KDP晶体单点金刚石车削表面形貌分形分析

 分别使用2维和3维分形方法对单点金刚石车削加工的KDP晶体表面形貌进行了分析,并对表面的3维分形维数和3维粗糙度表征参数进行了比较,分析了二者对表面形貌表征的差异。使用2维轮廓分形方法计算了KDP晶体表面圆周各方向上的分形维数。通过分析得出：3维分形维数与表面粗糙度值成反比关系;使用单点金刚石车削方法加工KDP晶体会形成各向异性特征明显的已加工表面,在一定程度上容易形成小尺度波纹;已加工表面是否具有明显的小尺度波纹特征与表面粗糙度值并无直接关系,但与其表面轮廓分形状态分布密切相关;KDP晶体表面2维功率谱密度与其分形状态具有相近的方向性特征。     

KDP晶体单点金刚石车削表面形貌分形分析

分别使用2维和3维分形方法对单点金刚石车削加工的KDP晶体表面形貌进行了分析,并对表面的3维分形维数和3维粗糙度表征参数进行了比较,分析了二者对表面形貌表征的差异。使用2维轮廓分形方法计算了KDP晶体表面圆周各方向上的分形维数。通过分析得出：3维分形维数与表面粗糙度值成反比关系;使用单点金刚石车削方法加工KDP晶体会形成各向异性特征明显的已加工表面,在一定程度上容易形成小尺度波纹;已加工表面是否具有明显的小尺度波纹特征与表面粗糙度值并无直接关系,但与其表面轮廓分形状态分布密切相关;KDP晶体表面2维功率谱密度与其分形状态具有相近的方向性特征。     

基于傅里叶模方法的KDP晶体镀膜减反技术

 采用傅里叶模方法,分析了单点金刚石铣削后KDP晶体表面小尺度波纹的周期和幅值对单层增透膜折射率、厚度以及透射率的影响。研究表明：膜层最佳折射率在1.22左右,在此折射率条件下,保证透射率大于99%的单层增透膜的理想厚度范围应为180~220 nm,并且折射率和膜厚值的选取基本不受晶体表面小尺度波纹周期和幅值的影响。若只考虑SPDT法加工后KDP晶体表面小尺度波纹周期和幅值的实际范围,透射率基本不受波纹周期的影响,但却会随波纹幅值的增大而加速下降。理想镀膜条件下透射率最大值大于99%,并且通常在99.67%~99.94%之间。     

Modification of UO2 crystal morphologies through hydroxylation

Atomic scale computer simulation is used to predict the surface energies of UO₂, subject to different hydroxide coverages. It was found that the {1 1 1} surface dominates dry UO₂, resulting in an octahedral morphology. However, the {1 0 0} surfaces were strongly stabilized by hydroxylation relative to the {1 1 1} surfaces. Consequently, even a modest hydroxylation of 30% substantially truncates the octahedron crystal morphology, and a fully cubic morphology is predicted at 80% hydroxide coverage.     

pH值对KDP晶体中散射颗粒的影响

 探讨了不同pH值对KDP晶体散射颗粒的影响。结果表明，不同pH值生长条件下生长的KDP晶体中散射颗粒的尺寸、密度呈现明显差异，pH值为5.5条件下KDP晶体中散射颗粒尺寸明显变大，分布稀疏；pH值为2.0时，散射颗粒密度高，尺寸小。其原因在于形成散射的杂质颗粒的存在形式不同。     

KDP晶体拉曼散射角度特性

利用群理论详细分析了磷酸二氢钾(KDP)晶体的拉曼振动模式,得出了其拉曼振动模的归类?并采用拉曼光谱仪测量了Z切退火KDP晶体X(ZZ)X,Z(XY)Z和Y(XY)X三种散射配置和未退火KDP晶体Z(XY)Z配置下的拉曼光谱?根据拉曼选择定则得出X(ZZ)X,Z(XY)Z和Y(XY)X散射配置下的拉曼峰分别对应A1,B2(LO)?B2(TO)对称类振动模,但在Z(XY)Z配置下的拉曼光谱中除了B2模,还观察到了A1模,而在Y(XY)X配置下的拉曼光谱中只有B2模,且退火和未退火晶体Z(XY)Z配置下的拉曼光谱无明显差别,此结果表明KDP晶体的对称性降低,在背向散射时A1模也具有角度特性,但与晶体的内应力无关,这是由KDP晶体内部结构决定的?     

