100 keV H+ ion irradiation of as‐deposited Al‐doped ZnO thin films: An interest in tailoring surface morphology for sensor applications

We report the influence of 100 keV H⁺ ion beam irradiation on the surface morphology, crystalline structure, and transport properties of as‐deposited Al‐doped ZnO (Al:ZnO) thin films. The films were deposited on silicon (Si) substrate by using DC sputtering technique. The ion irradiation was carried out at various fluences ranging from 1.0 × 10¹² to 3.0 × 10¹⁴ ions/cm². The virgin and ion‐irradiated films were characterized by X‐ray diffraction, Raman spectroscopy, atomic force microscopy, and Hall probe measurements. Using X‐ray diffraction spectra, 5 points Williamson‐Hall plots were drawn to deduce the crystallite site and strain in Al:ZnO films. The analysis of the measurements shows that the films are almost radiation resistant in the structural deformation under chosen irradiation conditions. With beam irradiation, the transport properties of the films are also preserved (do not vary orders of magnitude). However, the surface roughness and the crystallite size, which are crucial parameters of the ZnO film as a gas sensor, are at variation with the ion fluence. As ion fluence increases, the root‐mean‐square surface roughness oscillates and the surface undergoes for smoothening with irradiation at chosen highest fluence. The crystallite size decreases initially, increases for intermediate fluences, and drops almost to the value of the pristine film at highest fluence. In the paper, these interesting experimental results are discussed in correlations with ion‐matter interactions especially energy losses by the ion beam in the material.     

Evolution of surface topography and optical band gap of ZnO film deposited on NiO/Si(100)

Evolution of surface features and optical band gap of ZnO thin films deposited on different NiO/Si(100) are reported. In order to create different initial microstructure, we first deposited NiO film on Si(100) at 3 different temperatures (400°C, 650°C, and 700°C) by pulsed laser deposition. These NiO/Si(100) films are used as substrate for the deposition of ZnO films. Combining the results obtained from grazing incidence X‐ray diffraction, atomic force microscope, and UV‐Visible characterization, our study indicated that the microstructure of the substrate takes the important role in dictating properties of the film. Our study also indicated that one needs to choose appropriate synthesis condition to achieve good quality ZnO films.     

Effect of nitrogen ion irradiation treatment to the enhancement of ZnO photocatalytic performance

To overcome the drawbacks of fast charge recombination and the limited visible-light absorption of semiconductor photocatalysts, N ion irradiation is used to enhance photocatalytic performance of ZnO nanowires. Compared with as-grown ZnO nanowires, the photocatalytic performance of ZnO under dose of 5 × 10¹⁵ cm⁻² was efficiently improved because of the bandgap energy decreasing and the introduction of oxygen vacancies defects. On one hand, the reduced bandgap energy improves the easy transfer process of electrons and holes, thus improving the charge separation efficiency, and visible-light absorption. On the other hand, N ion irradiation increases oxygen vacancy defects and hinders the recombination of photo-excited electrons and holes. This study has certificated that ion irradiation is an efficient way and created a new insight on the enhancement of photocatalytic activity.     

Ion‐beam‐induced morphology on the surface of thin polymer films at low current density and high ion fluence

