Development on the reconstruction of photothermal imaging method for subsurface structure

Journal of Visualization - The photothermal imaging technique is a nondestructive inspection technique that visualizes the inside of a metal by utilizing the photothermal effect. Although the...     

Thermal-wave detection and characterisation of sub-surface defects

Results of the analysis of air-gap and thermal-contact resistance defects are presented. The analysis is illustrated by model predictions of the influence of such defects in a number of important coated and uncoated materials. Experimental results of defects in steel and aluminium coated steel samples are presented and compared with theory. These results show the importance of the lateral extent of the defect and the presence of contact points within the defect.     

Thermal conductivity and interface thermal resistance of Si film on Si substrate determined by photothermal displacement interferometry

An in situ, noncontact, photothermal displacement interferometer for performing thermal diffusivity measurements on bulk and thin-film materials has been developed. Localized transient surface motion is generated through photothermoelastic coupling of a pulsed, heating laser beam to the sample under investigation. The maximum surface displacement is found to be linearly dependent on the laser power while the proportionality is a function of the thermal diffusivity. Both thin-film conductivity and film/substrate interface thermal resistance are derived from the measured, effective thermal conductivity by employing simple heat-flow analysis. Wedge-shaped Si films, vacuum deposited on single crystal Si wafers are studied with this technique. A sample with oxide layer removed by ion bombardment of the wafer surface prior to film deposition shows the same film conductivity as a sample film deposited on an as-cast wafer, while the uncleaned sample exhibits higher interface thermal resistance. It is found that the thin-film thermal conductivity is somewhat smaller than the bulk value. However, the existence of an interface thermal resistance, when combined with film thermal conductivity, can result in an effective thermal conductivity as low as two orders of magnitude lower than the bulk value.Currently supported by the LLE fellowship     

Non-intrusive mapping of subsurface defects in semiconductors

We have adapted differential interference contrast Nomarski microscopy in the transmission configuration to the problem of mapping subsurface defects in semiconductors. We have demonstrated the ability to rapidly measure the depth of the precipitate-free-zone in silicon with a reproducibility of ±1 m in whole Si wafers up to 200 nm in diameter, having an extrinsic doping concentration up to 7×10¹⁹ cm^–3 and a nominal, as received, back side roughness. Because our subsurface defect profiler is completely non-destructive, product wafers can be inspected at various stages of processing and immediately returned to the production line.     

The investigation of defects in metals with positive muons

It is shown that the trapping of positive muons by defects in metals attracting positively charged particles may be used to investigate such defects in considerable detail by spin relaxation of positive muons.     

Study of inspection on metal sheet with subsurface defects using linear frequency modulated ultrasound excitation thermal-wave imaging (LFM-UTWI)

The linear frequency modulated ultrasound excitation thermal wave imaging (LFM-UTWI) was investigated on detection of subsurface defects of metal sheet. A numerical finite element analysis is carried out to calculate thermal wave signal dependence of time by linear frequency modulated ultrasonic wave excitation. Cross-correlation operation in time domain and frequency domain are used to extract the main peak value and the corresponding delay time, respectively. Fourier transform (FT) is applied to calculate the amplitude and phase angle of harmonic component of thermal wave. Experimental results show that various deep subsurface defects are readily detected using LFM-UTWI with once excitation, and LFM-UTWI has an advantage of better defect detectability compared to ultrasound lock-in thermography (ULIT).     

Hard-x-ray region tomographic reconstruction of the refractive-index gradient vector field: imaging principles and comparisons with diffraction-enhanced-imaging-based computed tomography

The unique tomographic imaging method based on refractive effects that was recently developed by Maksimenko et al. [Appl. Phys. Lett. 86, 124105 (2005)] exhibits an excellent imaging property in the hard-x-ray region for phase objects such as soft materials and biological samples. However, there seems to have been little consideration of the physical aspects of the underlying imaging principles. Also, as the method is similar to diffraction-enhanced-imaging (DEI)-based computed tomography (CT), the difference between these two methodologies has not been made clear. We theoretically consider the imaging principles starting from the measurement process to the reconstruction procedures from the viewpoint of geometrical optics and then clarify their difference in relationship to the physical quantities to be depicted. The major feature of this novel method is the in-plane two-dimensional vector-field reconstruction of the refractive-index gradient in an object, while DEI CT obtains the out-of-plane scalar-field gradient component. In other words, the novel method and DEI CT present the transverse and the longitudinal components, respectively, of the three-dimensional vector fields of the gradient refractive index. Therefore they can be considered complementary to each other.     

