Characterization and optimization of high-power InGaAs/InP photodiodes

The performance of 34-μm-diameter InGaAs/InP charge compensated modified uni-traveling carrier photodiodes (CC MUTCs) is studied using a commercial device simulator based on a drift-diffusion model. Excellent agreement has been achieved between simulations and experiments. The origin of the degradation of responsivity at high optical injection level is investigated. Parameters of the photodiode are further optimized to maximize the saturation current without sacrificing bandwidth and responsivity.     

Extracting dark current components and characteristics parameters for InGaAs/InP avalanche photodiodes

The dark current of separate absorption grading charge multiplication (SAGCM) InGaAs/InP avalanche photodiodes has been numerical analyzed. SRH current, TAT current, BBT current and avalanche amplification combined together as the dark current have been extracted by simulation separately. The trend of punch-through voltage and breakdown voltage have been discussed, meanwhile the influence of structure parameters also has been investigated.     

Influence of the p-type doping on the radiometric performances of MWIR InAs/GaSb superlattice photodiodes

In this paper, quantum efficiency (QE) measurements performed on type-II InAs/GaSb superlattice (T2SL) photodiodes operating in the mid-wavelength infrared domain, are reported. Several comparisons were made in order to determine the SL structure showing optimum radiometric performances: same InAs-rich SL structure with different active zone thicknesses (from 0.5 μm to 4 μm) and different active zone doping (n-type versus p-type), same 1 μm thick p-type active zone doping with different SL designs (InAs-rich versus GaSb-rich and symmetric SL structures). Best result was obtained for the p-type doped InAs-rich SL photodiode, with a 4 μm active zone thickness, showing a QE that reaches 61% at λ = 2 μm and 0 V bias voltage.     

Novel mid-IR laser based on hybrid AlGaAsSb/InAs/CdMgSe heterostructure

We report on the development of a novel design of a mid-IR laser combining III–V and II–VI compounds in a “hybrid” double heterostructure. It possesses large (1.5 eV) potential barriers both for injected electrons and holes, suppressing their leakage from the active region, and provides strong optical confinement. An AlGaAsSb/InAs/CdMgSe laser diode with a III–V/II–VI heterovalent interface at the 0.6 μm-InAs active region has been grown by molecular beam epitaxy on an InAs substrate. Despite a far from optimal defect density at the CdMgSe/InAs interface and high losses inherent for bulk active region of the laser, the structure demonstrates lasing at 2.8 μm (up to 100 K) in the pulsed regime with a threshold current density of 3–4 kA/cm². Type II InSb monolayer insertions into an InAs layer show bright photoluminescence at 3.8 μm (77 K), confirming the great potential of the InAs-based nanostructure active region for longer wavelength applications.     

Electrical and optical characteristics of the InAs/InAs0.7Sb0.1P0.2 single heterojunction photodiodes for the spectral range 1.6-3.5 μm

The electrical end optical characteristics of InAs/InAs_0.7Sb_0.1P_0.2 heterojunctions were studied. The dark current mechanisms in the heterostructures were investigated at several temperatures. The experimental results shows that, the low temperature region the tunneling mechanism of the current flow dominates in both, forward and reverse biases. At high temperatures region and in the range of voltage from 0.1 V to 1 V, the reverse current was defined by diffusion mechanism.     

双束质子辐照砷化镓光电导探测器的I-V特性

 对用能量为7.5MeV和20MeV,注量为10¹¹～10¹³cm^-2的质子辐照后的砷化镓材料制作的光电导探测器的光电流和暗电流进行了测试，并由此推得电导率的变化。结果表明，经过能量为7.5MeV的质子改性后的砷化镓探测器相对于未改性的附加光电导率Δσ减少，而且随着辐照注量的增加而越小，而对于先用能量为20MeV质子辐照后再用能量为7.5MeV的质子辐照的砷化镓材料制作的探测器，其附加光电导率Δσ的减少则更为明显。对上述现象进行了分析，并根据其相应关系预测了该种探测器的响应时间、灵敏度、拖尾现象及受X射线激发的输出脉冲的后延的变化情况。     

Integrated waveguide sensor utilizing organic photodiodes

We present a novel optical sensor platform, combining monolithically integrated ring‐like sensor waveguides together with ring‐shaped thin‐film organic photodiodes (OPDs) on one substrate. The OPDs serve as integrated light detectors, simplifying the detection system by minimizing the number of required optical components. The waveguide structures, including a means of coupling light in and out of the waveguides, serve as sensing elements. The functionality of the concept is demonstrated by an integrated carbon dioxide sensor, utilizing absorbance as sensing principle. The integrated optical sensor platform is suitable for the parallel detection of multiple parameters in a single sensor chip using sensor arrays. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Analysis of the response time in high-temperature LWIR HgCdTe photodiodes operating in non-equilibrium mode

