Photothermal modulation of laser diode wavelength: application to sinusoidal phase-modulating interferometer for displacement measurements

In this paper, a novel laser-diode (LD) sinusoidal phase-modulating (SPM) interferometer, which utilizes a photothermal technique for LD wavelength modulation, is proposed to measure displacements with a nanometer accuracy. In conventional LD–SPM interferometers, the LD intensity modulation is concurrent with the wavelength modulation, which increases measurement errors. Using the photothermal technique, the LD wavelength modulation can be accomplished with negligible concomitant intensity modulation, and the measurement errors are thus eliminated. The computer simulations and experiment results verify the usefulness of this novel interferometer.     

Sinusoidal phase-modulating laser diode interferometer insensitive to intensity modulation for real-time displacement measurement with feedback control system

In sinusoidal phase modulating laser diode (LD) interferometer, the injection current of the LD is sinusoidally modulated to realize the modulation of the wavelength. However, the light intensity of LD is also modulated, which affects the measurement accuracy. An all-fiber sinusoidal phase modulating LD interferometer for real-time displacement measurement is proposed where the influence of the intensity modulation is eliminated with a new algorithm. It is made clear that an optimal depth of the sinusoidal phase modulation (SPM) exists in the algorithm. Moreover, the SPM depth is locked at the optimal value by controlling the injection current with a feedback control system. The feasibility of the proposed interferometer for displacement measurement is verified by experiments.     

Sinusoidal phase-modulating laser diode interferometer insensitive to the intensity modulation of the light source

In a conventional sinusoidal phase-modulating laser-diode (SPM-LD) interferometer, the wavelength of the LD is sinusoidally modulated by varying its injection current. However, the intensity modulation is associated with the wavelength modulation, which affects the measurement accuracy. We propose an SPM-LD interferometer insensitive to the intensity modulation of the light source, in which the influence of the intensity modulation is eliminated by choosing the appropriate sinusoidal phase modulation depth. Computer simulations and experiments are performed for real-time displacement measurement with the proposed SPM-LD interferometer. The measurement accuracy has been improved and the measurement repeatability is less than 1 nm. No additional components are required in our proposed method that leads to a simple system compared with the other previously proposed methods.     

Influence of laser diode wavelength tunability on the range, resolution and repeatability of interferometric distance measurement

The coherence length of a single mode laser diode (LD) can reach more than 10 m. It allows the application of this source of light to interferometric distance measurement, with a measurement range of several meters. However, the LD's wavelength tunability, which is a result of the dependence of the lasing wavelength on the injection current, prevents the realization of the theoretically possible metrological parameters of the interferometer. In this study, we analyze the influence of a low-frequency signal disturbance, e.g., noise or disturbing modulation inherent to the injection current of the LD, on the repeatability and measurement range of an LD interferometer used for displacement measurements. Both the measurement range and the resolution of the interferometer are found to be highly limited by this factor.     

光纤外差干涉位移传感器性能的提高

利用半导体激光器 (LD)、光隔离器、光纤定向耦合器、自聚焦透镜等组成双路光纤斐索型干涉仪。采用三角波电流调制 ,上、下边沿拍频信号差动鉴相的方法 ,提高了测量灵敏度和位移响应速度 ,增大了测量范围 ;利用辅助干涉仪检测系统的相位漂移 ,并对LD发光波长进行反馈控制 ,提高了系统的稳定性 ,实现了大测量范围、高分辨率、高精度位移测量。     

正弦相位调制自混合干涉微位移测量精度分析

为了提高自混合干涉仪的位移测量精度,提出将正弦相位调制技术引入自混合干涉中。相位调制由置于自混合干涉仪外腔中的电光晶体实现,相位解调由傅里叶分析的方法得到。对位移测量过程中各种可能的误差来源如电光晶体调制不稳定性、光在外腔中的二次反馈效应等对测量精度的影响进行了模拟分析,从理论上得到了这种新的信号处理方法可以达到纳米级的测量精度。实验上,用高精度的商用压电陶瓷标定的结果验证了这种正弦相位调制自混合干涉仪在普通实验室噪声环境中可以达到纳米级的位移测量精度。     

