InSb/CdTe heterostructures grown by MBE

InSb/CdTe heterostructures were grown by MBE, including a 10 layer superlattice. The structures were characterized by X-ray diffraction, van der Pauw measurements, and SNMS depth profiling. The interfaces widen because of interdiffusion and through the formation of an interface compound from the reaction of Te with the InSb surface. The interface compound is identified as strained InTe(II). The interfaces are still too wide for practical devices. Thermochemical analysis indicates that the reaction can be suppressed by applying a Cd overpressure. The diffusion of In and Sb in CdTe is very fast and will necessitate a MEE growth scheme at lower temperatures.     

缓冲层对InSb/GaAs薄膜质量的影响

InSb是制作3~5μm红外探测器的重要材料。在GaAs衬底上外延生长InSb,存在的主要问题在于两种材料间14.6%的晶格失配度,会引入较大的表面粗糙度以及位错密度,使外延材料的结构和电学性能均会受到不同程度的影响。通过系列实验,研究了在生长过程中缓冲层对薄膜质量的影响。利用高能电子衍射仪(RHHEED)得到了合适的生长速率和Ⅴ/Ⅲ比,研究了异质外延InSb薄膜生长中低温InSb缓冲层对材料生长质量以及不同外延厚度对材料电学性质的影响。采用原子力显微镜(AFM)、透射电子显微镜(TEM)、X射线双晶衍射(DCXRD)等方法研究了InSb/GaAs薄膜的表面形貌、界面特性以及结晶质量。通过生长合适厚度的缓冲层,获得了室温下DCXRD半高峰宽为172″,77 K下迁移率为64300 cm²·V^-1·s^-1的InSb外延层。     

Interface effect on superlattice quality and optical properties of InAs/GaSb type-II superlattices grown by molecular beam epitaxy

We systematically investigate the influence of InSb interface (IF) engineering on the crystal quality and optical properties of strain-balanced InAs/GaSb type-II superlattices (T2SLs). The type-II superlattice structure is 120 periods InAs (8 ML)/GaSb (6 ML) with different thicknesses of InSb interface grown by molecular beam epitaxy (MBE). The high-resolution x-ray diffraction (XRD) curves display sharp satellite peaks, and the narrow full width at half maximum (FWHM) of the 0th is only 30-39 arcsec. From high-resolution cross-sectional transmission electron microscopy (HRTEM) characterization, the InSb heterointerfaces and the clear spatial separation between the InAs and GaSb layers can be more intuitively distinguished. As the InSb interface thickness increases, the compressive strain increases, and the surface "bright spots" appear to be more apparent from the atomic force microscopy (AFM) results. Also, photoluminescence (PL) measurements verify that, with the increase in the strain, the bandgap of the superlattice narrows. By optimizing the InSb interface, a high-quality crystal with a well-defined surface and interface is obtained with a PL wavelength of 4.78 μ, which can be used for mid-wave infrared (MWIR) detection.     

First-principles study of interface relaxation effect on interface and electronic structures of InAs/GaSb superlattices with different interface types

We have implemented first-principles relativistic pseudopotential calculations within general gradient approximation to investigate the structural and electronic properties of quaternary InAs/GaSb superlattices with an InSb or GaAs type of interface. Because of the complexity and low symmetry of the quaternary interfaces, the interface energy and strain in the InAs/GaSb superlattice system have been calculated to determine the equilibrium interface structural parameters. The band structures of InAs/GaSb superlattices with InSb and GaAs interfaces have been calculated with respect to the lattice constant and atomic position relaxations of the superlattice interfaces. The calculation of the relativistic Hartree–Fock pseudopotential in local density approximation has also been performed to verify the calculated band structure results that have been predicted in other empirical theories. The calculated band structures of InAs/GaSb superlattices with different types of interface (InSb or GaAs) have been systematically compared. We find that the virtual–crystal approximation fails to properly describe the quaternary InAs/GaSb superlattice system, and the chemical bonding and ionicity of anion atoms are essential in determining the interface and electronic structures of InAs/GaSb superlattice system.     

