Simulation of ion beam extraction and focusing system

The characteristics of ion beam extraction and focused to a volume as small as possible were investigated with the aid of computer code SIMION 3D version 7. This has been used to evaluate the extraction characteristics (accel-decel system) to generate an ion beam with low beam emittance and high brightness. The simulation process can provide a good study for optimizing the extraction and focusing system of the ion beam without any losses and transported to the required target. Also, a study of a simulation model for the extraction system of the ion source was used to describe the possible plasma boundary curvatures during the ion extraction that may be affected by the change in an extraction potential with a constant plasma density meniscus.     

高电荷态ECR离子源引出束流4D 发射度测量仪设计

为了进一步探究高电荷态电子回旋共振(ECR) 离子源引出束流品质和横向相空间耦合情况,根据中国科学院近代物理研究所高电荷态离子源引出束流发射度测量需求,针对束流流强为1 eμA∼1 emA,能量范围为10∼35 keV/q 的直流或脉冲高电荷态重离子束,设计了一台实时四维Pepper-pot 发射度测量仪。该Pepper-pot 型发射度测量仪具有响应时间快和工作范围宽等特点。针对强流重离子束诊断的特点,在结构与材料选择上做了设计与优化,并对获得图像的处理方法提出了具体的解决办法。For the purpose of on-line beam quality diagnostics and transverse emittance coupling investigation of the ion beams delivered by an Electron Cyclotron Resonance (ECR) ion source, a real-time 4D Pepper Pot type emittance scanner is under development at IMP(Institute of Moden Physics, Chinese Academy of Sciences). The high charge state ECR ion source at IMP could produce CW or pulsed heavy ion beam intensities in the range of 1 eμA∼1 emA with the kinetic energy of 10∼35 keV/q, which needs the design of the Pepper Pot scanner to be optimized accordingly. The Pepper Pot scanner has many features, such as very short response time and wide dynamic working range that the device could be applied. Since intense heavy ion beam bombardment is expected for this device, the structure and the material selection for the device is specially considered during the design, and a feasible solution to analyze the pictures acquired after the data acquisition is also made.     

Optimization and numerical simulation for the extraction system of the H~- multicusp ion source

A new ion source has been designed and manufactured for the CYCLONE30 accelerator, which has a much advanced performance compared with the original. It is expected that the newly designed ion source extraction system will transport a very large percentage of the beam without deteriorating the beam optics, which is designed to deliver an H^- beam at 30 keV. The accelerator assembly consists of three circular aperture electrodes made of copper. The simulation study was focused on finding parameter sets that raise the beam perveance as large as possible and which reduce the beam divergence as low as possible. Ion beams of the highest quality are extracted whenever the half-angular divergence is minimum, for which the perveance current intensity and the extraction gap have optimum values. The triode extraction system is designed and optimized by using CST software (for Particle Beam Simulations). The physical design of the extraction system is given in this paper. From the simulation results, it is concluded that it is possible to achieve this goal by decreasing the thickness of the plasma electrode, shortening the first gap, and adjusting the acceleration electrode voltage.     

NSCL从ECR离子源向CCF注入的离子束流动力学研究

The Coupled Cyclotron Facility (CCF) has been operating at the NSCL since 2001,providing up to 160MeV/u heavy ion beams for nuclear physics experiments.Recent steps,particularly the improvement of the ECR-to-K500 injection line,were taken to improve the CCF performance.For that purpose an off-line ECR source,ARTEMIS-B,was built and used to investigate the impact on beam brightness under various source operating conditions,different initial focusing systems and current analysis dipole.Beam dynamics simulations including space-charge and 3D electrostatic field effects were performed and beam diagnostics including emittance scanner were used,leading to a better understanding of the CCF beam injection process. New initial electrostatic focusing elements such as a large-bore quadrupole triplet and a quadrupole double- doublet with compensating octupole were tested,and a new beam tuning procedure was established to improve the beam brightness for the CCF.Following these efforts,a significant increase of primary beam power out of the CCF has been achieved.     

Emittance Measurements for Beams Extracted from LECR3 Ion Source

High quality ion beams are required by IMP cyclotron and atomic physics research, so it is important to research and measure beam emitt ance of ECR ion source. Intense beams extracted from ECR ion source usually have low energy, so it is suitable to use Electric-Sweep Scanner to measure the emittance. This kind of measurement is popularly used at ECR ion source, and it has some prominent merits such as high accuracy, very short time of data processing and easy expressing of the emittance pattern. So we designed and built this emittance scanner to measure emittance of the ion beams produced by LECR3 ion source. The structure of the ESS is shown in Fig.l, and the photo of the ESS is shown in Fig.2.     

