Electrochemistry of conductive polymers 36. pH dependence of polyaniline conductivities studied by current-sensing atomic force microscopy

We demonstrate from our current-sensing atomic force microscopic studies that both electrical and topographical properties of electrochemically prepared polyaniline (PAn) films are affected by their preparation conditions. The electrical properties of the fully doped PAn films prepared in 0.30 M nitric acid with its pH and ionic strength adjusted to 0.50 can be described as a conductor with an average conductivity of 49 (+/-13) S/cm with primarily a compact structure resulting from a relatively small growth rate. The doped PAn films prepared at pH 5.0, for example, have compact structures with large grains and lightly doped semiconducting properties with an average conductivity of about 1.54 (+/-0.09) x 10(-4) S/cm. From these data, we conclude that the degree of protonation of the monomers and the main reactions taking place during an early stage of the polymerization reaction are important factors determining the chemical structures as well as their conductivities and morphologies of the PAn films.     

Electrochemistry of conductive polymers 39. Contacts between conducting polymers and noble metal nanoparticles studied by current-sensing atomic force microscopy

Electrical properties of contacts formed between conducting polymers and noble metal nanoparticles have been examined using current-sensing atomic force microscopy (CS-AFM). Contacts formed between electrochemically prepared pi-conjugated polymer films such as polypyrrole (PPy), poly(3-methylthiophene) (P3MeT), as well as poly(3,4-ethylenedioxythiophene) (PEDOT) and noble metal nanoparticles including platinum (Pt), gold (Au), and silver (Ag) have been examined. The Pt nanoparticles were electrochemically deposited on a pre-coated PPy film surface by reducing a platinum precursor (PtCl62-) at a constant potential. Both current and scanning electron microscopic images of the film showed the presence of Pt islands. The Au and Ag nanoparticles were dispersed on the P3MeT and PEDOT film surfaces simply by dipping the polymer films into colloid solutions containing Au or Ag particles for specified periods (5 to approximately 10 min). The deposition of Au or Ag particles resulted from either their physical adsorption or chemical bonding between particles and the polymer surface depending on the polymer. When compared with PPy, P3MeT and PEDOT showed a stronger binding to Au or Ag nanoparticles when dipped in their colloidal solutions for the same period. This indicates that Au and Ag particles are predominantly linked with the sulfur atoms via chemical bonding. Of the two, PEDOT was more conductive at the sites where the particles are connected to the polymer. It appears that PEDOT has better aligned sulfur atoms on the surface and is strongly bonded to Au and Ag nanoparticles due to their strong affinity to gold and silver. The current-voltage curves obtained at the metal islands demonstrate that the contacts between these metal islands and polymers are ohmic.     

Halo-like structures studied by atomic force microscopy

Nanometer-sized clusters of copper have been produced in a hollow cathode sputtering source and deposited on SiO_x. Halo-like structures consisting of micrometer sized protrusions in the silicon oxide surface surrounded by thin rings of smaller particles are observed. The area in between seems to be depleted of particles. We propose that the halo-like structures are a result of electrostatic forces acting between the incoming charged clusters and charged regions on the surface. A simple computer simulation supports this suggestion.     

Behavior of thin films of poly(oxyethylene)-poly(oxybutylene) copolymers studied by brewster angle microscopy and atomic force microscopy

Surface films of two copolymers of ethylene oxide (E) and butylene oxide (B), namely E23B8 and E87B18, have been examined by Brewster angle microscopy (BAM) and atomic force microscopy (AFM). Isotherms taken on unsupported films of these copolymers at the air-water interface showed a clear gas to liquid phase transition for E57B18 and a barely discernible phase transition for E23B8. The BAM studies showed a gradual brightening of the films as the surface pressure was increased, which was associated with a film thickening and/or a film densification. Several bright spots were also observed within the films, with the number of spots increasing gradually as the film surface pressure was increased. AFM studies of these films did not show any localized ordering, which fits in with the results from our previous X-ray study of these copolymers [Hodges, C. S.; Neville, F.; Konovalov, O.; Gidalevitz, D.; Hamley, I. W.; Langmuir 2006, 22 (21), 8821-8825], where no long-range ordering was observed. AFM imaging showed two sizes of particulates that were irregularly spaced across the film. The larger particulates were associated with silica contaminants from the copolymer synthesis, whereas the smaller particulates were assumed to be aggregated copolymer. An analysis of the semidilute region of the isotherm showed that while both copolymers had intermixed ethylene oxide and butylene oxide units, the lower molecular weight E23B8 copolymer manifested significantly more intermixing than E87B18.     