The effect of Xe⁺ bombardment on the surface morphology of four different polymers, polystyrene (PS), poly(phenylene oxide), polyisobutylene, and polydimethylsiloxane, was investigated in ion energy and fluence ranges of interest for secondary ion mass spectrometry depth‐profiling analysis. Atomic force microscopy (AFM) was applied to analyze the surface topography of pristine and irradiated polymers. AFM analyses of nonirradiated polymer films showed a feature‐free surface with different smoothness. We studied the influence of different Xe⁺ beam parameters, including the incidence angle, ion energy (660–4000 eV), current density (0.5 × 10² to 8.7 × 10² nA/cm²), and ion fluence (4 × 10¹⁴ to 2 × 10¹⁷ ion/cm²). Xe⁺ bombardment of PS with 3–4 keV at a high current density did not induce any change in the surface morphology. Similarly, for ion irradiation with lower energy, no surface morphology change was found with a current density higher than 2.6 × 10² nA/cm² and an ion fluence up to 4 × 10¹⁶ ion/cm². However, Xe⁺ irradiation with a lower current density and a higher ion fluence led to topography development for all of the polymers. The roughness of the polymer surface increased, and well‐defined patterns appeared. The surface roughness increased with ion irradiation fluence and with the decrease of the current density. A pattern orientation along the beam direction was visible for inclined incidence between 15° and 45° with respect to the surface normal. Orientation was not seen at normal incidence. The surface topography development could be explained on the basis of the balance between surface damage and sputtering induced by the primary ion beam and redeposition–adsorption from the gas phase. Time‐of‐flight secondary ion mass spectrometry analyses of irradiated PS showed strong surface modifications of the molecular structure and the presence of new material. © 2000 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 39: 314–325, 2001     

Focused ion beam implantation of Ga in Si and Ge: fluence‐dependent retention and surface morphology

Focused ion beam implantation of 30‐keV Ga⁺ ions in single‐crystalline Si and Ge was investigated by SIMS, using Cs⁺ primary ions for sputtering. Nine different implantation fluences ranging from 1 × 10¹³ to 1 × 10¹⁷ Ga⁺‐ions/cm² were used, with implanted areas of 40 × 40 µm². The Ga concentration distributions of these implants were determined by SIMS depth profiling. Such 30‐keV Ga implantations were also simulated by a dynamic Monte‐Carlo code that takes into account the gradual change of the near‐surface composition due to the Ga incorporation. In both approaches, an essentially linear increase of the Ga peak concentrations with fluence is found up to ～1 × 10¹⁶cm^?2; for higher fluences, the Ga content approaches a saturation level which is reached at about (1–2) × 10¹⁷cm^?2. The measured and simulated peak concentrations of the Ga distributions are in good agreement. The most probable ranges obtained from the experiments correspond closely with the respective values from the simulations. The surface morphology caused by Ga⁺ implantation was investigated by atomic force microscopy (AFM). The AFM data indicate that for low fluences (<3 × 10¹⁵cm^?2) the surface within the implanted areas is growing outward (i.e. is swelling). For increasingly higher fluences, sputter‐induced erosion of the surface becomes dominant and distinct craters are formed for fluences above ～1 × 10¹⁶cm^?2. At the boundary of the implanted region a wall‐like structure is found to form upon Ga implantation; its height is growing with increasing fluence, reaching a value of ～15 nm at 1 × 10¹⁷ Ga⁺‐ions/cm². Copyright © 2008 John Wiley & Sons, Ltd.     

Medium energy ion irradiation of Ge surface – search for a better understanding of the surface nano‐patterning

We report the morphological changes on Ge surfaces upon 50 keV Ar⁺ and 100 keV Kr⁺ beam irradiation at 60° angle of incidence. The Ge surfaces having three different amorphous–crystalline (a/c) interfaces achieved by the pre‐irradiation of 50 keV Ar⁺ beam at 0°, 30° and 60° with a constant fluence of 5 × 10¹⁶ ions/cm² were further processed by the same beam at higher fluences viz. 3 × 10¹⁷, 5 × 10¹⁷, 7 × 10¹⁷ and 9 × 10¹⁷ ions/cm² to understand the mechanism of nano‐scale surface patterning. The Kr⁺ beam irradiation was carried out only on three fresh Ge surfaces with ion fluences of 3 × 10¹⁷, 5 × 10¹⁷ and 9 × 10¹⁷ ions/cm² to compare the influence of projectile mass on surface patterning. Irrespective of the depth of a/c interface, the nanoscale surface patterning was completely missing on Ge surface with Ar⁺ beam irradiation. However, the surface patterning was evidenced upon Kr⁺ beam irradiation with similar ion fluences. The wavelength and the amplitude of the ripples were found to increase with increasing ion fluence. In the paper, the mass redistribution at a/c interface, the incompressible solid flow through amorphous layer, the angular distribution of sputtering/backscattering yields and the generation of non‐uniform stress across the amorphous layer are discussed, particularly in analogy with low energy experiments, to get better understanding of the mechanism of nanoscale surface patterning by the ion beams. Copyright © 2016 John Wiley & Sons, Ltd.     

