Method of resonance near-field optical microscopy

We have solved the problem in which a thin metal wafer (probe) with a nanohole interacts with the flat surface of a metastructured film consisting of metal nanoparticles in an external optical radiation field. Nanoparticles are considered as two-level atomic systems. This interaction of the wafer-probe and the flat surface in the external optical radiation field gives rise to optical near-field resonance, the frequency of which differs significantly from the natural frequencies of two-level atoms in the medium and the probe. The fields inside and outside the probe and metastructured film are calculated in the near-field and far-field zones. The maximum resolution, which is achievable in the suggested scheme of near-field optical microscopy, can reach about 10 nm. __________ Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 74, No. 4, pp. 499–506, July–August, 2007.     

Optical waveguide behavior of Se-doped and undoped CdS one-dimensional nanostructures using near-field optical microscopy

The optical waveguide behaviors of CdS and CdS _x Se_1−x nanostructures are studied using near-field optical microscopy. Optical measurements demonstrate that light may be guided on sub-wavelength scales along CdS nanoribbons in straight or bent structures. The photoluminescence (PL) spectra from nanoribbon emission using scanning near-field optical microscopy are analyzed under different incident laser intensities. The PL spectra along Se-doped and undoped CdS nanoribbons at different propagation distances are investigated. Both the guided PL spectra of Se-doped and undoped CdS nanoribbons show red-shifts because of the band-edge absorption. Our results are useful for the development of new kinds of functional nano devices. Supported by the National Natural Science Foundation of China (Grant Nos. 10574002, 90406007, and 50602015) and the National Basic Research Program of China (Grant No. 2007CB936800)     

The coaxial tip as a nano-antenna for scanning near-field microwave transmission microscopy

A novel scanning-probe setup is reported that maps the complex transmission of microwaves. Response to topographic features as small as 15 nm was observed. The sharpened coaxial probe tip serves as a microwave antenna and, at the same time, as a tunnel tip to warrant precise distance control by STM (scanning tunneling microscope) feedback. The instrument can be applied to map the microwave conductivity of, e.g. thin films or low-dimensional semiconductors. Consequences for the development of an infrared microscope are outlined.     

Dual mode near-field scanning optical microscopy for near-field imaging of surface plasmon polariton

In this paper, we theoretically and experimentally demonstrate that metal coated apertured probes are efficient near-field probes on surfaces with high reflectivity for the scattering as well as for the collection mode near-field scanning optical microscopy (NSOM). We show that a blunt apertured metal coated tip is very effective in suppressing image dipoles which affect strongly the signals scattered from frequently used sharp metal tips or gold nanoparticle attached probes. By using a simultaneous collection and scattering mode (dual mode) NSOM we measure the near-field images of surface plasmon polariton (SPP) launched from a slit. The collection mode measures propagating SPP along lateral distance in a long scan range with high signal-to-noise ratio, and the scattering mode measures the polarization resolved near-field of SPP. Comparisons of the measured data obtained in the dual mode enable to easily characterize SPP and to separate the measured near-field into the propagating SPP and the directly transmitted light.     

Image dipole approach and polarization effects in scanning near-field optical microscopy

A coupled-dipole approach is proposed in order to study the coupling between the probe tip and the rough sample in SNOM. In the present model both the optical probe tip and the sample protrusions are represented by polarizable dipole spheres. The induced polarization effects on the sample surface can be replaced by the image dipoles in the circumstance of quasi-static electromagnetic field approximation. Applying the radiation theory of the dipole, we have established a set of self-consistent equations to describe the field distribution at the sites of the probe tip and the sample protrusions. The results are completely the same as those obtained by means of the dyadic electromagnetic propagator formalism and also the derivation procedure is relatively simple. This method permits us to analyze the physical mechanisms of the interaction between the probe tip and the rough surface in SNOM intuitively. Based on this approach, we further discuss the influence of polarization of the incident light on the imaging quality. The calculating result shows that the shape and the contrast of the images of the sample are both sensitive to the field polarization, and the z-polarized mode is proved to give better resolution in SNOM.     

High-sensitivity piezoelectric tube sensor for shear-force detection in scanning near-field optical microscopy

An easy-to-implement non-optical shear-force detection setup for tip–sample distance regulation in scanning near-field optical microscopy is demonstrated. The detection method is based on attaching the near-field probe to a piezoelectric tube resulting in excellent mechanical contact between tip and detector. The main advantages of the method are good signal-to-background contrast and thus potential for high sensitivity. The method is demonstrated by obtaining approach curves of silicon surfaces. The suitability for optical experiments is further shown by measuring the near-field intensity distribution of the emission of a semiconductor laser.     

