Photoelectric properties and electroluminescence of <Emphasis Type="Italic">p-i-n</Emphasis> diodes based on GeSi/Si heterostructures with self-assembled nanoclusters

This paper reports on the results of investigations into the photoelectric properties and electroluminescence of p-i-n diodes based on GeSi/Si heterostructures with GeSi self-assembled nanoclusters embedded in the i region. The p-i-n diodes are grown through sublimation molecular-beam epitaxy using a vapor-phase source of germanium. The photovoltage spectra of the p-i-n diodes measured at a temperature of 300 K exhibit a photosensitivity band attributed to interband optical transitions in the GeSi nanoclusters. A new approach to analyzing the photosensitivity spectra of the heterostructures containing GeSi thin layers is proposed, and the energy at the edge of the photosensitivity bands assigned to these layers is determined. The electroluminescence observed in the p-i-n diodes at 77 K is associated with the radiative interband optical transitions in GeSi nanoclusters.     

Morphology and photoluminescence of self-assembled GeSi/Si nanoclusters grown by sublimation molecular-beam epitaxy in a GeH<Subscript>4</Subscript> ambient

The dependence of the morphology and photoluminescence spectra of GeSi/Si(001) heterostructures with self-assembled nanoclusters, obtained by sublimation molecular-beam epitaxy in a GeH₄ ambient, on the growth conditions has been analyzed. The conditions for obtaining structures with uniform nanocluster arrays exhibiting photoluminescence at room temperature have been determined.     

Temperature-dependent photoluminescence and Raman spectra from porous GeSi/Si heterostructures

Porous GeSi/Si heterostructures were fabricated by laterally anodization in HF-based solutions. Photoluminescence spectra have been investigated as a function of temperature (77–300 K), showing that porous GeSi has a quite different temperature dependence from that of porous silicon. Raman spectra indicated that the sample structure changed after anodization. Phonon participation and direct recombination of excitons are proposed to be responsible in the light emission processes of porous GeSi and Si, respectively.     

Room Temperature Spin Accumulation Effect in Boron Doped Si Created by Epitaxial Fe<Subscript>3</Subscript>Si/<Emphasis Type="Italic">p</Emphasis>-Si Schottky Contact

To study spin-dependent transport phenomena in Fe₃Si/p-Si structures we fabricated 3-terminal planar microdevices and metal/semiconductor diode using conventional photolithography and wet chemical etching. I?V curve of prepared diode demonstrates rectifying behavior, which indicates the presence of Schottky barrier in Fe₃Si/p-Si interface. Calculated Schottky barrier height is 0.57 eV, which can provide necessary conditions for spin accumulation in p-Si. Indeed, in 3-terminal planar device with Fe₃Si/p-Si Schottky contact Hanle effect was observed. By the analysis of Hanle curves spin lifetime spin diffusion length in p-Si were calculated, which are 145 ps and 405 nm, respectively (at T = 300 K). Spin lifetime strongly depends on temperature which can be related to the fact that spin-dependent transport in our device is realized via the surface states. This gives a perspective of creation of spintronic devices based on metal/semiconductor structure without need for forming tunnel or Schottky tunnel contact.     

Infrared photoluminescence from GeSi nanocrystals embedded in a germanium–silicate matrix

We investigate the structural and optical properties of GeO/SiO₂ multilayers obtained by evaporation of GeO₂ and SiO₂ powders under ultrahigh vacuum conditions on Si(001) substrates. Both Raman and infrared absorption spectroscopy measurements indicate the formation of GeSi nanocrystals after postgrowth annealing at 800°C. High-resolution transmission electron microscopy characterizations show that the average size of the nanocrystals is about 5 nm. For samples containing GeSi nanocrystals, photoluminescence is observed at 14 K in the spectral range 1500–1600 nm. The temperature dependence of the photoluminescence is studied.     