Patterning of cells on a PVC film surface functionalized by ion irradiation

Micropatterns of cells on a poly(vinyl chloride) (PVC) film surface were created by using ion irradiation. A PVC film was irradiated with H⁺ ions through a pattern mask in order to create patterns of the hydrophilic/hydrophobic regions on the PVC surface. The effect of ion irradiation on the surface properties of the PVC film was characterized by using Fourier transform‐infrared spectroscopy (FT‐IR), water contact angle measurement, and X‐ray photoelectron spectroscopy (XPS). The results revealed that the chemical environment of the PVC film surface was effectively changed by ion irradiation due to dehydrochlorination and oxidation. The in vitro cell culture on the patterned PVC film surface showed selective adhesion and proliferation of the cells on the ion‐irradiated regions. Well‐defined 50 µm patterns of the cells were obtained on the PVC film surface irradiated to 1 × 10¹⁵ ions/cm². Copyright © 2009 John Wiley & Sons, Ltd.     

Medium energy,heavy and inert ion irradiation of metallic thin films: studies of surface nano‐structuring and metal burrowing

In context to the ion induced surface nanostructuring of metals and their burrowing in the substrates, we report the influence of Xe and Kr ion‐irradiation on Pt:Si and Ag:Si thin films of ~5‐nm thickness. For the irradiation of thin films, several ion energies (275 and 350 keV of Kr; 450 and 700 keV of Xe) were chosen to maintain a constant ratio of the nuclear energy loss to the electronic energy loss (S_n/S_e) in Pt and Ag films (five in present studies). The ion‐fluence was varied from 1.0 × 10¹⁵ to 1.0 × 10¹⁷ ions/cm². The irradiated films were characterized using Rutherford backscattering spectroscopy (RBS), atomic force microscopy (AFM) and scanning electron microscopy (SEM). The AFM and SEM images show ion beam induced systematic surface nano‐structuring of thin films. The surface nano‐structures evolve with the ion fluence. The RBS spectra show fluence dependent burrowing of Pt and Ag in Si upon the irradiation of both ion beams. At highest fluence, the depth of metal burrowing in Si for all irradiation conditions remains almost constant confirming the synergistic effect of energy losses by the ion beams. The RBS analysis also shows quite large sputtering of thin films bombarded with ion beams. The sputtering yield varied from 54% to 62% by irradiating the thin films with Xe and Kr ions of chosen energies at highest ion fluence. In the paper, we present the experimental results and discuss the ion induced surface nano‐structuring of Pt and Ag and their burrowing in Si. Copyright © 2016 John Wiley & Sons, Ltd.     

Physio-chemical influence of high electron-phonon coupling induced by 120 MeV Ag9+ SHI irradiation on exfoliated MoS2 - PVA nanocomposite films for achieving remarkable electrical conductivity for potential application in organic electronics

Swift heavy ion (SHI) irradiation technology is known to enhance the optical, electronic, mechanical, and electrical properties in polymer nanocomposites by the virtue of electron-phonon coupling. In the present work, Molybdenum disulphide (MoS₂), a two-dimensional metal dichalcogenide, has been exfoliated via liquid-phase exfoliation using N-methyl-2- pyrrolidone (NMP) as the solvent that yielded nanosheets of around 2–4 layers as depicted by HR-TEM images. MoS₂ - PVA free-standing films were prepared by wet chemical technique i.e. solution casting method and irradiated by focussed high-energy Ag⁹⁺ ion beam at fluence range of 1E10 - 3E11 ions/cm². As a consequence, the structural modification was observed by X-Ray diffraction studies that showed the shift of (002) plane of MoS₂ while Raman studies indicated the decrease of degree of disorderness at fluence 1E10 ions/cm². SHI irradiation has found to induce a two-order increase in the electrical conductivity yielding a 9.7 E-3 S/cm against that of the pristine films at 2.6E-5 S/cm. The enhanced conductivity is attributed to the induced dispersion and annealing of MoS₂ nanosheets in the PVA matrix due to the interaction of 120 MeV Ag⁹⁺ ion beam irradiation as explained by Thermal spike model.     