加工误差引入的薄型KDP晶体附加面形

针对惯性约束聚变（ICF）驱动装置中口径为400 mm400 mm薄型频率转换KDP晶体在45放置状态下产生的附加面形问题,采用有限元分析软件ANSYS,建立了以实测数据为基础的大口径薄型KDP晶体的应变模型和有加工误差的夹具模型,仿真分析了KDP晶体的加工误差和夹具的加工误差对KDP晶体附加面形的影响, 给出了KDP晶体附加面形变化的P-V值和RMS值。在此基础上,通过对KDP晶体的加工误差及夹具支撑表面不同类型和不同大小加工误差的分析和比较,得出:KDP晶体边缘的加工误差和夹具支撑表面的凹型加工误差是引起较大附加面形的原因之一,KDP晶体的加工误差也会导致其面形变化不均匀,而夹具支撑表面的凸型、波浪形加工误差和压条表面的随机加工误差对KDP晶体附加面形的影响相对较小,且支撑表面的随机加工误差引起的附加面形变化介于其他两者之间。     

3-D surface profilometry based on modulation measurement by applying wavelet transform method

A new analysis of 3-D surface profilometry based on modulation measurement technique by the application of Wavelet Transform method is proposed. As a tool excelling for its multi-resolution and localization in the time and frequency domains, Wavelet Transform method with good localized time-frequency analysis ability and effective de-noizing capacity can extract the modulation distribution more accurately than Fourier Transform method. Especially for the analysis of complex object, more details of the measured object can be well remained. In this paper, the theoretical derivation of Wavelet Transform method that obtains the modulation values from a captured fringe pattern is given. Both computer simulation and elementary experiment are used to show the validity of the proposed method by making a comparison with the results of Fourier Transform method. The results show that the Wavelet Transform method has a better performance than the Fourier Transform method in modulation values retrieval.     

Modification in etching characteristics and surface topography of some electron irradiated polymers

Track formation in polymers is a complex phenomenon in which not only primary but also secondary processes, such as formation of radicals and chemical processes, are involved. In the present work, the influence of 2 MeV electrons on the etching properties and the surface topography of polyethylene terephthalate (PET) and polyimide (PI) are studied. The increase in the bulk etch-rate and a decrease in the activation energy of etching were observed for both the polymers. The surface roughness of both polymers was reduced due to electron irradiation.     

A phenomenological explanation for the buckling of surface alloys

A phenomenological model, in which the interactions between the nearest-neighbor (NN) atoms are described as bondings but not hard sphere contacts, is proposed to explain the unexpected reduced buckling in surface alloy systems. In the model, the forces acting on an adsorbate atom from its NN substrate atoms in different layers may be either repulsive or attractive, depending on whether the bond between the adsorbate atom and its NN substrate atoms is compressed or stretched. It is found that the forces on the adsorbate atom from its NN substrate atoms in the sub-surface layer play a more important role for the buckling of surface alloy than those from its NN substrate atoms in the surface layer do. The bucklings expected by the model are significantly smaller than those predicted by the simple hard sphere model and are in good agreement with the experiments when the equilibrium bond length of the NN adsorbate-substrate atom pairs is taken as the sum of the corresponding metal radii.     

Application of the structured illumination method to study the topography of the sole of the foot during a walk

The structured illumination technique consists of projecting a fringe system onto a 3D object from a well defined space point, which results in a pattern that depends on the characteristic of the projected fringes, the viewpoint and the illuminated object morphology. Therefore, the structured illumination method enables to determine the topography of 3D objects. To implement this technique we set up an optoelectronic array that allows studying the sole of the foot during a walk. The method consists of projecting a Ronchi grid and capturing the images generated on the foot by a CCD camera. These obtained images are graphically processed and fringes converted into vectors. A depending algorithm on the experimental setup allows obtaining, from those vectors data, cotes for a discrete profile plotting of the studied object. The method enables the quantitative determination of the sole topography during the walk. Qualitatively, it can be used for diagnosis and control of deformation and injuries caused by accidents or illnesses. It can be introduced in the primary attention health system to study a great number of patients, due to its simplicity and low cost installation, and for being a non-invasive technique.     

