An Investigation of the Temporal Dark-Image-Sticking Phenomenon in an AC Plasma Display Panel With an Auxiliary Electrode

In this paper, the temporal dark-image-sticking phenomenon in an ac plasma display panel (PDP) with an auxiliary electrode is investigated. To investigate this phenomenon, temporal behaviors of a black background image were observed in accordance with the sustain-discharge time and the relaxation time. Since dark image sticking is related to the reset discharge, our measurements focused on the reset period. In the case of an ac PDP with three electrodes, iterant sustain discharges induced an increase in black luminance, thereby leaving a residual image. However, in the case of an ac PDP with an auxiliary electrode, there was no variation of luminance between the states before and after the iterant sustain discharges. As a result, no residual image remained, and no distortion of the image could be recognized with the human eye, even after iterant sustain discharges.      

ASAP模拟变焦系统中鬼像的研究

 非成像光束在光学系统内表面的多次折射反射容易在像面附近形成光晕或鬼像,变焦系统由于镜片多,机构复杂等往往难以进行全面的分析模拟。利用ASAP软件模拟每个透射面作为部分透射、部分反射的表面,对变焦光学系统非轴上光进行分析,模拟出变焦系统的光学元件表面和光机内壁,实行实际光线追迹,然后以像面为研究对象,进一步实施实际光线追迹,模拟出全部散射光在像面上的能量分布,找出鬼像形成的原因,并在此基础上通过改变二次反射所在面的曲率或改变所在面的折射率两种方法对变焦光学系统进行优化,减小鬼点数目,以提高系统的成像质量。     

Rigorous transmittance analysis of a sub-wavelength Sb thin film lens

We quantitatively analysed the factors contributing to the optical transmission enhancement of a sub-wavelength Sb thin film lens, using the finite-difference time-domain (FDTD) method. The results show that the transmission enhancement of the dielectric with a Gaussian distributed refractive index loaded in a sub-wavelength circular hole is not only due to the high refractive index dielectric, but also due to the specific distributions of refractive index. It is the first study about the effects of the refractive index distribution on the transmission of a sub-wavelength aperture. This kind of lens has practical applications in the very small aperture lasers and for near-field optical storage and lithography. PACS 42.79.Ag; 42.25.Bs; 42.25.Fx     

Contrast reversal and enhancement of phase spot array/grid with an intensity-dependent refractive index medium as phase filter

We report on a complete contrast reversal and contrast enhancement of a holographically recorded phase spot array/grid achieved by phase filtering, using an intensity-dependent refractive index medium, zinc tetraphenyl porphyrin as phase filter placed in the Fourier plane of the 4-f imaging system. We show that the contrast enhancement is robust and insensitive to local errors in the phase array and can be used to repair a damaged portion of the input phase array.     

连续照明时成像对比度与气象条件的关系

 通过同轴激光连续照明成像模型分析了大气后向散射对成像对比度的影响，得出了考虑散射因素时成像对比度的计算公式。基于不同气象条件下大气粒子散射特点，讨论了霾和雾两种不同天气时成像对比度随照明距离的变化规律，并与实验结果进行了对比，计算结果与实验吻合较好。     

光子晶体中基于有效折射率接近零的光束准直出射

利用平面波展开法(PWM)和时域有限差分法(FDTD)研究了二维正方格子光子晶体靠近禁带边沿附近频率光波的传输特性.研究发现,若有效折射率接近于零,可出现光束从晶体表面准直出射的现象,且光束的出射方向只与晶体表面的取向有关,而与晶格取向无关.这种现象与自准直现象有很大不同.     

锗在吸收边附近的压力—折射率系数

目前半导体锗在吸收边附近(1550 nm)的压力-折射率系数在实验和理论上并未研究清楚.本文通过测量在不同压力下镀在光纤端面的高结晶度锗薄膜的反射率,来计算得到锗在吸收边附近的压力-折射率系数.本文的实验结果显示,锗在吸收边附近出现反常色散现象,即折射率随能量变化呈正相关,并且其压力-折射率系数出现反常,为正值,这是由于多晶结构中的激子吸收所引起.通过引入描述激子色散的临界点模型,得到锗在吸收边附近的反常色散范围和压力-折射率系数呈正值的范围.本文的结果将有助于基于锗薄膜的通信C波段光学器件的研究.     