Inspection on CFRP sheet with subsurface defects using pulsed thermographic technique

The pulsed thermographic technique was used to detect flat-bottomed hole defects in CFRP sheet. Pulsed phase thermography (PPT) was used to extract the characteristic information of the thermal wave signal generated by thermal pulse. The difference of the phases between the sound and defective areas were analyzed. The defects’ edges were extracted by Fuzzy C-Means clustering algorithm.     

Autonomous reconstruction and segmentation of tomographic data

A Bayesian approach to reconstruction and segmentation of tomographic data is outlined and further detailed for the case of absorption tomography. The algorithm allows the quantification of reconstruction errors and segmentation confidence. Calculation results for various experimental settings (number of projections, incident dose, different materials) are shown and discussed.     

Generation of shear bands in subsurface layers of metals in sliding

Nanostructuring of the surface of specimens during friction is investigated under the conditions of shear instability of the subsurface layers of the material due to the strong localization of deformation. It is demonstrated that the localization of deformation in the subsurface layers occurs in three stages. The structure of the localization zone is studied. The formation of a nanocrystalline material on the surface due to the shear instability is considered by analogy with the formation of the shear band. The formation of the nanocrystalline material can be responsible for the crossover from the mild wear to the adhesive wear in the absence of mechanisms providing structural adaptability.     

基于改进维纳逆滤波的衍射成像光谱仪数据误差分析与重构

衍射成像光谱仪探测到的高光谱数据需要进行计算与反演才可以得到成像光谱数据,本文对衍射成像光谱仪的成像过程及数据误差产生的原理从空间维和光谱维两方面进行了分析,并针对其光谱重构过程中系统点扩散函数标准差较大时重构结果清晰度较低、存在振铃等问题,提出了基于改进维纳逆滤波的光谱数据重构算法,该方法在分析衍射成像光谱仪数据特点与误差的基础上,将每一次维纳逆滤波的重构结果视为新的模糊图像,利用成像过程及维纳逆滤波的基本原理确定新的模糊图像对应的点扩散函数,反复进行维纳逆滤波达到提高图像清晰度的效果,再根据图像自身的空间和光谱特征分布,进行自适应性的噪声去除.利用模拟的衍射成像光谱数据进行验证,在系统点扩散函数的标准差为2.5的情况下,能得到无振铃的重构结果,且与传统维纳逆滤波法的重构结果进行比较,清晰度、细节能力等指标均有所提高,满足了衍射成像光谱数据应用需求.     

The production of frenkel defects in fcc metals

Experimental results from polycrystalline and single crystalline samples of aluminum are analyzed in terms of how electron irradiation causes atomic displacements along 〈100〉 and 〈110〉 crystallographic directions. This interpretation is made for atoms that recoil with energies sliihtly greater than the threshold energy. It is noted that definite correlations exist between some of the substages of stage I and the natural required behavior of recoiling atoms. By applying this criterion to polycrystalline samples, one establishes a means for identifying other phenomena; e.g. multiple atomic displacements, spontaneous recombination, etc.     

Evaluation of enamel crystallites in subsurface lesion by microbeam X‐ray diffraction

Early caries lesion is a demineralization process that takes place in the top 0.1 mm layer of tooth enamel. In this study, X‐ray microbeam diffraction was used to evaluate the hydroxyapatite crystallites in the subsurface lesion of a bovine enamel section and the results are compared with those obtained by transversal microradiography, a method commonly used for evaluation of tooth mineral. Synchrotron radiation from SPring‐8 was used to obtain a microbeam with a diameter of 6 µm. Wide‐angle X‐ray diffraction reports the amount of hydroxyapatite crystals, and small‐angle X‐ray scattering reports that of voids in crystallites. All three methods showed a marked decrease in the enamel density in the subsurface region after demineralization. As these diffraction methods provide structural information in the nanometre range, they are useful for investigating the mechanism of the mineral loss in early caries lesion at a nanometre level.     