The paper presents the theoretical investigation of the active region parameters, especially the influence of thickness and doping, on the response time and current responsivity of high-temperature long wavelength infrared HgCdTe photodiodes operating at 230 K in non-equilibrium mode. Results of theoretical predictions of time constant were compared to the experimental data. The response time of the devices have been characterized using Nd:YAG laser, optical parametric generator with pulse width <25 ps and fast oscilloscope with suitable transimpedance amplifier as a function of detector design, temperature and bias. The reverse bias applied to the photodiode causes Auger-suppression and improve the performances of the devices. This way the response time decreases to the value below 1 ns at the good current responsivity increased to the value of about 6 A/W and what is a promising parameter in view of potential telecommunication applications. Due to the series resistance of electrical connections, the response time of the devices is mainly limited by RC constant while the calculations show that the time constant of the Auger suppressed structures should be limited by the drift time of carriers.     

Signatures of differential Log R–V characteristics for non-uniformity analysis of HgCdTe infrared photodiode arrays

In continuation to our research on the non-uniformity in infrared focal plane arrays of HgCdTe photodiodes, we have examined and found a few important signature parameters in the forward bias region of the electrical characteristics of the photodiodes. These signatures are the peaks of the first and second order derivatives of dynamic resistance–voltage characteristics. They show good correlation with the material and devices parameters and have been investigated to be good signatures for statistical performance variation analysis. In this note, by using theoretical model and statistical analysis of these signatures, we show that the variations in the proposed signatures represent underlying non-uniformity in important material/device parameters. Such signatures may be used along with the other conventional signatures of reverse biased photodiode characteristics to identify the root cause of response non-uniformity in the array with high confidence level.     

Thermo-Sensitive Ba0.64Sr0.36TiO3 Thin Film Capacitors for Dielectric Type Uncooled Infrared Sensors

Ba_0.64Sr_0.36TiO₃ (BST) thin films are prepared on Pt/Ti/SiO₂/Si₃N₄/SiO₂/Si substrates by a sol-gel method. Thermo-sensitive BST thin film capacitors with a Metal-Ferroelectrics-Metal (M-F(BST)-M) structure are fabricated as the active elements of dielectric type uncooled infrared sensors. XRD are employed to analyze the crystallographic structures of the films. AFM observations reveal a smooth and dense surface of the films with an average grain size of about 35 nm. Rapid temperature annealing (RTA) process is a very efficient way to improve crystallization quality. The preferable annealing temperature is 800°C for 1 min. The butterfly shaped C-V curves of the capacitors indicate the films have a ferroelectric nature. The dielectric constant and dielectric loss of the films at 100 kHz are 450 and 0.038, respectively. At 25°C, where the thermo-sensitive capacitors work, the temperature coefficient of dielectric constant (TCD) is about 5.9 %/°C. These results indicate that the capacitors with sol-gel derived BST thin films are promising to develop dielectric type uncooled infrared sensors.     

A new circuit model of HgCdTe photodiode for SPICE simulation of integrated IRFPA

We propose a novel sub circuit model to simulate HgCdTe infrared photodiodes in a circuit simulator, like PSPICE. We have used two diodes of opposite polarity in parallel to represent the forward biased and the reverse biased behavior of an HgCdTe photodiode separately. We also connected a resistor in parallel with them to represent the ohmic shunt and a constant current source to represent photocurrent. We show that by adjusting the parameters in standard diode models and the resistor and current values, we could actually fit the measured data of our various HgCdTe photodiodes having different characteristics. This is a very efficient model that can be used for simulation of readout integrated circuit (ROIC) for HgCdTe IR photodiode arrays. This model also allows circuit level Monte Carlo simulation on a complete IRFPA at a single circuit simulator platform to estimate the non-uniformity for given processes of HgCdTe device fabrication and Si ROIC fabrication.     

The electronic structure of modulation-doped In0.53Ga0.47As/n-In0.52Al0.48As heterostructure

Summary The subband structure of modulation-doped InGaAs/InAlAs heterostructures is calculated in a variational self-consistent manner. The dependence on various device parameters is examined. The many-body exchange correlation effects are taken into account.     

Integrated fluorescence sensor based on ring‐shaped organic photodiodes

We demonstrate a novel sensor type, which is based on the monolithic integration of luminescent optical sensor spots together with ring‐shaped thin‐film organic photodiodes on one substrate. The organic photodiodes serve as integrated fluorescence detectors, simplifying the detection system by minimizing the number of required optical components. The proposed concept enables filter‐less discrimination between excitation light and generated fluorescence light. The functionality of the concept is demonstrated by an integrated oxygen sensor, exhibiting excellent performance. The sensor spots are excited by an assembled organic light emitting diode. The integrated optical sensor platform is suitable for the parallel detection of multiple parameters. Sensor schemes for the analytical parameters carbon dioxide, temperature and ammonia, are proposed.

