Quantitative atomic force microscopy with carbon monoxide terminated tips

Noncontact atomic force microscopy (AFM) has recently progressed tremendously in achieving atomic resolution imaging through the use of small oscillation amplitudes and well-defined modification of the tip apex. In particular, it has been shown that picking up simple inorganic molecules (such as CO) by the AFM tip leads to a well-defined tip apex and to enhanced image resolution. Here, we use the same approach to study the three-dimensional intermolecular interaction potential between two molecules and focus on the implications of using molecule-modified AFM tips for microscopy and force spectroscopy experiments. The flexibility of the CO at the tip apex complicates the measurement of the intermolecular interaction energy between two CO molecules. Our work establishes the physical limits of measuring intermolecular interactions with scanning probes.     

Polymer tips for application of atomic force microscopy

A hydrophobic polymer tip for atomic force microscopy has been fabricated by two-photon adsorbed photopolymerization techniques and has been applied for the high resolution imaging of a hydrophilic metal surface. Using optimized photopolymerization conditions, we have succeeded in fabricating sub-100-nm sized polymer tips. This fabricating resolution of two-photon adsorbed photopolymerization is also confirmed by other supporting experiments. The imaging results show that the capillary-force-induced image distortion can be successfully removed by applying a pure hydrophobic polymer tip with a lateral resolution better than 5 nm, which is difficult to achieve with a commercial tip without any environmental control.     

Characterization of electrodeposited nickel film surfaces using atomic force microscopy

Microstructures of nickel surfaces electrodeposited on indium tin oxides coated glasses are investigated using atomic force microscopy. The fractal dimension D and Hurst exponent H of the nickel surface images are determined from a frequency analysis method proposed by Aguilar et al. [J. Microsc. 172 (1993) 233] and from Hurst rescaled range analysis. The two methods are found to give the same value of the fractal dimension D∼2.0. The roughness exponent α and growth exponent β that characterize scaling behaviors of the surface growth in electrodeposition are calculated using the height-difference correlation function and interface width in Fourier space. The exponents of α∼1.0 and β∼0.8 show that the surface growth does not belong to the universality classes theoretically predicted by statistical growth models.     

Strain relaxation at cleaved surfaces studied by atomic force microscopy

Atomic force microscopy (AFM) in air is used to study the (110) cleaved surface of strained (100) In_xGa_1-xAs/ InP heterostructures for different compositions and thicknesses of the ternary compound layers. We find that the elastic strain relaxation induces a surface undulation of a few ? amplitude, even for very small misfits, provided the layers are thick enough. Using finite-element calculations of the strain relaxation near the cleaved edge, we reproduce quantitatively the AFM observations for compressive- as well as for tensile-strained layers with an accuracy better than 0.1 nm. This demonstrates the ability of AFM to quantify strain distributions by making use of surface profile measurements. Received: 9 November 1998 / Accepted: 11 March 1999 / Published online: 7 July 1999     

A novel excitation scheme to enhance image resolution in dynamic atomic force microscopy

We propose a novel multifrequency excitation technique for the non-contact atomic force microscopy (AFM). The probe is excited at two frequencies that are far from resonances while their subtraction is close to the fundamental frequency. Due to combination resonance occurring in nonlinear systems, the response includes a term with frequency equal to subtraction of excitation frequencies. We suggest to employ this term as the main signal for imaging. It is found that the present excitation improves signal sensitivity to sample topography and increases resolution. This technique is especially convenient for highly-damped environments where non-contact AFMs are very difficult to use.     

Adhesion hysteresis in dynamic atomic force microscopy

The effects of adhesion hysteresis in the dynamic‐dissipation curves measured in amplitude‐modulation atomic force microscopy are discussed. Hysteresis in the interaction forces is shown to modify the dynamics of the cantilever leading to different power dissipation curves in the repulsive and attractive regimes. Experimental results together with numerical simulations show that power dissipation, as measured in force microscopy, is not always proportional to the energy dissipated in the tip–sample interaction process. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Atomic-scale sharpening of silicon tips in noncontact atomic force microscopy

The atomic-scale stability of clean silicon tips used in noncontact atomic force microscopy (NC-AFM) is simulated by ab initio calculations based on density functional theory. The tip structures are modeled by silicon clusters with and termination. For the often assumed Si(111)-type tip we observe the sharpening of the initially blunt tip via short-range chemical forces during the first approach and retraction cycle. The structural changes corresponding to this intrinsic process are irreversible and lead to stable NC-AFM imaging conditions. In opposition to the picture used in literature, the Si(001)-type tip does not exhibit the so-called "two-dangling bond" feature as a bulklike termination suggests.     

Direct imaging of polyethylene films at single-chain resolution with torsional tapping atomic force microscopy

The physical properties of semicrystalline polymers depend on the organisation of chains within the crystal and amorphous regions, on the interface between the two, and on the location and nature of defects. Here, torsional tapping atomic force microscopy has been used to image crystalline lamellae and the crystal-amorphous-region interface at the single-chain level with resolution down to 3.7 ?. Defects within the crystalline phase, such as buried folds and chain ends, are revealed. Imaging at the chain level also allows direct measurement of crystalline stem lengths, providing a potential route to test theories of crystal thickness selection.     

Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy

We investigated the conditions to achieve true atomic resolution with an atomic force microscope under noncontact mode (NC-AFM). At first, we derived the equation of vertical resolution as a function of the signal-to-noise ratio and the decay length of frequency shift by assuming an exponential tip-to-sample distance dependence of frequency shift. Next, by assuming a single atom probe, we derived the equation of lateral resolution as a function of the vertical resolution and the tip-to-sample distance, from which we clarified the guidelines to achieve true atomic resolution with NC-AFM. At last, we made clear the attainable decay length of frequency shift both for the van der Waals potential and the electrostatic (Coulomb) potential.     

Features in atomic force microscopy studies of dielectric surfaces

To improve the accuracy of AFM measurements in air and the reproducibility of results, a clean room-based metrological facility has been designed and built. The main function of the facility is to control temperature and humidity in an operation zone in various combinations and to maintain them with high accuracy. Measurements under controlled conditions are particularly important for dielectric materials. It has been shown that special procedures allow one to avoid disturbances caused by static charges on the surface under study, i.e., to remove the already accumulated charge and prevent its appearance during experiments. The use of the proposed procedures makes it possible to adequately study the features of the dielectric surface relief at micro-and nanoscale levels.     

Imaging elastic property of surfaces at nanoscale using atomic force microscope

We present a simple technique to characterize and image the distribution of local elastic property using ultrasonic atomic force microscope (UAFM). We interpret the UAFM images using simple arguments. We have demonstrated the capability of the UAFM technique to image the distribution of the local elastic property of the sample surface and semi-quantitatively map the local stiffness of the sample surface using a few selected samples. The local stiffness of the sample surface was obtained by measuring the changes in the frequency of contact resonance peak values and could verify the same using force-distance measurement at the same regions on the sample surface.     

Investigating biomolecular recognition at the cell surface using atomic force microscopy

Probing the interaction forces that drive biomolecular recognition on cell surfaces is essential for understanding diverse biological processes. Force spectroscopy has been a widely used dynamic analytical technique, allowing measurement of such interactions at the molecular and cellular level. The capabilities of working under near physiological environments, combined with excellent force and lateral resolution make atomic force microscopy (AFM)-based force spectroscopy a powerful approach to measure biomolecular interaction forces not only on non-biological substrates, but also on soft, dynamic cell surfaces. Over the last few years, AFM-based force spectroscopy has provided biophysical insight into how biomolecules on cell surfaces interact with each other and induce relevant biological processes. In this review, we focus on describing the technique of force spectroscopy using the AFM, specifically in the context of probing cell surfaces. We summarize recent progress in understanding the recognition and interactions between macromolecules that may be found at cell surfaces from a force spectroscopy perspective. We further discuss the challenges and future prospects of the application of this versatile technique.     

Using the dissipation mode in high resolution atomic force microscopy

The possibility of using the dissipation mode in high-resolution atomic force microscopy is demonstrated. By the dissipation mode we mean the dynamic mode in which the cantilever oscillates at a resonance frequency and the oscillation amplitude serves as a signal of the feedback tracing a distance to the surface. The possibility of obtaining molecular resolution when scanning in air is shown. The procedure of choosing the optimum scanning parameters is considered.     

Etched glass surfaces,atomic force microscopy and stochastic analysis

The effect of etching time scale of glass surface on its statistical properties has been studied using atomic force microscopy technique. We have characterized the complexity of the height fluctuation of an etched surface by the stochastic parameters such as intermittency exponents, roughness, roughness exponents, drift and diffusion coefficients and found their widths in terms of the etching time.     

Surface structure investigations using noncontact atomic force microscopy

Surfaces of several A_IIIB_V compound semiconductors (InSb, GaAs, InP, InAs) of the (0 0 1) orientation have been studied with noncontact atomic force microscopy (NC-AFM). Obtained atomically resolved patterns have been compared with structural models available in the literature. It is shown that NC-AFM is an efficient tool for imaging complex surface structures in real space. It is also demonstrated that the recent structural models of III-V compound surfaces provide a sound base for interpretation of majority of features present in recorded patterns. However, there are also many new findings revealed by the NC-AFM method that is still new experimental technique in the context of surface structure determination.     

High-speed atomic force microscopy with phase-detection

In order to improve the scanning speed of tapping mode AFM, we have studied the phase-detection mode AFM with a high frequency (1.5 MHz) cantilever. The phase shifts versus tip-sample distance with different types of samples including polymer, semiconductor, and graphite were measured and the interaction forces were analyzed. It was found that the phase shift in repulsive region is nearly linear as a function of distance, which can be used for feedback control in general, except that some blunt tips cause reversed polarity of phase shift due to excessive energy dissipation. High-speed image with scan rate of 100 Hz was obtained which were controlled with phase shift as a feedback signal.