Photothermal deflection microscopy for imaging sub-micronic defects in optical materials

Photothermal deflection is widely used to study defects in optical coatings and role of these defects in laser damage. Because defects responsible for laser damage are assumed to be nanometer-sized and lowly absorbing, both high spatial resolution and high sensitivity are required to detect them. In this work we theoretically and experimentally explore the capability of collinear photothermal deflection to give micronic resolution by reduction of the pump beam diameter. Thanks to a model describing temperature distribution and photothermal deflection, we have studied the effects of pump beam focusing on photothermal deflection. Then, we have developed a high resolution, high sensitivity microscope based on the photothermal deflection of a transmitted probe beam. The setup is characterized and the theoretical predictions are checked. We present a test of lateral spatial resolution obtained on specially prepared absorbing resolution targets and show that a lateral spatial resolution of 1 μm is reached on non-isolated defects. In case of single defects, we expect that 10 nm sized defects could be detected.     

Optically detected nuclear magnetic resonance at the sub-micron scale

Nuclear magnetic resonance is arguably one of the most powerful techniques available today to characterize diverse systems. However, the low sensitivity of the standard detection method constrains the applicability of this technique to samples having effective dimensions not less than a few microns. Here, we propose a novel scheme and device for the indirect detection of the nuclear spin signal at a submicroscopic scale. This approach--for which the name Dipolar Field Microscopy is suggested--is based on the manipulation of the long-range nuclear dipolar interaction created between the sample and a semiconductor tip located close to its surface. After a preparation interval, the local magnetization of the sample is used to modulate the nuclear magnetization in the semiconductor tip, which, in turn is determined by an optical inspection. Based on results previously reported, it is shown that, in principle, images and/or localized high-resolution spectra of the sample can be retrieved with spatial resolution proportional to the size of the tip.     

Channel length effect in a MOSFET structure by scanning capacitance microscopy

Depth dependent carrier density and trapped charges in a metal-oxide-semiconductor field effect transistor (MOSFET) like structure have been studied using scanning capacitance microscopy (SCM). For a MOSFET structure, since minority carrier can be provided by the source and drain diffusions, its response time is shorter than that of metal-oxide-semiconductor (MOS) system. So the high frequency C-V relation is slightly different from that of MOS capacitor and shows the characteristics dependent on the channel length. Bias dependent SCM images which represent the depth dependent carrier density and detrapping time constant of trapped charges in the oxide layer were observed to see the channel effect in a MOSFET structure.     

Magnetic resonance microscopy of biofilm structure and impact on transport in a capillary bioreactor

Microorganisms that colonize surfaces, biofilms, are of significant importance due to their role in medical infections, subsurface contaminant remediation, and industrial processing. Spatially resolved data on the distribution of biomass within a capillary bioreactor, the heterogeneity of the biofilm itself and the impact on transport dynamics for a Staphylococcus epidermidis biofilm in the natural growth state are presented. The data demonstrate the ability of magnetic resonance microscopy to study spatially resolved processes in bacterial biofilms, thus providing a basis for future studies of spatially resolved metabolism and in vivo clinical detection.     

"MR conditional" respiratory ventilator system incident in a 3-T MRI environment

The misunderstanding of the labeling for an “MR conditional” respiratory ventilator system resulted in the placement of this device, which had substantial ferromagnetic components, too close to a 3-T magnetic resonance (MR) system, causing a projectile incident. Magnetic resonance imaging health care professionals should be aware of the potentially dangerous consequences when such medical devices that have Food and Drug Administration-approved MR conditional labeling are brought into the MR system room. Recommendations to prevent future incidents are provided herein.     

Investigation of the resolution ability of an image inversion interferometer

The present paper presents the experimental measurement of the interferometric point spread function of an image inversion interferometer (III). The measurement was realized by scanning a pointlike source in the object plane and integrating the intensity in the image plane for each position of the point source. The achieved results are compared to the theoretical expectations and the results, which we received in a previous work by using a different method. The improved resolution of two neighbouring points in comparison to the conventional image is demonstrated. In addition we propose an explanation concerning the divergences of the values to be expected in theory.     

Microwave excitation and readout of nano- and micron scale cantilevers

We show that a microwave near-field coaxial resonator system allows mechanical cantilever excitation on a scale much shorter than the microwave wavelength. Thermal noise is observed in the unexcited system, enabling room temperature displacement sensitivity of ∼70 fm/Hz^1/2. The measured force between near-field probe and cantilever varies with separation, in excellent agreement with theory. Uniquely, optical excitation and read-out lasers are also included. The dependence of mechanical resonator quality factor on ambient air pressure has been accurately measured. We have demonstrate passive cantilever mode cooling from 300 K to 80 K by frequency detuning the microwave resonator and propose pulsed cooling operation to enable several high-sensitivity applications.     