X射线干涉仪实现扫描探针显微镜样板线间距纳米测量

X射线干涉仪以非常稳定的单晶硅晶格作为长度单位 ,可以实现亚纳米精度的微位移测量。提出了将 X射线干涉仪和扫描隧道显微镜结合起来 ,利用单晶硅的晶格尺度测量扫描探针显微镜样板节距的技术方案 ,并进行了实验研究     

A sinusoidal phase-modulating fiber-optic interferometer insensitive to the intensity change of the light source

In a conventional laser-diode sinusoidal phase-modulating (LD-SPM) interferometer, the wavelength of the LD is modulated by varying its injection current. The intensity modulation concurrent with the wavelength modulation leads to measurement errors. A photothermal-modulation method has been proposed to decrease the intensity change of the LD; however, this method cannot be used to measure vibration with a high frequency, and the beam diameter is too large to be used to measure minute objects. In this paper, we propose LD-SPM fiber-optic interferometer, in which the effect of the intensity change of the light source on measurement is eliminated. The diameter of the light beam is less than 0.5 mm. Using this interferometer, we measured displacements of a mirror driven by a piezoelectric transducer. The measurement repeatability is less than 1 nm.     

基于F-P腔法的纳米精度非线性误差校准系统研究

为了研究可用于纳米、亚纳米精度的非线性误差校准系统,采用差拍F-P干涉法,在中国计量科学研究院研制的差拍F-P干涉仪基础上,设计并制作了适用于该系统的密封干涉光路的真空系统。通过与电容式测微仪的比对实验,证明了系统的抗干扰能力得到了改善,在大于半波长的测量范围内,系统的非线性度优于3.86nm。     

A microchip laser feedback interferometer with nanometer resolution and increased measurement speed based on phase meter

We introduce a new signal processing method based on phase meter into heterodyne microchip Nd:YAG laser feedback interferometer. The nanometer resolution and a higher measurement speed are realized. The factors determining the accuracy are analyzed. The displacements of the Physik Instrumente nanopositioning system and two piezoelectric transducers were measured. Experimental results indicate laser feedback interferometer’s ability of measuring nanoscale displacement and present promising application prospects in noncooperative targets measurement.     

Real-time surface profile measurement using a feedback type of sinusoidal phase modulating interferometer

In this paper, we propose a sinusoidal phase modulating (SPM) interferometer that is insensitive to external disturbances, and its measuring principle is analyzed theoretically. In the SPM interferometer, the interference signal is detected by a high-speed image sensor based on a low-speed CCD and a signal processing circuit is used to obtain the phase of each point on the surface. Therefore, the surface profile can be measured real-time. The experiments measuring the surface profile of a wedge-shaped optical flat show that the measurement time of the SPM interferometer is less than 10 ms, the repetitive measurement accuracy is 4.2 nm. The results show that the impacts of nonlinear distortion of the piezoelectric transducer (PZT) and part external disturbance are removed.     

Real-time micro-vibration measurement in sinusoidal phase-modulating interferometry

As there exist some problems with the previous laser diode (LD) real-time microvibration measurement interferometers, such as low accuracy, correction before every use, etc., in this paper, we propose a new technique to realize the real-time microvibration measurement by using the LD sinusoidal phase-modulating interferometer, analyze the measurement theory and error, and simulate the measurement accuracy. This interferometer utilizes a circuit to process the interference signal in order to obtain the vibration frequency and amplitude of the detective signal, and a computer is not necessary in it. The influence of the varying light intensity and light path difference on the measurement result can be eliminated. This technique is real-time, convenient, fast, and can enhance the measurement accuracy too. Experiments show that the repeatable measurement accuracy is less than 3.37 nm, and this interferometer can be applied to real-time microvibration measurement of the MEMS.     

