Characterization of VX on concrete using ion trap secondary ionization mass spectrometry

The nerve agent VX (O-ethyl S-2-diisopropylaminoethyl methyl phosphonothiolate) was analyzed on the surface of concrete samples using an ion trap secondary ion mass spectrometer (IT-SIMS). It was found that VX could be detected down to an absolute quantity of 5 ng on a concrete chip, or to a surface coverage of 0.0004 monolayers on crushed concrete. To achieve these levels of detection, the m/z 268-->128 ion fragmentation was measured using MS2, where m/z 268 corresponds to [VX + H]+, and 128 corresponds to a diisopropylvinylammonium isomer, that is formed by the elimination of the phosphonothiolate moiety. Detection at these levels was accomplished by analyzing samples that had been recently exposed to VX, i.e., within an hour. When the VX-exposed concrete samples were aged, the SIMS signature for intact VX had disappeared, which signaled the degradation of the compound on the concrete surface. The VX signature was replaced by ions which are interpreted in terms of VX degradation products, which appear to be somewhat long lived on the concrete surface. These compounds include ethylmethylphosphonic acid (EMPA), diisopropyl taurine (DIPT), diisopropylaminoethanethiol (DESH), bis(diisopropylaminoethane) disulfide [(DES)2], and a particularly tenacious compound that may correspond to diisopropylvinylamine (DIVA), or an isomer thereof. It was found that the thiolamine-derived degradation products DIPT, DESH, and (DES)2 were removed with isopropyl alcohol extraction. However, the DIVA-related degradation product was observed to strongly adhere to the concrete surface for longer than one week. Although quantitation was not possible in this set of experiments, the results clearly show the rapid degradation of VX on concrete, as well as the surface sensitivity of the IT-SIMS for intact VX and its adsorptive degradation products.     

Depth profile measurement by secondary ion mass spectrometry

The possibilities of measuring depth profiles by secondary ion mass spectrometry are evaluated. The influence of different instrumental and experimental parameters on depth resolution in the profiles are studied: the effects of primary ion beam characteristics, reactive gas adsorption and mechanical aperturing in secondary ion extraction are discussed. Beam effects are studied from the point of view of surface damage. The effects of secondary processes, such as crater edge effects, element mixing, preferential sputtering, background signals, (residual) gas contamination and ion-induced topographical and compositional changes are studied for thin metal and binary materials.     

Protein denaturation detected by time-of-flight secondary ion mass spectrometry

In the present work we investigate the denaturation of a functional protein, horseradish peroxidase (HRP), under various experimental conditions using time-of-flight secondary ion mass spectrometry. HRP was immobilized on TiO(2), and the samples were stored under different conditions. The activity of the enzyme was assessed colorimetrically and compared to ToF-SIMS spectra. We show that denaturation of the protein can be monitored using the ToF-SIMS signal of the disulfide bonds, which is related to the tertiary structure of the protein. As disulfide bonds appear in a vast range of proteins, the present findings may be of wide significance; i.e., a tool is provided that can allow the investigation of the presence of an active protein structure by a comparably simple surface analytical method.     

A discussion on mass resolution in secondary ion mass spectrometry

Mass resolution is a very important parameter for mass spectrometry. It is necessary to compare the mass resolution between the newly developed TOF-SIMS and the conventionally high-performance magnetic SIMS. However, the definitions of mass resolution for these two types of instruments are quite different. Whether it is possible to compare mass resolution and how to do such comparison is a challenge. This problem was raised officially during the 2012 ISO/TC 201 meeting at Tampa, Florida, the United States and the long-term cooperation with ISO started afterwards. The definition of mass resolution is one of the most important and fundamental problems for mass spectrometry and should attract significant attention. Here, some detail discussions on mass resolution as well as the related experimental studies in the past few years, including the collaborations with ISO/TC 201/SC6 and SC1 are summarized. This summary covers the common problem for almost all the current existing and still used definitions of mass resolution. A reasonable new definition for mass resolution considering the peak shape or resolution function has been proposed, which has also been confirmed by using experimental studies of the mass resolution comparison between TOF and magnetic SIMS. This study lays a foundation for the future mass resolution comparisons between different mass spectrometry.     

Surface analysis of polymer materials by secondary ion mass spectrometry

Atomic as well as molecular secondary ions are emitted from the uppermost monolayer of a solid during ion bombardment. Mass analysis of these positive and negative secondary ions supplies detailed information on the chemical composition of the bombarded surface. High mass range (> 10,000 u), high mass resolution (m/Δm > 10,000), accurate mass determination (ppm range) and high sensitivity (ppm of a monolayer) are achieved by applying time-of-flight (TOF) mass analyzers. TOF-SIMS has been successfully applied to a wide variety of polymer materials, including polymer blends, chemically or plasma modified surfaces, and plasma polymerization layers. Detailed information on the composition of repeat units, endgroups, oligomer distributions, additives, as well as surface contaminants can be obtained. Basic concepts of TOF-SIMS will be described and typical analytical examples for the characterization of polymer materials will be presented.     

