A comparison of modifications induced by Li<Superscript>3+</Superscript> and Ag<Superscript>8+</Superscript> ion beams irradiation in poly(lactide-<Emphasis Type="Italic">co</Emphasis>-glycolide) films

Poly(lactide-co-glycolide) (PLGA) films were irradiated by 180 MeV/amu Ag⁸⁺ ions and 50 MeV/amu Li³⁺ ions at different fluences of 5 × 10¹⁰, 5 × 10¹¹ and 1 × 10¹² ions/cm². Modifications of polymer films induced by the swift heavy ions (SHI) irradiation were studied by X-ray diffraction (XRD), Field emission scanning electron microscopy (FESEM), Fourier transform infrared spectroscopy (FTIR) and UV–Vis spectroscopy. The dominant effect of the SHI beam irradiation is proposed to be chain scission which leads to breakage of polymer chains, followed by hydrogen abstraction. The results from FTIR spectroscopy showed that the intensity of all peaks of the irradiated samples decreased at high fluence of SHI, suggesting PLGA samples significantly degraded at high SHI fluence. The variation in optical band gap energy and Urbach energy with increasing fluence was calculated from UV–Vis spectroscopy and explained in terms of changes occurring in the polymer matrix. X-ray diffraction patterns also show appreciable changes in PLGA at high fluence. FESEM results revealed that the hydrophilicity of the PLGA surface increased with an increase in ion fluence. In this paper the optical, chemical and structural changes with different fluence rates are discussed.     

Optical Properties of Swift Heavy Ion Beam Irradiated Polycarbonate/Polystyrene Composites Films

Polycarbonate/polystyrene composites films were irradiated by 55 MeV Carbon ion beam with fluence ranging from 1 × 10¹¹ to 1 × 10¹³ ions/cm². The polymer composites films were prepared by solution mixing method. The effects of ion beam on structural, optical and surface morphology of PC/PS composites films were investigated by X-ray diffraction (XRD), UV-visible spectroscopy (UV-vis), Fourier Transform Infrared Spectroscopy (FT-IR) and Optical Microscope. The XRD pattern shows the average crystallite size, percentage of crystallinity and inter-chain separation, which decreases with increase in ion fluences. UV-vis spectra show that the energy band gap and transmittance decreases while number of carbon atoms increases with fluences. The FT-IR spectra evidenced very small change in cross linking and chain scissoring at high ion fluences, while the optical microscopy shows a color change with ion fluence.     

Carbon ion beam induced modifications of optical,structural and chemical properties in PADC and PET polymers

We report a study on the carbon ion beam induced modifications on optical, structural and chemical properties of polyallyl diglycol carbonate (PADC) commercially named as CR-39 and Polyethyleneterepthalate (PET) polymer films. These films were then irradiated by 55 MeV C⁵⁺ ion beam at various fluences ranging from 1×10¹¹ to 1×10¹³ ions/cm². The pristine as well as irradiated samples were subjected to UV–Visible spectral study (UV–Vis), Photoluminescence (PL), X-ray diffraction (XRD) and Fourier transform infrared (FTIR) spectroscopy. It has been found that ion irradiation may induce a sort of defects in the polymers due to chain scission and cross linking as observed from PL spectral study. It is revealed from UV–Vis spectra absorption edge shifted towards longer wavelength region after irradiation with increasing ion fluence. This shift clearly reflects decrease in optical band gap. The XRD study indicates the gradual decrease in intensity in case of PADC with increasing ion fluence. However, the intensity pattern increased in case of PET at fluence of 10¹¹ ion/cm² then decreased with further increase in fluence. Crystalline size of PADC was found to be decreasing gradually with increase of ion fluence. Whereas, the crystalline size of PET films found to increase with lower fluence and decreases with higher ion fluence. FTIR spectrum also shows the change in intensity of the typical bands after irradiation in the both the polymers. The results so obtained can be used successfully in heavy ions dosimetry using well reported techniques.     

Ion‐beam‐induced morphology on the surface of thin polymer films at low current density and high ion fluence