MPS结构中的光生伏特现象

报道了金属／多孔硅／单晶硅结构（ＭＰＳ）中光生伏特效应研究的最新结果，给出了该结构的光谱响应曲线，发现该结构在１１００—３５０ｎｍ波长范围具有明显的光谱响应．还测量了开路电压随温度、光照波长及光照强度的变化关系，发现开路电压随温度的降低近似线性增加，其温度系数对于金／多孔硅结构约为２.０ｍＶ／Ｋ，对于铝／多孔硅结构约为２.８ｍＶ／Ｋ，与单晶硅及非晶硅太阳电池的温度系数相近，但ＭＰＳ结构的开路电压随光强的增加不满足对数关系．结果表明，在ＭＰＳ结构中金属／多孔硅肖特基结对光生伏特效应起了主要作用，而多孔硅／单晶硅异质结的作用是与此相反的 关键词：     

Photoluminescence of Ge(Si)/Si(0 0 1) self-assembled islands in the near infra-red wavelength range

The dependence of photoluminescence spectra of structures with GeSi/Si(0 0 1) self-assembled nanoislands on growth temperature has been investigated. It was shown that the redshift of the island-related photoluminescence peak with a decrease of the growth temperature is associated with suppression of Si diffusion in the islands and an increase of Ge content in them. For the first time a photoluminescence signal from SiGe islands was observed at energies much lower than the Ge band gap. The energy position of the island-related photoluminescence peak is well described by the model of optical transition, which is indirect in real space. The photoluminescence signal at 1.55 μm from GeSi/Si(0 0 1) self-assembled islands was obtained up to room temperature.     

Vibrational density of states of hen egg white lysozyme

The resonant Raman scattering in GeSi/Si structures with GeSi quantum dots has been analyzed. These structures were formed at various temperatures in the process of molecular-beam epitaxy. It has been shown that Raman scattering spectra recorded near resonances with the E₀ and E₁ electronic transitions exhibit the lines of Ge optical phonons whose frequencies differ significantly from the corresponding values in bulk germanium. In the structures grown at low temperatures (300–400°C), the phonon frequency decreases with increasing excitation energy. This behavior is attributed to Raman scattering, which is sensitive to the size of quantum dots, and shows that quantum dots are inhomogeneous in size. In the structures grown at a higher temperature (500°C), the opposite dependence of the frequency of Ge phonons on excitation energy is observed. This behavior is attributed to the competitive effect of internal mechanical stresses in quantum dots, the localization of optical photons, and the mixing of Ge and Si atoms in structures with a bimodal size distribution of quantum dots.     

Specific features of plastic relaxation of a metastable Ge x Si1 − x layer buried between a silicon substrate and a relaxed germanium layer

Heterostructures Ge/Ge _x Si_{1 ? x} /Si(001) grown by molecular beam epitaxy have been investigated using atomic scale high-resolution electron microscopy. A germanium film (with a thickness of 0.5–1.0 μm) grown at a temperature of 500°C is completely relaxed. An intermediate Ge_0.5Si_0.5 layer remains in a strained metastable state, even though its thickness is 2–4 times larger than the critical value for the introduction of 60° misfit dislocations. It is assumed that the Ge/GeSi interface is a barrier for the penetration of dislocations from a relaxed Ge layer into the GeSi layer. This barrier is overcome during annealing of the heterostructures for 30 min at a temperature of 700°C, after which dislocation networks having different degrees of ordering and consisting predominantly of edge misfit dislocations are observed in the Ge/GeSi and GeSi/Si(001) heteroboundaries.     

Temperature dependence of the bandgap width in FeIn2Se4 single crystals

We have used the Bridgman method to grow single crystals of the ternary compound FeIn₂Se₄ and we have determined their composition and structure. We measured the transmission spectra in the intrinsic absorption edge region in the temperature range 20–300 K. From the transmission spectra, we determined the bandgap width and plotted its temperature dependence. We show that the E_g(T) dependence has a shape typical for semiconductor compounds.     