Measurement of fluid ingress into calcium polyphosphate bioceramics using nuclear magnetic resonance microscopy

A MR microscopy experiment is developed and used to characterize fluid ingress and microstructural transformation in degradable calcium polyphosphate (CPP) bioceramics. High-resolution (49 μm) maps of fluid density and spin–lattice relaxation rate were obtained as a function of time for CPP immersed in phosphate buffered saline. These results demonstrate clear differences in fluid transport rates and solid matrix microstructure in two differing CPP formulations. CPP has been proposed as a potential implantable device for the delivery of pharmaceuticals, and the magnetic resonance imaging (MRI) data are used in conjunction with previously reported bulk elution results to develop a hypothesis explaining microstructural evolution in these materials. This type of non-destructive evaluation of the structure–transport of fluids in CPP is important to improved design of these functionalized biomaterials for long-term, localized delivery of sustained levels of therapeutic agents.     

Lattice-resolution imaging of the sapphire (0 0 0 1) surface in air by AFM

Lattice-resolution images of single-crystal α-alumina (sapphire) (0 0 0 1) surfaces have been obtained using contact-mode AFM under ambient conditions. It was found that the hexagonal surface lattice has a periodicity of 0.47 ± 0.11 nm, which is identical to that reported previously when the same surface was imaged in water. Large lattice corrugations (as high as 1 nm) were observed, but were concluded to be imaging artifacts because of the strong friction which causes additional deflection of the cantilever. The additional deflection of the cantilever is registered by the detector of the optical beam-deflection AFM resulting in an overestimation of the height at each lattice point. Abrupt changes were also resolved in the topography including honeycomb patterns and a transition from 2D lattices to 1D parallel stripes, with scanning direction. These phenomena can be explained by the commensurate sliding between the tip and sapphire surface due to the strong contact force.     

A matter of scale: from far‐field microscopy to near‐field nanoscopy

Vibrational spectroscopy is a powerful analytical tool which provides chemical information about a sample without a priori knowledge. By combining vibrational spectroscopy with different microscopic techniques, scientists can visualize and characterize the chemical composition of a sample on length scales which cover many orders of magnitude; from far‐field radiation used in microwave astronomy and Fourier transform infrared microscopy, to near‐field scattering used in tip‐enhanced Raman spectroscopy and scanning near‐field optical or infrared microscopy. Here, various modern chemical mapping techniques are reviewed and their advantages and disadvantages are discussed. Also, a basic theoretical background is provided for each technique along with several illustrative examples.     

The effects of restricted diffusion in nuclear magnetic resonance microscopy

A stochastic computer simulation is used to investigate the effects of restricted diffusion in NMR microscopy. It is shown that diffusion contributes to a loss of interfacial resolution through two main mechanisms. The first applies to spatial regions bound by impermeable interfaces and involves diffusive averaging of the frequency differences set up by the applied field gradients. This effect can be made arbitrarily small by increasing the magnitude of the field gradient. The second mechanism involves diffusion through permeable membranes or interfaces defining the sample morphology. This effect can, in principle, be reduced by multiple echo imaging with short pulse spacings. The possibility of imaging diffusive flow through a permeable interface is discussed.     

Scanning infrared microscopy investigation of copper precipitation in cast multicrystalline silicon

The behavior of copper precipitation in cast multicrystalline silicon (mc-Si) annealed at different temperatures under air cooling (30 K/s) or slow cooling (0.3 K/s) was investigated by scanning infrared microscopy (SIRM). Comparing to Czochralski-grown silicon (Cz-Si), copper precipitated more easily in mc-Si, and the lowest temperature of copper precipitation in mc-Si was about 700 °C, lower than that in Cz-Si. It was also observed that copper preferably precipitated on grain boundaries so that near the grain boundaries the denuded zone formed. The results indicate that the defects including dislocations, grain boundaries and microdefects, as the heteronucleation sites, enhanced copper precipitation. Moreover, cooling rates had a great influence on the copper precipitation, especially at lower annealing temperatures. Generally air cooling led to the formation of high density of copper-precipitate colonies.     

Ag growth on Si(111) with an Sb surfactant investigated by scanning tunneling microscopy

We have investigated a room-temperature growth mode of ultrathin Ag films on a Si(111) surface with an Sb surfactant using STM in a UHV system. On the Sb-passivated Si surface, small sized islands were formed up to 1.1 ML. Flat Ag islands were dominant at 2.1 ML, coalescing into larger islands at 3.2 ML. Although the initial growth mode of Ag films on the Sb-terminated Si(111) surface was Volmer-Weber (island growth), the films were much more uniform than Ag growth on clean (Si(111) at the higher coverages. From the analysis of STM images of Ag films grown with and without an Sb surfactant, the uniform growth of Ag films using an Sb surfactant appears to be caused by the kinetic effects of Ag on the preadsorbed Sb layer. Our STM results indicated that Sb suppresses the surface diffusion of Ag atoms and increases the Ag-island density. The increased island density is believed to cause coalescence of Ag islands at higher coverages of Ag, resulting in the growth of atomically flat and uniform Ag islands on the Sb surfactant layer.     

