多成分电负性碰撞等离子体的鞘层玻姆判据

采用双流体模型研究了多成分的电负性碰撞等离子体鞘层的玻姆判据,讨论了一维稳态情形下不同的带电粒子对鞘层玻姆判据的影响。采用拟牛顿法,得到了数值解。结果表明：玻姆判据存在上限和下限。二次电子发射系数越大,离子的马赫数越大;负离子的含量越多,离子的马赫数越小。鞘层中离子的温度、离子与中性粒子的碰撞以及离子的带电量对玻姆判据的上下限的取值都有一定的影响。     

固体金属二次电子发射的Monte-Carlo模拟

二次电子的发射在生产实践中有着广泛的应用,但其相关测量结果受实验环境和实验仪器的影响很大．在实验中难以精确测量．所以本文建立了一个包含二次电子激发、在固体内部传输和最后逸出固体表面的二次电子系统模型．采用Monte-Carlo的模拟方法仿真二次电子运动轨迹,定量分析二次电子的发射系数和能谱分布．并探讨它们与一次电子的入射角度和入射能量的关系．仿真结果表明：本文建立的二次电子系统模型能较好地反映实际情况．通过该模型仿真,可以定量得到二次电子发射系数和能谱分布与一次电子的入射能量和入射角度的关系．     

电子和负离子的反射运动对碰撞电负性磁鞘的影响

研究了鞘层中电子和负离子的反射运动对碰撞电负性磁鞘玻姆判据和鞘层结构的影响.通过理论推导得到了考虑鞘层中电子和负离子的反射运动时鞘层玻姆判据表达式,并通过数值模拟得到了电子和负离子采用玻尔兹曼模型和反射运动模型时离子马赫数的下限随参数的变化曲线以及鞘层中带电粒子密度的分布曲线.结果表明,电子和负离子的反射运动模型和玻尔兹曼模型离子马赫数的上限完全相同,下限表达式不同,反射运动模型中下限还与基板电势有关,且随着基板电势值的增加而增大,达到与玻尔兹曼分布中相同值后保持不变,随着鞘边负离子浓度和温度的不同达到最大值的速度不同;离子马赫数的下限在玻尔兹曼和反射运动模型中都随鞘边负离子浓度的增加和温度的降低而减小,只是在反射运动模型中的最大值要小;两种模型中离子马赫数的下限都随鞘边电场的增加而增加,但在玻尔兹曼模型中增加得更快最终值更大;两种模型离子马赫数的下限都随碰撞参数或磁场角度的增加而降低,但在玻尔兹曼模型中降低更快,随着碰撞参数或者磁场角度的增加两种模型中离子马赫数的下限趋于一致;当基板电势值较小时,电子和负离子的反射运动对鞘层结构影响较大,当基板电势值较大时电子和负离子反射运动对鞘层中带电粒子密度分布的影响很小.     

Numerical study of the effect of secondary electron emission on the sheath characteristics in q-non-extensive plasma

In this paper, a plasma sheath containing primary electrons, cold positive ions, and secondary electrons is studied using a one-dimensional fluid model in which the primary electrons are described by q-non-extensive distribution according to the Tsallis statistics. Based on the Sagdeev potential method and the current balance relation, a modified sheath criterion, and floating potential are established theoretically. The effect of secondary electron emission on q-non-extensive plasma sheath characteristics have been numerically examined. A significant change is observed in the quantities characterizing the non-extensive plasma sheath with the presence of the secondary electrons. It is found that the sheath properties with super-extensive distribution and sub-extensive distribution are different compared with plasma sheath with Maxwell distribution .     

Effect of secondary electrons from latent tracks created in YBCO by swift heavy ion irradiation