Effect of Ga alloying on thermoelectric properties of InSb

As a potential thermoelectric (TE) material, the high lattice thermal conductivity and relatively low weighted mobility severely limit TE property optimization of InSb binary compound. In this paper, we substituted In of InSb with Ga and systematically investigated the effect of Ga alloying on the Seebeck coefficient, electrical conductivity and lattice thermal conductivity of InSb between 300 K and 770 K. We found that Ga alloying simultaneously reduced the lattice thermal conductivity and optimized the weighted mobility of InSb. The lattice thermal conductivity has been analyzed using Abeles model to gain more insight on the roles of Ga in In_1-xGa_xSb(x = 0, 0.1, 0.15, 0.2) solid solution. The synergetic effect of Ga alloying on the electron and phonon transport leads to a marked enhancement in TE potential of InSb. The dimensionless figures of merit of InSb and In_0.8Ga_0.2Sb reach, respectively, 0.54 and 0.52 at 770 K.     

Raman study of interface modes in GaSb/InAs superlattices with controlled interface composition

We have performed a Raman scattering study of GaSb/InAs superlattices grown by MOVPE using different gas switching sequences to control the interface type. The identification of an InSb interface mode, clearly resolved already at room temperature, has been revised. A strongly localised GaAs-like interface mode has been used for the first time to characterise sequentially grown interfaces in an independent and selective way.     

第一原理研究界面弛豫对InAs/GaSb超晶格界面结构、能带结构和光学性质的影响

通过广义梯度近似的第一原理全电子相对论计算, 研究了不同界面类型InAs/GaSb超晶格的界面结构、电子和光吸收特性. 由于四原子界面的复杂性和低对称性, 通过对InAs/GaSb超晶格进行电子总能量和应力最小化来确定弛豫界面的结构参数. 计算了InSb, GaAs型界面和非特殊界面(二者交替)超晶格的能带结构和光吸收谱, 考察了超晶格界面层原子发生弛豫的影响.为了证实能带结构的计算结果, 用局域密度近似和Hartree-Fock泛函的平面波方法进行了计算. 对不同界面类型InAs/GaSb超晶格的能带结构计算结果进行了比较, 发现界面Sb原子的化学键和离子性对InAs/GaSb超晶格的界面结构、 能带结构和光学特性起着至关重要的作用.     

Synthesis experiments on in-Sb and B-Sb systems in a laser heated diamond-anvil cell

Abstract

High pressure and high temperature synthesis experiments were carried out on In-Sb and B-Sb systems with a laser heated diamond-anvil cell. InSb was synthesized starting from In and Sb at various pressures ranging from 0.2 to 10 GPa. The cubic as well as the high pressure phases were successfully synthesized. Experiments above 8 GPa, wherein antimony exists in the tetragonal phase, have revealed no new phases of InSb. Trials of synthesizing a compound from B and Sb gave negative result to at least 30 GPa.     

强磁场中晶体生长研究

设计和制造了一套垂直渐冷设备以研究强磁场中的晶体生长,在强磁场和无磁场下,测量了掺碲InSb熔体及其上方的温度分布;生长了低GaSh组分的InGaSb和掺碲InSb晶体.实验表明,8.00T的强磁场能改善InGaSb混晶的质最和提高InSb晶体中Te杂质轴向分布的均匀性.分析认为,这些结果是强磁场提高流体的稳定性和降低对流的速度所致. 关键词：     

Interface of anodic sulfide-oxide on n-type InSb

A novel anodic sulfidization process for forming native sulfide-oxide films on n-type InSb is described. The results of Auger electron spectroscopy analysis indicate that native sulfide-oxide films are formed from aqueous sulfide solutions. The measured capacitance-voltage characteristics of metal-insulator-semiconductor devices indicate that the films have a low fixed surface charge density of the order of 3×10¹⁰ cm^–2 and small hysteresis. The native sulfide-oxide films leave the surface of n-type InSb practically at flatband and in this respect are superior to the passivation layers of anodic oxide and direct plasma SiN _x . The interface between InSb and its native sulfide-oxide in combination with plasma CVD SiN _x has excellent electrical properties.     