Analysis of electrical characteristics of Er/p-InP Schottky diode at high temperature range

We report on the temperature-dependent electrical characteristics of Er/p-InP Schottky barrier diodes. The current–voltage (I–V) and capacitance–voltage (C–V) measurements have been carried out in the temperature range of 300–400 K. Using thermionic emission (TE) theory, the zero-bias barrier height (Φ_bo) and ideality factor (n) are estimated from I–V characteristics. It is observed that there is a decrease in n and an increase in the Φ_bo with an increase in temperature. The barrier height inhomogenity at the metal/semiconductor (MS) interface resulted in Gaussian distribution of Φ_bo and n. The laterally homogeneous Schottky barrier height value of approximately 1.008 eV for the Er/p-InP Schottky barrier diodes is extracted from the linear relationship between the experimental zero-bias barrier heights and ideality factors. The series resistance (R_s) is calculated by Chenug's method and it is found that it increases with the decrease in temperature. The reverse-bias leakage current mechanism of Er/p-InP Schottky diode is investigated. Both Poole–Frenkel and Schottky emissions are described and discussed. Furthermore, capacitance–voltage (C–V) measurements of the Er/p-InP Schottky contacts are also carried out at room temperature in dark at different frequencies of 10, 100 and 1000 kHz. Using Terman's method, the interface state density is calculated for Er/p-InP Schottky diode at different temperatures.     

Temperature dependence of photoluminescence from mono-dispersed Si nanoparticles

The temperature dependence of photoluminescence (PL) from mono-dispersed Si nanoparticles was studied from 4 to 300 K. Si nanoparticles produced by pulsed laser ablation in He background gas were sorted into the 6 nm size range by a differential mobility analyzer (DMA). The spread of the size distribution was narrowed to a geometrical standard deviation _g = 1.05. On decreasing the temperature from 300 to 4 K, the intensity of the PL spectra increased gradually, peaked at about 60 K, and then decreased rapidly. The temperature dependences of the intensity and the full width at half maximum (FWHM) on the PL spectra are discussed in terms of radiative and nonradiative decay rates.     

Band structure and valence-band offset of HfO2 thin film on?Si?substrate from photoemission spectroscopy

Synchrotron radiation photoemission spectroscopy and optical transmission spectrum measurements have been performed on an HfO₂ thin film grown on a Si(100) substrate to determine the band structure of the HfO₂/Si stack. The result shows a valence-band offset of 2.5 eV and a conduction-band offset of 2.2 eV for the HfO₂/Si interface. The Schottky barrier height between Au and HfO₂ is obtained from current density–voltage measurement. The characterization reveals that the dominant conduction mechanism in the region of low field under gate injection is Schottky emission. The energy-band diagram of an Au–HfO₂–Si MOS stack was obtained from these results.     

Photovoltaic activity in a ZnSe/PEO–chitosan blend electrolyte junction

Thin films of ZnSe and PEO–chitosan blend polymer doped with NH₄I and iodine crystals were prepared to form the two sides of a semiconductor electrolyte junction. ZnSe was electrodeposited on indium tin oxide (ITO) conducting glass. The polymer is a blend of 50 wt% chitosan and 50 wt% polyethylene oxide. The polymer blend was complexed with ammonium iodide (NH₄I), and some iodine crystals were added to the polymer–NH₄I solution to provide the I⁻/I³⁻redox couple. The room temperature ionic conductivity of the polymer electrolyte is 4.32 × 10⁻⁶ S/cm. The polymer film was sandwiched between the ZnSe semiconductor and an ITO glass to form a ZnSe/polymer electrolyte/ITO photovoltaic cell. The open circuit voltage (V _oc) of the fabricated cells ranges between 200 to 400 mV and the short circuit current between 7 to 10 μA.     

Application of XAFS spectroscopy to studying the microstructure and electronic structure of quantum dots

Variations in the microscopic structural parameters of semiconductor nanoclusters (interatomic distances, coordination numbers, and types of neighboring atoms) under variation of the preparation conditions of Ge/Si, GaN/AlN, and InAs/AlAs heterostructures are determined by the EXAFS-and XANES spectroscopy methods. The effect of preparation conditions on interphase diffusion and structure parameters in semiconductor nanoclusters is revealed. The effect of the temperature of synthesis at different stages, the substrate orientation and pretreatment, the composition of the molecular beam (in particular, the presence of Ge⁺ cations) on the local composition of nanostructures is studied. Relations between the size and shape of nanoparticles and their local spatial characteristics (interatomic distances, stoichiometric composition, and phase boundary characteristics) are examined.     

