Efficiency of automated peak identification with daily used commercial software for X‐ray photoelectron spectra ‐ report from VAMAS/TWA 2/A 9 project

In the first step of X‐ray photoelectron spectroscopy (XPS) analysis, photoelectron peaks in a survey spectrum for the specimen of interest are generally identified as arising from particular elements and electron energy levels. This peak identification is performed using sophisticated software on commercial XPS instruments. For the Versailles Project on Advanced Materials and Standards (VAMAS)/Technical Working Area (TWA) 2/A 9 project, automated peak‐identification efficiency using commercial software utilities has been investigated with simulated test XPS spectra. This efficiency has been investigated with reference peaks that were detected by eye in our previous work [SIA, 2008, 40, 1337]. We found (i) one software that identified the binding energy (BE) at the peak maximum for a fitted curve in the peak region, a second that reported the BE stored in its database, and a third that reported the BE as the local maximum, (ii) software does not identify some weak peaks even though they were obviously detected by analysts, (iii) only one major peak of a doublet appeared to be in software database when the energy separation is less than about 4 eV such as 3.6 eV for Au 4f, and (iv) the identification efficiency is larger than 90% when the ratio between peak height and noise amplitude is greater than 10. We suggest several things for improving software design to assist non‐expert analysts. Copyright © 2013 John Wiley & Sons, Ltd.     

Core level studies of calcite and dolomite

Conventional X‐ray photoelectron spectroscopy (XPS) and synchrotron‐based X‐ray photoelectron spectroscopy (HRXPS) have been used to study Iceland spar calcite (CaCO₃) and dolomite (CaMg(CO₃)₂). The obtained full widths at half maximum (FWHMs) are mostly narrower than in the previous results, which together with the symmetry of the fitted peaks indicate effective neutralisation of surface charging. Some previously unidentified features observed in the Ca 2p, C 1s and O 1s spectra of calcite have been suggested to be bulk plasmons. Also, surface core level shifts in Ca 2p (in calcite) and Mg 2p (in dolomite) spectra have been obtained and found to be consistent between XPS and HRXPS measurements. A peak attributed to carbide (CaC₂) has been suggested to indicate beam‐assisted interaction with hydrocarbons found on the surface. Copyright © 2014 John Wiley & Sons, Ltd.     

Evaluation of uncertainties in X‐ray photoelectron spectroscopy intensities associated with different methods and procedures for background subtraction. II. Spectra for unmonochromated Al and Mg X‐rays

We report uncertainties in X‐ray photoelectron spectroscopy (XPS) intensities arising from commonly used methods and procedures for subtraction of the spectral background. These uncertainties were determined from a comparison of XPS intensities reported by volunteer analysts and the corresponding intensities expected for a set of simulated XPS spectra. We analyzed peak intensities from 16 sets of data (submitted from 15 institutions) for a group of 12 spectra that had been simulated for an unmonochromated Al‐Kα source and similar intensities from 20 sets of data (submitted from 17 institutions) that had been simulated for an unmonochromated Mg‐Kα source. Each reported intensity was compared with an expected intensity for the particular integration limits chosen by each analyst and known from the simulation design. We present ratios of the reported intensities to the expected intensities for the background‐subtraction methods chosen by the analysts. These ratios were close to unity in most cases, as expected, but deviations were found in the results from some analysts, particularly if shakeup was present. We showed that better results for the Shirley and Tougaard backgrounds were obtained when analysts determined peak intensities over certain energy ranges or integration limits. We then were able to suggest integration limits that should be a useful guide in the determination of peak intensities for other XPS spectra. The use of relatively narrow integration limits with the Shirley and linear backgrounds, however, will lead to measures of peak intensity that are less than the total intensities. Although these measures may be satisfactory for some quantitative analyses, errors in quantitative XPS analyses can occur if there are changes in XPS lineshapes or shakeup fractions with change of chemical state. The use of curve‐fitting equations to fit an entire spectrum will generally exclude the shakeup contribution to the intensity of the main peak, and any variation in the shakeup fraction with change of chemical state will not be taken into account. Published in 2009 by John Wiley & Sons, Ltd.     