The effect of Xe⁺ bombardment on the surface morphology of four different polymers, polystyrene (PS), poly(phenylene oxide), polyisobutylene, and polydimethylsiloxane, was investigated in ion energy and fluence ranges of interest for secondary ion mass spectrometry depth‐profiling analysis. Atomic force microscopy (AFM) was applied to analyze the surface topography of pristine and irradiated polymers. AFM analyses of nonirradiated polymer films showed a feature‐free surface with different smoothness. We studied the influence of different Xe⁺ beam parameters, including the incidence angle, ion energy (660–4000 eV), current density (0.5 × 10² to 8.7 × 10² nA/cm²), and ion fluence (4 × 10¹⁴ to 2 × 10¹⁷ ion/cm²). Xe⁺ bombardment of PS with 3–4 keV at a high current density did not induce any change in the surface morphology. Similarly, for ion irradiation with lower energy, no surface morphology change was found with a current density higher than 2.6 × 10² nA/cm² and an ion fluence up to 4 × 10¹⁶ ion/cm². However, Xe⁺ irradiation with a lower current density and a higher ion fluence led to topography development for all of the polymers. The roughness of the polymer surface increased, and well‐defined patterns appeared. The surface roughness increased with ion irradiation fluence and with the decrease of the current density. A pattern orientation along the beam direction was visible for inclined incidence between 15° and 45° with respect to the surface normal. Orientation was not seen at normal incidence. The surface topography development could be explained on the basis of the balance between surface damage and sputtering induced by the primary ion beam and redeposition–adsorption from the gas phase. Time‐of‐flight secondary ion mass spectrometry analyses of irradiated PS showed strong surface modifications of the molecular structure and the presence of new material. © 2000 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 39: 314–325, 2001     

Microstructural modifications in swift ion irradiated PET

Polyethylene terephthalte (PET) was irradiated with carbon (70 MeV) and copper (120 MeV) ions to analyze the induced modifications with respect to optical, structural and thermal properties. In the present investigation, the fluence for carbon irradiation was varied from 1×10¹¹ to 1×10¹⁴ ions cm⁻², while that for copper beam was kept in the range of 1×10¹¹ to 1×10¹³ ions cm⁻². UV–vis, FTIR, XRD and DSC techniques were utilized to study the induced changes. The analysis of UV–vis absorption studies reveals that there is decrease of optical energy gap up to 10% on carbon ion irradiation (at 1×10¹⁴ ions cm⁻²), whereas the copper beam (at 1×10¹³ ions cm⁻²) leads to a decrease of 49%. FTIR analysis indicated the formation of alkyne end groups along with the overall degradation of polymer with copper ion irradiation. X-ray diffraction analysis revealed that the semi-crystalline PET losses its crystallinity on swift ion irradiation. It was found that the carbon beam (1×10¹⁴ ions cm⁻²) decreased the crystallite size by 16% whereas this decrease is of 12% in case of the copper ion irradiated PET at 1×10¹³ ions cm⁻². The loss in crystallinity on irradiation has been supported by DSC thermograms.     

Dielectric properties and surface morphology of swift heavy ion beam irradiated polycarbonate films

Swift heavy ion beam irradiation induces modification in the dielectric properties and surface morphologies of polycarbonate (PC) films. The PC films were irradiated by 55 MeV energy of C⁵⁺ beam at various ions fluences ranging from 1 × 10¹¹ to 1 × 10¹³ ions cm^?2. The dielectric properties (i.e., dielectric constant, dielectric loss, and AC conductivity) and surface morphologies of pristine and SHI beam irradiated PC films were investigated by dielectric measurements, atomic force microscopy (AFM), and optical microscopy. The dielectric measurements show that the dielectric constant, dielectric loss, and AC conductivity increase with ion fluences and temperature, however, the dielectric constant and AC conductivity decrease while dielectric loss increases with frequency. AFM shows the increase in average roughness values with ion fluences. The change of color in PC films has been observed from colorless to yellowish and then dark brown with increases of ion fluence by using optical microscopy.     

Medium energy ion irradiation of Ge surface – search for a better understanding of the surface nano‐patterning

We report the morphological changes on Ge surfaces upon 50 keV Ar⁺ and 100 keV Kr⁺ beam irradiation at 60° angle of incidence. The Ge surfaces having three different amorphous–crystalline (a/c) interfaces achieved by the pre‐irradiation of 50 keV Ar⁺ beam at 0°, 30° and 60° with a constant fluence of 5 × 10¹⁶ ions/cm² were further processed by the same beam at higher fluences viz. 3 × 10¹⁷, 5 × 10¹⁷, 7 × 10¹⁷ and 9 × 10¹⁷ ions/cm² to understand the mechanism of nano‐scale surface patterning. The Kr⁺ beam irradiation was carried out only on three fresh Ge surfaces with ion fluences of 3 × 10¹⁷, 5 × 10¹⁷ and 9 × 10¹⁷ ions/cm² to compare the influence of projectile mass on surface patterning. Irrespective of the depth of a/c interface, the nanoscale surface patterning was completely missing on Ge surface with Ar⁺ beam irradiation. However, the surface patterning was evidenced upon Kr⁺ beam irradiation with similar ion fluences. The wavelength and the amplitude of the ripples were found to increase with increasing ion fluence. In the paper, the mass redistribution at a/c interface, the incompressible solid flow through amorphous layer, the angular distribution of sputtering/backscattering yields and the generation of non‐uniform stress across the amorphous layer are discussed, particularly in analogy with low energy experiments, to get better understanding of the mechanism of nanoscale surface patterning by the ion beams. Copyright © 2016 John Wiley & Sons, Ltd.     