KDP晶体单点金刚石切削表面粗糙度预测及实验研究

采用单点金刚石切削的方法加工了KDP晶体,利用回归分析的方法建立了表面粗糙度预测模型,达到了在加工前设计、预测和控制表面粗糙度的目的。利用预测模型分析了进给量、切削速度、背吃刀量对表面粗糙度的影响。通过优化设计获得了KDP晶体在该条件下的最佳切削参数,得到的表面粗糙度的最佳估计值为6.3389nm。利用最佳的切削工艺参数,加工出了表面粗糙度值为6.895nm的超光滑表面。     

基于傅里叶模方法的KDP晶体镀膜减反技术

采用傅里叶模方法,分析了单点金刚石铣削后KDP晶体表面小尺度波纹的周期和幅值对单层增透膜折射率、厚度以及透射率的影响。研究表明：膜层最佳折射率在1.22左右,在此折射率条件下,保证透射率大于99%的单层增透膜的理想厚度范围应为180~220 nm,并且折射率和膜厚值的选取基本不受晶体表面小尺度波纹周期和幅值的影响。若只考虑SPDT法加工后KDP晶体表面小尺度波纹周期和幅值的实际范围,透射率基本不受波纹周期的影响,但却会随波纹幅值的增大而加速下降。理想镀膜条件下透射率最大值大于99%,并且通常在99.67%~99.94%之间。     

Removal of scratch on the surface of MgO single crystal substrate in chemical mechanical polishing process

Etching and chemical mechanical polishing (CMP) experiments of the MgO single crystal substrate with an artificial scratch on its surface are respectively performed with the developed polishing slurry mainly containing 2 vol.% phosphoric acid (H₃PO₄) and 10-20 nm colloidal silica particles, through observing the variations of the scratch topography on the substrate surface in experiments process, the mechanism and effect of removing scratch during etching and polishing are studied, some evaluating indexes for effect of removing scratch are presented. Finally, chemical mechanical polishing experiments of the MgO substrates after lapped are conducted by using different kinds of polishing pads, and influences of the polishing pad hardness on removal of the scratches on the MgO substrate surface are discussed.     

Investigating the effect of different asphaltene structures on surface topography and wettability alteration

This paper aims at investigation of the effect of asphaltene structure on wettability and topography alteration of a glass surface as a result of asphaltene precipitation. In order to provide a better insight into the topography alteration, a bi-fractal approach was employed. Such an approach is capable of discriminating topography alteration in two different surface types, namely, macro-asperities and micro-asperities. The observed variation of the fractal dimension in the two surface types could be considered as the consequence of different asphaltene sources. Therefore, the structure of different asphaltene sources was carefully examined. The effect of asphaltene structure is more pronounced for asphaltene precipitation at higher pressure. It was revealed that asphaltene particles of high complexity and with larger poly-aromatic rings tend to be detached easier at higher pressure than those with smaller poly-aromatic rings. Another evidence to emphasize the significance of asphaltene structure was given through wettability alteration. It was found that asphaltene particles with larger poly-aromatic rings turn the surface less oil wet at higher pressure. It seems that the difference in wetting condition and surface topography alteration of different asphaltene sources roots in their different structures.     

Structure analysis of stoichiometric LiNbO3(0 0 0 1) surfaces using low-energy neutral scattering spectroscopy

The atomic structure of LiNbO₃(0 0 0 1) surface was investigated by low-energy neutral scattering spectroscopy (LENS). Poled stoichiometric LiNbO₃ (SLN) samples were prepared for the measurements. The LENS was developed for surface structure and composition analysis particularly of highly insulating materials and was successfully applied to the structure analysis of the SLN(0 0 0 1) surface. The polar angle dependences of intensity of scattered He⁰ from the poled SLN surfaces indicate obvious differences between the negatively and the positively charged surfaces. It is suggested that O atoms cover the surfaces, and the first metal layers underneath the O layer consist of Li and Nb for negatively and positively charged surfaces, respectively, parallel to the applied electric field.     

