Growth and characterization of ZnO-SDS hybrid thin films prepared by electrochemical self-assembly method

ZnO-SDS hybrid thin films were grown on ITO glass using the potentiostatic electrodeposition route from aqueous zinc nitrate solution containing surfactant sodium dodecyle sulfanate (SDS). The electrochemical process of the hybrid films was analyzed by comparing the cyclic voltammetric curve and current-time curve with those of pure ZnO film. Results showed that the addition of a small amount of SDS could decrease the deposition current density, and inhibit the growth of ZnO crystals significantly. The hybrid films electrodeposited at −0.9 V for 30 min exhibited smooth and platelet-like morphology, with the film thickness of about 110 nm. The well-defined ZnO-SDS lamellar structures could be clearly observed, with two interlayer spaces of 35.1 and 30.9 Å, respectively. Optical analysis showed that the hybrid films had good optical quality, and exhibited the fundamental absorption edge of ZnO at 380 nm.     

Processing parameters and transport properties of vacuum evaporated CdSe thin films

Semiconducting thin films of cadmium selenide have been grown by conventional thermal evaporation technique on glass substrate. Films evaporated at substrate temperature equal 523 K are stoichiometric and homogeneous. Effect of various growth parameters like rate of deposition and substrate temperature on the electrical properties has been studied in details. Also, the annealed at 673 K under vacuum for 1 h films have been analyzed for resistivity and Hall effect.     

Surface and electrical properties of organic-inorganic hybrid structure as gate insulator to organic thin film transistor

Carbon-based OTFT devices were fabricated using a plasma process for the gate electrode and gate insulators. A nanocrystalline carbon (nc-C) film was used as the gate electrode, and three different layers, cyclohexene, diamond-like carbon (DLC), and cyclohexene/DLC (hybrid insulator), were used as the gate insulator. The surface and electrical properties of the three different gate insulators on the nc-C gate electrode were investigated using the SPM method, and the leakage current density and dielectric constant of the metal-insulator-metal (MIM) structures with three different insulator layers were evaluated. The hybrid insulator layer had a very smooth surface, approximately 0.2 nm, a uniform surface without defects, and good adhesion between the layers. Overall, it is believed that the hybrid insulator lead to a decrease in the electrical leakage current and an improvement in the device performance.     

Tailoring the structural and magnetic properties of sol-gel derived Sm-Co nanogranular films

In this study, we investigated the microstructure, phase evolution and magnetic properties of nanogranular films of Sm-Co compounds processed by the sol-gel method. By controlling the compositional ratio of Sm:Co precursor concentration, nanogranular films consisting of three distinct hard magnetic phases namely, Sm₂Co₇, SmCo₅ and Sm₂Co₁₇ with coercivity values of 1.78, 2.94 and 2.12 kOe, respectively, were obtained through this technique.     

球面元件表面AlF3薄膜的光学特性和微观结构表征

在模拟球面元件曲率半径的仿面形夹具上镀制了AlF3单层薄膜,并对不同口径位置上的薄膜进行了比较,以表征球面元件表面镀制薄膜的光学特性和微观结构。首先,采用紫外可见光分光光度计测量了不同口径位置上薄膜样品的透射和反射光谱,反演得出AlF3的折射率和消光系数。然后,使用原子力显微镜观察了样品的表面形貌和表面粗糙度。最后,使用X射线衍射仪对薄膜的内部结构进行了表征。实验结果表明：在球面不同位置镀制的AlF3单层薄膜样品的光学损耗随着所在位置口径的增大而增大。口径为280 mm处的消光系数是中心位置处消光系数的1.8倍,表面粗糙度是中心位置的17.7倍。因此,球面元件需要考虑由蒸汽入射角不同带来的光学损耗的差异。     

Influence of various thickness metallic interlayers on opto-electric and mechanical properties of AZO thin films on PET substrates

