AFM and XRD investigation of crystalline vapor-deposited C60 films

The morphological and structural properties of C₆₀ films deposited on quartz substrates by sublimation at 320–500° C under high vacuum have been investigated using atomic force microscopy (AFM) and reflection X-ray diffraction (RXRD). The thickness of the films varied between 0.2 m and 10 m. AFM showed that the films consist predominantly of cubic crystals of a few micrometer in size with well-developed (111) and (100) faces. The crystallographic investigation revealed a strongly preferred [111] growth direction which is very sensitive to the deposition rate and substrate temperature. The influence of the experimental parameters on the morphology of the crystals and on the preferred orientation of the films is discussed in view of the AFM and RXRD results.     

Atomic Force Microscopy Study of TiO2 Films Obtained by the Sol-Gel Method

Atomic Force Microscopy (AFM) was used to study the influence of thermal treatments on the structural and textural properties of the sol-gel TiO2 films obtained from Ti(OC3H7i)4. X-ray diffraction (XRD), ellipsometric and porosity measurements have also been made.The TiO2 sol-gel films were homogeneous, transparent and amorphous. Heat treatments in the 400–600°C range indicate that the films have a strong tendency to crystallization. The high initial homogeneity of the TiO2 films was preserved during the crystallization process. AFM shows that the thermally treated films exhibit uniform, monodispersed crystals.     

Anisotropy analysis of the surface energy of diamond cubic crystals

The surface energies for 24 surfaces of diamond structure cubic crystals of C, Si and Ge have been calculated using the modified embedded‐atom method. The results show that the three lowest surface energies correspond to the (111), (211) and (433) surfaces. Considering surface energy minimization solely, the (111), (211) and (433) textures should be favourable successively in diamond cubic films. The appearance of abnormal grains or textures with (111) and (211) orientations in Si, Ge and C films results from surface energy minimization. Copyright © 2003 John Wiley & Sons, Ltd.     

Comparison of resistance to protein adsorption and stability of thin films derived from alpha-hepta-(ethylene glycol) methyl omega-undecenyl ether on HSi(111) and HSi(100) surfaces

Oligo(ethylene glycol)-terminated thin films were prepared by photo-induced hydrosilylation of alpha-hepta-(ethylene glycol) methyl omega-undecenyl ether (EG(7)) on hydrogen-terminated silicon (111) and (100) surfaces. Their resistance to protein adsorption, and stabilities (from hours to days) under a wide variety of conditions, such as air, water, biological buffer, acid, and base, were investigated using contact-angle goniometry and ellipsometry techniques. Results indicated higher stability of the films chemisorbed on Si(111) than on Si(100). Furthermore, micron-sized patterns were fabricated on the films via AFM anodization lithography. Using atomic force microscopy (AFM) and fluorescence microscopy, we demonstrated that various proteins including fibrinogen, avidin, and bovine serum albumin (BSA) predominately adsorbed onto the patterns, but not the rest of the film surfaces.     

In-situ atomic force microscopy observation of enzymatic degradation in poly(hydroxyalkanoic acid) thin films: normal and constrained conditions

The enzymatic degradation of lamellar crystals in poly(hydroxyalkanoic acid) thin films has been visualized by using in-situ dynamic force mode (tapping mode) atomic force microscopy (AFM) in buffer solution. It was found that poly(hydroxybutyric acid) (PHB) depolymerase from Ralstonia pickettii T1 degraded the thin surface layers formed at room temperature first, and that lamellar crystals formed at the crystallization temperature (110 degrees C) were eroded from the crystallographic a-axis to show splintered morphologies at the tips of the crystals. In some cases, lamellar crystals were hydrolyzed from the crystallographic b-axis, resulting in the formation of small crevices. These results suggest that disordered molecular chain-packing regions exist in the crystal along the crystallographic a- and b-axes, and that enzymatic degradation predominantly occurs from these defective regions. In addition, cantilever-tip-induced enzymatic degradation was carried out in the presence of PHB depolymerase. A concave area was artificially formed on the stacked lamellar crystals by the AFM tip. In-situ AFM observation has revealed that enzymatic degradation proceeds along both the longitudinal and lateral directions of the lamellae. At the same time, the PHB depolymerase preferentially eroded the concave area along the crystallographic c-axis. These results demonstrated that the PHB depolymerase predominantly degrades the less-ordered molecular chain-packing regions in the crystals.     