Effect of surface lay in the surface roughness evaluation using machine vision

This work explores the influence of orientation of surface lay pattern of the machined components, while quantifying the surface roughness using machine vision approach. The surface images are captured from milled low carbon steel specimens with different roughness values using a vision system with coaxial lighting arrangement at different angular orientations of the work pieces (0°, 30°, 45°, 60°, 90°, 120°, 135°, 150°, and 180°). The captured images are subjected to preprocessing in order to retain the frequency components that attribute to roughness using a Gaussian filter by adapting the filtering procedures specified in ISO 4288. Numerous image based parameters such as gray level average (G_a), gray level co-occurrence matrix based image quantification parameters namely contrast, correlation, energy or uniformity, maximum probability and differential box courting based fractal dimension are computed from the surface images captured at different angular positions of the work piece. The computed vision based parameters are compared and correlated with the roughness average (R_a) obtained using a stylus instrument and the results are analyzed. The results clearly indicated that it is important to consider the orientation of the work piece when the machine vision approach is used to quantify the surface texture parameters.     

3D surface topography from the specular lobe of scattered light

Scattered light from a surface contains a huge amount of information including surface slope, roughness, pattern, texture, etc. In this paper, the relationship between the intensity distribution of scattered light from a surface and the 3D surface topography will be investigated. From the geometrical point of view the intensity distribution of scattered light from a surface may be modelled with three components, the specular spike, specular lobe and diffuse lobe. In the situation when light is scattered from a relatively smooth surface whose roughness is much larger than the wavelength of the incident light, the scattered light intensity distribution will consist of only a diffuse lobe and a specular lobe, which are well described by a combination of the Lambertian and Torrance–Sparrow geometrical models. Based on the light scattering phenomenon, in this paper a scanning method capable of measuring the 3D surface topography with 500 mm scanning width, high scanning speed, and micron resolution is presented. The 3D topography measurement is implemented by using a linear photodiode array to measure scattered light intensity distribution at different angles against the surface normal. Then the specular lobe of the scattered light will be extracted at each scanning point to calculate the surface normal distribution. Sequentially, the 3D surface topography is obtained by using gradient integration techniques.     

Regeneration of surface roughness by the Langevin equation using stochastic analysis on AFM image of a carbon fiber

A new method was developed using AFM images of a fiber surface to regenerate the surface roughness in 3D geometry, such as the cylindrical shape of a “model” fiber. The Langevin equation was used to derive the fluctuations of a carbon fiber surface image. The equation contains two quantities, D⁽¹⁾ (h) and D⁽²⁾ (h) which in physics represent drift and diffusion coefficients. Knowing this coefficient and adding a proper noise function, a similar surface of larger dimension with the same statistical properties of the initial data was created. The generated surface was mapped into cylindrical coordinates, then a mesh generated. The resulting reconstructed surface, input over the geometry of a cylindrical shape, can be implemented for finite element analysis of a single fiber surrounded by matrix and generalized to a many fiber model.     

Influence of surface topography on the secondary electron yield of clean copper samples

Secondary electron yield (SEY) due to electron impact depends strongly on surface topography. The SEY of copper samples after Ar-ion bombardment is measured in situ in a multifunctional ultrahigh vacuum system. Increasing the ion energy or duration of ion bombardment can even enlarge the SEY, though it is relatively low under moderate bombardment intensity. The results obtained with scanning electron microscopy and atomic force microscopy images demonstrate that many valley structures of original sample surfaces can be smoothed due to ion bombardment, but more hill structures are generated with stronger bombardment intensity. With increasing the surface roughness in the observed range, the maximum SEY decreases from 1.2 to 1.07 at a surface characterized by valleys, while it again increases to 1.33 at a surface spread with hills. This phenomenon indicates that hill and valley structures are respectively effective in increasing and decreasing the SEY. These obtained results thus provide a comprehensive insight into the surface topography influence on the secondary electron emission characteristics in scanning electron microscopy.