内掩式透射地基日冕仪中杂光鬼像的消除

为了消除杂散光对日冕仪成像质量的影响,分析了工作波段为530～555 nm的内掩式透射地基日冕仪（其视场为±1.1～3R⊙,分辨率为13.5μm,口径为120 mm,系统F数为8.2）物镜的多次反射形成的鬼像。基于鬼像形成原理,完成建模模拟,提出了结构性遮拦措施,并通过实验论证了遮拦结构对鬼像有良好的遮拦效果,同时验证了鬼像的光强和物镜边缘衍射光基本一致。实验还显示：鬼像的尺寸和模拟基本一致,直径均约为0.9 mm。消除鬼像后,内掩式透射日冕仪消杂光能力和成像质量进一步提高,实现了对日冕的有效观测。     

表面等离子体无掩膜干涉光刻系统的数值分析

表面等离子体激元具有近场增强效应,可以代替光子作为曝光源形成纳米级特征尺寸的图像.本文数值分析了棱镜辅助表面等离子体干涉系统的参量空间,并给出了计算原理和方法.结果表明,适当地选择高折射率棱镜、低银层厚度、入射波长和光刻胶折射率,可以获得高曝光度、高对比度的干涉图像.入射波长为431 nm时,选择40 nm厚的银层,曝光深度可达200 nm,条纹周期为110 nm.数值分析结果为实验的安排提供了理论支持.     

表面等离子体无掩膜干涉光刻系统的数值分析(英文)

表面等离子体激元具有近场增强效应,可以代替光子作为曝光源形成纳米级特征尺寸的图像.本文数值分析了棱镜辅助表面等离子体干涉系统的参量空间,并给出了计算原理和方法.结果表明,适当地选择高折射率棱镜、低银层厚度、入射波长和光刻胶折射率,可以获得高曝光度、高对比度的干涉图像.入射波长为431nm时,选择40nm厚的银层,曝光深度可达200nm,条纹周期为110nm.数值分析结果为实验的安排提供了理论支持.     

Cs^＋-K^＋ Exchange in Z-Cut KTiOPO4 Crystal Covered with Chromium Masking Layer

Cs^＋-K^＋ ion exchanges are performed on z-cut KTiOPO4 crystals with chromium coating covered. The temperature of ion exchange is 430℃, and the time range from 15min to 30min. The dark mode spectra of the samples are measured by the prism coupling method. The channel structures on the samples are observed by a microscope and the near field pattern of the channel waveguides are measured by the end-fire coupling method. The refractive index of the samples increases and the increments at surface are modulated due to the existence of Cr film. In the region covered by Cr film, the refractive index of the samples at the surface increases dramatically in a shallow layer. The results of energy dispersive x-ray spectra indicate that in the region covered with Cr film, Cr ions participate in the ion exchange process, and enhance the refractive index. The results may provide a possibility that achieves index enhancement and Cr doping synchronically.     

双像法测液体的折射率

在分光计上测量液膜和空气膜两狭缝像间的夹角,再测出液膜的楔角,由折射定律求出液体的折射率。     

非晶态As2S8半导体薄膜的光致结构变化效应研究

实验研究了非晶态As2S8半导体薄膜在光照、退火-光照和退火-光照-退火-光照关连作用下的光折变效应及淀积态与退火态两种膜系光致体积变化现象.采用棱镜耦合技术、Raman光谱和X线衍射测试技术,确认了As2S8薄膜经紫外光辐照后薄膜密度增高、折射率增大的现象.实验表明,淀积态As2S8薄膜经紫外光照后,折射率变化的最大增量可达到0.06,而退火态As2S8薄膜经紫外光照射后,其折射率最大变化比前者要小一个数量级,约为0.005 7.淀积态和退火态两种膜系紫外光照后,体积缩小,这与As2S3非晶态薄膜的情况不同,体积变化率分别为－3.5%和－2.1%.实验还显示,退火态的As2S8薄膜存在折射率完全可逆现象.     