Various thickness metallic interlayers to improve the opto-electric and mechanical properties of aluminum-doped zinc oxide (AZO) thin films deposited on flexible polyethylene terephtalate (PET) substrates are studied. The effects of the interlayers on the resistance and transmittance of the AZO thin films are discussed. The result shows that the metallic interlayers effectively improve the electric resistance but reduce the optical transmittance of the AZO thin films. These phenomena become more obvious as the interlayer thickness increases. However, the AZO with an aluminum interlayer still behaves an acceptable transmittance. Moreover, mechanical tests indicate that the aluminum interlayer increases the hardness and modulus, and reduce the residual stress of the AZO thin films. In contrast, the silver and copper interlayers decrease the AZO's mechanical properties. Comparing to those without any interlayer, the results show that the best interlayer is the 6 nm thick aluminum film.     

Optical and electrical properties of thermally oxidized bismuth thin films

Bismuth trioxide (Bi₂O₃) thin films were prepared by dry thermal oxidation of metallic bismuth films deposited by vacuum evaporation. The oxidation process of Bi films consists of a heating from the room temperature to an oxidation temperature (T_o = 673 K), with a temperature rate of 8 K/min; an annealing for 1 h at oxidation temperature and, finally, a cooling to room temperature. The optical transmission and reflection spectra of the films were studied in spectral domains ranged between 300 nm and 1700 nm, for the transmission coefficient, and between 380 nm and 1050 nm for the reflection coefficient, respectively. The thin-film surface structures of the metal/oxide/metal type were used for the study of the static current-voltage (I-U) characteristics. The temperature of the substrate during bismuth deposition strongly influences both the optical and the electrical properties of the oxidized films. For lower values of intensity of electric field (ξ < 5 × 10⁴V/cm), I-U characteristics are ohmic.     

Structure and magnetic properties of Co-substituted NiZn ferrite thin films synthesized by the sol-gel process

Co-substituted NiZn ferrite thin films, Ni_0.5Zn_0.5Co_xFe_2−xO₄ (0≤x≤0.2), were synthesized by the sol-gel process. The structure and magnetic properties of Ni_0.5Zn_0.5Co_xFe_2−xO₄ ferrite thin films have been investigated. The diffraction peak shifted towards the lower angle and the lattice parameter increased with Co substitution. There is little influence of Co substitution on the microstructure of NiZn ferrite thin films. The saturation magnetization gradually increases with the increase in Co substitution when x≤0.10, and decreases when x>0.10. Meanwhile, the coercivity initially decreases with the increase in Co substitution when x≤0.10, and increases when x>0.10.     

Stress analysis, structure and magnetic properties of sputter deposited Ni-Mn-Ga ferromagnetic shape memory thin films

The residual stress instituted in Ni-Mn-Ga thin films during deposition is a key parameter influencing their shape memory applications by affecting its structural and magnetic properties. A series of Ni-Mn-Ga thin films were prepared by dc magnetron sputtering on Si(1 0 0) and glass substrates at four different sputtering powers of 25, 45, 75 and 100 W for systematic investigation of the residual stress and its effect on structure and magnetic properties. The residual stresses in thin films were characterized by a laser scanning technique. The as-deposited films were annealed at 600 °C for 1 h in vacuum for structural and magnetic ordering. The compressive stresses observed in as-deposited films transformed into tensile stresses upon annealing. The annealed films were found to be crystalline and possess mixed phases of both austenite and martensite, exhibiting good soft magnetic properties. It was found that the increase of sputtering power induced coarsening in thin films. Typical saturation magnetization and coercivity values were found to be 330 emu/cm³ and 215 Oe, respectively. The films deposited at 75 and 100 W display both structural and magnetic transitions above room temperature.     