Resolution and noise in ghost imaging with classical thermal light

The resolution and classical noise in ghost imaging with a classical thermal light are investigated theoretically. For ghost imaging with a Gaussian Schell model source, the dependences of the resolution and noise on the spatial coherence of the source and the aperture in the imaging system are discussed and demonstrated by using numerical simulations. The results show that an incoherent source and a large aperture will lead to a good image quality and small noise.     

光学元件亚表面缺陷的损伤性检测方法

在磨削、研磨和抛光加工过程中产生的微裂纹、划痕、残余应力等亚表面缺陷会导致熔石英元件抗激光损伤能力下降,如何快速、准确地检测亚表面损伤成为光学领域亟待解决的关键问题。采用HF酸蚀刻法、角度抛光法和磁流变斜面抛光法对熔石英元件在研磨加工中产生的亚表面缺陷形貌特征及损伤深度进行了检测和对比分析,结果表明,不同检测方法得到的亚表层损伤深度的检测结果存在一定差异,HF酸蚀刻法检测得到的亚表面损伤深度要比角度抛光法和磁流变斜面抛光法检测结果大一些。且采用的磨粒粒径越大,试件表面及亚表面的脆性断裂现象越严重,亚表面缺陷层深度越大。     

单幅层析全息图的记录及数据重建

进行了数字单幅离轴层析全息图记录和数值处理模拟分析及实验研究.首先定义了单幅层析全息图并分析了基于多向投影的数字单幅离轴层析全息图频谱分布特点, 由此表明它的可处理性.在此基础上,数值模拟分析了基于三向投影的单幅离轴层析全 息图记录与各向投影信息的分离提取, 最后选择了具有周期结构的透明光栅(周期为100 μm)作为实验样本, 实现了三向投影的单幅层析全息图的记录以及数值重建, 三束物光波重建周期值误差在4%-5%范围内.模拟分析及实验结果验证了单幅层 析全息图记录与信息分离的可行性,同时为实现具备实时检测功能的极少量投影数字全息 层析系统提供了重要的技术基础.     

Runout error correction in tomographic reconstruction by intensity summation method

An alignment method for correction of the axial and radial runout errors of the rotation stage in X‐ray phase‐contrast computed tomography has been developed. Only intensity information was used, without extra hardware or complicated calculation. Notably, the method, as demonstrated herein, can utilize the halo artifact to determine displacement.     

Influence of gallium arsenide surface treatment in selenium vapors on subsurface defects

Influence of GaAs surface treatment in selenium vapors on the parameters of electronic states in the subsurface GaAs regions is investigated by the methods of volt-ampere and volt-farad characteristics and isothermal capacitance relaxation at temperatures in the interval 77–400 K. Electrophysical measurements of the Schottky barriers formed on the GaAs surface treated in selenium indicate a decrease in the surface electron state (SES) density and unfastening of the Fermi energy level. In this case, generation of subsurface defects is observed that causes compensation of shallow donors and refastening of the Fermi energy level typical of some structures.     

Numerical simulation of the trajectory of a light ray propagating through an optic system with non-centered spherical diopters and broken optic axis

The present paper is devoted to the elaboration of a strategy for the design of some practical focusing devices for the radiation emitted by a high-power laser used in thermal treatment processes. Usually, technological solutions employ spherical mirrors. Because spherical mirrors introduce a certain astigmatism, it is necessary to get an energetically efficient configuration which reduces as much as possible the astigmatic difference, thus concentrating the laser radiation energy which is distributed within the area between the sagital and meridional foci.     

光学元件亚表面缺陷偏振双向反射分布函数

利用琼斯散射矩阵,借助右手正交基组来表示入射场和散射场,推导出光学元件亚表面缺陷或微粒在不同偏振状态下的双向反射分布函数的表达式。给出了亚表面缺陷在不同入射角条件下,不同偏振状态下的双向反射分布函数与散射方位角之间的关系,以及不同入射角下p偏振入射产生的p偏振双向反射分布函数的3维散射图。结果表明:p偏振入射产生的p偏振双向反射分布函数强烈依赖于入射角、散射角和方位角,且随着入射角的增加,其最小值点所对应的方位角逐渐减小。