     

Technology of the (Al,Ga)As/GaAs double heterostructure lasers

Conclusion Even thqugh the LPE growth of (Al,Ga)As layers is now largely a matter of industrial development or routine, there still remain some problems that need fundamental study. We have pointed to two of them: growth of very thin layers and the influence of ambient atmosphere. The problem of automation of the growth process, while being connected with industrial LPE installations, also has a bearing on the fundamental research, e.g. it is important for reproducible preparation of very thin layers.We did not include in this paper work done in our laboratories in the field of integrated optics. A hybrid combination of DH coherent source with a MESFET GaAs device has been tested; integrated version of this optoelectronic circuit is in preparation.Invited talk at the International Conference on Radiative Recombination and Related Phenomena in III–V Compound Semiconductors, Prague, 4–7 October, 1983.     

Modeling of transient and steady-state dark current in amorphous silicon p–i–n photodiodes

A theoretical model for describing the bias-dependent transient and steady-state behavior of dark current in hydrogenated amorphous silicon (a-Si:H) p–i–n photodiode has been developed. An analytical expression for the bias-dependent steady-state thermal generation current is derived by solving the continuity equations for both electrons and holes. The model for describing transient dark current in a-Si:H p–i–n photodiode is developed by considering the depletion of electrons from the i-layer and carrier injection through p–i interface. For photodiodes that have very good junction properties, the high initial dark current decreases with time monotonously and reaches a plateau. However, in case of poor junctions, the injection current can be the dominating mechanism for transient leakage current at relatively high biases, the dark current decays initially and then rises to a steady-state value. The proposed physics-based dark current model is compared with published experimental results on several photodiodes. The comparison of the model with the experimental data allows an estimate of active dopant concentration in the p-layer and the defect density in the midgap of i-layer.     

The leakage current mechanisms in the Schottky diode with a thin Al layer insertion between Al0.245Ga0.755N/GaN heterostructure and Ni/Au Schottky contact

This paper investigates the behaviour of the reverse-bias leakage current of the Schottky diode with a thin Al inserting layer inserted between Al0.245Ga0.755 N/GaN heterostructure and Ni/Au Schottky contact in the temperature range of 25-350°C. It compares with the Schottky diode without Aluminium inserting layer. The experimental results show that in the Schottky diode with Al layer the minimum point of I-V curve drifts to the minus voltage, and with the increase of temperature increasing, the minimum point of I-V curve returns the 0 point. The temperature dependence of gate-leakage currents in the novelty diode and the traditional diode are studied. The results show that the Al inserting layer introduces interface states between metal and Al0.245Ga0.755N. Aluminium reacted with oxygen formed Al2O3 insulator layer which suppresses the trap tunnelling current and the trend of thermionic field emission current. The reliability of the diode at the high temperature is improved by inserting a thin Al layer.     

Current transport in ZnO/Si heterostructure grown by laser molecular beam epitaxy

The n-ZnO/p-Si heterojunction was fabricated by depositing high quality single crystalline aluminium-doped n-type ZnO film on p-type Si using the laser molecular beam epitaxy technique. The heterojunction exhibited a good rectifying behavior. The electrical properties of the heterojunction were investigated by means of temperature dependence current density-voltage measurements. The mechanism of the current transport was proposed based on the band structure of the heterojunction. When the applied bias V is lower than 0.15 V, the current follows the Ohmic behavior. When 0.15V 0.6 V), the space charge limited effect becomes the main transport mechanism. The current-voltage characteristic under illumination was also investigated. The photovoltage and the short circuit current density of the heterojunction aproached 270 mV and 2.10 mA/cm 2 , respectively.     

p-i-nInP/In_(0.53)Ga_(0.47)As/InP探测器结构优化

利用半导体仿真工具Silvaco对p-i-n InP/In_(0.53)Ga_(0.47)As/InP近红外光探测器进行优化仿真.参考实际器件对红外探测器进行建模,并将其暗电流、光谱响应仿真结果与实验结果进行拟合,保证仿真结果的有效性.以减小探测器的暗电流为目的,优化其结构.针对探测器吸收层厚度和吸收层掺杂浓度对暗电流、光响应的影响进行研究,发现当吸收层厚度大于0.3μm后,暗电流不再上升,但光响应随着吸收层厚度的增加而增大;当吸收层掺杂浓度不断上升时,器件暗电流不断降低,当掺杂浓度上升到2×1017/cm3时,暗电流达到最低值.本文还研究了p-i-n型探测器的瞬态响应,探究了响应速度与反偏电压之间的关系,发现提高反偏电压能减小探测器响应时间.