InSb-TiOPc interfaces: Band alignment, ordering and structure dependent HOMO splitting

Thin films of titanyl phthalocyanine (TiOPc) have been adsorbed on InSb(1 1 1) (3 × 3) and InSb(1 0 0) c(8 × 2) surfaces and studied with respect to their electronic structure using photoemission (PES), density functional theory (DFT) and scanning tunneling microscopy (STM). The interface chemical interaction is weak in both cases; no adsorbate induced surface band bending is observed and the energy level alignment across the interface is determined by the original position of the substrate Fermi level and the charge neutrality level of the molecule.Room temperature adsorption results in disordered films on both surfaces. The behaviors after annealing are different; on InSb(1 0 0) well-ordered molecular chains form along and on top of the In-rows, whereas on (1 1 1) no long range order is observed. The disorder leads to intermolecular interactions between the titanyl group and neighboring benzene rings leading to a split of TiOPc HOMO (highest occupied molecular orbital) by as much as 0.8 eV.     

Field induced interlayer interband coupled states in aperiodic InAs/GaSb heterostructures

The interlayer interband state coupling and the interfacial composition effect in aperiodic InAs/GaSb (001) heterostructures are studied with the scattering theoretic Green's function technique, which can handle interlayer multi-subband interaction under the external bias. The current density calculation shows that the interlayer interband coupled subbands enhance the peak current density by facilitating electron resonant tunneling. The calculated spectral local density of states of a heterostructure predicts that the GaAs interface shifts the energies of the quasibound states to lower energies than those of the InSb interface case, which agrees with experimental results.     

Me-PTCDI thin film deposition on InSb(1 1 1)A

The evolution of N,N′-dimethylperylene-3,4,9,10-dicarboxyimide (Me-PTCDI) thin films formed by vapour deposition on InSb(1 1 1)A substrates has been studied by X-ray photoelectron spectroscopy (XPS), high-resolution electron energy loss spectroscopy (HREELS) and low energy electron diffraction (LEED). XPS studies of the Me-PTCDI covered surface indicate that no significant interaction occurs at sub-monolayer coverage when compared to multilayer Me-PTCDI films. HREELS studies suggest only a weak interaction as evidenced by very small changes in the frequencies of several molecular vibrational modes. LEED patterns show the Me-PTCDI overlayer adopts a structure commensurate with the underlying InSb(1 1 1)A substrate surface and that can be rationalised by van der Waals intermolecular energy calculations for the Me-PTCDI unit cell. The results are consistent with a weak interaction at the Me-PTCDI/InSb interface, the formation of the commensurate structure being sufficient to overcome the small energetic penalty associated with deviation from the calculated intermolecular interaction energy minimum.     

Melting properties of group-V elements and InSb

Summary In this paper, we study the structural properties of liquid group-V elements (and a compound InSb) and we analyse the differences with their room temperature crystalline phases. Neutron diffraction experiments are performed using short-wavelength neutrons (0.7 ?). We show different melting behaviours of a light element (As) and a heavy element (Sb) under study. Whereas As keeps its coordination three upon melting, Sb is six-coordinated in the melt. Similarly, InSb has a coordination number increasing from 4 to about 6 upon melting. Large entropies of melting are related to important structural variations. Paper presented at the workshop ?Highlights on Simple Liquids?, held in Turin at ISI on 1–3 May, 1989.     

The linear dispersion coefficient of surface magnetoplasmons

The dispersion of surface magnetoplasmons supported on a semiconductor-vacuum interface which is normal to an applied magnetic field is investigated. It is assumed that the surface possesses a depletion layer and that the dispersion is of hydrodynamic origin. Dimensionless numerical results are obtained for the magnetic field dependence of the linear dispersion coefficient with special reference being given to n-type InSb.     