Quantitative analysis of microstructures by secondary ion mass spectrometry.

The focus of this review is on trace-element quantitation of microstructures in solids. This review is aimed at the nonspecialist who wants to know how secondary ion mass spectrometry (SIMS) quantitation is achieved. Despite 35 years of SIMS research and applications, SIMS quantitation remains a fundamentally empirical enterprise and is based on standards. The most used standards are "bulk standards"-solids with a homogeneous distribution of a trace element-and ion-implanted solids. The SIMS systematics of bulk standards and ion-implanted solids are reviewed.     

Image processing in secondary ion mass spectrometry

The application of image processing in secondary ion mass spectrometry is discussed. The Cameca 4f SIMS uses a single microchannel plate and a highly sensitive camera in combination with an image processor with real time capabilities (Kontron IBAS). An automation procedure with image integration, extended dynamic range image acquisition and retro depth profiling is presented and illustrated with practical applications.     

Quantitative analysis by thin-layer chromatography with secondary ion mass spectrometry

Summary A direct combination of thin-layer chromatography with secondary ion mass spectrometry (TLC/SIMS) provides a method for the quantitative analysis of thermally unstable compounds or compounds of low volatility such as nicergoline. The method is very simple and has excellent precision. The analysis was performed by using an aluminium TLC plate and a mixture of methylene chloride, acetone, and distilled water as a developing solvent. After development the portion of the plate with the nicergoline and the internal standard spots was cut off the TLC plate, and was attached to the SIMS holder directly. The amount of nicergoline was determined from the ratio of the fragment ion intensity of the nicergoline to the internal standard. The calibration curve was linear, and the detection limit was 10 ng at a signal-to-noise ratio of 5. This method should be considered for application to the determination of drugs in biological samples and also for the determination of possible impurities and decomposition products in drugs.     

Method for improved secondary ion yields in cluster secondary ion mass spectrometry

A method to increase useful yields of organic molecules is investigated by cluster secondary ion mass spectrometry (SIMS). Glycerol drops were deposited onto various inkjet‐printed arrays and the organic molecules in the film were rapidly incorporated into the drop. The resulting glycerol/analyte drops were then probed with fullerene primary ions under dynamic SIMS conditions. High primary ion beam currents were shown to aid in the mixing of the glycerol drop, thus replenishing the probed area and sustaining high secondary ion yields. Integrated secondary ion signals for tetrabutylammonium iodide and cocaine in the glycerol drops were enhanced by more than a factor of 100 compared with an analogous area on the surface, and a factor of 1000 over the lifetime of the glycerol drop. Once the analyte of interest is incorporated into the glycerol microdrop, the solution chemistry can be tailored for enhanced secondary ion yields, with examples shown for cyclotrimethylenetrinitramine (RDX) chloride adduct formation. In addition, depositing localized glycerol drops may enhance analyte secondary ion count rates to high enough levels to allow for site‐specific chemical maps of molecules in complex matrices such as biological tissues. Published in 2010 by John Wiley & Sons, Ltd.     

Characterization of combinatorially designed polyarylates by time-of-flight secondary ion mass spectrometry

A series of 16 polyarylates, with well-controlled and systematically varying chemistry, has been characterized by time-of-flight secondary ion mass spectrometry (TOF-SIMS). The polymers are structurally identical except for the incremental additions of C2H4 units to the backbone and sidechain. From the spectra, peaks characteristic of all polyarylates are identified. Furthermore, evaluation of the spectra and identification of unique signals allow classification of the polyarylates according to sidechain and backbone chemistry.     

Study on ion formation in electrospray droplet impact secondary ion mass spectrometry

A new type of cluster secondary ion mass spectrometry (SIMS), named electrospray droplet impact (EDI), has been developed in our laboratory. In general, rather strong negative ions as well as positive ions can be generated by EDI compared with conventional SIMS. In this work, various aspects of ion formation in EDI are investigated. The Brønsted bases (proton acceptor) and acids (proton donor) mixed in the analyte samples enhanced the signal intensities of deprotonated molecules (negative ions) and protonated molecules (positive ions), respectively, for analytes. This suggests the occurrence of heterogeneous proton transfer reactions (i.e. M + M′ → [M+H]⁺ + [M′? H]^?) in the shockwave‐heated selvedge of the colliding interface between the water droplet and the solid sample deposited on the metal substrate. EDI‐SIMS shows a remarkable tolerance to the large excess of salts present in samples. The mechanism for desorption/ionization in EDI is much simpler than those for MALDI and SIMS because only very thin sample layers take part in the shockwave‐heated selvedge and complicated higher‐order reactions are largely suppressed. Copyright © 2007 John Wiley & Sons, Ltd.     