Changes in the surface morphology induced by 1.0‐MeV Au ion bombardment of Ti and Ti‐6Al‐4V

The effects of surface sputtering by 1.0‐MeV Au ion implantation in commercially pure Ti and its alloy Ti‐6Al‐4V have been studied. These materials are associated with applications in orthopaedic implants. There are few studies that try to explain the ion implantation process of Au in these materials when considering the effects generated on the surface by sputtering, especially at energies of the order of MeV. Discs of these materials were mirror polished and then implanted with 1.0‐MeV Au ions for 4.7 × 10¹⁷ ions/cm² at 45° incident angle with respect to the surface. Part of the eroded material was deposited simultaneously on glass slides to determine their spatial distribution. These discs and the slides were analysed by Rutherford backscattering spectroscopy (RBS), scanning electron microscopy (SEM), optical microscopy and atomic force microscopy. The implanted materials show the initial production of surface ripples that evolve into banded structures. Copyright © 2014 John Wiley & Sons, Ltd.     

50 keV H+ ion beam irradiation of Al doped ZnO thin films: Studies of radiation stability for device applications

Thin films of Al doped ZnO (Al:ZnO) were deposited on two substrates (Si and glass) at room temperature and 300°C using DC magnetron sputtering. These films were bombarded with 50 keV H⁺ beam at several fluences. The pristine and ion beam irradiated films were analysed by X‐ray diffraction, Raman spectroscopy, scanning electron microscopy, and UV‐Vis spectroscopy. The X‐ray diffraction analysis, Hall measurements, Raman and UV‐Vis spectroscopy confirm that the structural and transport properties of Al:ZnO films do not change substantially with beam irradiation at chosen fluences. However, in comparison to film deposited at room temperature, the Al:ZnO thin film deposited at 300°C shows increased transmittance (from 70% to approximately 90%) with ion beam irradiation at highest fluence. The studies of surface morphology by scanning electron microscopy reveal that the ion irradiation yields smoothening of the films, which also increases with ion fluences. The films deposited at elevated temperature are smoother than those deposited at room temperature. In the paper, we discuss the interaction of 50 keV H⁺ ions with Al:ZnO films in terms of radiation stability in devices.     

Effect of a lateral methyl group on azo-mesogens containing the naphthalene moiety

Two mesogenic homologous series, 2-[4-(4-n-alkoxybenzoyloxy)-2-methylphenylazo]-naphthalenes (I) and 2-[4-(4-n-alkoxybenzoyloxy)-3-methylphenylazo]naphthalenes (II) with a lateral methyl group have been synthesized. Both series are purely nematogenic. The mesomorphic properties of both series are compared with each other and also with the properties of other structurally related series to evaluate the effect of the lateral methyl group on mesomorphism. The chiral nematic (N*) mesophase was induced in the system by doping with a derivative of naturally occurring chiral menthol.     

AFM image processing for estimating the number and volume of nanoparticles on a rough surface

This article presents the method of computer automatic recognition and measurement of the number and volume of nanoparticles formed on a rough surface by smoothing, enhancement and segmentation of image processing. The grafted grains (nanoparticles) on polyethylene surface are taken as the example. This method uses shock filter enhancement and globally convex segmentation to separate the nanoparticles from the polymer substrate surface. Then the nanoparticles are extracted from the rough surface, and the number and volume of nanoparticles on the rough surface are determined. By applying this method to analyze the surfaces irradiated for different time, the number and volume of grafted grains are obtained and they are consistent with the results obtained manually. Copyright © 2010 John Wiley & Sons, Ltd.     

