用蒙特卡罗法计算X射线在重金属界面的剂量增强系数

当X射线射入不同材料组成的界面时,在低Z材料的一侧将产生剂量增强.介绍了界面剂量增强效应的基本原理,并用蒙特-卡洛程序计算了钨-硅、钽-硅、钨-二氧化硅和钽-二氧化硅界面的剂量增强系数. 关键词： X射线 界面 辐射损伤 剂量增强系数     

X射线在金-硅界面剂量增强系数与金和硅厚度关系的模拟研究

用蒙特卡罗(Monte Carlo)方法计算不同能量的X射线在金-硅(Au-Si)界面处中产生的剂量增强系数（DEF）与金(Au)和硅(Si)厚度的关系.结果表明：界面一侧Si中的DEF与Au和Si的厚度有关。当Au厚度分别取1μm、2μm、4μm、8μm时,界面处最大剂量增强系数分别为：19.78、24.78、24.78、32.3,界面处的DEF随Au厚度的增加而增大;当Si厚度分别取1μm、2μm、4μm、8μm时,界面处最大剂量增强系数分别为：24.5、25.91、27.84、30.09,界面处的DEF随Si厚度的增加而增大.并且研究了Au为2μm、4μm时界面下不同位置处的DEF随能量的变化关系,界面处的DEF最大,离界面越远剂量增强效应越小.     

X射线在金-硅界面剂量增强系数与金和硅厚度关系的模拟研究

用蒙特卡罗(Monte Carlo)方法计算不同能量的X射线在金-硅(Au-Si)界面处中产生的剂量增强系数（DEF）与金(Au)和硅(Si)厚度的关系.结果表明：界面一侧Si中的DEF与Au和Si的厚度有关。当Au厚度分别取1μm、2μm、4μm、8μm时,界面处最大剂量增强系数分别为：19.78、24.78、24.78、32.3,界面处的DEF随Au厚度的增加而增大;当Si厚度分别取1μm、2μm、4μm、8μm时,界面处最大剂量增强系数分别为：24.5、25.91、27.84、30.09,界面处的DEF随Si厚度的增加而增大.并且研究了Au为2μm、4μm时界面下不同位置处的DEF随能量的变化关系,界面处的DEF最大,离界面越远剂量增强效应越小.     

多层平板电离室测量不同材料界面剂量分布及其蒙特-卡洛模拟

研究设计了多层平板铝电离室.用该电离室测量了30—100keV宽谱同步辐射X射线在Kovar/Au/Al,Pb/Al,Ta/Al界面附近的辐射剂量梯度分布,给出了不同材料界面剂量增强因子(dose enhancement fctor)(DEF).理论上用蒙特卡洛粒子输运方法模拟计算了实测模型下的不同材料的界面剂量增强因子,实验结果与理论模拟符合很好.为研究不同材料的剂量增强提供了理论和实验手段 关键词： 多层平板电离室 剂量增强 蒙特卡-洛模拟     

同步辐射X射线源的剂量增强效应实验研究

设计了多层平板铝电离室,利用北京同步辐射装置BSRF产生的30—100keV同步辐射硬X射线,测量了不同材料界面Kovar/Au/Al,Pb/Al,Ta/Al的辐射剂量梯度分布,给出了不同材料界面剂量增强因子DEF.在该装置上同时开展了硬X射线辐照引起的CMOS器件4069的剂量增强效应RDEF研究.采用双层膜结构,通过实验给出辐照敏感参数随总剂量的变化关系,从而给出器件损伤增强因子.这些方法为器件抗硬X射线辐射加固技术研究提供了实验技术手段.     