Imaging of human meiotic chromosomes by scanning near-field optical microscopy (SNOM)

Centromeres and telomeres are key structures of mitotic and meiotic chromosomes. Especially telomeres develop particular structural properties at meiosis. Here, we investigated the feasibility of scanning near-field optical microscopy (SNOM) for light-microscopic imaging of meiotic telomeres in the sub-hundred nanometer resolution regime. SNOM was applied to visualise the synaptonemal complex (SC) and telomere proteins (TRF1, TRF2) after differential immuno-fluorescent labelling. We tested and compared two different preparation protocols for their applicability in a SNOM setting using micro-fabricated silicon nitride aperture tips. Protocol I consisted of differential labelling of meiotic chromosome cores (SC) by SCP3 immuno-fluorescence and telomeres by TRF1 or TRF2 immuno-fluorescence, while protocol II combined absorption labelling with alkaline phosphatase substrates of cores with fluorescent labelling of telomeres. The results obtained indicate that protocol I reveals a better visualisation of structural (topographic) details than protocol II. By means of SNOM, meiotic chromosome cores could be visualised at a resolution overtopping that of far-field light microscopy.     

Sensitivity analysis of scanning near-field optical microscope probe

In this paper, we study the dynamic modes of a scanning near-field optical microscope (SNOM) which uses an optical fiber probe; and the sensitivity of flexural and axial vibration modes for the probe were derived and the closed-form expressions were obtained. According to the analysis, as expected each mode has a different sensitivity and the first mode is the most sensitive mode of flexural and axial vibration for the SNOM probe. The sensitivities of both flexural and axial modes are greater for a material surface that is compliant with the cantilever probe. As the contact stiffness increases, the high-order vibration modes are more sensitive than the lower-order modes. Furthermore, the axial contact stiffness has a significant effect on the sensitivity of the SNOM probe, and this should be noted when designing new cantilever probes.     

Recent developments in nanofabrication using scanning near-field optical microscope lithography

In addition to its well-known capabilities in imaging and spectroscopy, scanning near-field optical microscopy (SNOM) has recently shown its great potentials for fabricating various structures at the nanoscale. A variety of SNOM-based fabrication techniques have been developed for different applications. In this paper, the SNOM-based techniques involving three major functions: material modification, addition, and removal, are examined with emphasis on their abilities and reliability to make structures with resolutions at the nanometer level. The principles and procedures underlying each technique are presented, and the differences and uniqueness among them are subsequently discussed. Finally, concluding remarks are provided to summarize the major techniques studied and to recommend the scopes for technology improvement and future research.     

基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像

本文结合近场扫描结构和纳米线-微光纤耦合技术,提出了一种基于硫化镉纳米线/锥形微光纤探针结构的被动近场光学扫描成像系统.该系统采用被动式纳米探针,保留了纳米探针对样品表面反射光的强约束优势.其理论收集效率为4.65‰,相比于传统的金属镀膜近场探针收集效率提高了一个数量级,可有效地提高扫描探针对样品形貌信息的检测能力;而后通过硫化镉纳米线与微光纤之间高效的倏逝场耦合,将检测的光强信号传输到远场进行光电探测,最终实现对目标样品形貌的分析成像,其样品宽度测量误差在7.28%以内.该系统不需要外部激发光路,利用显微镜自身光源进行远场照明,被动扫描探针仅作为样品表面反射光的被动收集系统.本文基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像方案,可有效地降低探针的制备难度和目标光场的检测难度,简化扫描成像的结构,为近场光学扫描显微系统之后的发展提供新的思路.     

基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像

本文结合近场扫描结构和纳米线-微光纤耦合技术,提出了一种基于硫化镉纳米线/锥形微光纤探针结构的被动近场光学扫描成像系统.该系统采用被动式纳米探针,保留了纳米探针对样品表面反射光的强约束优势.其理论收集效率为4.65‰,相比于传统的金属镀膜近场探针收集效率提高了一个数量级,可有效地提高扫描探针对样品形貌信息的检测能力;而后通过硫化镉纳米线与微光纤之间高效的倏逝场耦合,将检测的光强信号传输到远场进行光电探测,最终实现对目标样品形貌的分析成像,其样品宽度测量误差在7.28%以内.该系统不需要外部激发光路,利用显微镜自身光源进行远场照明,被动扫描探针仅作为样品表面反射光的被动收集系统.本文基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像方案,可有效地降低探针的制备难度和目标光场的检测难度,简化扫描成像的结构,为近场光学扫描显微系统之后的发展提供新的思路.     

Versatile UHV system for combined far- and near-field magneto-optical microscopy of thin films

We have developed a UHV system for in situ studies of magnetic domains and magnetization reversal of thin films in the presence of external magnetic fields and at variable temperature. The system comprises a setup for magneto-optical Kerr effect measurements of magnetization curves, a Kerr-microscope for far-field magnetic-domain imaging, and a magneto-optical scanning near-field microscope in combination with a Sagnac interferometer (Sagnac-SNOM) for high-resolution imaging on a sub-μm scale. All components have successfully been tested, and the feasibility of studying ultrathin films has been demonstrated.     