Swift heavy ions (SHI) with electronic energy loss exceeding a value of 14.4 keVnm⁻¹ create amorphized latent tracks in YBCO type superconductors. In the low fluence regime of an ion beam where tracks do not overlap, a decrease of the superconducting transition temperature as probed through resistivity studies, is not expected due to availability of percolating current paths. The present study however shows T_c decrease by about 1–3 K in thin films of YBCO when irradiated by 250 MeVAg ions at 79 K at a fluence of 5×10¹⁰–1×10¹² ionscm⁻². The highest fluence used in the present study is three times less than the fluence where track overlapping becomes significant. The T_c tends to increase towards the preirradiation value on annealing the films at room temperature. To explain this unusual result, we consider the effect of ion irradiation in inducing materials modification not only through creation of amorphized latent tracks along the ion path, but also through creation of atomic disorder in the oxygen sublattice in the Cu–O chains of YBCO by the secondary electrons. These electrons are emitted radially from the tracks during the passage of the SHI. Considering the correlation between the charge state of copper and its oxygen coordination, we show in particular that the latter process is a consequence of the inelastic interaction of the SHI induced low-energy secondary electrons with the YBCO lattice, which result in chain oxygen disorder and T_c decrease.     

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建立了包含两种正离子的碰撞等离子体鞘层的流体模型,通过四阶龙格-库塔法模拟了碰撞对含有两种正离子的等离子体鞘层中的离子密度和速度分布产生的影响。结果表明,对于两种正离子的等离子体来说,鞘层中无论哪种离子与中性粒子碰撞频率的增加,该种离子的密度和速度分布都将呈现波动变化,密度是先增加后降低,速度是先降低后增加;而另一种离子的密度和速度呈单调变化。鞘边正离子的含量越少,受自身与中性粒子的碰撞频率增加,鞘层中该种离子密度先增加后降低的变化位置就越远离等离子体的鞘层边界。同时发现该种离子密度分布受自身碰撞频率增加,降低的幅度变化非常小。另外发现电子碰撞器壁产生的二次电子发射系数对质量较轻的离子影响要大一些。     

提高砷化镓二次电子发射系数的探讨

介绍了延长负电子亲和势二次电子发射材料砷化镓的逸出深度的设计,并给出了经过特殊设计的这种砷化镓的能级示意图,然后对通常的砷化镓和经过特殊设计的砷化镓的二次电子发射系数的理论值进行了比较,得出:当原电子入射能量较低（小于10 keV）时,两种砷化镓的二次电子发射系数差值较小;当原电子入射能量较高（大于20 keV）时,经过特殊设计的砷化镓的二次电子发射系数比普通砷化镓的二次电子发射系数大,而且随着原电子入射能量的升高,两种砷化镓的二次电子发射系数差值也在增大。     

Sheath structure in plasma with two species of positive ions and secondary electrons

The properties of a collisionless plasma sheath are investigated by using a fluid model in which two species of positive ions and secondary electrons are taken into account. It is shown that the positive ion speeds at the sheath edge increase with secondary electron emission(SEE) coefficient, and the sheath structure is affected by the interplay between the two species of positive ions and secondary electrons. The critical SEE coefficients and the sheath widths depend strongly on the positive ion charge number, mass and concentration in the cases with and without SEE. In addition, ion kinetic energy flux to the wall and the impact of positive ion species on secondary electron density at the sheath edge are also discussed.     

Effects of trapped electrons on the line shape in emission Mössbauer spectra

To explain line broadening in emission Mössbauer spectra as compared to the corresponding absorber measurements, the model of trapped electrons has been proposed. Auger electrons (emitted, e.g. after electron capture by ⁵⁷Co or after the converted isomeric transition of ^119mSn), as well as secondary electrons, may be trapped in the proximity to the nucleogenic ion. Electrons captured by lattice traps at different distances from the daughter ion induce an asymmetric distribution of quadrupole splitting in the resulting emission spectra, as shown in a few examples. This model is supported by estimates of quadrupole splitting values which may be caused by such trapped electrons located at specified distances from the nucleogenic atom.     

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利用硬X射线诊断监测逃逸电子,研究了HT-7装置放电初始阶段不同等离子体初始密度对逃逸电子产生过程的影响。实验结果表明,提高等离子体初始密度能有效地抑制逃逸电子的产生。     