金刚石薄膜电致发光现象的研究进展

阐明了金刚石薄膜电致发光研究的重要意义．综述了金刚石薄膜电致发光现象研究的进展情况，指出目前该方面研究中存在的问题，并提出了进一步提高金刚石薄膜蓝区电致发光强度的可能途径．     

A study on electrical and mechanical properties of hybrid-polymer thin films by a controlled TEOS bubbling ratio

Organic-inorganic hybrid-polymer thin films were deposited on silicon(1 0 0) substrates at room temperature by PECVD (plasma enhanced chemical vapor deposition). Ethylcyclohexane and TEOS (tetraethoxysilane) were utilized as organic and inorganic precursors with hydrogen gas for the ethylcyclohexane bubbler and argon gas for both the TEOS bubbler and as a carrier gas. To compare the electrical and the mechanical properties of the plasma polymerized thin films, we grew the hybrid-polymer thin films under conditions of various TEOS bubbling ratios. MTS nano-indenter was used to measure the hardness and Young's modulus and showed that these values increased as the TEOS bubbling ratio increased, with the highest hardness at 0.8 GPa in this experiment. An impedance analyzer was utilized for the measurements of I-V curves and capacitance, showing the lowest dielectric constant at approximately 1.83, with a leakage current density of 10⁻⁸ A/cm² at 1 MV/cm, respectively.     

Microstructure and magnetic properties of FeRh thin films with Pt doping

In this paper,the structure and magnetic properties of FeRh alloy thin films with a small amount of Pt doping fabricated onto a glass substrate by sputtering are investigated systematically.XRD results show that the diffraction pattern of as-deposited film exhibits only nonmagnetic γ phase.After annealing,the disordered γ phase transforms to an ordered α' phase.The temperature dependence of saturation magnetization of different annealing times and Pt contents are characterized.The phase transition temperatu...     

Magnetoelectrical properties of W doped ZnO thin films

ZnO thin films were deposited on the Si(100) substrate by rf sputtering using a 99.999% pure commercially bought and a home made target under 100 W power. The home made ZnO target, including 1–2% tungsten, was synthesized via solid state reaction. Thin films were deposited under a flow of 70% argon and 30% O₂ gas mixture followed by post-deposition annealing under 1 Torr oxygen atmosphere. Both deposition and post-deposition annealing were done at 420±1 °C. The structural analyses show that the films were in the [0002] preferred direction and that W atoms are bound to the oxygen atoms by replacing the Zn host atoms. Although no specific change was observed in the magnetic properties as a result of W doping, significant changes in the electrical properties were observed, as determined by the longitudinal and transversal magneto-electrical measurements. It was found that the W impurities induce better insulating properties due to lower carrier concentration and higher resistivity values. On the other hand, the enhanced positive magnetoresistivity and the existence of polarized spin currents, which were not specific for pure ZnO thin films, were observed in W doped ZnO films below 10 K.     

Emission properties of thin films of electroactive doped polymers

We have studied the effect of the intensity of the exciting radiation and the temperature on the emission properties of two kinds of thin-film samples based on blends of two types of organic electroactive materials: polyfluorene + iridium triphenylpyridinate and polyepoxypropylcarbazole + zero-th order PAMAM dendrimer with eosin. We have shown that an increase in the excitation intensity leads to an increase in the intensity of the luminescence of the polymer matrices and the iridium complex up to a power density of 300 kW/cm², and the emission of the dendrimer is rapidly saturated and does not return to the initial value when the excitation level decreases. Heating up to 170°C followed by cooling causes an increase in the intensity for all the components except the dendrimer. The data obtained show that annealing is an important method for improving the emission efficiency of the proposed thin-film structures, due to a change in the packing of the activator molecules in the polymer matrix leading to more efficient transfer of the excitation energy. Molecules of the studied dendrimer are not stable when exposed to optical radiation and temperature. __________ Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 74, No. 6, pp. 820–825, November–December, 2007.     

Physical properties of ZnO thin films deposited by spray pyrolysis technique

Thin films of ZnO have been prepared on glass substrates at different thicknesses by spray pyrolysis technique using 0.2 M aqueous solution of zinc acetate. X-ray diffraction reveals that the films are polycrystalline in nature having hexagonal wurtzite type crystal structure. The resistivity at room temperature is of the order 10⁻² Ω cm and decreased as the temperature increased. Films are highly transparent in the visible region. The dependence of the refractive index, n, and extinction coefficient, k, on the wavelength for a sprayed film is also reported. Optical bandgap, E_g, has been reported for the films. A shift from E_g = 3.21 eV to 3.31 eV has been observed for deposited films.     