Structural analysis of secondary ions by post-source decay in time-of-flight secondary ion mass spectrometry

Tandem mass spectrometry measurements have been achieved using time-of-flight secondary ion mass spectrometry (TOF-SIMS) and a post source decay (PSD)-like method. The performance of the method has been demonstrated on model molecules with well-known fragmentation pathways. Several lipids have been fragmented including the phosphocholine ion, phosphatidylcholines, cholesterol and vitamin E. Pure samples were analyzed, and the results compared with those obtained with the same compounds on a quadrupole-TOF hybrid mass spectrometer. Then, the structures of some lipids which are currently observed in the TOF-SIMS imaging of mammalian tissue sections were verified.     

Alpha spectrometry and secondary ion mass spectrometry of electrodeposited uranium films

Electrodeposited natural uranium films prepared by electrodeposition from solution of uranyl nitrate UO₂(NO₃)₂·6H₂O on stainless steel discs in electrodeposition cell. Solutions of NaHSO₄, and Na₂SO₄ and electric current from 0.50 up to 0.75 A were used in this study. Recalculated weights and surface’s weights of ²³⁸U from the alpha activities and secondary ion mass spectrometry (SIMS) intensities resulted in a linear regression. A dependency between of ²³⁸U surface’s weights recalculated from alpha activities and signal intensity of ²³⁸U in SIMS was investigated in order to determine a potential of SIMS in quantitative analysis of surface samples containing uranium. In the SIMS spectra of electrodeposited uranium films we found that upper layer consist not only from isotopes of uranium (ions ²³⁴U⁺, ²³⁵U⁺, and ²³⁸U⁺). In the positive polarity SIMS spectra, various molecules ions of uranium were suggested as UH⁺, UH₂ ⁺, UO⁺, UOH⁺, UO₂ ⁺, UO₂H⁺, UO₂H₂ ⁺, as well as possibly ions UNO⁺ and UNOH⁺.     

Semiquantitative analyses by secondary ion mass spectrometry using one fitting parameter

Summary A procedure for SIMS semiquantitative analysis, based on the use of one fitting-parameter, has been applied to metal and mineral standards with satisfactory results. Values of this parameter for various matrices are given, and prospects for analyses involving no reference elements are discussed. Analytical accuracies obtainable for individual elements are assessed in terms of matrix-independent error factors.

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Zusammenfassung Eine Methode zur semiquantitativen SIMS-Analyse, die im Gegensatz zu den aus der Literatur bekannten Verfahren nur einen Anpassungsparameter benötigt, wurde mit gutem Erfolg an Metall- und Mineralstandards getestet. Werte des Anpassungsparameters für verschiedene Matrices wurden angegeben und Aussichten für eine Weiterentwicklung dieser Methode in Richtung auf standardfreie Analysen wurden besprochen. Die analytische Richtigkeit für einige Elemente wurde mit Hilfe von matrixunabhängigen Fehlerfaktoren abgeschätzt.

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Presented at the International Symposium on Microchemical Techniques 1977, Davos, May 1977.     

Direct analysis of thin-layer chromatograms and electrophoretograms by secondary ion mass spectrometry

Mixtures separated by thin-layer chromatography and electrophoresis can be analyzed in situ by secondary ion mass spectrometry. The paramount advantage of such a combination is the selectivity inherent to the mass spectrum, which can provide information sufficient for the identification of an unknown compound as well as precise quantification of known compounds. Separation of the time frames of chromatographic development and mass spectrometer operation relaxes the constraints on each, and unique analytical advantages result.     

A pulsed time-of-flight mass spectrometer for liquid secondary ion mass spectrometry

The design and performance of a new time-of-flight mass spectrometer is reported. The instrument combines the advantages of a pulsed drawout TOF analyzer with a liquid secondary ion source. Differences from commercially available pulsed TOF analyzers (Wiley/McLaren type) are discussed with regard to operation with ion desorption from a liquid matrix.     

Microscopical speciation analysis with laser microprobe mass spectrometry and static secondary ion mass spectrometry

This paper presents a set of data which compares the potential and limitations of laser microprobe mass spectrometry (TOF-LMMS and FT-LMMS) and static secondary ion mass spectrometry (S-SIMS) for inorganic speciation at a microscopical level. In general LMMS yields prominent signals of adduct ions consisting of the intact molecule combined with a stable ion, which allows a direct identification of the analyte. S-SIMS also yields abundant diagnostic signals to specify the molecular composition. However, adduct ions are not always present, which means that the identification often relies on fingerprinting. Results further indicate that the potential and the application area of S-SIMS and FT-LMMS are complementary to one another.