霍尔推进器壁面材料二次电子发射及鞘层特性

霍尔推进器放电通道等离子体与壁面相互作用形成鞘层,不同壁面材料的二次电子发射对推进器鞘层特性具有重要影响,本文针对推进器壁面鞘层区域建立二维物理模型,研究了氮化硼(BN)、碳化硅(SiC)和三氧化二铝(Al_2O_3)三种不同壁面材料的二次电子发射特性,在改进SiC材料二次电子发射模型的基础上,采用粒子模拟方法,讨论了壁面二次电子发射系数与电子温度和磁场强度的关系,研究了三种材料(BN,SiC和Al_2O_3)的鞘层特性,结果表明:修正的二次电子发射模型拟合曲线与实验曲线几乎一致;在相同电子温度下,三种材料(BN,SiC和Al_2O_3)的二次电子发射系数和壁面电子数密度依次增大,而鞘层电场和鞘层电势降依次减小,BN材料具有合适的二次电子发生射系数,使得霍尔推进器能在低电流下稳态工作。     

绝缘体二次电子发射系数测量装置的研制

 成功研制了测量绝缘体二次电子发射系数的测量装置，该装置主要由栅控电子枪系统、真空系统和电子采集系统组成，测量装置产生的原电子流的能量范围为0.8~60 keV。采用单脉冲电子枪法，测量了原电子能量范围为0.8~45 keV的多晶MgO的二次电子发射系数。测量中，收集极(偏置盒)离材料表面设置为约35 mm，偏置电压设置为 45 V。测量得到：用磁控溅射法制备的MgO的二次电子发射系数最大值约为2.83，处于 2~26范围内，其对应的原电子能量约为980 eV。这表明该装置测量的绝缘体二次电子发射系数是可信的，但用磁控溅射法制备的MgO的二次电子发射系数较低，这可能是制备MgO时引入了过多的杂质在MgO二次电子发射体里面所引起的。     

二次发射微波电子枪的倍增特性

 利用3DRun程序通过数值模拟计算，对二次发射微波电子枪的束流倍增特性作了研究。用1维模型计算了束流倍增与腔两极间距离以及腔中场强的关系，并详细给出了腔两极间距离为10mm,场强为5-4MV/m时出射电子纵向聚束及能量聚焦过程；利用3DRun程序研究了在高频场及粒子束本身空间电荷场的共同作用下，束流在3维运动过程中的倍增特性，计算了出射束流的发射度。通过计算表明：二次发射微波电子枪可以提供低发射度、高流强的电子束。     

二次电子发射和负离子存在时的鞘层结构特性

建立了包括电子、离子、器壁发射二次电子以及负离子多种成分的等离子体无碰撞鞘层的基本模型,讨论了二次电子发射和负离子对1维稳态等离子体鞘层结构的影响,并且分析了多种成分等离子体鞘层内的二次电子和负离子的相互作用。结果表明：二次电子发射系数的增加和负离子含量的增加,都将导致鞘层的厚度有所减小;二次电子发射系数超过临界发射系数之后,鞘层不再是离子鞘。随着器壁材料二次电子发射系数的增加,鞘层中的负离子密度分布也逐渐增加;负离子的增加,导致二次电子临界发射系数有所增加。另外,在等离子体鞘层中二次电子发射和负离子的存在,也影响着鞘层中电子的放电特性与器壁材料的腐蚀。     

提升等离子体初始密度抑制逃逸电子的实验研究

利用硬X射线诊断监测逃逸电子,研究了HT-7装置放电初始阶段不同等离子体初始密度对逃逸电子产生过程的影响。实验结果表明,提高等离子体初始密度能有效地抑制逃逸电子的产生。     

Heating-induced variations of secondary electron emission from ion-cleaned copper samples

Secondary electron (SE) emission due to electron impact depends strongly on surface conditions. The variations of SE yield and spectrum with the heating temperature of Ar-ion-cleaned oxygen-free copper samples are therefore measured in situ in a multifunctional ultrahigh vacuum system. The SE yield and the SE spectrum are observed to increase and to narrow, respectively, after sample heating. The maximum SE yield increases from 0.97 before heating to 1.25 after heating at ∼313 °C, and the corresponding full width at half maximum of SE spectrum decreases considerably from 9.3 to 5.5 eV. More CO₂ and Ar ions are shown to desorb at a higher heating temperature by residual gas analysis, indicating their contribution to the reduction in work function and surface potential barrier. Ar-ion desorption appears to affect the SE spectrum more than the SE yield. The obtained results provide a new insight into complicated surface influences on SE emission in thermal applications of scanning electron microscopy.     