受空间电荷效应影响的离子束流从等离子体边界的最佳引出的一阶理论

The problem of extracting space-charge-limited ion beams from spherical emission boundaries is analyzed for simple,two electrode,parallel-plate and spherical sector electrode systems by application of Langmuir-Blodgett theory with account taken for the divergent lens effect caused by the aperture in the extraction electrode.Results derived from simulation studies for the three electrode system,designed for use with the Oak Ridge National Laboratory ECR ion source,complement predictions made from elementary analytical theory with or without magnetic field in the extraction region of the source.Under minimum half- angular divergence(minimum emittance)conditions,the plasma emission boundary has an optimum curvature and the perveance,P,(i.e,current density,j and extraction gap,d),has an optimum value for a given charge- state.From these studies,we find that the optimum perveance for any electrode system can be determined from the Child-Langmuir relation for the parallel-plate electrode system multiplied by a factor,F with value 0.49≤F≤1.     

用于聚焦离子束系统的离子源

介绍了现阶段两种用于聚焦离子束系统的离子源——液态金属离子源和气体场发射离子源的基本原理, 并对比了它们的优缺点。由于目前这两种离子源都难以满足纳米加工领域不断提高的技术要求, 因此提出了一种用于聚焦离子束的新型离子源——电子束离子源, 并介绍了电子束离子源的基本原理, 给出了设计参数、 模拟结果（20 kV的Ar+离子束, 发射度约为5.8×10-5·mm·mrad, 束斑约为1 μm）和初步的实验结果。 There are two kinds of ion sources, Liquid Metal Ion Source and Gas Field Ion Source, used to provide ion beams for the Focus Ion Beam system. The working mechanism of the two kinds of sources is presented and their advantages and disadvantages are summarized. With the rapid development in the nano technology, the requirements are hardly met with these two kinds of ion sources. Therefore, a new kind of ion source, electron beam ion source, is developed for the Focus Ion Beam system. The basic principle of the electron beam ion source is introduced and the design parameters, the result of the simulation (20 kV Ar+, extracted emittance is 5.8×10-5π·mm·mrad, raduis of the ion beam about 1 μm.) and the primary experimental results are presented     

Status of CSNS H- ion source

A new H^- ion source has been installed successfully and will be used to serve the China Spallation Neutron Source (CSNS). In this paper, we report various components of the ion source, including the discharge chamber, temperature, cooling system, extraction electrodes, analyzing magnet, remote control system and so on. Compared to the previous experimental ion source, some improvements have been made to make the ion source more compact and convenient. In the present arrangement, the Penning field is generated by a pair of pole tip extensions on the 90° analyzing magnet instead of by a separate circuit. For the remote control system, F3RP61-2L is applied to the accelerator online control system for the first time. In the running of the ion source, a stable pulse H^- beam with a current of 50 mA at an energy of 50 keV is produced. The extraction frequency and pulse width is 25 Hz and 500 μs, respectively. Furthermore, an emittance scanner has been installed and measurements are in progress.     

Practical 2.45-GHz microwave-driven Cs-free Hˉ ion source developed at Peking University

A practical 2.45-GHz microwave-driven Cs-free Hˉ source was improved based on the experimental Hˉ source at Peking University(PKU). Several structural improvements were implemented to meet the practical requirements of Xi'an Proton Application Facility(XiPaf). Firstly, the plasma chamber size was optimized to enhance the plasma intensity and stability. Secondly, the filter magnetic field and electron deflecting magnetic field were enhanced to reduce co-extracted electrons. Thirdly, a new two-electrode extraction system with farther electrode gap and enhanced water cooling ability to diminish spark and sputter during beam extraction was applied. At last, the direct Hˉ current measuring method was adopted by the arrangement of a new pair of bending magnets before Faraday cup(FC) to remove residual electrons. With these improvements, electron cyclotron resonance(ECR) magnetic field optimization experiments and operation parameter variation experiments were carried out on the Hˉ ion source and a maximum 8.5-mA pure Hˉ beam was extracted at 50 kV with the time structure of 100 Hz/0.3 ms. The root-mean-square(RMS) emittance of the beam is 0.25 Π·mm·mrad. This improved Hˉ source and extraction system were maintenance-free for more than 200 hours in operation.     

高电荷态ECR离子源

介绍了目前ECR离子源的发展状况和国际上几台典型的ECR离子源.Electron cyclotron resonance (ECR) ion source is the most efficient facility for producing highly charged ions. So far more than 1 emA of O 6+ and 0.02 eμA of U 55+ have been delivered by ECR ion source. In this paper the latest development of ECR ion source is presented and several typical ECR ion sources in the world is introduced.     

