Fast and accurate group delay ripple measurement technique for ultralong chirped fiber Bragg gratings

A simple and very precise group delay ripple (GDR) measurement technique for linearly chirped fiber Bragg gratings (CFBGs) is proposed. It is based on real-time optical Fourier transformation of an ultrashort pulse directly induced by the CFBG dispersion. We have experimentally demonstrated highly accurate characterization of the GDR profile of a commercial 10-m-long CFBG with a dispersion of +2000 ps/nm, having achieved a remarkably small standard deviation in our measurements of about 4 ps over a bandwidth of 28 nm. The proposed method has the unique potential to provide real-time GDR monitoring (in the MHz range) by use of commercially available high-speed sampling electronics.     

Encoding method of CGH for highly accurate optical measurement based on non-maxima suppression

The use of a computer-generated hologram(CGH) in interferometric testing provides new methods for highly accurate optical measurement.To fabricate a CGH,polygons are used to approximate the smooth CGH pattern.Because the data size supported by CGH writing machines is limited,the number of polygon vertices must be limited.Therefore,the CGH-encoding method determines the encoding accuracy.To realize a highly accurate optical measurement using CGHs,we propose a CGH-pattern-encoding method based on non-maxima suppression.A self-aligned CGH is designed to verify the accuracy.The experimental result shows that a highly accurate CGH can be fabricated using this method.     

High-accuracy optical time delay measurement in fiber link [Invited]

Optoelectronic components and subsystems such as optically controlled phased array antennas, distributed radar networks, interferometric optical fiber hydrophones, and high-speed optoelectronic chips demand highaccuracy optical time delay measurement with large measurement range and the capability for single-end and wavelength-dependent measurement. In this paper, the recent advances in the optical time delay measurement of a fiber link with high accuracy are reviewed. The general models of the typical time delay measurement technologies are established with the operational principle analyzed. The performance of these techniques is also discussed.     

Simple linear technique for the measurement of space-time coupling in ultrashort optical pulses

We demonstrate a simple sensitive linear technique that quantifies the spatiotemporal coupling in the electric field of an ultrashort optical pulse. The space-time uniformity of the field can be determined with only time-stationary filters and square-law integrating detectors, even if it is impossible to measure the temporal electric field in this way. A degree of spatiotemporal uniformity is defined and can be used with the demonstrated diagnostic to quantify space-time coupling. Experimental measurements of space-time coupling due to linear and nonlinear focusing, refraction, and diffraction are presented.     

Tunable photonic delay lines in optical fibers

A comprehensive overview is presented about optical fiber‐based tunable photonic delay lines, which have been steadily developed over the last decade for the realization of all‐optically controlled timing functions. The most widely used techniques, such as those based on slow & fast light and wavelength conversion associated to dispersion, are described and their physical limitations are discussed in terms of the maximal achievable delay, the associated signal distortion and signal bandwidth. Besides, an entirely different approach for all‐optical signal delaying is introduced. This technique is based on movable grating reflectors dynamically generated in highly birefringent optical fibers. This type of delay line has experimentally demonstrated large tunable delaying with a moderate signal distortion for high capacity optical data streams and even for wideband analog signals.     

Simple and accurate optical height sensor for wafer inspection systems

An accurate method for measuring the wafer surface height is required for wafer inspection systems to adjust the focus of inspection optics quickly and precisely. A method for projecting a laser spot onto the wafer surface obliquely and for detecting its image displacement using a one-dimensional position-sensitive detector is known, and a variety of methods have been proposed for improving the accuracy by compensating the measurement error due to the surface patterns. We have developed a simple and accurate method in which an image of a reticle with eight slits is projected on the wafer surface and its reflected image is detected using an image sensor. The surface height is calculated by averaging the coordinates of the images of the slits in both the two directions in the captured image. Pattern-related measurement error was reduced by applying the coordinates averaging to the multiple-slit-projection method. Accuracy of better than 0.35 μm was achieved for a patterned wafer at the reference height and ±0.1 mm from the reference height in a simple configuration.     

Simple model for frozen-in viscoelastic stress in optical fibers

We have measured residual stress in a commercial single mode optical fiber and observed its relaxation in an annealing process with a polariscopic stress measurement method. After annealing the fiber for an hour at various high temperatures in a specially made image furnace we have measured the temperature dependent relaxation of frozen-in viscoelastic stress in the fiber. We have proposed a simple physical model to explain recently observed relaxation of frozen-in viscoelastic stress in optical fibers based on the Kelvin-Voigt model of viscoelastic materials. The experimental results are explained with our model of frozen-in viscoelastic stress by introducing simplified four-step procedures for fiber drawing.     

Simple technique for measurement of energy spectra of ions from laser produced plasma

Old absorption technique is revived for measuring the energy spectra of ions arising from laser generated plasma. The technique suggested relies on implantation of produced ions into a light element target situated close to the ion production site. Then the ion energy spectra are reconstructed from the depth profile of the implanted ions measured by some of the common depth profiling techniques such as RBS or SIMS. Theoretical range vs. ion energy relations are used for this purpose. In this study the principles of the method are explained and its capabilities are assessed. The feasibility of the method is demonstrated on the energy spectra of Ta ions arising from the laser generated plasma.     

Ultralow-birefringence measurement in optical fibers by the twist method

We describe a simple method for measuring ultralow birefringence in optical fibers. It allows one to measure birefringence in the range of 4x10(-6) 1.25x10(-8) , which corresponds to the 0.2580-m range of the polarization beat length at the wavelength of 1 microm . A fiber section of a length shorter than the polarization beat length can be used for measurement. The measuring procedure involves measurement of the light intensity only and does not require an analysis of the light-polarization state. Experimental results for an optical fiber with a beat length of 1.9m are presented.     

