扫描近场光学显微镜的光耦合偶极子模型

为了研究扫描近场光学显微镜中探针和粗糙样品表面的耦合相互作用,提出了一种光耦合偶极子模型.在该模型中,探针和样品突起都由光极化偶极子表示,在准静态电磁场近似的情况下样品表面的诱导极化效应由影像偶极子表示,应用偶极子辐射理论可以得到系统的自洽场方程.此模型提供了一种直观分析扫描近场光学显微镜中探针和样品相互作用机理的方法.在此基础上,进一步讨论了金属样品的近场成像特点和其特有的局域光学共振现象.数值结果表明：不同于一般的介质样品,金属样品的近场图像与入射光频率直接相关,改变入射光的频率,获得的样品近场图像的形状和对比度都会发生变化.特别是当入射光频率处于样品极化共振范围内时,金属纳米粒子的极化率会出现光极化共振,这样就可以获得样品粒子的最大有效尺寸,为提高系统的分辨率提供了一条重要途径.     

High-sensitivity piezoelectric tube sensor for shear-force detection in scanning near-field optical microscopy

An easy-to-implement non-optical shear-force detection setup for tip–sample distance regulation in scanning near-field optical microscopy is demonstrated. The detection method is based on attaching the near-field probe to a piezoelectric tube resulting in excellent mechanical contact between tip and detector. The main advantages of the method are good signal-to-background contrast and thus potential for high sensitivity. The method is demonstrated by obtaining approach curves of silicon surfaces. The suitability for optical experiments is further shown by measuring the near-field intensity distribution of the emission of a semiconductor laser.     

Recent developments in nanofabrication using scanning near-field optical microscope lithography

In addition to its well-known capabilities in imaging and spectroscopy, scanning near-field optical microscopy (SNOM) has recently shown its great potentials for fabricating various structures at the nanoscale. A variety of SNOM-based fabrication techniques have been developed for different applications. In this paper, the SNOM-based techniques involving three major functions: material modification, addition, and removal, are examined with emphasis on their abilities and reliability to make structures with resolutions at the nanometer level. The principles and procedures underlying each technique are presented, and the differences and uniqueness among them are subsequently discussed. Finally, concluding remarks are provided to summarize the major techniques studied and to recommend the scopes for technology improvement and future research.     

Dual mode near-field scanning optical microscopy for near-field imaging of surface plasmon polariton

In this paper, we theoretically and experimentally demonstrate that metal coated apertured probes are efficient near-field probes on surfaces with high reflectivity for the scattering as well as for the collection mode near-field scanning optical microscopy (NSOM). We show that a blunt apertured metal coated tip is very effective in suppressing image dipoles which affect strongly the signals scattered from frequently used sharp metal tips or gold nanoparticle attached probes. By using a simultaneous collection and scattering mode (dual mode) NSOM we measure the near-field images of surface plasmon polariton (SPP) launched from a slit. The collection mode measures propagating SPP along lateral distance in a long scan range with high signal-to-noise ratio, and the scattering mode measures the polarization resolved near-field of SPP. Comparisons of the measured data obtained in the dual mode enable to easily characterize SPP and to separate the measured near-field into the propagating SPP and the directly transmitted light.     

Imaging of human meiotic chromosomes by scanning near-field optical microscopy (SNOM)

Centromeres and telomeres are key structures of mitotic and meiotic chromosomes. Especially telomeres develop particular structural properties at meiosis. Here, we investigated the feasibility of scanning near-field optical microscopy (SNOM) for light-microscopic imaging of meiotic telomeres in the sub-hundred nanometer resolution regime. SNOM was applied to visualise the synaptonemal complex (SC) and telomere proteins (TRF1, TRF2) after differential immuno-fluorescent labelling. We tested and compared two different preparation protocols for their applicability in a SNOM setting using micro-fabricated silicon nitride aperture tips. Protocol I consisted of differential labelling of meiotic chromosome cores (SC) by SCP3 immuno-fluorescence and telomeres by TRF1 or TRF2 immuno-fluorescence, while protocol II combined absorption labelling with alkaline phosphatase substrates of cores with fluorescent labelling of telomeres. The results obtained indicate that protocol I reveals a better visualisation of structural (topographic) details than protocol II. By means of SNOM, meiotic chromosome cores could be visualised at a resolution overtopping that of far-field light microscopy.     