The effects of energetic ion irradiation on metal-to-polymer adhesion

In this study, the simple and effective surface modification of polymers through ion irradiation is described to improve metal-to-polymer adhesion. The surface of polymer films was irradiated with 150 keV Xe⁺ ions at various fluences, and copper (Cu) was then deposited onto the surface-modified polymer films. The surface properties of the modified films were investigated in terms of their wettability, chemical composition, and surface morphology. The metal-to-polymer adhesion strength was estimated using a nano-indenter. As a result, the surface environment of the polymer films was physiochemically changed by ion irradiation, which could have a significant effect on the metal-to-polymer adhesion. The irradiated polymer films exhibited a higher adhesion strength than the control film, and the strength depended on the fluence. The maximum adhesion strength (8.45 mN) of the Cu deposited on the irradiated PEN films was obtained at a fluence of 5×10¹⁴ ions/cm².     

50 keV H+ ion beam irradiation of Al doped ZnO thin films: Studies of radiation stability for device applications

Thin films of Al doped ZnO (Al:ZnO) were deposited on two substrates (Si and glass) at room temperature and 300°C using DC magnetron sputtering. These films were bombarded with 50 keV H⁺ beam at several fluences. The pristine and ion beam irradiated films were analysed by X‐ray diffraction, Raman spectroscopy, scanning electron microscopy, and UV‐Vis spectroscopy. The X‐ray diffraction analysis, Hall measurements, Raman and UV‐Vis spectroscopy confirm that the structural and transport properties of Al:ZnO films do not change substantially with beam irradiation at chosen fluences. However, in comparison to film deposited at room temperature, the Al:ZnO thin film deposited at 300°C shows increased transmittance (from 70% to approximately 90%) with ion beam irradiation at highest fluence. The studies of surface morphology by scanning electron microscopy reveal that the ion irradiation yields smoothening of the films, which also increases with ion fluences. The films deposited at elevated temperature are smoother than those deposited at room temperature. In the paper, we discuss the interaction of 50 keV H⁺ ions with Al:ZnO films in terms of radiation stability in devices.     

100 keV H+ ion irradiation of as‐deposited Al‐doped ZnO thin films: An interest in tailoring surface morphology for sensor applications

We report the influence of 100 keV H⁺ ion beam irradiation on the surface morphology, crystalline structure, and transport properties of as‐deposited Al‐doped ZnO (Al:ZnO) thin films. The films were deposited on silicon (Si) substrate by using DC sputtering technique. The ion irradiation was carried out at various fluences ranging from 1.0 × 10¹² to 3.0 × 10¹⁴ ions/cm². The virgin and ion‐irradiated films were characterized by X‐ray diffraction, Raman spectroscopy, atomic force microscopy, and Hall probe measurements. Using X‐ray diffraction spectra, 5 points Williamson‐Hall plots were drawn to deduce the crystallite site and strain in Al:ZnO films. The analysis of the measurements shows that the films are almost radiation resistant in the structural deformation under chosen irradiation conditions. With beam irradiation, the transport properties of the films are also preserved (do not vary orders of magnitude). However, the surface roughness and the crystallite size, which are crucial parameters of the ZnO film as a gas sensor, are at variation with the ion fluence. As ion fluence increases, the root‐mean‐square surface roughness oscillates and the surface undergoes for smoothening with irradiation at chosen highest fluence. The crystallite size decreases initially, increases for intermediate fluences, and drops almost to the value of the pristine film at highest fluence. In the paper, these interesting experimental results are discussed in correlations with ion‐matter interactions especially energy losses by the ion beam in the material.     

On the effects of He+ ions bombardment of polyphenylacetylene

Polyphenylacetylene (PPA) thin films deposited on silicon substrates have been bombarded with a beam of 30 keV of He⁺ ions. The radiation damage of the film has been monitored by FT-IR spectroscopy at fluences between 0.8×10¹⁹ and 1.1×10²⁰ ions/m². The spectral changes undergone by the PPA film have been interpreted in terms of chain scission with formation of acetylenic and saturated end groups, and in terms of crosslinking reaction and extensive radiolytic degradation. The expected PPA cyclization reaction, a reaction which transforms a linear polymer into a ladder polymer has not been observed, although polystyrene (PS) is able to give this kind of reaction under somewhat similar conditions to those adopted in the present work. The results have been discussed in an astrochemical context in relation to the infrared emission spectra of certain astrophysical object and molecules present in the interstellar medium.     