Single molecule force spectroscopy on poly(vinyl alcohol) by atomic force microscopy

The elastic properties of poly(vinyl alcohol) (PVA) were investigated on the nanoscale using the new technique of single molecule force spectroscopy by atomic force microscopy (AFM). It was found that the elastic properties of PVA molecules scale linearly with their contour lengths. This finding corroborates that the deformation of individual PVA chains is measured. The force spectra of PVA show a kink at around 200 pN and cannot be fitted by an extended Langevin function. The deviation of the elastic behavior of PVA from a freely jointed chain model may indicate the presence of a suprastructure of PVA in NaCl solution.     

Thin liquid films studied by atomic force microscopy

Since its invention twenty years ago the atomic force microscope (AFM) has become one of the most important instruments in colloid and interface science. The ability of tracing force profiles between single particles or particles and flats in liquid environment makes it a tool-of-choice for investigating thin liquid films. In this paper we review experimental work on confined Newtonian and non-Newtonian liquids using the AFM.     

Confined polymer melts studied by atomic force microscopy

Using an atomic force microscope (AFM) the interaction between an AFM tip and different planar solid surfaces have been measured across a long-chain poly(dimethyl siloxane) (PDMS, M_W = 18,000 g/mol), a short-chain PDMS (M_W = 4200 g/mol), a poly(ethylmethyl siloxane) (PEMS, M_W = 16,800 g/mol), and a diblock copolymer consisting of one PDMS and one PEMS block (PDMS-b-PEMS, M_W = 15,100 g/mol). The interaction changed significantly during the first 10 h after immersing the solids in the polymer melt. This demonstrates that the time scale of structural changes at a solid surface is much slower than in the bulk. On mica and silicon oxide both polymers formed an immobilized “pinned” layer beyond which a monotonically decaying repulsive force was observed. Attractive forces were observed with short-chain PDMS on silicon oxide and PEMS on mica and silicon oxide. On the basal plane of graphite PEMS caused a stable, exponentially decaying oscillatory force.     

Morphological studies of spin-coated films of poly(styrene-block-methyl methacrylate) copolymers by atomic force microscopy

The surface structure of very thin (15–20 nm) spin-coated films of a symmetrical poly(styrene-b-methyl-methacrylate) block copolymer on silicon and mica is analyzed by atomic force microscopy (AFM). The films show a surface corrugation of a very regular 100 nm lateral periodicity and 6–8 nm amplitude. Film thickness is measured by AFM at induced film defects and checked by ellipsometry. XPS shows that both blocks are at the film surface. Selective degradation of the methyl methacrylate block is used for contrast enhancement and allows to assign poly(styrene) to the elevated surface regions and poly(methyl methacrylate) to the substrate/film interface.Friction interactions of the AFM tip with the film surface may be used to induce high orientational ordering of the morphological pattern perpendicular to the fast scan direction.     

Electrochemistry of conductive polymers 40. Earlier phases of aniline polymerization studied by Fourier transform electrochemical impedance spectroscopy

Earlier stages of aniline polymerization have been studied by Fourier transform electrochemical impedance spectroscopy (FTEIS) experiments. Initial oxidation of aniline leads to the formation of a thin layer passivating the electrode surface, which is depassivated upon a further increase in potential and mediates a further electron transfer from aniline to the electrode. The charge-transfer resistance was first shown to decrease upon increasing the potential, which leads to the inductive behavior upon further increase in the overpotential. The oligomer-polymer film thus formed was shown to undergo a transition from its passive state to neutral oligomer-polymer molecules via a conducting state; its oxidation was then observed during the anodic scan. It is this transition to the conductive states that leads to the propagation of the conductive zone throughout the nonconductive film, leading to further growth of polyaniline, as was clearly shown by the FTEIS measurements.     

SEBS aggregate patterning at a surface studied by atomic force microscopy

The morphologies of films spin coated from dilute block copolymer solution onto a mica substrate were studied by atomic force microscopy (AFM). Variables of interest were the polymer concentration, solvent, heating temperature, aging, and ultrasonic effect. It is shown that the solution concentration is the predominant factor in determining the shape of the aggregates displayed from spheres and rods to irregular patches with increasing concentration. The solubility parameter of the solvent plays an important role in modifying the distribution and the size of clusters at the surface. The structures of the aggregates at the surface are metastable, which could evolve with temperature from rodlike aggregates into regular stripes when annealed at a temperature higher than the order-disorder transition temperature of SEBS, whereas those in solution could evolve with aging and ultrasonic treatment into a more stable network structure.     