Method of resonance near-field optical microscopy

We have solved the problem in which a thin metal wafer (probe) with a nanohole interacts with the flat surface of a metastructured film consisting of metal nanoparticles in an external optical radiation field. Nanoparticles are considered as two-level atomic systems. This interaction of the wafer-probe and the flat surface in the external optical radiation field gives rise to optical near-field resonance, the frequency of which differs significantly from the natural frequencies of two-level atoms in the medium and the probe. The fields inside and outside the probe and metastructured film are calculated in the near-field and far-field zones. The maximum resolution, which is achievable in the suggested scheme of near-field optical microscopy, can reach about 10 nm. __________ Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 74, No. 4, pp. 499–506, July–August, 2007.     

The coaxial tip as a nano-antenna for scanning near-field microwave transmission microscopy

A novel scanning-probe setup is reported that maps the complex transmission of microwaves. Response to topographic features as small as 15 nm was observed. The sharpened coaxial probe tip serves as a microwave antenna and, at the same time, as a tunnel tip to warrant precise distance control by STM (scanning tunneling microscope) feedback. The instrument can be applied to map the microwave conductivity of, e.g. thin films or low-dimensional semiconductors. Consequences for the development of an infrared microscope are outlined.     

Sensitivity analysis of scanning near-field optical microscope probe

In this paper, we study the dynamic modes of a scanning near-field optical microscope (SNOM) which uses an optical fiber probe; and the sensitivity of flexural and axial vibration modes for the probe were derived and the closed-form expressions were obtained. According to the analysis, as expected each mode has a different sensitivity and the first mode is the most sensitive mode of flexural and axial vibration for the SNOM probe. The sensitivities of both flexural and axial modes are greater for a material surface that is compliant with the cantilever probe. As the contact stiffness increases, the high-order vibration modes are more sensitive than the lower-order modes. Furthermore, the axial contact stiffness has a significant effect on the sensitivity of the SNOM probe, and this should be noted when designing new cantilever probes.     

Collection mode near-field scanning microwave microscopy

Collection mode near-field microscopy is demonstrated using a 10.56 GHz (X-band) frequency illumination. Imaging of a standing evanescent microwave was experimentally used to evaluate the capabilities of the microscope. The microscope functionality was validated by imaging near field interactions of different systems of dipole-like resonances. We prove that those microscope images contain near-field information by presenting numerical modeling of dipole-like resonant interactions. The model makes use of an analytic Dyadic Green's which is based in the near-field electrostatic approximation. We propose that this microscopy technique can be used, with certain limitations, as a check for 2D mapping of designed (spoof) surface plasmon at microwave frequencies.     

Influence of the probe--sample interaction on scanning near-field optical microscopic images in the far field

We have studied the influence of probe--sample interaction in a scanning near-field optical microscopy (SNOM) in the far field by using samples with a step structure. For a sample with a step height of $\sim \lambda $/4, the SNOM image contrast between the two sides of the step changes periodically at different scan heights. For a step height of $\sim \lambda $/2, the image contrast remains approximately the same. The probe--sample interaction determines the SNOM image contrast here. The influence of different refractive indices of the sample has been also analysed by using a simple theoretical model.     

Optical waveguide behavior of Se-doped and undoped CdS one-dimensional nanostructures using near-field optical microscopy

The optical waveguide behaviors of CdS and CdS _x Se_1−x nanostructures are studied using near-field optical microscopy. Optical measurements demonstrate that light may be guided on sub-wavelength scales along CdS nanoribbons in straight or bent structures. The photoluminescence (PL) spectra from nanoribbon emission using scanning near-field optical microscopy are analyzed under different incident laser intensities. The PL spectra along Se-doped and undoped CdS nanoribbons at different propagation distances are investigated. Both the guided PL spectra of Se-doped and undoped CdS nanoribbons show red-shifts because of the band-edge absorption. Our results are useful for the development of new kinds of functional nano devices. Supported by the National Natural Science Foundation of China (Grant Nos. 10574002, 90406007, and 50602015) and the National Basic Research Program of China (Grant No. 2007CB936800)     

基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像

本文结合近场扫描结构和纳米线-微光纤耦合技术,提出了一种基于硫化镉纳米线/锥形微光纤探针结构的被动近场光学扫描成像系统.该系统采用被动式纳米探针,保留了纳米探针对样品表面反射光的强约束优势.其理论收集效率为4.65‰,相比于传统的金属镀膜近场探针收集效率提高了一个数量级,可有效地提高扫描探针对样品形貌信息的检测能力;而后通过硫化镉纳米线与微光纤之间高效的倏逝场耦合,将检测的光强信号传输到远场进行光电探测,最终实现对目标样品形貌的分析成像,其样品宽度测量误差在7.28%以内.该系统不需要外部激发光路,利用显微镜自身光源进行远场照明,被动扫描探针仅作为样品表面反射光的被动收集系统.本文基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像方案,可有效地降低探针的制备难度和目标光场的检测难度,简化扫描成像的结构,为近场光学扫描显微系统之后的发展提供新的思路.     