Proton (3 MeV) and copper (120 MeV) ion irradiation effects in low-density polyethylene (LDPE)

Low-density polyethylene (LDPE) was irradiated with proton (3 MeV) and copper (120 MeV) ions to analyze the induced modifications with respect to optical and structural properties. In the present investigation, the fluence for proton irradiation was varied up to 2×10¹⁵ protons cm⁻², while that for copper beam was kept in the range of 1×10¹ to 1×10¹³ ions cm⁻² to study the swift heavy ion-induced modifications in LDPE. Ultraviolet–visible (UV–vis), FTIR and X-ray diffraction (XRD) techniques were utilized to study the induced changes. The analysis of UV–vis absorption studies reveals that there is decrease of optical energy gap up to 43% on proton irradiation (at 2×10¹⁵ ions cm⁻²), whereas the copper beam (at 1×10¹³ ions cm⁻²) leads to a decrease of 51%. FTIR analysis indicated the presence of unsaturations due to vinyl end groups in the irradiated sample. The formation of OH and CO groups has also been observed. XRD analysis revealed that the semi-crystalline LDPE losses its crystallinity on swift ion irradiation. It was found that the proton beam (2×10¹⁵ ions cm⁻²) decreased the crystallite size by 23% whereas this decrease is of 31% in case of the copper ion-irradiated LDPE at 1×10¹³ ions cm⁻².     

Positron annihilation and ion beam analysis of ion-bombardment-induced hydrogen release and oxidation of ultra high molecular weight polyethylene

Ultra high molecular weight polyethylene was bombarded with He⁺ and Ar⁺ ions to fluences ranging from 10¹³ to 2×10¹⁶ ions/cm². Rutherford backscattering and nuclear reaction analysis were applied to study mechanism of oxygen uptake and hydrogen release induced by ion beam bombardment. The influence of ion bombardment on positron annihilation lifetime parameters is also discussed. Hydrogen release was observed with increasing ion dose and was correlated to the ion stopping power. An important effect observed, was the rapid oxidation of samples after exposure to air.     

Modification of microstructure of the surface and the bulk in ion-irradiated membrane studied using positron annihilation spectroscopy

The effect of ion irradiation and etching on the microstructure of polyethyleneterephthalate (PET) membrane has been studied using positron annihilation spectroscopy. PET membrane of 25 μm thickness was irradiated by 100 MeV ³⁵Cl beam (7×10⁷ ions/cm²) and then etched with NaOH for 45 min. The modification in the microstructure at the surface of the membrane was probed by depth-dependent Doppler-broadened S-parameter and positronium 3γ–2γ annihilation ratio using a slow positron beam, while the free volume properties in the bulk of the membrane were studied using the conventional positron lifetime technique. Positron annihilation parameters were found to be very sensitive to the microstructural changes occurring in the polymer at such a low fluence. It was observed that on ion-irradiation, the surface of the membrane is modified in a different way than the bulk. While the ion-irradiation produces large fraction of excess free volumes at the surface of the membrane due to chain scission, the free volumes are reduced in the bulk of the membrane due to cross-linking. FTIR and XRD measurements were also carried out to investigate the changes occurring in the chemical structure and crystallinity of the polymer samples on ion-irradiation and etching.     

Effects of Ar/H/N‐ion bombardment on the surface free energy and friction behavior of the fullerene‐like hydrogenated carbon (FL‐C:H) film

The surface modification of the fullerene‐like hydrogenated carbon (FL‐C:H) film was achieved by bombardment using Ar, H, and N ions, respectively. A systematic comparison of X‐ray photoelectron spectroscopy (XPS) and Fourier transformation infrared(FTIR) spectra was made between the FL‐C:H film and ion‐bombarded films. The results show that ion bombardment resulted in the increase of sp³ C content, specially, new C? N bonds were formed for N‐ion‐bombarded film. The contact angle (CA) and friction coefficient of those films were measured. The surface free energy evaluated from the contact angle increased for ion‐bombarded films, and the most obvious increase was obtained for N‐ion‐bombarded film. The friction coefficient decreased for H‐ion‐bombarded film whereas it increased for N‐ion‐bombarded film, and the friction coefficient of Ar‐ion‐bombarded film was close to that of the FL‐C:H film. Copyright © 2008 John Wiley & Sons, Ltd.     

