Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS)

Secondary-ion mass spectrometry is frequently used for concentration-depth profiling of macroscopic samples, but it is certainly not a common analytical technique for the analysis of sub-micrometer-size particles. This is because of the additional ion-bombardment-induced artifacts which can occur when a three-dimensional microvolume is sputtered, instead of a flat surface. This paper presents a model of how small cubic photographic Ag(Cl,Br) crystals are eroded under primary-ion bombardment, and the extent to which secondary ions generated at different faces are extracted. The latter is studied by means of the program SIMION, which simulates ion trajectories in complex electrical field systems. It is shown that up to 90% of the secondary ions originating from the side face of a cubic crystal are unable to reach the detector, in contrast with most secondary ions originating from the top face. The angular dependence of the sputtering yield and the elemental ratio of Br/Cl sputtered particles have been calculated by using the well-known computer code TRIM (transport of ions in matter) under some limiting assumptions (possible preferential sputtering is disregarded and a steady-state sputtering process is assumed). The validity of the theoretical model and the calculated results were checked with experimental data. On the basis of the depth profiles presented it is explained why it is still possible to measure an interface inside a cubic volume, even though a group of several hundred crystals is sputtered simultaneously, and even though the orientations of the distinct faces of the cubes relative to the angle of incidence of the primary-ion beam are different.     

Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals

The present article describes depth-profiling studies on populations of cubic silver halide microcrystals (typical size between 400 and 600 nm). These crystals consist of mixed halides (Cl, Br, I) and are characterized by internal halide distributions such as core-shell structures. Determination of the spatial distribution of the different halides in the microcrystals offers valuable information for the optimization of the crystal design of new photographic materials. The first part describes the calibration of the sputtered depth, which is more complicated than in the one-dimensional case of flat surfaces. In a second part, three different quantification methods [halide intensity ratios, XCs₂⁺ detection (X=halide) and the infinite velocity method] are used to determine the mean composition of the surface layer as a function of sputtered depth in the silver halide crystals. Although particles of submicrometer size are obviously not the ideal samples for depth profiling, a good correlation with values obtained by scanning electron microscopy energy dispersive X-ray microanalysis and wavelength dispersive X-ray fluorescence bulk analysis could be achieved.     

Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS

Alternating layers of two different organic materials, Irganox1010 and Irganox3114, have been created using vapor deposition. The layers of Irganox3114 were very thin ( approximately 2.5 nm) in comparison to the layers of Irganox1010 ( approximately 55 or approximately 90 nm) to create an organic equivalent of the inorganic 'delta-layers' commonly employed as reference materials in dynamic secondary ion mass spectrometry. Both materials have identical sputtering yields, and we show that organic delta layers may be used to determine some of the important metrological parameters for cluster ion beam depth profiling. We demonstrate, using a C(60) ion source, that the sputtering yield, S, diminishes with ion dose and that the depth resolution also degrades. By comparison with atomic force microscopy data for films of pure Irganox1010, we show that the degradation in depth resolution is caused by the development of topography. Secondary ion intensities are a well-behaved function of sputtering yield and may be employed to obtain useful analytical information. Fragments characteristic of highly damaged material have intensity proportional to S, and those fragments with minimal molecular rearrangment exhibit intensities proportional to S(2). We demonstrate quantitative analysis of the amount of substance in buried layers of a few nanometer thickness with an accuracy of approximately 10%. Organic delta layers are valuable reference materials for comparing the capabilities of different cluster ion sources and experimental arrangements for the depth profiling of organic materials.     

Determination of iron(II) ions in aqueous solutions by secondary-ion mass spectrometry

Model samples of aqueous solutions containing iron(II/III) salts have been studied by secondary-ion mass spectrometry. Mass spectra of the samples containing ferrous and ferric ions have been compared. The possibility of using secondary-ion mass spectrometry for the analysis of rain precipitations and samples of atmospheric aerosols has been considered.     

Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials

Sputter‐depth profiles of model organic thin films on silicon using C₆₀ primary ions have been employed to measure sputtering yields and depth resolution parameters. We demonstrate that some materials (polylactide, Irganox 1010) have a constant and high sputtering yield, which varies linearly with the primary ion energy, whereas another material (Alq₃) has lower, fluence‐dependent sputtering yields. Analysis of multi‐layered organic thin films reveals that the depth resolution is a function of both primary ion energy and depth, and the sputtering yield depends on the history of sputtering. We also show that ～30% of repeat units are damaged in the steady‐state regime during polylactide sputtering. Crown Copyright © 2006. Reproduced with the permission of Her Majesty's Stationery Office. Published by John Wiley & Sons, Ltd.     

Electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) for silver halides

Electrospray droplet imact/secondary ion mass spectrometry (EDI/SIMS) was applied to many materials such as synthetic polymers, metals, semiconductors, and biological tissues. Little surface modification was observed for these samples by in situ XPS analysis. In this work, silver halides AgX (X = F, Cl, Br, and I) were examined by EDI/SIMS. The preferential etching of F for AgF was observed for the first time. This is due to the highly reactive F atoms generated at the colliding interface that are quickly annihilated by the reaction with water molecules. The selective etching of fluorine results in the enrichment of silver on the sample surface leading to the abundant Ag⁺ ion formation. It was suggested that metal fluorides may be useful as the cationization matrices in EDI/SIMS. Copyright © 2014 John Wiley & Sons, Ltd.     

Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS.

The technique of imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) and dual beam depth profiling has been used to study the composition of the surface of tabular silver halide microcrystals. Analysis of individual microcrystals with a size well below 1 microm from a given emulsion is possible. The method is successfully applied for the characterization of silver halide microcrystals with subpercent global iodide concentrations confined in surface layers with a thickness below 5 nm. The developed TOF-SIMS analytical procedure is explicitly demonstrated for the molecular imaging of adsorbed thiocyanate layers (SCN) at crystal surfaces of individual crystals and for the differentiation of iodide conversion layers synthesized with KI and with AgI micrates (nanocrystals with a size between 10 and 50 nm). It can be concluded that TOF-SIMS as a microanalytical, surface-sensitive technique has some unique properties over other analytical techniques for the study of complex structured surface layers of silver halide microcrystals. This offers valuable information to support the synthesis of future photographic emulsions.     

The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS

The determination of the mass transport kinetics of oxide materials for use in electrochemical systems such as fuel cells, sensors and oxygen separators is a significant challenge. Several techniques have been proposed to derive these data experimentally with only the oxygen isotope exchange depth profile technique coupled with secondary ion mass spectrometry (SIMS) providing a direct measure of these kinetic parameters. Whilst this allows kinetic information to be obtained, there is a lack of knowledge of the surface chemistry of these complex processes. The advent of low-energy ion scattering (LEIS) now offers the opportunity of correlating exchange kinetics with chemical processes at materials atomic surfaces, giving unprecedented levels of information on electrochemical systems with isotopic discrimination. Here, the challenges of these techniques, including sample preparation, are discussed and the advantages of the combined approach of SIMS and LEIS illustrated with reference to key literature data.     

Quantitative depth profiling of argon in tungsten films by secondary ion mass spectrometry.

Depth profiling of Ar in Ar-implanted tungsten (W) films with an excellent detection limit was investigated by secondary ion mass spectrometry (SIMS). Depth profiles of Ar with the detection of Ar+ and ArCs+ secondary ions, which were produced by O2+ and Cs+ primary ions, respectively, were compared in view of the detection limit and the depth resolution. The detection limit of Ar monitoring Ar+ was limited by the carbon- and oxygen-containing molecular ion (C2O+) in the sample as well as in the SIMS instrument. It was observed that some of the Ar+ ions were produced in the vacuum above the sample surfaces, whereas the ionization of almost all C2O+ occurred at the samples. By using different energy spectra between Ar+ and C2O+, we showed that the energy-filtering technique is advantageous for suppressing C2O+ ion detection. It is also confirmed that the ArCs+ secondary ion is only slighting by the C2OCs+ mass-interference ion. A detection limit of 4 x 10(18) cm(-3) for monitoring Ar+ and 3 x 10(16) cm(-3) for monitoring ArCs+ was achieved under a primary-ion current density of 0.16 mA/cm2. The detection of ArCs+ ion rather than Ar+ was found to be superior in the detection limit and the depth resolution. We conclude that SIMS is useful for the determination of the Ar depth distribution in W films.     