基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像

本文结合近场扫描结构和纳米线-微光纤耦合技术,提出了一种基于硫化镉纳米线/锥形微光纤探针结构的被动近场光学扫描成像系统.该系统采用被动式纳米探针,保留了纳米探针对样品表面反射光的强约束优势.其理论收集效率为4.65‰,相比于传统的金属镀膜近场探针收集效率提高了一个数量级,可有效地提高扫描探针对样品形貌信息的检测能力;而后通过硫化镉纳米线与微光纤之间高效的倏逝场耦合,将检测的光强信号传输到远场进行光电探测,最终实现对目标样品形貌的分析成像,其样品宽度测量误差在7.28%以内.该系统不需要外部激发光路,利用显微镜自身光源进行远场照明,被动扫描探针仅作为样品表面反射光的被动收集系统.本文基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像方案,可有效地降低探针的制备难度和目标光场的检测难度,简化扫描成像的结构,为近场光学扫描显微系统之后的发展提供新的思路.     

A correlative optical microscopy and scanning electron microscopy approach to locating nanoparticles in brain tumors

The growing use of nanoparticles in biomedical applications, including cancer diagnosis and treatment, demands the capability to exactly locate them within complex biological systems. In this work a correlative optical and scanning electron microscopy technique was developed to locate and observe multi-modal gold core nanoparticle accumulation in brain tumor models. Entire brain sections from mice containing orthotopic brain tumors injected intravenously with nanoparticles were imaged using both optical microscopy to identify the brain tumor, and scanning electron microscopy to identify the individual nanoparticles. Gold-based nanoparticles were readily identified in the scanning electron microscope using backscattered electron imaging as bright spots against a darker background. This information was then correlated to determine the exact location of the nanoparticles within the brain tissue. The nanoparticles were located only in areas that contained tumor cells, and not in the surrounding healthy brain tissue. This correlative technique provides a powerful method to relate the macro- and micro-scale features visible in light microscopy with the nanoscale features resolvable in scanning electron microscopy.     

扫描近场红外显微镜近场距离控制系统的改进

针尖 样品的距离控制系统是扫描近场红外显微镜的重要组成部分。切变力探测作为一种重要的近场距离控制手段而得到了广泛的应用。介绍了一种对切变力探测系统的改进方法 ,它可以有效地提高石英晶振音叉的品质因数 ,进而提高探测系统对切变力感应的灵敏度。给出了理论分析和实验验证结果     

Versatile UHV system for combined far- and near-field magneto-optical microscopy of thin films

We have developed a UHV system for in situ studies of magnetic domains and magnetization reversal of thin films in the presence of external magnetic fields and at variable temperature. The system comprises a setup for magneto-optical Kerr effect measurements of magnetization curves, a Kerr-microscope for far-field magnetic-domain imaging, and a magneto-optical scanning near-field microscope in combination with a Sagnac interferometer (Sagnac-SNOM) for high-resolution imaging on a sub-μm scale. All components have successfully been tested, and the feasibility of studying ultrathin films has been demonstrated.     

Optical near-field mapping of bright and dark quantum dot states

We theoretically investigate scanning near-field optical microscopy (SNOM) of semiconductor quantum dots. A general theoretical framework is developed that accounts for photo excitation and relaxation in complex dielectric environments. We find that in the near-field regime bright and dark excitonic states become mixed, opening new channels for the coupling to the electromagnetic field.     

远场光钳与近场光钳的发展

以经典光学为基础的光钳技术(又称"光镊")在生物、物理和化学等领域得到了广泛的发展和应用,但是该技术受到高倍显微物镜的尺寸和光学衍射极限等多种因素的制约,从而限制了其进一步发展。而远场光纤光钳和近场光钳技术,从不同方面克服了传统光钳的局限。回顾了传统光钳、远场光纤光钳和近场光钳的发展,着重讨论了各种方法的工作原理、实验方法和技术性能,对这几种光钳技术进行了深入地总结和细致地比较。