Effect of MeV protons on the phase behaviour and thermal stability of polytetrafluoroethylene

Thermomechanical spectroscopy analysis was used to study the influence of accelerated protons on the molecular-topological properties of polytetrafluoroethylene (PTFE). The study showed changes in a wide number of polymer parameters as a result of bombardment with 1, 2 and 4 MeV protons at fluences up to 2 × 10¹⁵ protons/cm². The basic topological process occurring under proton bombardment is amorphicity, as found for γ-irradiation of PTFE. The flow temperature of bombarded PTFE significantly decreases with increasing the fluxes and energy of the accelerated protons. The general process resulting from proton bombardment is cleavage of C-F bonds, leading to formation of “centered” radicals ～CF₂CF · CF₂～ and HF. The thermal stability of bombarded PTFE is below than that of virgin polymer. The rate of thermal destruction noticeably increases and the temperature of the initiation of effective thermal decomposition decreases after bombardment. The gaseous products generated during thermal destruction of the bombarded and virgin PTFE are similar.     

Opto-structural characterization of proton (3 MeV) irradiated polycarbonate and polystyrene

Polycarbonate (Makrofol-N) and polystyrene thin films were irradiated with protons (3 MeV) under vacuum at room temperature with the fluence ranging from 1×10¹⁴ to 1×10¹⁵ protons cm⁻². The change in optical properties, degradation of the functional groups and crystallinity of the proton-irradiated polymers were investigated with UV–vis, Fourier-transform infrared (FTIR) and X-ray diffraction (XRD) techniques, respectively. The UV–vis analysis revealed that the optical band gap of irradiated Makrofol-N is reduced by 30% as compared to 27.5% in polystyrene at highest fluence of 1×10¹⁵ protons cm⁻², owing to higher electronic energy loss of protons in Makrofol-N. The calculations of the number of carbon atoms per conjugation length, N and number of carbon atoms per clusters, M embedded in the network of polymers further revealed that Makrofol-N is more modified as compared to polystyrene on proton irradiation. FTIR results reveal the reduction in absorption intensity of the main characteristic bands of both the polymers after irradiation. The proton-irradiated Makrofol-N shows a strong decrease of almost all of its characteristic absorption bands at about 1×10¹⁴ protons cm⁻². Beyond a critical dose an increase of almost all its characteristic bands are noticed, however, no such effect had been observed in polystyrene at this particular fluence. Appearance of new –OH groups was observed at the higher fluences in the FTIR spectra of both proton-irradiated polymers. XRD measurements show the decrease of the main peak intensity and the crystallite size, confirming the increase of amorphization in polymers under irradiation.     

Multifractal analysis of sputtered CaF2 thin films

The surface morphologies of CaF₂ thin films prepared by electron beam evaporation technique were measured by atomic force microscopy. The films were bombarded by energetic ion beams of different fluences, which modified the surface morphology predominantly via the process of erosion. The dependence of the surface morphology on ion fluence was explored using multifractal analysis. It was found that the roughness of the film first decreased with ion fluence but increased at higher fluences. Copyright © 2013 John Wiley & Sons, Ltd.     

ESR study for ion beam induced phenomena in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP)

Trapped radicals induced in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP) were observed by X-band electron spin resonance (ESR) spectroscopy at room temperature (RT) under atmospheric field after an irradiation with various kinds of high energy ion beams (6 MeV/u). The irradiation was carried out to a stacked FEP films under vacuum (<4E?4 Pa) at RT with various fluences from 1.0×10⁹ to 1.0×10¹¹ ions/cm². All ESR spectra indicated an existence of peroxy radicals in each of the FEP films without any relation to a kind of ion and a penetration depth. Obtained depth profiles of radical concentrations induced with each ion beam almost correspond to those of stopping power. The trapped radical concentrations were strongly dependent on stopping power. It was found that G-value of trapped radicals by ion beam irradiation was decreased with increasing a stopping power, and was less than the case of gamma-rays irradiation.     

Effect of bombardment with helium ions on the molecular-topological structure and elemental composition of the surface of Kynar polyvinylidene fluoride resin

A polyvinylidene fluoride film has been bombarded with accelerated (1–5 MeV) helium ions at a fluence of 10¹⁵ ion/cm². Unlike the completely amorphous structure of the unirradiated polymer, the weight fraction of the crystalline modification in the irradiated polymer is 0.86–0.90, which is indicative of the efficient conversion of the amorphous structures of the polymer pseudo-network into the crystalline ones. Irradiation with 1-MeV ions leads to the greatest changes in the fraction of the crystalline modification and the glass-transition and flow temperatures of the polymer. The detachment of fluorine and the surface carbonization of the irradiated polymer occur under the ion beam.