Low-energy photoluminescence of structures with GeSi/Si(001) self-assembled nanoislands

The photoluminescence spectra of structures with self-assembled GeSi/Si(001) islands are investigated as functions of the growth temperature. It is shown that the shift of the peak of photoluminescence from islands toward lower energies on decreasing the growth temperature is due to the suppression of Si diffusion into islands and an increase in the fraction of Ge in islands. A photoluminescence signal from the GeSi islands is found in the region of energies down to 0.6 eV, which is considerably smaller than the band-gap width in bulk Ge. The position of the peak of photoluminescence from islands is described well by the model of a real-space indirect optical transition with account of the real composition and elastic strains of the islands. Mono-and multilayer structures are obtained with self-assembled GeSi/Si(001) nanoislands exhibiting a photoluminescence signal in the region 1.3–2 μm at room temperature.     

Transmission spectra of epitaxial layers of Pb1 ? xEuxTe (0 ≤ x ≤ 0.37) solid solutions in the frequency range 7–4000 cm?1

The spectra of epitaxial Pb_{1 − x} Eu _x Te (0 ≤ x ≤ 0.37) solid solution layers grown on BaF₂ and Si substrates have been investigated over a wide frequency range 7–4000 cm⁻¹ at temperatures of 5–300 K. Apart from the phonon and impurity absorption lines, the absorption in a local mode in PbEuTe layers of substrates and buffer layers has been observed in the frequency range 110–114 cm⁻¹. As the temperature decreases from 300 to 5 K, the transverse phonon mode softens from 33.0 to 19.5 cm⁻¹.     

Ni/4H-SiC 肖特基势垒磁场下输运性质的分析

采用高真空电子束蒸发的方法将镍 (Ni)淀积在 4H SiC(0 0 0 1)面上 ,制备出良好的Ni/4H SiC肖特基接触 .研究了Ni/4H SiC肖特基势垒在强磁场和低温下的I -V特性 ,并以热电子发射理论为基础 ,结合弛豫近似玻尔兹曼方程对Ni/4H SiC肖特基势垒在磁场下的输运性质进行了分析和计算 ,发现电流的变化与磁场的平方和电压成线性关系 ,和温度成反比关系 ,与实验结果基本符合     

高择优取向铌酸锶钡薄膜的射频磁控溅射制备

采用溶胶-凝胶法在(100)Si单晶上预先制备出掺钾(K)的铌酸锶钡(SBN)缓冲层,利用射频磁控溅射法在缓冲层KSBN上沉积出高择优取向的铌酸锶钡薄膜,获得了磁控溅射法制备择优取向铌酸锶钡薄膜的相关工艺参数,研究发现,KSBN缓冲层能够很有效地克服衬底与SBN薄膜之间较大的晶格失配,在氧气氩气的比例为1∶2,工作气压为10 Pa,溅射功率300 W,衬底温度300℃,退火温度为800℃的工艺条件下,能够获得c轴高度择优取向的铌酸锶钡铁电薄膜.利用X射线衍射仪,原子力显微镜等仪器分析了薄膜 关键词： 磁控溅射 高择优取向 p-n结效应     

Evaluation of the barrier capability of Zr-Si films with different substrate temperature for Cu metallization

Barrier capability of Zr-Si diffusion barriers in Cu metallization has been investigated. Amorphous Zr-Si diffusion barriers were deposited on the Si substrates by RF reactive magnetron sputtering under various substrate temperatures. An increase in substrate temperature results in a slightly decreased deposition rate together with an increase in mass density. An increase in substrate temperature also results in grain growth as deduced from field emission scanning electron microscopy (FE-SEM) micrographs. X-ray diffraction (XRD) spectra and Auger electron spectroscopy (AES) depth profiles for Cu/Zr-Si(RT)/Si and Cu/Zr-Si(300 °C)/Si samples subjected to anneal at various temperatures show that the thermal stability was strongly correlated with the deposition temperature (consequently different density and chemical composition etc.) of the Zr-Si barrier layers. ZrSi(300 °C) with higher mass density make the Cu/Zr-Si(300 °C)/Si sample more stable. The appearance of Cu₃Si in the Cu/Zr-Si/Si sample is attributed to the failure mechanism which may be associated with the diffusion of Cu and Si via the grain boundaries of the Zr-Si barriers.