Rubbing effect on surface morphology and thermoelectric properties of TTF-TCNQ thin films

Thin films of tetrathiofulvalene-tetracyanoquinodimethane (TTF-TCNQ), a typical organic material of charge transfer salts, were prepared on glass substrates by evaporation using TTF-TCNQ powder. The rubbing effect on the surface morphology and thermoelectric properties was studied. TTF-TCNQ films exhibited a bush-like disordered growth on the as-received glass substrate, whereas those on the rubbed glass substrate had extremely flat surfaces tiled with small rectangular TTF-TCNQ single crystals. Due to the ordered alignment of TTF-TCNQ tiles, improvement in the electrical conductivity and enhancement of the Seebeck coefficient were achieved.     

Multiferroic properties of sol-gel derived Bi5Fe1-xCoxTi3O15 thin films

Co-doped Bi 5 FeTi 3 O 15 thin films (BFCT-x,Bi 5 Fe 1-x Co x Ti 3 O 15) were prepared using a sol-gel technique.XRD patterns confirm their single phase Aurivillius structure,and the corresponding powder Rietveld analysis indicates the change of space group around x=0.12.The magnetic hysteresis loops are obtained and ferromagnetism is therefore confirmed in BFCT-x thin films.The remanent magnetization (M r) first increases and reaches the maximum value of 0.42 emu/cm 3 at x=0.12 due to the possible Fe 3+-O-Co 3+ ferromagnetic coupling.When x=0.25,the M r increases again because of the dominant Fe 3+-O-Co 3+ ferromagnetic coupling.The remanent polarization (2P r) of BFCT-0.25 was measured to be as high as 62 μC/cm 2,a 75% increase when compared with the non-doped BFCT-0 films.The 2P r remains almost unchanged after being subjected to 5.2 × 10 9 read/write cycles.Greatly enhanced ferroelectric properties are considered to be associated with decreased leakage current density.     

Dielectric and relaxation properties of thermally evaporated nanostructured bismuth sulfide thin films

Nanostructured bismuth sulfide thin films were prepared onto glass substrates with particle size of 21 nm by thermal evaporation using readily prepared bismuth sulfide nanocrystallite powder. The X-ray diffraction pattern revealed that bismuth sulfide thin films exhibit orthorhombic structure. The existence of quantum confinement effect was confirmed from the observed band gap energy of 1.86 eV. AC and DC electrical conductivity of Al/BiSnc/Al structures was investigated in the frequency range 0.5-100 kHz at different temperatures (303-463 K) under vacuum. The AC conductivity (σ_ac) is found to be proportional to angular frequency (ω^s). The obtained experimental result of the AC conductivity showed that the correlated barrier hopping model is the appropriate mechanism for the electron transport in the nanostructured bismuth sulfide thin films. DC conduction mechanism in these films was studied and possible conduction mechanism in the bismuth sulfide thin films was discussed.     

Effects of different annealing atmospheres on the surface and microstructural properties of ZnO thin films grown on p-Si (1 0 0) substrates

Effects of different annealing atmospheres on the surface and microstructural properties of ZnO thin films grown on Si (1 0 0) substrates were investigated. X-ray diffraction results showed that the crystallinity of the ZnO thin film annealed in an oxygen atmosphere was better than that annealed in a nitrogen atmosphere. Atomic force microscopy and transmission electron microscopy (TEM) images showed that the surfaces of the ZnO thin films annealed in a nitrogen atmosphere became very rough in contrast to those annealed in an oxygen atmosphere. High-resolution TEM images showed that many stacking faults and tilted grains could be observed in the ZnO thin films annealed in a nitrogen atmosphere in contrast to those annealed in an oxygen atmosphere. Surface morphology and microstructural property variations due to different annealing atmospheres in ZnO thin films are also described on the basis of the experimental results.