHS) were taken as research objects, some interesting conclusions were obtained as follow. In aqueous medium, the WHS give priority to adsorb on low-energy surface that is low polar or particularly non-polar. There is a clear corresponding relationship between the free energy and Lewis base component γ or the hydrophile index of low-energy surface, and the specific relationship is obtained. Finally, we find hydrophobic attractive force of the Lewis acid-base interaction is mainly responsible for the absorption of WHS on low-energy surface. In short, an initial insight into adsorption behavior of WHS on low-energy surface is demonstrated in this paper.  相似文献   

18.
研究了散射测量在激光陀螺用石英基片表面检测中的应用.比较发现,收集物镜比积分球更有利于体散射的消除,更适用于直接检测超光滑石英基片表面的散射测试系统.用ZEMAX设计了散射光收集物镜,使其数值孔径达到了0.4,并完全消除了轴上距离大于1.5 mm的散射点的体散射|为了消除光电倍增管输出本身随时间长漂的问题,设计了特定的散射光收集系统的结构,将散射光和反射光分时打在同一个光电倍增管上.分析发现,这种设置能有效消除光电倍增管输出随时间趋势性漂移的问题,增强了系统长时间的稳定性,有效保障了其工程实用性.  相似文献   

19.
This paper describes a new goniometric optical scattering instrument whose distinctive features include a mobile light source, a telecentric objective, and a fixed photodiode array. A scientific-grade CCD detector allows the instrument to reliably detect BRDF levels as low as , while generating a high-resolution map of light scattered from the sample surface. These data reveal the position and size of localized defects, which can then be excised from the sample to give an unbiased determination of the surface’s intrinsic roughness. High-quality signature and calibration data are also obtained, as well as a practical characterization of a silicon wafer.  相似文献   

20.
A new and simple dynamic angle limited integrated scattering (DALIS) method is developed to examine optically smooth reflective surfaces with defined surface form. Our experimental results from two systems show advantages over conventional angle resolved scattering measurement (ARS) methods. By collecting scattered light in a given solid angle, our methods do not require a detection unit with an extremely large dynamic range. Unlike in the common ARS measurement method, here we use a simple linear translation stage to scan scattered light. The power spectrum density function and the autocorrelation function of the surface roughness can be recovered from the measured scattering pattern. This method can be applied to in-workshop inspection of optical polishing processes.  相似文献   

设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号