Effects of In and Sb mono-layers to form rotated InSb films on a Si(1 1 1) substrate

A new method for InSb heteroepitaxial growth on a Si substrate was introduced in our previous work, in which an InSb film was formed via an InSb bi-layer. In the present work, to study the effects of In and Sb individual layers on the InSb film quality, InSb was deposited onto an InSb bi-layer, In mono-layer, and Sb mono-layer on a Si substrate. It was found that both In and Sb layers (in other words, InSb bi-layer) were essential to form a fine InSb film.     

Study on thermal effects of InSb infrared focal plane arrays irradiated by pulsed laser

To learn thermal effects of InSb infrared focal plane arrays (IRFPAs) detector irradiated by pulsed laser, basing on ANSYS software, and considering temperature dependent thermal parameters of InSb, a three dimensional temperature field analysis model of InSb IRFPAs detector by 1064 nm Gauss laser irradiation is built. The characteristics of temperature rise and temperature distribution in InSb IRFPAs detector are studied. The results show that the maximum temperature always occurs in InSb chip, locating at the top layer of InSb IRFPAs detector, the temperature rises in each layer are different, and the temperature distribution in InSb IRFPAs detector is quite different from that in single-layer material. The temperature distribution of InSb chip in InSb IRFPAs reduces from center to outside, while it shows not a smooth decrease, but a concentric-ringed ripple decrease with non-consecutive high temperature extremum regions. The temperature distribution patterns in underfill, Si readout integrated circuits are similar to that in InSb chip, but the discontinuous high temperature areas in InSb chip, underfill locate at the regions between indium bumps, and the discontinuous high temperature areas in Si readout integrated circuits locate at the contact area with indium bumps. This different temperature distribution phenomenon in each material is mainly due to its multi-layer architecture and quite different thermal properties of the middle layer, which is an interlacing layout of underfill and indium bumps. Besides, the influences of indium bump structure size on the temperature rise are also discussed. All these results qualitatively reflect the disciplines of temperature rise in InSb IRFPAs detector, providing a theory support for thermal analysis of detectors irradiated by laser.     

液氮冲击中锑化铟焦平面探测器形变研究

液氮冲击中锑化铟红外焦平面探测器(InSb IRFPAs)的形变研究对理解探测器结构设计可靠性、预测探测器耐冲击寿命具有重要意义.在系统分析液氮冲击结束时模拟得到的InSb IRFPAs形变分布与方向的基础上,提出了降温过程中累积热应变完全弛豫的设想,升至室温后的模拟结果重现了室温下拍摄的InSb IRFPAs典型形变分布特征.经分析认为室温下拍摄的InSb IRFPAs表面屈曲变形源于底充胶固化中引入的残余应力应变,变形幅度随降温过程逐步减弱,至77 K时完全消失,升温过程则依据弹性变形规律复现典型棋盘格屈曲模式.这为后续InSb IRFPAs结构设计、优化及耐冲击寿命预测提供了理论分析基础.     

Sputtering of solid argon by keV electrons

Thermochemical maskless etching of compound semiconductors (GaAs, InP, InSb, and GaP) has been performed by focused Ar-laser irradiation in chloride gas atmospheres. A controlled minimum linewidth of down to 0.6 m with a maximum etching rate of up to 13 m/s has been obtained. Minimum laser powers necessary for thermochemical etching in each of compound semiconductors were found to be 0.24, 0.56, and 0.06 W, corresponding to minimum local temperature rises of 190, 515, and 110°C for GaAs, InP, and InSb, respectively. Etching rates exhibited Arrhenius behavior with activation energies of 3.6–3.9 kcal/mole. Etching at excessively higher laser powers than those minimum powers was found, by microprobe photoluminescence measurements, to degrade the optical quality of the etched substrate.     

MBE-grown InSb photodetector arrays

The MBE method has been applied to grow InSb layers on InSb substrates. These layers have served as a basis for fabricating mid-wave IR photodetector arrays. The characteristics of photodetector arrays on epitaxial InSb layers have been compared with those of series-produced single-crystal InSb arrays.