Vacuum Ultraviolet and Soft X‐ray Photoelectron Spectroscopy of Liquid Beams Using a Hemispherical Photoelectron Spectrometer with a Multistage Differential Pumping System

We present photoelectron spectroscopy of liquid beams using a high‐resolution hemispherical photoelectron spectrometer with a multistage differential pumping system developed in our laboratory. Intense soft X‐ray synchrotron radiation (500‐1200 eV) at SPring‐8 and a relatively large detection solid angle (1.5 × 10^?2 π sr) of the spectrometer enable highly efficient measurements of X‐ray photoelectron spectra of liquids. Vacuum ultraviolet photoelectron spectroscopy using the same spectrometer provides sufficiently high spectral resolution to resolve rotational isomers of gas‐phase molecules.     

Photoelectron spectroscopy on organic surfaces: X‐ray degradation of oxygen‐plasma‐treated and chemically reduced poly(propylene) surfaces in comparison to conventional polymers

The X‐ray‐induced sample damage during mono XPS analysis of an oxygen‐plasma‐oxidized and subsequently wet‐chemically reduced poly(propylene) film was investigated as a showcase for plasma‐modified or plasma‐deposited samples. By doing this, the degradation index approach as introduced by Beamson and Briggs in the Scienta ESCA300 high‐resolution XPS database of organic polymers has been adopted. As to be expected, the sample degrades by loosing oxygen as revealed by observation of decreasing O/C and C OR/C_sum ratios. However, the X‐ray degradation indices are definitely higher than those of conventional reference polymers. Moreover, the C OR/C_sum degradation index is significantly higher in comparison with one obtained for the O/C ratio. In that context, there is no difference between the plasma sample and a conventional poly(vinyl alcohol) polymer. It is concluded that for reliable quantitative surface chemical analysis, the quality of spectra in terms of acquisition times must be optimized aimed to a minimization of X‐ray degradation. Finally, it is proposed to describe the photon flux of an X‐ray gun in an XPS experiment, which defines the degradation rate at the end, by using the sample current simply measured with a carefully grounded sputter‐cleaned reference silver sample. Copyright © 2009 John Wiley & Sons, Ltd.     

Monte‐Carlo simulation of x‐ray photoelectron emission from silver

Silver 3d x‐ray photoelectron spectroscopy (XPS) spectra were simulated with the Monte‐Carlo method using an effective energy‐loss function that was derived from a reflected electron energy‐loss spectroscopy (REELS) analysis based on an extended Landau approach. After confirming that Monte‐Carlo simulation based on the use of the effective energy‐loss function can successfully describe the experimental REELS spectrum and Ag 3d XPS spectrum, we applied Monte‐Carlo simulation to predict the angular distribution of Ag 3d x‐ray photoelectrons for different x‐ray incidence angles and different photoelectron take‐off angles. The experimental photoelectron emission microscope that we are constructing was confirmed as being close to the optimum configuration, in which the x‐ray incident angle as measured from the surface normal direction is 74° and the photoelectron take‐off angle is set normal to the surface. The depth distribution functions of the Ag 3d X‐ray photoelectrons for different energy windows suggest that the photoelectron emission microscope will exhibit greater surface sensitivity for narrower photoelectron energy windows. Copyright © 2003 John Wiley & Sons, Ltd.     

Summary of ISO/TC 201 Standard: XXIX. ISO 20903: 2006—Surface chemical analysis—Auger electron spectroscopy and X‐ray photoelectron spectroscopy—methods used to determine peak intensities and information required when reporting results

This article is a brief summary of the ISO Standard 20903. This standard provides information on methods for the measurement of peak intensities in Auger electron and X‐ray photoelectron spectra and on uncertainties of the derived peak areas. It also specifies the necessary information required in a report of analytical results based on such measurements. Published in 2007 by John Wiley & Sons, Ltd.     