Influence of the probe--sample interaction on scanning near-field optical microscopic images in the far field

We have studied the influence of probe--sample interaction in a scanning near-field optical microscopy (SNOM) in the far field by using samples with a step structure. For a sample with a step height of $\sim \lambda $/4, the SNOM image contrast between the two sides of the step changes periodically at different scan heights. For a step height of $\sim \lambda $/2, the image contrast remains approximately the same. The probe--sample interaction determines the SNOM image contrast here. The influence of different refractive indices of the sample has been also analysed by using a simple theoretical model.     

Optical near-field mapping of bright and dark quantum dot states

We theoretically investigate scanning near-field optical microscopy (SNOM) of semiconductor quantum dots. A general theoretical framework is developed that accounts for photo excitation and relaxation in complex dielectric environments. We find that in the near-field regime bright and dark excitonic states become mixed, opening new channels for the coupling to the electromagnetic field.     

Reducing Background Light Interaction in Near-Field Optical Microscopy Using Lateral and Vertical Probe-Dithering

We investigate the effectiveness of differential detection, which is a combination of probe-dithering and synchronous detection, in discriminating near-field light interaction from background light interaction in apertureless near-field optical microscopy (NSOM). The lateral differential NSOM with a photocantilever is more effective than the vertical differential detection, which does not always provide sufficient discrimination. The V-dithering-based lateral differential detection provides apertureless NSOM that can image the optical coupling between sample and probe dipoles, which is an interaction through near-field light.This paper was originally presented at the 5th International Conference on NEAR FIELD OPTICS and RELATED TECHNOLOGIES (NFO-5), which was held on December 6–10, 1998 at Coganoi Bay Hotel, Shirahama, Japan, in cooperation with the Japan Society of Applied Physics and Mombusho Grant-in Aid for Scientific Research on Priority Areas “Near-field Nano-optics” Project, sponsored by Japan Society for the Promotion of Science.     

纳米光学和生物单分子探测

纳米光学技术展示了纳米级探测本领,同时生物单分子探测所需要分辨尺度也是纳米数量级的,因此在生物单分子探测过程中,纳米光学发挥了巨大的作用.文章介绍了与生物单分子探测技术相关的纳米光学技术,包括量子近场光学探针技术、近场光学成像技术（包括扫描近场光学显微术及全内反射荧光显微术）和激光光钳测控技术及它们在生物单分子探测上的进展,从而在染色、成像、测控三个方面展示了纳米光学技术在生物方面的应用,并对其未来的发展方向进行了展望.     

扫描近场微波显微镜测量非线性介电常数的理论校准系数

从理论上分析了扫描近场微波显微镜中探针和非线性样品之间的相互作用，对非线性介电常数测量时的一个校准系数进行了理论分析和计算，得到该系数与介电常数之间的关系曲线，并对各方向的贡献和分辨率极限进行了初步探讨.     

相干反斯托克斯拉曼散射显微成像技术研究

基于全量子理论对相干反斯托克斯拉曼散射(CARS)过程进行了分析, 在此基础上搭建了单频CARS显微成像系统, 获得了不同尺寸聚苯乙烯微球高对比度的CARS显微图像. 为了标定成像系统的空间分辨率, 采用逐点扫描方式对直径为110 nm聚苯乙烯微球成像, 从而重构出系统的点扩展函数. 结果表明: 该CARS显微成像系统的横向空间分辨率约为600 nm, 而由阿贝衍射极限决定的理论空间分辨率约为300 nm. 分析了导致分辨率降低的原因, 并提出了解决方案. 为实现纳米分辨的CARS显微成像打下了坚实的基础.     

有孔探针近场拉曼光谱和成像技术进展

基于有孔探针SNOM的近场拉曼光谱和成像技术的出现使得拉曼光谱的分辨率突破了光学衍射极限,从而提供了一个有力的工具对样品亚波长尺度之下的化学信息进行表征。文章讨论了探针性质对实现近场拉曼光谱的影响,并全面地介绍了有孔探针近场拉曼光谱发展十余年来在纳米尺度化学分辨成像、液-液界面性质研究、微观层面解释SERS增强机理、图像化反映SERS热点分布等诸多领域的研究进展。     

扫描近场光学显微镜中两类光纤探针传输特性的研究

采用局域模式耦合理论，对扫描近场光学显微镜中的两类光纤探针－腐蚀锥和熔拉锥的传输特性进行了比较和分析。给出了光在探针锥中传输时耦合效率的分布情况，以及传输效率随锥长，针尖直径和光波长变化的特性。