脱乙酰基对天然魔芋葡甘聚糖分子形貌的影响

通过原子力显微镜直接观察魔芋葡甘聚糖（KGM）分子的三维结构形貌，KGM水溶液铺展在经Ca^2 处理的云母片上，干燥固定后，可获得稳定，重复的图像，实验结果表明，稀溶液中KGM分子具有伸展的螺旋链状结构，单股的长度达200－400nm，厚度为1．0nm，宽度为35．0－35．2nm，脱乙酰后分子链卷曲成直径约40－50nm,厚3．5－5．0nm的弹性圆台状。     

Hydrogen bonding,mechanical properties,and surface morphology of clay/waterborne polyurethane nanocomposites

A novel clay/waterborne polyurethane (WPU) nanocomposite was synthesized from polyurethane and saponite organoclay. The clay was organically modified with various swelling agents, the effect of which has been investigated. Hydrogen bonding between organic and inorganic materials was characterized with Fourier transform infrared (FTIR) spectroscopy. The results implied that hydrogen bonding increased when organoclay was added. Mechanical and wear property studies revealed that introducing clay into waterborne polyurethane will enhance the Young's modulus (from 56 to 126 MPa), the maximum stress (from 3.9 to 7.6 MPa), and the elongation at break (from 27.7 to 58.7%) of the nanocomposite by a factor of two, whereas the wear loss will be only one third of the neat waterborne polyurethane. Atomic force microscopy (AFM) was used to analyze the surface morphology of the nanocomposite. An AFM microphotograph showed that the surface of the clay/waterborne polyurethane nanocomposite was smoother when clay was added in waterborne polyurethane. The average roughness (R_a) decreased from 1.00 to 0.12. © 2004 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 43: 1–12, 2005     

A study on crystalline residual stress of the iPP surface layer in Al/iPP/Al under the influence of microwave irradiation

The residual stress of the iPP surface layer in Al/iPP/Al under the influence of microwave irradiation was investigated by thin film (TF)‐X‐ray diffraction (XRD). Depending on the irradiation time, we calculated the macro residual stress, micro stress, and lattice static distortion stress. The results show that the macroscopic residual tensile stress of irradiated iPP samples dropped from about 12 MPa to 4 MPa. D₍₃₀₀₎ (the β crystal phase) becomes larger from about 4 to 10 nm as the irradiation time increased, and the β‐form iPP becomes more perfect. However, for theα‐form phase, D₍₁₁₀₎ remains almost stable. Moreover, the microscopic distortion coefficient ε₍₃₀₀₎ that decreases from approximately 0.03 to 0.018, becomes smaller than ε₍₁₁₀₎ parallel to the irradiation time, so the microscopic stress of the β‐crystal is decreased. In addition, the lattice static distortion energy of the α‐form greatly increases from 2 to 6 MPa, but the lattice static distortion energy of the β‐crystals remains constant at about 1.5 MPa and is much smaller than that of the α‐crystals at the same irradiation time. These calculated results are in good agreement with that of the crystallinity and order parameter of the β‐crystals of the TF‐XRD. The lattice distortion energy is a major portion of the plastic deformation, therefore, it suggests that the lattice static distortion energy is the main cause of α → β crystalline transformation. © 2004 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 42: 3759–3765, 2004     

Effect of coagulant temperature and composition on surface morphology and mass transfer properties of cellulose acetate hollow fiber membranes

Cellulose acetate (CA) hollow fibers were spun via the dry‐jet wet spinning technique under various external coagulant compositions and temperatures. The surface morphology of the resulting hollow fiber was examined using field emission scanning electron microscopy (FESEM) and tapping mode atomic force microscopy (TMAFM). The pure water permeability (PWP) and the retention of dextran of the hollow fiber were also measured. The results showed that both the temperature and composition can affect greatly the surface morphology and hence the permeation performance of hollow fiber membranes when the temperature was over 55°C and the dimethyl formamide (DMF) content was higher than 15%. The on‐line draw ratio increased with the coagulant temperature and DMF content (in the range of 0 to 10%) in the external coagulant. The ultimate tensile strength also increased when the fibers were coagulated in 5–10% DMF and at 70°C. The PWP increased with the DMF content in the coagulant and the coagulant temperature. The retention of dextran decreased with the increase of the DMF content in the coagulant and the coagulant temperature. Copyright © 2005 John Wiley & Sons, Ltd.     