Four-wave mixing in non-step-index optical fibers: a sensitive technique for measurement of refractive-index profiles

Investigation of four-wave mixing 6.4-mum core-diameter fiber with 520-610-nm pump light is used to develop a new technique for characterizing the refractive-index profiles of non-step-index fibers. Deviation from the step-index profile is measured. Small variations in the refractive index between different segments of the same commercial fiber is measured with a sensitivity of 0.0001.     

Fast and accurate measurement of large optical surfaces before polishing using a laser tracker

We present a method that accurately measures large optical surfaces before polishing using a laser tracker. Using the scanning mode of the laser tracker considerably improves measurement efficiency and minimizes the dominant errors caused by environmental change. We use this method to measure a φ1.3-m aspheric mirror and obtain a measurement uncertainty of 0.72 μm （root mean square, RMS）.     

Fast and accurate measurement of large optical surfaces before polishing using a laser tracker

Analysis of glass homogeneity using the attaching interferometric data model neglects body distribution.To improve analysis accuracy,we establish the three-dimensional gradient index(GRIN) model of glass index by analyzing fused silica homogeneity distribution in two perpendicular measurement directions.Using the GRIN model,a lithography projection lens with a numerical aperture of 0.75 is analyzed.Root mean square wavefront aberration deteriorates from 0.9 to 9.65 nm and then improves to 5.9 nm after clocking.     

频域反射法光纤延时精密测量

本文提出了一种应用于光纤延时系统中实现光纤延时精密测量的新方法,用以提高光纤延时测量的精度和准确性.该方法以1064 nm激光调制信号作为光源,通过测量回波信号的幅值和相位信息得到被测通道的频率响应,采用快速傅里叶逆变换得到被测目标的延时信息,实现光纤延时测量.本文通过理论分析和延时测量实验对频域反射法与传统的时域测量方法进行对比,使用频域反射法在调制频率范围10—200 MHz,采样频率间隔0.5 MHz的实验条件下,实现了3.3 ps延时测量分辨率,并证明了该方法具有比时域方法更高的测量精度,测量结果的准确性更好.     

Method to identify time delay of chaotic semiconductor laser with optical feedback

We propose a power spectrum analysis method to directly identify the time delay of a chaotic semiconductorlaser with optical feedback. By measuring the radio frequency (RF) power spectrum of the chaotic laserand performing an inverse Fourier transform, we can easily unveil all the time delay signatures, regardless ofwhether the chaotic output is induced by single or multiple feedback. This method successfully retrieves thetwo time delay signatures from the power spectrum of a semiconductor laser with double-cavity feedback.     

Attenuation measurement of optical fibers for sensor technology

Abstract

Generally the attenuation of optical fibers used for sensor technology is higher than that of fibers for telecommunications. This is difficult to measure by the optical time domain reflectometry (OTDR). This paper presents a simple method that employs an integrating sphere. The total and scattering attenuation coefficients can be calculated and discriminated by the measured power of the light scattered out of the optical fiber and collected by the integrating sphere.     

Attenuation measurement of optical fibers for sensor technology

Generally the attenuation of optical fibers used for sensor technology is higher than that of fibers for telecommunications. This is difficult to measure by the optical time domain reflectometry (OTDR). This paper presents a simple method that employs an integrating sphere. The total and scattering attenuation coefficients can be calculated and discriminated by the measured power of the light scattered out of the optical fiber and collected by the integrating sphere.     

双光反馈半导体激光混沌系统中外腔延时反馈特征的抑制

在一个双光反馈半导体激光混沌系统中,固定其中一个反馈腔镜(固定腔M₁)的反馈延迟时间以及反馈强度,实验研究了另一个反馈腔镜(可变腔M₂)的反馈延迟时间以及反馈强度对系统混沌输出的延时反馈特征的影响.研究结果表明:在可变腔M₂与固定腔M₁的反馈强度相等的条件下,改变M₂的腔长,当其腔长约等于(但不能严格等于)M₁的腔长或者腔长的一半时,系统将呈现较好地抑制延时反馈特征效果;当M 关键词： 半导体激光器 双光反馈 混沌输出 延时特征     

Direct measurement of electrostriction in optical fibers

The electrostriction contribution to the nonlinear refractive index in optical fiber was theoretically calculated and measured. Nonlinearity was induced directly by insertion of the optical fiber into an intense external electric field. With this technique both the Kerr and the electrostrictive contributions to the intensity dependence of the nonlinear refractive index in a step-index fiber were measured. Good agreement between calculated and measured values was observed. These results should confirm and explain the differences observed in measurement of n(2) at different bit rates.     

An automatic processing technique for accurate surface form measurement

A single shot algorithm using a Fizeau interferometer was used to measure the form profile of a spherical smooth surface by means of fringe thinning process, which plays an important role in fringe patterns analysis. In this paper, an automatic processing technique based on the fringe thinning process is presented. The circular interference fringe pattern of the spherical smooth surface captured by the Fizeau interferometer was corrected by using the flat fielding method and then processed. Based on the fringe thinning and the assignment of the fringe orders, the information on the fringe feature was recovered automatically and the interference wavefront was reconstructed by the Zernike polynomial fitting method. The results were compared with the results measured by Bünnagel method, and the results were in good agreement. This means that the single shot algorithm is reliable, fast, and less sensitive to vibration and turbulence in surface form measurements. Simulation fringes with the ray tracing technique were obtained to match the practical fringes.     

Reliability of multicore optical fibers in fiber-optic delay lines

Analytical expressions for estimating the minimum acceptable bending diameter are derived as a function of the expected service life, probability of premature fracture, and optical fiber diameter, which can be used to estimate the multicore optical fiber functionality in the particular applications.