Growth and characterization of ultrathin carbon films on electrodeposited Cu and Ni

Ultrathin carbon films were grown on different types of metallic substrates. Free‐standing foils of Cu and Ni were prepared by electroforming, and a pure Ni film was obtained by galvanic displacement on a Si wafer. Commercial foil of Ni 99.95% was used as a reference substrate. Carbon films were grown on these substrates by chemical vapour deposition in a CH₄‐H₂ atmosphere. Obtained films were characterized by Raman spectroscopy, X‐ray photoelectron spectroscopy (XPS), Auger electron spectroscopy, and ultraviolet photoemission spectroscopy. The XPS at grazing collection angle was used to determine the thickness of carbon films. Depending on the deposition parameters, the films of graphene or graphite were obtained on the different substrates. The uniformity of graphene and its distribution over the sample area were investigated from Raman data, optical images, and XPS chemical maps. The presence of graphene or graphite in the films was determined from the Raman spectra and Auger peak of C KVV. For this purpose, the D parameter, which is a fingerprint of carbon allotropes, was determined from C KVV spectra acquired by using X‐rays and electron beam. A formation of an intermediate layer of metal hydroxide was revealed in the samples with graphene overlayer.     

A novel intumescent flame retardant imparts high flame retardancy to epoxy resin

Intumescent flame retardant (IFR) has received the considerable attention ascribed to the inherent advantages including non‐halogen, low toxicity, low smoke release and environmentally friendly. In this work, a novel charring agent poly (piperazine phenylaminophosphamide) named as PPTA was successfully synthesized and characterized by Fourier transform infrared spectra (FTIR) and X‐ray photoelectron spectroscopy (XPS). Then, a series of flame‐retardant EP samples were prepared by blending with ammonium polyphosphate (APP) and PPTA. Combustion tests include oxygen Index (LOI), vertical Burning Test (UL‐94) and cone calorimeter testing,these test results showed that PPTA greatly enhances the flame retardancy of EP/APP. According to detailed results, EP containing 10 wt% APP had a LOI value of 30.2%,but had no enhancement on UL‐94 rating. However, after both 7.5 wt% APP and 2.5 wt% PPTA were added, EP‐7 passed UL‐94 V‐0 rating with a LOI value of 33.0%. Moreover, the peak heat release rate (PHRR) and peak of smoke product rate (PSPR) of EP‐7 were greatly decreased. Meanwhile, the flame‐retardant mechanism of EP‐7 was investigated by scanning electron microscopy (SEM), thermogravimetric analysis/infrared spectrometry (TG‐IR) and X‐ray photoelectron spectroscopy (XPS). The corresponding results presented PPTA significantly increased the density of char layer, resulting in the good flame retardancy.     

Studies on Structure and Electrocatalytic Hydrogen Evolution of Nanocrystyalline Ni—Mo—Fe Alloy Electrodeposit Electrodes

Nanocrystalline Ni‐Mo‐Fe alloy deposits were obtained by electrode‐position. The structures of the alloy deposits were analyzed by X‐ray diffraction (XRD) and X‐ray photoelectron spectroscopy (XPS). The XRD results of nanocrystalline Ni‐Mo‐Fe alloy deposit show that many diffraction lines disappear, and that there is only one diffraction peak at 44.0°. The XPS results of nanocrystalline Ni‐Mo‐Fe alloy deposits indicate that the nickel, molybdenum and iron of the deposits exist in metallic state, and that the binding energy of the alloyed elements increases to some extent. The nanocrystalline Ni‐Mo‐Fe alloy deposit electrode may offer better electrocatalytic activity than the polycrystalline nickel electrode and the nanocrystalline Ni‐Mo alloy electrode. The electrochemical impedance spectra from the nanocrystalline Ni‐Mo‐Fe alloy electrode indicate that hydrogen evolution in 30% (m/m) KOH at lower overpotential is in accordance with the Vohner‐Tafel mechanism, but with the Vohner‐Heyrovsky mechanism at higher overpotential.     

The X‐ray photoelectron spectra of Ir,IrO2 and IrCl3 revisited

The X‐ray photoelectron spectra of metallic iridium and the technologically important iridium compounds, IrO₂ and IrCl₃, have been studied. The results not only improve the accuracy of published data but also expand the binding energy database of other iridium core‐levels. The difference between anhydrous and hydrated materials is explored, and the effect on curve‐fitting is discussed, together with the derivation of suitable line shapes for peak fitting of data acquired from a conventional monochromatic Al K_α X‐ray source. Copyright © 2017 John Wiley & Sons, Ltd.     