预处理对丝素蛋白膜调控羟基磷灰石晶体生长的影响

以丝素蛋白膜为基质, 在模拟体液中诱导羟基磷灰石晶体在其表面沉积和生长. 利用XRD, SEM, HRTEM, AFM和FTIR等表征手段研究了不同预处理方法对羟基磷灰石晶体的形成及其微观形貌的影响. 结果表明, 丝素膜可有效地诱导羟基磷灰石晶体在其表面沉积和生长; 较长的矿化时间有利于形成较多结晶度良好的HAP晶体; 而不同预处理方法对丝素膜的表面结构产生了不同影响, 进而调制在其表面沉积的羟基磷灰石的形貌和生长方向. 同时对丝素蛋白膜调控羟基磷灰石晶体生长的机制进行了必要的探讨.     

Electrochemical nanostructuring of fullerene films--spectroscopic evidence for C60 polymer formation and hydrogenation

Electrochemical reduction of ordered C60 fullerene films in aqueous solution was studied by AFM, FTIR and Raman spectroscopy, mass spectrometry and elastic recoil detection analysis. During the irreversible reduction process the film morphology changed from a heteroepitaxial (111) surface to a nanostructured array with clusters of 20 to 50 nm lateral size on average. On the molecular level the initial C60 underwent electrochemical reactions to form C60 polymers and hydrogenated C60. Chemical follow-up reactions of electrochemically formed C60- with water are responsible for the different reduction behaviour of C60 films in aqueous solution compared to C60 reduction in organic solvents and to C60 doping with alkali metals. Based on the spectroscopic analysis a reaction scheme accounting for the chemical processes at the C60 / aqueous electrolyte interface is presented.     

Electrochemically induced atom-by-atom growth of ZnS thin films: a new approach for ZnS co-deposition

Ultrathin films of ZnS were grown on Au (111) substrates using a novel, simple co-deposition method and characterized using X-ray diffraction (XRD), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), and UV-visible spectroscopy. Cyclic voltammograms were used to determine approximate deposition potentials for co-deposition. XRD shows that the material growth is highly preferential with (111) orientation. Both AFM and XRD data indicate that the ZnS growth mechanism starts by the formation of rounded nanoparticles at the surface and then continues by lateral and vertical growth to form flat square crystallites of ZnS. UV-vis spectra taken for the ZnS thin films with various thicknesses, which is related to deposition time, shows that the band gap of the ZnS decreases as the film thickness increases.     

聚(ε-己内酯)薄膜结晶形貌及分子取向研究

用匀胶机通过溶液铸膜方法在硅片和铝箔基板上分别制备具有不同厚度的聚(ε-己内酯)(PCL)薄膜. 通过原子力显微镜(AFM)和偏光衰减全反射傅里叶红外光谱(ATR-FTIR)对薄膜中PCL的结晶形貌、 片晶生长方式及分子链取向进行了研究. AFM结果表明, 在200 nm或更厚的薄膜中, PCL主要以侧立(edge-on)片晶的方式生长; 对于厚度小于200 nm的薄膜, PCL片晶更倾向于以平躺(flat-on)的方式生长. 这种片晶生长方式的改变在硅片和铝箔基板上都表现出同样的倾向. 此外, 在15 nm或更薄的薄膜中, PCL结晶由通常的球晶结构变为树枝状晶体. 偏光ATR-FTIR结果表明, 当膜厚小于200 nm时, 薄膜结晶中PCL分子链沿垂直于基板表面方向取向, 并且膜越薄, 取向程度越高, 与AFM的观测结果一致.     