Anisotropy of optical constants of ZnSe/BeTe heterostructures with no common atoms at the interfaces

The in-plane anisotropy of the refractive index and absorption coefficient in the blue-green spectral region in ZnSe/BeTe type-II heterostructures with no common atoms at the interface has been studied by ellipsometry in reflection. It was established that the relative difference (anisotropy) in the refractive index and absorption coefficient remains nonzero throughout the range covered and reaches 0.6% for the refractive index and 85% for the absorption coefficient. It was found that, in contrast to excitonic transitions involving a heavy hole, the anisotropy in absorption for the light-hole exciton is larger in magnitude and is of the opposite sign.     

Design of Highly Sensitive Surface Plasmon Resonance Sensors Using Planar Metallic Films Closely Coupled to Nanogratings

We investigate the sensitivity enhancement of surface plasmon resonance （SPR） sensors using planar metallic films closely coupled to nanogratings. The strong coupling between localized surface plasmon resonances （LSPRs） presenting in metallic nanostructures and surface plasmon polaritons （SPPs） propagating at the metallic film surface leads to changes of resonance reflection properties, resulting in enhanced sensitivity of SPR sensors. The effects of thickness of the metallic films, grating period and metal materials on the refractive index sensitivity of the device are investigated. The refractive index sensitivity of nanograting-based SPR sensors is predicted to be about 543 nm/RIU （refractive index unit） using optimized structure parameters. Our study on SPR sensors using planar metallic films closely coupled to nanogratings demonstrates the potential for significant improvement in refractive index sensitivity.     

Ghost imaging with white light speckle patterns

In this paper we describe a method to study the formation of a ghost image by using a simplified setup. A spatial light modulator (SLM) working in amplitude regime is used both to display the object and the intensity distribution that provides the high-spatially correlated beams which are the base of this phenomenon. We compare the recovered ghost image with that obtained by using pseudothermal light. Moreover we show that good quality images are also retrieved when a turbulent media is present.     

膜层渗透产生短波通截止滤光片半波孔现象的分析

半波孔现象的出现会极大地影响短波通截止滤光片的光谱性能,已有文献报道膜料色散、膜层折射率非均匀性以及膜厚控制误差积累等是产生半波孔现象的几个可能因素。本文通过模拟计算发现膜层间的相互渗透也是产生半波孔现象的重要原因之一,分析表明不同的渗透模式对半波孔现象的形成及大小具有不同的影响。     

高折射玻璃微珠粒径与折射率关系的研究

利用激光照射高折射率玻璃微珠下形成的二次彩虹现象,以艾里的虹理论为基础对玻璃微珠折射率进行了测量。推导了玻璃微珠尺寸对折射率影响的计算公式,表明半径差异在10μm时,折射率的测量误差为10^-3数量级。此外,通过软件模拟计算玻璃微珠的二次彩虹现象,并对微珠的折射率进行了测量,验证了二次彩虹方法的正确性,同时也表明玻璃微...     

The noise analysis of ghost imaging in transparent liquid

Ghost imaging with a fully spatially incoherent source in transparent liquid is investigated theoretically and numerically. The effects of water depth, refractive index of media and object position on noise property of ghost imaging in transparent liquid are studied by using classical optical theory. Based on simulation results, we find that for different media, ghost imaging with high quality can be obtained by selecting appropriate water depth and object position which may be helpful for underwater ghost imaging.     

镀高折射率纳米膜的长周期光纤光栅特性研究

针对镀高折射率纳米膜的长周期光栅,建立了传感理论模型,研究了长周期光栅的谐振波长与纳米膜厚度及外界折射率的关系,给出不同纳米膜厚度下长周期光栅不同包层模式重组特性.研究发现,当长周期光栅外面镀上一层沿角向均匀分布的纳米膜时,随着膜厚变化会出现包层模分布的明显调制;适当选择镀膜参数和外界介质折射率,最低次包层模式HE1,2会成为镀膜层中的导模,其他的包层模式将会发生模式转换现象;对于较低次包层模式(如HE1.6),在模式转换的时候存在两步转换,而高次的包层模只有一步转换(如HE1.14).同时给出了包层模式转换对外界折射率响应的关系:当膜层厚度增加时,长周期光栅模式转换现象移至低折射率区域.