Evaluation of uncertainties in X‐ray photoelectron spectroscopy intensities associated with different methods and procedures for background subtraction. I. Spectra for monochromatic Al X‐ray

We report uncertainties in X‐ray photoelectron spectroscopy (XPS) intensities arising from commonly used methods and procedures for subtraction of the spectral background. These uncertainties were determined from a comparison of XPS intensities reported by volunteer analysts from 28 institutions and the corresponding intensities expected for a set of simulated XPS spectra. We analyzed peak intensities from 32 sets of data for a group of 12 spectra that had been simulated for a monochromated Al Kα source. Each reported intensity was compared with an expected intensity for the particular integration limits chosen by each analyst and known from the simulation design. We present ratios of the reported intensities to the expected intensities for the background‐subtraction methods chosen by the analysts. These ratios were close to unity in most cases, as expected, but deviations were found in the results from some analysts, particularly if the main peak was asymmetrical or if shakeup was present. We showed that better results for the Shirley, Tougaard, and linear backgrounds were obtained when analysts determined peak intensities over certain energy ranges or integration limits. We then were able to recommend integration limits that should be a useful guide in the determination of peak intensities for other XPS spectra. The use of relatively narrow integration limits with the Shirley and linear backgrounds, however, will lead to measures of peak intensities that are less than the total intensities. Although these measures may be satisfactory for some quantitative analyses, errors in quantitative XPS analyses can occur if there are changes in XPS lineshapes or shakeup fractions with change of chemical state. The use of curve‐fitting equations to fit an entire spectrum will generally exclude the shakeup contribution to the intensity of the main peak, and no account will be taken of any variation in the shakeup fraction with change of chemical state. Published in 2009 by John Wiley & Sons, Ltd. Certain commercial products are identified to specify the formats in which the test spectra were distributed and the software with which the test spectra were analyzed by participants. This identification does not imply that the products are endorsed or recommended by the National Institute of Standards and Technology, or that they are necessarily the most suitable for the purposes described.     

Summary of ISO/TC 201 standard: ISO 19668—Surface chemical analysis—X‐ray photoelectron spectroscopy—Estimating and reporting detection limits for elements in homogeneous materials

This International Standard specifies a procedure by which elemental detection limits in X‐ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.     

X‐ray photoelectron and carbon Kα emission measurements and calculations of O‐, CO‐, N‐, and S‐containing substances

X‐ray fluorescence measurements for O‐containing [polyethylene oxide, polyvinyl alcohol, polyvinyl methyl ether], CO‐containing [polyvinyl methyl ketone, polyethylene terephthalate], N‐containing [poly‐4‐vinylpyridine (P4VP), polyaniline oligomer (PAO)], and S‐containing [polyphenylene sulfide] substances are presented. Carbon Kα X‐ray emission spectra (XES) and X‐ray photoelectron spectra (XPS) are compared with our DFT calculations performed with the Amsterdam density functional (ADF) program. The combined analysis of valence XPS and carbon Kα XES allows us to determine the individual contributions from pσ‐ and pπ‐bonding molecular orbitals of the polymers. The ΔSCF calculations yield the accurate C1s core‐electron binding energies (CEBEs) for all carbon sites of the organic compound. We calculate all CEBEs of the model molecules using the ΔE _KS approach. Our simulated C1s photoelectron and C Kα emission spectra are in good agreement with our measurements. We also obtain WD (work function and the other energies) values for the polymers and PAO from the difference between calculated (gas‐phase) and measured (solid) CEBE values. © 2006 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 45: 162–172, 2007     

Product or sum: comparative tests of Voigt,and product or sum of Gaussian and Lorentzian functions in the fitting of synthetic Voigt‐based X‐ray photoelectron spectra

A comparative study for the fitting of X‐ray photoelectron spectra (XPS) using different model functions is presented. Synthetically generated test spectra using Gaussian/Lorentzian convolution and a real measured spectrum are fitted with the three commonly used models: product, sum and Gaussian/Lorentzian convolution functions. In these limited tests, it was found that the sum function is superior to the product function, particularly for low‐noise spectra. Copyright © 2007 John Wiley & Sons, Ltd.     