Investigation of the profiling depth in matrix-assisted laser desorption/ionization imaging mass spectrometry

Matrix-assisted laser desorption/ionization (MALDI) imaging mass spectrometry is generally considered to be a surface analysis technique. In this report, the profiling depth of imaging mass spectrometry was examined. MALDI matrix solution was found to be able to gain access to the tissue interior and extract analyte molecules to the tissue surface. As a consequence, prazosin, a small molecule pharmaceutical compound, located as deep as 40 microm away from the surface was readily detected after matrix application. Likewise, cytochrome c, a 12 kDa protein, was also detectable from the tissue interior. Moreover, for prazosin, not only the extent of matrix effect, but also the extraction efficiency of the matrix solvent appeared to be dependent on the type of tissue. These results indicated that experimental conditions that decrease the matrix solvent evaporation during matrix application may increase analyte extraction efficiency and hence sensitivity of the analysis. Furthermore, thin sections should be used to avoid differential extraction efficiency of matrix solvent in different tissues for whole-body analysis.     

Investigation of the deuterium solubility in niobium using secondary ion mass spectrometry (SIMS)

Summary From SIMS measurements on deuterium charged niobium foils a pressure-composition isotherm was obtained. The plateau pressure of the –-two-phase region is in good agreement with that known from electrochemical p-n isotherm measurements. The solubility in the homogeneous -phase measured by SIMS, however, is enhanced compared with the electrochemical p-n isotherm, i.e. the homogeneous -phase is broadened. These results are due to the ion bombardment causing a lattice distortion within the near surface region during the SIMS experiment.     

Surface characterization and depth profiling of biological molecules by electrospray droplet impact/SIMS

Electrospray droplet impact (EDI) was applied to the analysis of peptides. The etching rate of bradykinin was estimated to be ~2 nm/min. This value is about one order of magnitude greater than the etching rate for SiO₂ (0.2 nm/min). Considering that the etching rate of argon cluster ions Ar₇₀₀⁺ for organic compounds is more than two orders of magnitude larger than that for inorganic materials, the rather small difference in etching rates of EDI for organic and inorganic materials is unique. When water/ethanol (1/1, vol%) solution of gramicidin S and arginine was dried in air, [gramicidin S + H]⁺ was observed as a predominant signal with little [Arg + H]⁺ right after the EDI irradiation, indicating that EDI is capable of detecting the analytes enriched on the sample surface. Copyright © 2011 John Wiley & Sons, Ltd.     

Evaluation of the sputtering rate variation in SIMS ultra‐shallow depth profiling using multiple short‐period delta layers

We have developed multiple short‐period delta layers as a reference material for SIMS ultra‐shallow depth profiling. Boron nitride delta layers and silicon spacer layers were sputter‐deposited alternately, with a silicon spacer thickness of 1–5 nm. These delta‐doped layers were used to measure the sputtering rate change in the initial stage of oxygen ion bombardment. A significant variation of sputtering rate was observed in the initial 3 nm or less. The sputtering rate in the initial 3 nm was estimated to be about four times larger than the steady‐state value for 1000 eV oxygen ions. Copyright © 2003 John Wiley & Sons, Ltd.     

Application of secondary ion mass spectrometry (SIMS) for the analysis of asbestos fibers

Summary Secondary ion mass spectrometry (SIMS) was applied for the analysis of asbestos fibers. It was possible to identify the asbestos fibers by the pattern of the positive secondary ion mass spectrum. The image of the asbestos fibers was measurable by use of any major positive secondary ions. The smallest size of detectable asbestos fiber was about 5 and 1 m in length and diameter, respectively. Using a fast atom bombardment (FAB) source instead of primary ion beam, asbestos fibers collected on a membrane filter were easily detected without any pretreatment.     

银离子高效液相色谱-质谱法分析血清中甘油三酯类化合物的组成

针对甘油三酯(TAG)类化合物的复杂性,建立了分析小鼠血清中TAG类化合物的方法。采用经典的氯仿-甲醇溶剂体系对血中的TAG类化合物进行提取。脂质提取物经Varian ChromSpher 5 Lipids柱分离,在0.75 mL/min的流速下以乙腈-正己烷(1:99, v/v)为流动相进行等度洗脱,采用大气压化学电离源正离子模式电离,质谱增强型全扫描、增强型子离子扫描和中性丢失扫描模式检测。根据银离子色谱对双键的保留规律以及质谱所给出的碎片离子信息,对血清中TAG类化合物进行了结构鉴定。结果表明采用该方法可以从小鼠血清中鉴定到66个TAG类化合物以及5个胆固醇酯。该方法简单,重现性好,可通用于其他样品中TAG类化合物的检测。