银/二氧化硅复合材料对硝酸钠红外吸收光谱特性影响

对海洋营养盐进行快速检测是海洋污染监控中的一项重要任务。测量了硝酸钠溶液蒸发过程中的红外光谱,发现表面增强红外光谱法在营养盐的快速检测中有重要的应用价值。采用Stober方法制备了二氧化硅纳米颗粒,然后采用银氨溶液与二氧化硅溶液混合的方法制备银/二氧化硅(Ag/SiO₂)复合材料,并利用扫描电镜(SEM)、X射线衍射(XRD)以及紫外-可见(UV-Visible)吸收光谱对其进行表征。研究了硝酸钠水溶液干燥过程中Ag/SiO₂复合材料对硝酸钠红外吸收光谱的影响,结果表明硝酸根反对称伸缩振动吸收峰的吸收强度得到增强,这可能来自Ag/SiO₂薄膜材料的界面效应。     

稳态、瞬态X射线辐照引起的互补性金属-氧化物-半导体器件剂量增强效应研究

重点开展了稳态、瞬态X射线辐照引起的金属氧化物半导体(CMOS)器件剂量增强效应relative dose enhancement effect(RDEF)研究.通过实验给出辐照敏感参数随总剂量的变化关系,旨在建立CMOS器件相同累积剂量时Χ射线辐照和γ射线辐照的总剂量效应损伤等效关系.在脉冲X射线源dense plasma focus(DPF)装置上,采用双层膜结构开展瞬态翻转增强效应研究,获得了瞬态翻转剂量增强因子.这些方法为器件抗X射线辐照加固技术研究提供了实验技术手段. 关键词： X射线 剂量增强因子 总剂量效应 剂量率效应     

强脉冲X射线辐照在Si-SiO2中感生的界面态及退火消除

 利用强脉冲X射线对Si-SiO₂界面进行了辐照，测量了界面态曲线和退火曲线。实验显示，经过强脉冲X射线对Si-SiO₂界面进行的辐照，在Si-SiO₂界面感生出新的界面态，感生界面态的增加与辐照剂量成正比，并且易出现饱和现象。总结出了感生界面态密度产额Dit随辐照剂量D变化的分布式，并定性分析了Dit随D变化的行为。随后进行的退火实验表明，强脉冲X射线辐照感生出的界面态越多，退火时这些界面态就消除得越快。退火过程显示有滞后现象，即辐照剂量大的阈电压漂移，在退火后恢复的绝对值，要小于辐照剂量小的阈电压漂移。导出了阈电压漂移随退火时间变化的关系，定性解释了滞后现象。     

X射线烧蚀泡沫-固体靶增压机理研究

X射线烧蚀泡沫-固体靶时界面失配会使得泡沫与固体靶中压力增加, 这一现象可用于研究高压下物质的状态方程. 本文以CH泡沫-Al固体靶为例, 研究了X射线烧蚀双层靶时的增压现象. 提出仅当泡沫中有冲击波产生时, 在固体靶中才会有增压现象出现. 文中基于冲击波强波近似, 理论分析了冲击波过界面情况与冲击波、稀疏波作用过程, 得到增压倍数与材料密度, 多方气体指数的近似表达式. 同时表明固体靶中增压产生的冲击波为高压脉冲, 会被紧跟热波的稀疏波追赶并稀疏. MULTI一维计算结果验证了该结论.     

55 nm硅-氧化硅-氮化硅-氧化硅-硅闪存单元的γ射线和X射线电离总剂量效应研究

基于~(60)Co-γ射线和10 keV X射线辐射源,系统地研究了55 nm硅-氧化硅-氮化硅-氧化硅-硅闪存单元的电离总剂量效应,并特别关注其电学特性退化的规律与物理机制.总剂量辐照引起闪存单元I-V特性曲线漂移、存储窗口变小和静态电流增大等电学特性的退化现象,并对其数据保持能力产生影响.编程态闪存单元的I_d-V_g曲线在辐照后显著负向漂移,而擦除态负向漂移幅度较小.对比两种射线辐照,擦除态的I_d-V_g曲线漂移方向不同.相比于擦除态,富含存储电子的编程态对总剂量辐照更为敏感;且相比于~(60)Co-γ射线,本文观测到了显著的X射线剂量增强效应.利用TCAD和Geant 4工具,从能带理论详细讨论了55 nm硅-氧化硅-氮化硅-氧化硅-硅闪存单元电离总剂量效应和损伤的物理机制,并模拟和深入分析了X射线的剂量增强效应.     