Deposition of small organic molecules by the displacement of two immiscible supercritical phases

A new coating process is described (deposition from two immiscible supercritical phases, or DISP) in which a solution of supercritical carbon dioxide (scCO2) with a desired solute is displaced by supercritical helium (scHe). After depressurization, the solute is deposited on substrates initially submerged in the coating solvent. Micron-sized particles and thin films of sucrose octaacetate (SOA) were formed on silicon wafer substrate coupons from DISP at relatively low temperatures and pressures (< or = 6500 psi and < or = 60 degrees C). The particle size, film thickness, and morphology of SOA were characterized as a function of coating conditions-solution concentrations, withdrawal velocities, and pressures. Particles in the range of 1-14 microm in diameter were deposited at low solute concentrations (< or = 0.2 wt % at 4500 psi), whereas films in the range of 0.1-0.5 microm in thickness were deposited at higher solute concentrations (> or = 1.5 wt % at 4500 psi). Particle sizes decreased with increasing displacement velocity and increasing pressure. Estimates of characteristic times for diffusion and nucleation indicate that DISP is a diffusion-limited process. Optical microscopy and atomic force microscopy (AFM) were used to characterize film morphology, including defect formations and film roughness. Highly uniform films with low root-mean-square (RMS) roughness (approximately 10 angstroms) were obtained at a low displacement velocity of 0.0035 cm/s, while ring-like defect structures were observed in films deposited at a higher displacement velocity of 0.035 cm/s. The film thickness and morphology of the films deposited from DISP were compared with films from normal dip coating with typical organic solvents (acetone and toluene). Films deposited from scCO2 by DISP were much thicker, more uniform, and exhibited much fewer drying defects and lower RMS roughness compared with films from the organic solvents.     

Piezoelectricity of ZnO Films Prepared by Sol-Gel Method

"ZnO piezoelectric thin films were prepared on crystal substrate Si(111) by sol-gel technology, then characterized by scanning electron microscopy, X-ray diffraction and atomic force microscopy (AFM). The ZnO films characterized by X-ray diffraction are highly oriented in (002) direction with the growing of the film thickness. The morphologies, roughness and grain size of ZnO film investigated by AFM show that roughness and grain size of ZnO piezoelectric films decrease with the increase of the film thickness. The roughness dimension is 2.188-0.914 nm. The piezoelectric coeocient d33 was investigated with a piezo-response force microscope (PFM). The results show that the piezoelectric coeocient increases with the increase of thickness and (002) orientation. When the force reference is close to surface roughness of the films, the piezoelectric coefficient measured is inaccurate and fluctuates in a large range, but when the force reference is big, the piezoelectric coeocient d33 changes little and ultimately keeps constant at a low frequency."     

AFM observations of phase transitions in molecularly thin films of a three-ring bent-core compound

Submonolayer thin films of a three-ring bent-core (or banana-shaped) compound, m-bis(4-n-octyloxystyryl)benzene (m-OSB), were vacuum-deposited on a mica surface, and a spontaneous transition from monolayer films to bilayer crystals was observed at room temperature, which was ascribed to the specific molecular shape and polar layered packing of the bent-core molecules [Tang et al. J. Phys. Chem. B 2004, 108 (34), 12921-12926]. The crystal nucleation and growth from the monolayer films as well as the melting phase transition from the bilayer crystals were investigated using atomic force microscopy (AFM). It was shown that after initial nucleation, the crystal growth was achieved through three pathways: direct absorption of molecules from monolayer films, molecular cluster diffusion, and quasi-Ostwald ripening. When annealing the bilayer crystals at elevated temperatures, morphological change from a bilayer to a monolayer was observed, and some new islands with fingerlike patterns were formed during this process, which resulted from a diffusion-controlled growth of the molten molecules. In general, the high-resolution AFM in combination with the molecularly thin m-OSB films provided us with direct visualization of nucleation, crystal growth, melting, and film morphology evolution on the mesoscopic scale, which are of fundamental interest from the theoretical viewpoint and are of central importance for the control of interfacial properties in practical applications.     

Formation of alkanethiol monolayer on Ge(111).