A novel route for synthesis of NiCoP/SiO2 hydrodesulfurization catalysts with active S species

We report a new route for synthesis of NiCoP/SiO₂ with active S species using NiS and CoS as precursors. The as‐prepared catalysts were characterized using X‐ray powder diffraction, N₂‐adsorption specific surface area measurements, inductively coupled plasma atomic emission spectroscopy, transmission electron microscopy, and X‐ray photoelectron spectroscopy (XPS). The catalyst was highly active during the dibenzothiophene hydrodesulfurization (HDS) of NiCoP/SiO₂. The XPS spectra of the as‐obtained samples show that the surface of NiCoP contains a small amount of S species, which may be responsible for the higher HDS activity.     

Analysis of XPS and XES of diamond and graphite by DFT calculations using model molecules

X‐ray photoelectron and emission spectra (XPS and XES) of diamond and graphite have been analyzed by deMon density‐functional theory (DFT) calculations using the model adamantane derivative (C₁₀H₁₂(CH₃)₄) and pyrene (C₁₆H₁₀) molecules, respectively. The theoretical valence photoelectron and C Kα X‐ray emission spectra for the allotrope are in good accordance with the experimental ones. The combined analysis of the valence XPS and C Kα XES enables us to divide the valence electronic distribution into the individual contributions for pσ‐, and pπ‐bonding MOs of the diamond and graphite, respectively. © 2000 John Wiley & Sons, Inc. J Comput Chem 22: 102–108, 2001     

Synthesis and Characterization of Core‐Shell Selenium/Carbon Colloids and Hollow Carbon Capsules

A novel Se/C nanocomposite with core‐shell structures has been prepared through a facile one‐pot microwave‐induced hydrothermal process. The new material consists of a trigonal‐Se (t‐Se) core and an amorphous‐C (a‐C) shell. The Se/C composite can be converted to hollow carbon capsules by thermal treatment. These products were characterized by transmission electron microscopy (TEM), powder X‐ray diffraction (XRD), scanning electron microscopy (SEM), selected area electron diffraction (SAED), energy‐dispersive X‐ray (EDX) spectroscopy, and X‐ray photoelectron spectroscopy (XPS).     

Further developments in quantitative X‐ray photoelectron spectromicroscopy: preliminary results from the study of germanium corrosion

The moisture‐induced corrosion of an evaporated germanium film has been observed and studied using quantitative X‐ray photoelectron spectromicroscopy. The application of recently reported software for the processing of multi‐spectral image datasets (particularly noise reduction) to this real‐world problem revealed the formation of oxide islands above the continuous passive oxide layer. The software has been developed to map the thickness of these structures within the XPS sampling depth, with a spatial resolution of a few microns. This exemplifies a characterisation methodology of use in any situation where (non‐uniform) surface modification results in chemically shifted components of the same core level (or Auger peak) between the original substrate and new overlayer. Copyright © 2005 John Wiley & Sons, Ltd.     

Practical estimation of XPS binding energies using widely available quantum chemistry software

Chemical shifts observed in high‐resolution X‐ray photoelectron spectroscopy (XPS) spectra are normally used to determine the chemical state of the elements of interest. Often, these shifts are small, or an element is present in several oxidation states in the same sample, so that interpretation of the spectra is difficult without good reference data on binding energies of the likely constituents. In many cases, reference spectra taken from pure reference samples of the chemical components can aid the peak fitting procedure. However, reference materials are not always available, so that it becomes necessary to estimate the binding energies of likely components through quantum chemical calculations. In principle, such calculations have become much easier than in the past, due to the availability of powerful personal computers and excellent software. In practice, though, care needs to be taken in the approximations, assumptions, and settings used in applying such software to calculate binding energies. In this work, we present a general summary of the methods for the calculation of the core electron binding energies and compare the use of 2 of these methods using the popular “GAUSSIAN” software package. Furthermore, a series of results for molecules, containing elements of the second and the third row of the periodic table, are presented and compared with experimental results, in order to establish the quality and fitness‐for‐purpose of the quantum chemical‐based predictions.