Nanosized Particles of Tantalum,Hafnium, and Cerium Oxides Used with Monochromatic Photon Beams and Brachytherapy Sources

High-Z nanoparticles can increase the absorbed radiation dose if they are accumulated in tumor cells. The quantitative measure of this radiosensitization effect is the dose enhancement factor (DEF), that is, the ratio of the doses absorbed in the presence and in the absence of nanoparticles. In the present work, the values of the dose enhancement factors of Ta₂O₅, HfO₂, and CeO₂ ceramic nanoparticles were calculated analytically for monochromatic radiation of the X-ray energy range (1–180 keV) and for low-energy sources for brachytherapy: ¹⁰³Pd (mean energy, 20.6 keV), ¹²⁵I (26.7 keV), and ¹³¹Cs (30.4 keV). For all types of nanoparticles in the concentration of 5 mg/mL, the values of the dose enhancement factor were high both for monochromatic radiation and for brachytherapy sources. The highest DEF values of ~1.7 were obtained for nanoparticles of tantalum oxide. For brachytherapy sources, the highest dose enhancement factors (1.48 to 1.67) were obtained for Ta₂O₅ and HfO₂ nanoparticles. These results confirm that ceramic nanoparticles are promising dose modifying agents for radiotherapy.     

Laser-produced plasma He-alpha source for pulse radiography

Through the use of time and space integrated kiloelectronvolt （keV） spectroscopy, we investigate the thermal emission of plasma, which produces strong line emission from the titanium K shell （He-a at 4.7 keV and H-α at 4.9 keV）, created by laser. In order to optimize the conversion efficiency enhancement on titanium foils, the experiment is conducted under a variety of laser-driven intensity conditions. The X-ray emission intensity at 4.7 keV is measured and compared with prediction. The experimental result demonstrates that the solid Ti target laser-produced plasma （LPP） source has X-ray emission at 4.7 keV, which are all generated from electronic transitions in Ti ions at pulse width of 2.1 ns or 30 ps, the crudely evaluated He-α X-ray intensity appears to slightly increase with laser intensity enhancement, and the pre- pulse effect increases the conversion efficiency of the He-α X-ray. In addition, a 90-μm-thick Ti foil as a filter is used to transmit He-α X-ray at near 4.7 keV, creating a quasi-monochromatic transmission and greatly reducing the lower- and higher-energy background.     

微型X射线管出射谱特征研究及Be窗厚度确定

微型X射线管已广泛应用于现场元素分析、放射性医疗等领域,对于微型X射线管铍窗,普遍认为除保证管内真空外,应越薄越好。采用蒙特卡洛方法,模拟了从50～500 μm范围内共13个Be窗厚度的微型X射线管出射X射线谱。按照在应用中的作用,将出射X射线划分为不同能量段进行分析。通过分析谱线特征,发现Be窗厚度应依据其应用要求合理选择。因此,提出了K系特征X射线与轫致辐射强度的比值和低能射线与激发射线计数比值等参量作为评价Be窗厚度最优化的判断依据。除上述评判指标外,铍窗的厚度最优化选择还应考虑Be窗对不同能量X射线的屏蔽效果。依据模拟结果分析,原位(现场)X射线能量色散荧光分析应用中,Be窗厚度约250 μm的微型X射线管最为合适。与50 μm铍窗厚度出射射线相比,71.66%低能原级X射线被屏蔽,5~50 keV能量原级X射线仅有21.31%被屏蔽,低能射线强度占总X射线比值小于10%,且K系X射线占激发射线的比例仍保持较高的水平。因此,采用250 μm铍窗厚度的微型X射线管作为能量色散激发源,能保证探测器探测的有效信号比值较高,低能X射线对探测器的能量分辨率的影响最小,而且能量色散分析谱线的散射本底相对强度处于较低的水平,从而保证元素分析结果精准度。对于放射性治疗的应用中,则铍窗厚度越薄越好,此时,低能X射线具有较高的通量,能保证辐射剂量在治疗组织中剂量的集中。     