Alkanethiols, CH3(CH2)(n-1)SH, are shown to react readily with HF-treated Ge(111) surface at room temperature to form a high-quality monolayer. The resulting films are characterized by using contact angle analysis (CAA), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), spectroscopic ellipsometry (SE), and high-resolution electron energy loss spectroscopy (HREELS). The octanethiol and octadecanethiol films on Ge(111) both exhibit 101 degrees and 40 degrees water and hexadecane contact angles, respectively. These values indicate that the thiol surface coverage is relatively high, and that the films possess a high degree of orientational ordering. The angle-resolved XPS analysis supports that thiols are bound to the Ge surface by Ge-S bonds at the monolayer/Ge interface. The film thickness values obtained by XPS and SE agree well with the earlier reported values on alkyl monolayers on Ge(111) prepared by Grignard reaction. On the basis of HREEL spectra taken after thermal annealing steps, the monolayers are found to be thermally stable up to 450 K. The thermal stability provides further evidence that thiols are covalently bonded to Ge(111).     

Dendritic growth of poly(ε-caprolactone) crystals from compatible blends with poly(t-butyl acrylate) at the air/water interface

Thermodynamic analyses of surface pressure-area (Π-A) isotherms and Brewster angle microscopy (BAM) reveal that poly(ε-caprolactone) (PCL) with a weight average molar mass of M_w = 10 kg mol⁻¹ and polydispersity index of M_w/M_n = 1.25 and poly(t-butyl acrylate) (PtBA, M_w = 25.7 kg mol⁻¹; M_w/M_n = 1.07) form compatible blends as Langmuir films below the dynamic collapse transition for PCL at Π = 11 mN m⁻¹. For PCL-rich blends, in situ BAM studies reveal growth of PCL crystals for compression past the PCL collapse transition. PCL crystals grown in the plateau regime of the Π-A isotherm exhibit a dendritic morphology presumably resulting from the rejection of PtBA from the growing PCL crystals and hindered diffusion of PCL from the surrounding monolayer to the crystal growth fronts. The ability to transfer the PCL dendrites as Langmuir–Schaefer films onto silicon substrates spincoated with a polystyrene layer facilitates detailed morphological characterization by optical and atomic force microscopy (AFM). AFM reveals that the dendritic branching occurs along the {100} and {110} sector boundaries and is essentially independent of composition. AFM also reveals that the average thickness of PCL dendrites formed at room temperature (22.5 °C), ∼7–8 nm, is comparable with that of PCL crystals grown from single-component PCL Langmuir films and spincoated thin films. In contrast, for PtBA-rich blend films PCL crystallization is suppressed. These findings establish PCL blends as an ideal system for exploring the interplay between chain diffusion and crystal growth in a two-dimensional confined geometry. © 2007 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 45: 3300–3318, 2007     

Nanoscale patterning of alkyl monolayers on silicon using the atomic force microscope

Self-assembled monolayers (SAMs) of 1-alkenes on hydrogen-passivated silicon substrates were successfully patterned on the nanometer scale using an atomic force microscope (AFM) probe tip. Nanoshaving experiments on alkyl monolayers formed on H-Si(111) not only demonstrate the flexibility of this technique but also show that patterning with an AFM probe is a viable method for creating well-defined, nanoscale features in a monolayer matrix in a reproducible and controlled manner. Features of varying depths (2-15 nm) were created in the alkyl monolayers by controlling the applied load and the number of etching scans made at high applied loads. The patterning on these SAM films is compared with the patterning of alkyl siloxane monolayers on silicon and mica.     

Adsorption, desorption, and diffusion of nitrogen in a model nanoporous material. II. Diffusion limited kinetics in amorphous solid water

The adsorption, desorption, and diffusion kinetics of N2 on thick (up to approximately 9 microm) porous films of amorphous solid water (ASW) films were studied using molecular beam techniques and temperature programmed desorption. Porous ASW films were grown on Pt(111) at low temperature (<30 K) from a collimated H2O beam at glancing incident angles. In thin films (<1 microm), the desorption kinetics are well described by a model that assumes rapid and uniform N2 distribution throughout the film. In thicker films (>1 microm), N2 adsorption at 27 K results in a nonuniform distribution, where most of N2 is trapped in the outer region of the film. Redistribution of N2 can be induced by thermal annealing. The apparent activation energy for this process is approximately 7 kJ/mol, which is approximately half of the desorption activation energy at the corresponding coverage. Preadsorption of Kr preferentially adsorbs onto the highest energy binding sites, thereby preventing N2 from trapping in the outer region of the film which facilitates N2 transport deeper into the porous film. Despite the onset of limited diffusion, the adsorption kinetics are efficient, precursor mediated, and independent of film thickness. An adsorption mechanism is proposed, in which a high-coverage N2 front propagates into a pore by the rapid transport of physisorbed second layer N2 species on top of the first surface bound layer.     