壁面二次电子发射对霍尔推力器放电通道绝缘壁面双鞘特性的影响

为进一步揭示霍尔推力器放电通道绝缘壁面鞘层的特性, 利用考虑了壁面二次电子分布函数的一维稳态流体鞘层模型, 研究了壁面二次电子发射对近壁双鞘特性的影响. 分析结果表明, 由于壁面发射的二次电子对近壁鞘层中的电子密度有增加作用, 存在一个临界二次电子发射系数σ_dc使得: 当σ≤σ_dc时, 鞘层为单层的正离子鞘结构; 当σ>σ_dc时, 鞘层表现为双层的正离子鞘和电子鞘相连结构, 连接点对应于垂直于壁面方向上电势分布的拐点. 然而, 当σ进一步增大到0.999时, 鞘层转变为三层的正离子鞘-电子鞘-正离子鞘交替结构. 数值结果表明: 随着σ的增加, 电子鞘与离子鞘的连接点向远离壁面的方向移动, 电子鞘的厚度逐渐增加; 随着壁面出射电子能量系数a的增加, 近壁区鞘层的厚度也逐渐增加. 关键词： 霍尔推力器 双鞘 壁面二次电子发射     

Heat flow through a plasma sheath in the presence of secondary electron emission from plasma‐wall interaction

The formation of a plasma sheath in front of a negative wall emitting secondary electron is studied by a one‐dimensional fluid model. The model takes into account the effect of the ion temperature. With the secondary electron emission (SEE ) coefficient obtained by integrating over the Maxwellian electron velocity distribution for various materials such as Be, C, Mo, and W, it is found that the wall potential depends strongly on the ion temperature and the wall material. Before the occurrence of the space‐charge‐limited (SCL ) emission, the wall potential decreases with increasing ion temperature. The variation of the sheath potential caused by SEE affects the sheath energy transmission and impurity sputtering yield. If SEE is below SCL emission , the energy transmission coefficient always varies with the wall materials as a result of the effect of SEE , and it increases as the ion temperature is increased. By comparison of with and without SEE , it is found that sputtering yields have pronounced differences for low ion temperatures but are almost the same for high ion temperatures.     

Ion-induced secondary electron and negative ion emission from Mo/O

Absolute yields of secondary electrons and negative ions resulting from collisions of Na⁺ with Mo(100) and a polycrystalline molybdenum surface have been measured as a function of the oxygen coverage of the surface for impact energies below 500 eV. The sputtered negative ions have been identified with mass spectroscopy, and O⁻ is found to be the dominant sputtered negative ion for the surfaces at all oxygen coverages and impact energies. Both the electron and O⁻ yields have an impact energy threshold at about 50 eV and exhibit a strong dependence on oxygen coverage. The kinetic energy distributions of the secondary electrons and sputtered O⁻ were determined as functions of the oxygen coverage and impact energy. The distributions for O⁻ are characterized by a narrow low-energy peak (at 1–2 eV) followed by a low-level high-energy tail. The secondary electrons have a narrow (FWHM 1–2 eV) kinetic energy distribution, centered approximately at 1–2 eV. The shapes of the distributions and their most probable energies are essentially invariant with impact energy, oxygen coverage and the nature of the Mo surface. The emission is explained and analyzed in terms of a simple model which involves a collision-induced electronic excitation of the MoO⁻ surface state. The decay of this excited state leads to the production of both secondary electrons and O⁻ with energy distributions and yields comparable to those observed.     

脉冲离子束作用下靶面次级电子的抑制

论述了离子束作用下固体表面次级电子产生的机制,介绍了特种真空器件中次级电子抑制的各种方法及其优缺点,提出了脉冲离子束作用下靶面次级电子抑制的自偏势法和曲面靶法等设计思路,并在实验上进行了初步验证。实验结果表明,自偏势电压大于80 V后,次级电子得到很好的抑制。在相同束流情况下,曲面靶较平面靶的次级电子产额少。利用实验结果进行估算得到了近似的次级电子产额约为0.67,比文献中的结果(0.58)偏大。对实验中自偏势法抑制反峰电子电流的效果进行了分析和讨论,结果表明:自偏势法不但能够有效抑制离子打靶产生的次级电子,还能抑制由功率源不稳定带来的入射反峰电子流。