Observation of microcontaminants on pure chromium surface by AFM and their removal by UV light illumination

Microcontaminants on a pure chromium surface were observed and confirmed by atomic force microscope (AFM). On the basis of surface observation, X‐ray photoelectron spectroscopy (XPS) analysis and wettability measurement, the removal of microcontaminants by ultraviolet (UV) light illumination was investigated. Particle‐ and film‐like microcontaminants on the specimen surface were observed. With an increase in air exposure time, particle‐like contaminants increased in size, and then film‐like contaminants almost covered the entire surface. Most organic substance in the contaminants was removed by UV light illumination in a sealed chamber, except water in the contaminants. The re‐adhesion of contaminants on the UV‐light‐illuminated surface seemed slower after compared to before UV light illumination. Copyright © 2008 John Wiley & Sons, Ltd.     

Effect of atomic oxygen irradiation on the structural and tribological characteristics of polytetrafluoroethylene and its composites

Based on the ground‐based simulation facility, the effects of atomic oxygen (AO) irradiation on the structural and tribological properties of pure polytetrafluoroethylene (PTFE) and carbon fiber and MoS₂‐filled PTFE composites were studied by scanning electron microscopy, X‐ray photoelectron spectroscopy, and a ball‐on‐disc tribometer. The results shown that AO irradiation had significant effects on the structural and tribological properties of pure PTFE, in which the surface morphologies, mass loss, friction coefficient, and wear rate had been changed greatly after AO irradiation. However, it was noticeable that the addition of carbon fiber and MoS₂ filler to PTFE could improve the AO resist capacity and tribological properties of PTFE composites significantly. Copyright © 2016 John Wiley & Sons, Ltd.     

Effect of γ irradiation on the surface properties of wet polysulfone films containing poly(vinylpyrrolidone)

In Japan, hemodialyzers are usually sterilized by γ irradiation. However, the polymer materials used in the dialysis membrane, such as polysulfone (PSf) and poly(vinylpyrrolidone) (PVP), undergo crosslinking or degradation on exposure to γ radiation. In the present study, we prepared PSf/PVP films (PVP content, 0–50 wt%) and used atomic force microscopy (AFM) to perform nanoscale evaluations of the effect of γ irradiation (25 and 50 kGy) on the surface properties of wet PSf/PVP surfaces. Force‐curve measurements were used to evaluate the hardness of and fibrinogen adsorbability on the wet PSf/PVP surface; fibrinogen adsorbability on the wet PSf/PVP surface was evaluated using AFM probes with fibrinogen immobilized on the tips of the probes. At PVP levels greater than 5 wt%, the wet PSf/PVP film surface was completely covered with hydrated and swollen PVP particles. The surface hardness of the wet PSf/PVP films exposed to 25‐kGy γ irradiation greatly decreased with increasing PVP content, whereas the surface hardness of the wet PSf/PVP films exposed to 50‐kGy γ irradiation did not decrease significantly. At higher PVP levels, the reduction in the fibrinogen adsorbability on a wet PSf/PVP film exposed to 25‐kGy γ irradiation was more significant than that on a wet PSf/PVP film exposed to 50‐kGy γ irradiation. PVP particles on the wet PSf/PVP film surface exposed to 50‐kGy γ irradiation did not show significant hydration and swelling because the polymer materials PVP–PSf and PVP‐PVP in these membranes has undergone excessive crosslinking due to γ irradiation. Copyright © 2010 John Wiley & Sons, Ltd.