黑腔中等离子体相互作用的流体力学现象观测

激光间接驱动惯性约束聚变实验中,黑腔内情况复杂,在激光烧蚀和辐射烧蚀等的驱动下,光斑区、冕区、纯辐射烧蚀区、射流区的多种等离子体以不同规律运动.发展了X光双能段窄能带的时间分辨成像方法,用以观测黑腔内多种等离子体的运动情况.在真空黑腔中观测到清晰的射流,分析了射流产生机制及其速度;在黑腔中充气,能有效消除射流和抑制冕区等离子体运动,但两种物质界面处可能会出现流体力学不稳定性等现象,分析了界面处的压力平衡关系和密度陡变情况.     

Absorption-free calibration on X-ray fluorescence analysis of high-speed steel with glass bead preparation

This article describes a novel idea on preparation of a glass bead for X-ray fluorescence spectrometry, to determine alloyed elements in high-speed steel without any matrix correction. The quantification method using the glass bead is generally effective to reduce secondary X-ray absorption and enhancement (matrix effect) by coexisting elements in a sample. Although the glass bead is normally prepared based on a flux-to-sample ratio, the suggested method mainly controls an absolute amount of the sample in the glass bead to prevent from any interference with the matrix elements. As a result, the alloyed elements, except tungsten, in high-speed steels could be determined with high precision and accuracy, independent of the flux-to-sample ratio. However, the fluorescent X-ray intensity of tungsten Lα line (8.40 keV) was obviously influenced by the sample amount (iron content) in a glass bead; in this case, the Mα line (1.77 keV) could be employed alternatively.     

X-Rays emission by high-intensity pulsed lasers irradiating thin foils at PALS laboratory

X-rays and forward ion emission from laser-generated plasma in the Target Normal Sheath Acceleration regime of different targets with 10-μm thickness, irradiated at Prague Asterix Laser System (PALS) laboratory at about 10¹⁶ W/cm² intensity, employing a 1,315 nm-wavelength laser with a 300-ps pulse duration, are investigated. The photon and ion emissions were mainly measured using Silicon Carbide (SiC) detectors in time-of-flight configuration and X-ray streak camera imaging. The results show that the maximum proton acceleration value and the X-ray emission yield growth are proportional to the atomic number of the irradiated targets. The X-ray emission is not isotropic, with energies increasing from 1 keV for light atomic targets to about 2.5 keV for heavy atomic targets. The laser focal position significantly influences the X-ray emission from light and heavy irradiated targets, indicating the possible induction of self-focusing effects when the laser beam is focalized in front of the light target surface and of electron density enhancement for focalization inside the target.     

Degradation of the Giant Magnetoresistance in Fe/Cr Multilayers Due to Ar-Ion Beam Mixing

The influence of 200 keV Ar-ion irradiation on the interlayer coupling in the Fe/Cr multilayer system exhibiting the giant magnetoresistance effect (GMR) is studied by conversion electron Mössbauer spectroscopy (CEMS), VSM hysteresis loops, magnetoresistivity and electric resistivity measurements and supplemented by the small-angle X-ray diffraction (SAXRD). The increase of Ar ion dose causes an increase of interface roughness, as evidenced by the increase of the Fe step-sites detected by CEMS as a result of which the GMR gradually decreases and vanishes at doses exceeding 1×10¹⁴ Ar/cm². A degradation of GMR with increasing Ar-ion dose is related to the formation of pinholes between Fe layers and the decrease of the antiferromagnetically coupled fraction.