The characterization of high generation poly(amidoamine) G9 dendrimers by atomic force microscopy (AFM)

Scanning force microscopy (AFM) has been employed to characterize the generation‐9 (G9) poly(amidoamine) (PAMAM) dendrimer packing on a mica surface under various conditions. Well ordered 2‐D arrays from hexagonally packed particles of PAMAM (G9) dendrimers (11.4nm in diameter) were deposited on the mica surface. This may be one of the smallest regular monolayer arrays ever observed. The mechanism considered to be responsible for this 2‐D array packing is the interaction of forces between the dendrimer and the mica surface and between dendrimer molecules as well. Other factors such as molecular interpenetrating and the rigidity of the branch structure obviously play an important role in the 2‐D array formation.     

Mechanical and electrical properties of CdTe tetrapods studied by atomic force microscopy

The mechanical and electrical properties of CdTe tetrapod-shaped nanocrystals have been studied with atomic force microscopy. Tapping mode images of tetrapods deposited on silicon wafers revealed that they contact the surface with three of its arms. The length of these arms was found to be 130+/-10 nm. A large fraction of the tetrapods had a shortened vertical arm as a result of fracture during sample preparation. Fracture also occurs when the applied load is a few nanonewtons. Compression experiments with the atomic force microscope tip indicate that tetrapods with the shortened vertical arm deform elastically when the applied force was less than 50 nN. Above 90 nN additional fracture events occurred that further shortened the vertical arm. Loads above 130 nN produced irreversible damage to the other arms as well. Current-voltage characteristics of tetrapods deposited on gold revealed a semiconducting behavior with a current gap of approximately 2 eV at low loads (<50 nN) and a narrowing to about 1 eV at loads between 60 and 110 nN. Atomistic force field calculations of the deformation suggest that the ends of the tetrapod arms are stuck during compression so that the deformations are due to bending modes. Empirical pseudopotential calculation of the electron states indicates that the reduction of the current gap is due to electrostatic effects, rather than strain deformation effects inside the tetrapod.     

Mechanical properties of cellulose nanomaterials studied by contact resonance atomic force microscopy

Quantification of the mechanical properties of cellulose nanomaterials is key to the development of new cellulose nanomaterial based products. Using contact resonance atomic force microscopy we measured and mapped the transverse elastic modulus of three types of cellulosic nanoparticles: tunicate cellulose nanocrystals, wood cellulose nanocrystals, and wood cellulose nanofibrils. These modulus values were calculated with different contact mechanics models exploring the effects of cellulose geometry and thickness on the interpretation of the data. While intra-particle variations in modulus are detected, we did not observe a measureable difference in modulus between the three types of cellulose particles. Improved practices and experimental complications for the characterization of cellulosic nanomaterials with atomic force microscopy are discussed.     

Adhesion forces between protein layers studied by means of atomic force microscopy

Adhesion forces between different protein layers adsorbed on different substrates in aqueous media have been measured by means of an atomic force microscope using the colloid probe technique. The effects of the loading force, the salt concentration and pH of the medium, and the electrolyte type on the strength, the pull-off distance, and the separation energy of such adhesion forces have been analyzed in depth. Two very different proteins (bovine serum albumin and apoferritin) and two dissimilar substrates (silica and polystyrene) were used in the experiments. The results clearly point out a very important contribution of the electrostatic interactions in the adhesion between protein layers.     

Estimating the thickness of hydrated ultrathin poly(o-phenylenediamine) film by atomic force microscopy

A novel method to measure ultrathin poly(o-phenylenediamine) (PPD) film electropolymerized on gold electrode in liquid was developed. It is based on the force versus distance curve (force curve) of atomic force microscopy (AFM). When 1-0.25 μm/s was chosen as the rising rate of the scanner, and 50% of the confidence interval (CI) as the qualifying threshold value, the thickness of the hydrated polymer film could be calculated. This result was compared with one obtained from an AFM image. A step-like electrode fabricated by a photolithographic process was used. The height difference of the electrode before and after the PPD coating was imaged in liquid, and then the real thickness, 19.6±5.2 nm, was obtained. The sample was also measured by estimating the transition range of the force curve of hydrated PPD film, and the thickness of the hydrated PPD film was determined to be 19.3±8.2 nm. However, the results calculated by integrating the electropolymerized charge for the oxidation process of o-phenylenediamine (o-PD) was only one-third as large as it was when using the two previously described methods. This indicated that the structure of hydrated PPD film might have been swollen.     