Scanning tunneling microscopy investigations of silicon carbide nanowires

Scanning tunneling microscopy (STM) images have been obtained from the surfaces of silicon carbide nanowires produced in the thermolysis-induced carbonization of halocarbons (combustion synthesis). The morphology of the nanowires shows trench-like features perpendicular to the fibres’ axis, which is assigned to the existence of microfacets on their sidewalls. For the first time high-resolution STM images of the SiC nanowires are presented. The results are in agreement with the previous reports suggesting the presence of microfacets on the SiC whiskers’ surface.     

Modification of silicon waveguide structures using ion implantation induced defects

The structure of re-crystallized silicon films is investigated using transmission electron microscopy, spectroscopic ellipsometry and positron annihilation spectroscopy. Samples were prepared via amorphization of the silicon overlayer of silicon-on-insulator substrates, and subsequent thermal annealing. For an annealing temperature of 650 °C we show that the silicon film has a poly-crystalline structure. Its refractive index measured at 1550 nm is comparable to that of crystalline silicon following re-crystallization at 750 °C. Positron measurements indicate a high concentration of open-volume point defects in the re-crystallized films. We discuss the potential importance of these structures with regard to defect engineering for silicon photonic devices.     

Vicinal and on-axis surfaces of 6H-SiC(0001) thin films observed by scanning tunneling microscopy

Surfaces of 6H-SiC(0001) homoepitaxial layers deposited on vicinal (3.5° off (0001) towards [11 0]) and on-axis 6H---SiC wafers by chemical vapour deposition have been investigated using ultra-high vacuum scanning tunneling microscopy. Undulating step configurations were observed on both the on-axis and the vicinal surfaces. The former surface possessed wider terraces than the latter. Step heights on both surfaces were 0.25 nm corresponding to single bilayers containing one Si and one C layer. After annealing at T>1100°C for 3–5 min in UHV, selected terraces contained honeycomb-like regions caused by the transformation to a graphitic surface as a result of Si sublimation. A model of the observed step configuration has been proposed based on the observation of the [ 110] or [1 10] orientations of the steps and energetic considerations. Additional deposition of very thin (2 nm) SiC films on the above samples by gas source molecular beam epitaxy was performed to observe the evolution of the surface structure. Step bunching and growth of 6H---SiC layers and formation of 3C---SiC islands were observed on the vicinal and the on-axis surfaces, respectively, and controlled by the diffusion lengths of the adatoms.     

Signal enhancement by diffusion: experimental observation of the "DESIRE" effect

Inadequate signal-to-noise ratio is a major factor limiting applications of magnetic resonance microscopy. The "Diffusion Enhancement of Signal and Resolution" (DESIRE) scheme promises potential sensitivity enhancements of between one and three orders of magnitude, but images using this mechanism have not been shown to date. Here, we report the first images obtained using the DESIRE method, and obtain excellent agreement between numerical simulations and experimental data with signal-to-noise enhancements of close to one order of magnitude.     

Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy

We investigated the conditions to achieve true atomic resolution with an atomic force microscope under noncontact mode (NC-AFM). At first, we derived the equation of vertical resolution as a function of the signal-to-noise ratio and the decay length of frequency shift by assuming an exponential tip-to-sample distance dependence of frequency shift. Next, by assuming a single atom probe, we derived the equation of lateral resolution as a function of the vertical resolution and the tip-to-sample distance, from which we clarified the guidelines to achieve true atomic resolution with NC-AFM. At last, we made clear the attainable decay length of frequency shift both for the van der Waals potential and the electrostatic (Coulomb) potential.     

Lattice imaging of close-packed structures by high resolution electron microscopy: ABO3 perovskite polytypes

Lattice imaging technique of high resolution electron microscopy has been employed to examine 4H, 6H and 9R ABO₃ perovskite polytypes. The lattice images can be correlated with the lattice periodicity and the stacking sequence of AO₃ layers and BO₆ octahedra. The study shows the utility and validity of the lattice imaging technique for the study of relatively close-packed systems. Commonwealth Visiting Professor, University of Oxford (1974–75).     

A post-processing technique for extending depth of focus in conventional optical microscopy

In this paper, we propose a post-processing technique to obtain optical microscope images with extended depth of focus using a conventional microscope. With the proposed technique, we collect a sequence of images focused at different depths. We then combine the in-focus regions of each acquired frame to compose a single all-in-focus image. That is, a new image with extended depth of focus is obtained. The key to such an algorithm is in selecting the “in-focus” regions from each frame. In this paper, we describe the technique used to identify the in-focus region on every depth slice. Quantitative simulation results are presented where mean absolute error is used as a metric to assess the algorithm performance. Results using real imagery are also presented for subjective evaluation. Based on subjective evaluation and the quantitative simulation results, we believe that the proposed algorithm provides useful depth of focus extension.