ECR离子源束流发射度的实验研究

利用最新自行研制的电扫描发射度探测系统, 在ECR离子源上进行了一系列关于ECR离子源引出束流发射度的研究. 这套电扫描发射度探测系统安装在中国科学院近代物理研究所(兰州)的LECR3试验平台的束运线上. 试验中, 通过测量相关参数, 研究了磁场、微波、掺气效应及负偏压效应等对引出束流发射度的影响. 利用实验所得的结果与关于ECR等离子体和离子源束流发射度的半经验理论, 分析推导了离子源各可调参数与ECR等离子体的直接关系, 这为分析探索ECR离子源的工作机制提供了一定的参考依据.     

Simulation of ion beam extraction and focusing system

The characteristics of ion beam extraction and focused to a volume as small as possible were investigated with the aid of computer code SIMION 3D version 7.This has been used to evaluate the extraction characteristics(accel-decel system)to generate an ion beam with low beam emittance and high brightness.The simulation process can provide a good study for optimizing the extraction and focusing system of the ion beam without any losses and transported to the required target.Also,a study of a simulation model for the extraction system of the ion source was used to describe the possible plasma boundary curvatures during the ion extraction that may be affected by the change in an extraction potential with a constant plasma density meniscus.     

Analytical and simulation studies for diode and triode ion beam extraction systems

This work is concerned with ion beam dynamics and compares the emittance to aberration ratios of two-and three-electrode extraction systems. The study is conducted with the aid of Version 7 of SIMION 3D ray-tracing software. The beam dependence on various parameters of the extraction systems is studied and the numerical results lead to qualitative conclusions.     

ECR源低能强流高电荷态离子束四维发射度测量仪的研制

为全面研究ECR（Electron Cyclotron Resonance）离子源引出的高电荷态离子束流品质,获取ECR离子源引出离子束流的横向四维相空间分布,提高向加速器的注入效率,中国科学院近代物理研究所研制了一台高精度Pepper Pot型发射度测量仪PEMiL（Pepper pot Emittance Meter in Lanzhou）。根据使用需求,利用KBr晶体喷涂技术取代传统的CsI闪烁体成像技术,解决了束流光斑重叠效应,获得了边界清晰的束流图像;并开发了相应的数据处理分析程序,以分析处理得到的束流横向四维相空间分布。利用PEMiL获得了75 keV,170 eμA的O5+束流横向四维发射度。分析结果表明:PEMiL测量分析后的束流发射度结果可靠性高,荧光屏电荷累积效应造成的发射度差异不超过25%,PEMiL可作为ECR离子源引出离子束流品质诊断的有效装置。     

微波电子回旋共振等离子体阴极电子束的实验研究

介绍了实验室研制的微波电子回旋共振(ECR)等离子体阴极电子束系统及初步研究结果，该系统包括微波ECR 等离子体源、电子束引出极、聚焦线圈等。通过测量水冷靶电流和靶上的束斑尺寸，实验研究了微波ECR 等离子体阴极电子束的流强、聚束性能等随电子束系统工作条件的变化。结果表明：微波输入功率越高、引出电压越高，引出电子束流强越大；工作气压对电子束流强的影响较复杂，随气压增加呈现出先降低后升高的特点；在7×10⁻⁴Pa 的极低气压下电子束流强可达75mA，引出电压9kV；能量利用率可达0.6；调整聚焦线圈的驱动电流，电子束的束斑直径从20mm 减小到13mm，电子束流强未有明显变化。     

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The generation and control of microwave electron cyclotron resonance (ECR) plasma cathode electron beam is studied experimentally. A complete set of discharge, electron beam extraction, focusing and measuring system was set up. The characteristics and performance of microwave ECR plasmas as electron beam extraction source were studied by measuring the current of water cooling target and the beam spot size on the target. Experimental results indicated that both microwave input power and accelerating voltage are conducive to improving electron beam current. The influence of gas pressure on the electron beam current was complex. With the increase of gas pressure, the electron beam current is characterized by decreasing first and then increasing. The extracted electron current of microwave ECR plasma cathode can reach 75mA at gas pressure of 7×10⁻⁴Pa, and the energy of the electron beam can reach 9keV. The energy utilization can reach 0.6. By adjusting the current of the focusing coil, the diameter of electron beam spot is reduced from 20mm to 13mm and the electron beam current keeps the value unchanged.