Charge transfer on porous silicon membranes studied by current-sensing atomic force microscopy

A visible rectification effect on the current-voltage curves of metal/porous silicon/p-silicon has been observed by current-sensing atomic force microscopy. The current-voltage curves of porous silicon membranes with different porosities, prepared through variation of etching current density for a constant time, indicate that a higher porosity results in a higher resistance and thus a lower rectification, until the current reaches a threshold at a porosity 〉55%. We propose that the conductance mode in the porous silicon membrane with porosities 〉55% is mainly a hopping mechanism between nano-crystallites and an inverse static electric field between the porous silicon and p-Si interface blocks the electron injection from porous silicon to p-Si, but with porosities ≤55%, electron flows through a direct continuous channel between nano-crystallites.     

Surface organization of hyperbranched polymer molecules,as studied by atomic force microscopy

The recent emergence of hyperbranched polymers has opened the door for the design of a large variety of novel, well‐controlled chain architectures. For instance, «comb‐like» and “dendritic‐like” polymers can be obtained from hyperbranched poly(chloroethyl vinyl ether)‐g‐polystyrene (PCEVE‐g‐PS) copolymers, with excellent control over the dimensions of the polystyrene lateral branches and the PCEVE backbone. In this work, the nanometer scale organization of these materials is studied by means of Tapping Mode Atomic Force Microscopy. We focus on the influence of the intrinsic molecular architecture of the hyperbranched PCEVE‐g‐PS on the organization of the material. In the case of thin deposits, we observe a layer‐by‐layer organization. On the free surface, it is possible to image single polymer molecules and to analyze their size in terms of polymer molecular weight. In most cases, the molecules are found to adopt an extended conformation and to form lamellar arrangements. We observe that the degree of lateral ordering of these molecules strongly depends on their intrinsic architecture.     

Mechanical properties of polyelectrolyte-filled multilayer microcapsules studied by atomic force and confocal microscopy

By using a combination of atomic force and confocal microscopy, we explore the deformation properties of multilayer microcapsules filled with a solution of strong polyelectrolyte. Encapsulation of polyelectrolyte was performed by regulation of the multilayer shell permeability in water-acetone solutions. The "filled"capsules prepared by this method were found to be stiffer than "hollow" ones, which reflects the contribution of the excess osmotic pressure to the capsule stiffness. The force-deformation curves contain three distinct regimes of reversible, partially reversible, and irreversible deformations depending on the degree of compression. The analysis of the shape of compressed capsules and of the inner polyelectrolyte spacial distribution allowed one to relate the deformation regimes to the permeability of the multilayer shells for water and inner polyelectrolyte at different stage of compression.     

Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM)

AFM-SECM measurements using alternating current mode SECM (AC–SECM) were performed at an AFM tip with an integrated recessed ring microelectrode. Measurements were carried out in a three-electrode arrangement at 14.92 kHz and 110 mV_pp in 1 mM KCl solution. Combined AFM–AC–SECM enables the detection of electrochemical surface properties with high lateral resolution without addition of a redox mediator, thereby providing images on topographical changes along with chemical information. For demonstrating the capabilities of this method, simultaneously recorded data on the topography and the surface conductivity of gold/glass structures and of microelectrode arrays are discussed.     

Local surface charge dissipation studied using force spectroscopy method of atomic force microscopy

We propose herein a method to study local surface charge dissipation in dielectric films using force spectroscopy technique of atomic force microscopy. By using a normalization procedure and considering an analytical expression of the tip‐sample interaction force, we could estimate the characteristic time decay of the dissipation process. This approach is completely independent of the atomic force microscopy tip geometry and considerably reduces the amount of experimental data needed for the calculation compared with other techniques. The feasibility of the method was demonstrated in a freshly cleaved mica surface, in which the local charge dissipation after cleavage followed approximately a first‐order exponential law with the characteristic time decay of approximately 7–8 min at 30% relative humidity (RH) and 2–3.5 min at 48% RH. Copyright © 2015 John Wiley & Sons, Ltd.