Flexible free-standing films morphology characterization: PVA/silica polymer network dispersed cholesteric liquid crystals films by sol-gel method

A novel flexible free-standing films of polyvinyl alcohol (PVA)/silica polymer network dispersed cholesteric liquid crystals (CLC) have been prepared by the sol-gel process. In the hydrolysis of silicon alkoxides tetraethoxysilane (TEOS) processes, the silica having -OH with the -OH groups on PVA formed polymer networks with Si-O-C bonds by dehydration. The cholesteric liquid crystals were incorporated into the networks. The free-standing films were obtained by the spin-coating method. In order to improve the compatibility and microstructure of the cholesteric liquid crystals with PVA/silica polymer networks, the amphiphilic compound of hexadecyl trimethyl ammonium bromide (HDTMA) was introduced into the forming film solutions. Effects of the different ratios of raw materials on the structure of films were investigated. The microscopic morphology of free-standing films and the uniform dispersion of CLCs in the films have been characterized by polarizing optical microscopy (POM), the field emission scanning electron microscope (FESEM), Fourier transform infrared (FT-IR) spectrometer and atomic force microscope (AFM). The free-standing films exhibiting excellent CLC droplets dispersion, mechanical stability, and good flexibility could be useful for flexible displays, switchable optical elements and smart windows.     

Infrared reflection-absorption spectra of C2H4 and C2H6 on Cu: effect of surface roughness

Infrared reflection absorption spectroscopy (IRRAS) of the highly symmetric molecules C2H4 and C2H6 adsorbed as mono- and multilayers onto copper films is studied in relation to the type of metal-film roughness. Spectra of C2H4 show Raman lines on cold-deposited Cu films but not on Cu deposited at room temperature. For C2H6, the IR spectra from both types of metal films are similar; the surface infrared selection rule holds and no Raman bands are observed. The Raman lines that appear in the IR spectra already at low exposures are attributed to species adsorbed at special defect sites, identical to the so-called active sites in surface enhanced Raman scattering (SERS). The IR excitation mechanism by transient electron transfer to the adsorbate pi* state can deliver a discrete vibrational band of a Raman-active vibration only under certain circumstances, for example, for adsorbates at the "SERS-active sites". C2H6 at these sites cannot deliver Raman bands in IRRAS, because it has no pi* state. We also discuss IRRAS measurements on Cu(111) and Cu(110) single crystals, where Raman bands of C2H4 have been observed.     

Atomic force microscopy investigation of the mechanism of calcite microcrystal growth under Kitano conditions

A combined atomic force microscopy (AFM)-inverted optical microscopy technique has been used to image the surface of calcite single microcrystals, with dimensions of 10-20 microm, at high resolution. The microcrystals were grown on a glass substrate using the Kitano method, a process that involves the outgassing of carbon dioxide from a saturated solution of calcium carbonate. The resulting increase in the supersaturation of the solution, with respect to calcium carbonate, induces crystallization. It is demonstrated, for the first time, that calcite microcrystals formed in this way exhibit a single spiral growth hillock on the (104) surface, as evidenced by a spiral step pattern, indicating that growth occurs at steps arising from an individual screw dislocation. The subsequent reactivity of these crystals under Kitano conditions has been followed in situ using AFM imaging.     

Characterization of organic overlayers on well-defined substrates

Proceeding from some remarks on the importance of organic/inorganic interfaces and of the controlled growth of thin organic films for both, basic research and present or future applications it is shown that surface sensitive methods like NEXAFS, XPS, ARUPS, and TPD can nicely be applied for studying various model systems. These systems range from perylene single crystals, over perylene and PTCDA layers on Si(111), PTCDA on Ag(111), HCOOH on Ni(111) to adsorption and polymerization of thiophene on a Ag(111) surface. Selected data are shown, and some results are briefly discussed.