Sinusoidal phase-modulating laser diode interferometer for real-time surface profile measurement

A sinusoidal phase-modulating (SPM) laser diode (LD) interferometer for real-time surface profile measurement is proposed and its principle is analyzed. The phase signal of the surface profile is detected from the sinusoidal phase-modulating interference signal using a real-time phase detection circuit. For 60 × 60 measurement points of the surface profile, the measuring time is 10 ms. A root mean square (RMS) measurement repeatability of 3.93 nm is realized, and the measurement resolution reaches 0.19 nm.     

X射线干涉测量技术的最新进展

结合Ｘ射线干涉的基本特点，介绍了Ｘ射线干涉仪的几种基本形式。阐述了Ｘ射线干涉测量技术在纳米长度测量、小角度测量、ＳＰＭ的定标以及在其它测量领域内的最新进展，并对Ｘ射线干涉测量技术的发展作了展望。     

Double sinusoidal phase modulating laser diode interferometer for thickness measurements of transparent plates

A double sinusoidal phase modulating (SPM) laser diode interferometer for thickness measurements of a transparent plate is presented. A carrier signal is given to the interference signal by using a piezoelectric transducer, and the SPM interferometry is applied to measure the thickness of a transparent plate. By combining the double-modulation technique with the Bessel function ratio method, the measurement error originating from light intensity fluctuations caused by the modulation current can be decreased greatly.The thicknesses of a glass parallel plate and a quartz glass are measured in real time, and the corresponding experimental results are also given.     

纳米精度外差干涉仪非线性漂移的研究

在纳米精度外差干涉仪中，由于非线性温度漂移，成为外差干涉仪实现纳米精度测量的重要误差源。本文对差动干涉仪的理论分析得出如下的结论，干涉仪中除了测量光路和参考光路以外，还存在参考光误差分量和测量光误差分量的额外光路，从而引和了干涉混叠，产生非线性漂移：１／４波片的相位延迟量误差和安装是引入非线性漂移的主要因素，其影响程度是一阶的，提高波片对加工精度，并尽量减少其级数可降低非线性漂移。     

Aperiodic interferometer for six degrees of freedom position measurement

We present a new class of interferometer system that is capable of simultaneous measurement of absolute position and rotation in all six degrees of freedom (DOF) with nanometer precision. This novel capability is due to the employment of a system of interference fringes that is not periodic. One of the key strengths offered by this new approach is that the absolute position of the system can be determined with a single measurement, rather than by counting fringes during displacement from a known location. The availability of a simultaneous measurement of all six DOF eliminates many problems associated with conventional interferometry.     

New Laser Interferometer with OPD Multiplication for Nanometer Measurement

1lntfortionLaserinterferometersarewidelyadoPtedinthefieldsoflengthmeasurementandtheyaredevtheingveryqulcklyintheseyears.RecentdevefoPment0fnanornetr0lDyhasputincreaseddemandsonthepedrianceofthelaserinterferomters,suchasstability,reS0utionandmeasuretnentaccuray.Bothdomesticandinternatdriallaserinterferometerswithhighaccuracy,esPeciaIlywithnanOInetricaccuracy,arelindtedtobewidelyaPpliedandcomrnerciahaedondifferentdegreebecauseofthesarneproblemi.e.thehighrequlrementformeasurementconditbo.Thea…     

New Laser Interferometer with OPD Multiplication for Nanometer Measurement

By using coupled differential interferometry a new laser displacement measurement interferometer with nanometric accuracy has been developed. The resolution and the stability of the interferometer are improved by multiplicating the optical path difference (OPD). The new interferometer is simple in concept,symmetric in optical paths,without optical deadpath,easy to set up and align. λ/1600 resolution and nanometric accuracy are achieved within the measurement range of 10 mm.     

外差干涉仪中声光调制器特性对测量精度的影响

提出并论证了混合型声光调制器衍射光的衍射级次混叠特性, 它使衍射光强中存在着驱动频率的谐波项, 此外入射光束的漂移将引起衍射光的频率漂移。分析了在外差干涉仪中应用它们对测量精度的影响, 提出了消除这些因素影响的方法： 利用双声光调制器外差干涉, 并在干涉仪的内部提取测量的参考信号。用双声光调制器的外差干涉仪可以实现纳米测量。