Thin antimony films have been epitaxially deposited at 350K onto cleavage surfaces of mica at different residual gas pressures between 10?5 and 10?9 torr, and their resistivity ? measured as a function of film thicknessd≦500Å at temperaturesT=110K andT=300K. The ?(d) characteristics of films deposited at residual gas pressures of about 10?6 torr with condensation rates of about 1Å/s showed generally decreasing slopes as film thicknesses increased, but irregularities in detail. The ?(d) characteristics of films deposited at 10?8 torr with the same condensation rate decreasing with increasingd, too, show no such irregularities but very small regular variations of ?(d) with constant oscillation length Δd between the maxima, and decreasing amplitudes with increasingd. These variations are better recognizable in a modified ?(d) graph. We tend to interprete these variations by the quantum size effect as we found oscillation lengths and amplitudes compatibel with theory.
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