亚单层InGaAs量子点-量子阱异质结构的时间分辨光致发光谱

测定了亚单层InGaAs/GaAs量子点-量子阱异质结构在5K下的时间分辨光致发光谱.亚单层量 子点的辐射寿命在500 ps 至 800 ps之间，随量子点尺寸的增大而增大，与量子点中激子的 较小的横向限制能以及激子从小量子点向大量子点的隧穿转移有关.光致发光上升时间强烈 依赖于激发强度密度.在弱激发强度密度下，上升时间为 35 ps，纵光学声子发射为主要的 载流子俘获机理.在强激发强度密度下，上升时间随激发强度密度的增加而减小，俄歇过程 为主要的载流子俘获机理.该结果对理解亚单层量子点器件的工作特性非常有用. 关键词： 亚单层 量子点-量子阱 时间分辨光致发光谱     

Properties of GaAs/InGaAs quantum-size structures containing δ〈Mn〉-doped layers

Properties of structures containing an InGaAs quantum well (QW) or InAs quantum dots (QDs) as well as δ〈C〉-and δ〈Mn〉-doped layers are investigated. Most of these structures are fabricated by the MOCVD epitaxy method; δ〈Mn〉-doped layers are obtained by low-temperature laser deposition directly in the epitaxial reactor. The structures under study exhibit three conduction channels: the δ〈C〉-doped layer, δ〈Mn〉-doped layer, and QW or wetting layer in the case of QDs. The contribution of each channel into the total conduction depend on the measurement temperature. Photoluminescence of the structures as a function of thickness of δ〈Mn〉-doped layer is studied.     

Injection electroluminescence from quantum-size InGaAs/GaAs structures with metal/semiconductor and metal-oxide-semiconductor junctions

Electroluminescence from forward-biased diode structures with Au(Ni)/GaAs and Au(Ni)/tunneling-thin oxide/GaAs junctions has been studied. The possibility of luminescence amplification from the Schottky diodes by introducing a tunneling-thin anode-oxide or heavily doped p ⁺-GaAs layer between the metal and semiconductor have been demonstrated. The studies of the temperature dependence of electroluminescence and the I-W curves indicate that the amplification of the electroluminescence intensity from the above structures may be associated with lowering the potential barrier for the minority carriers under the forward bias of the Schottky barrier.     

Strained germanium films in Ge/InGaAs/GaAs heterostructures: Formation of edge misfit dislocations at the Ge/InGaAs interface

Heterostructures of the “strained Ge film/artificial InGaAs layer/GaAs substrate” type have been grown by molecular beam epitaxy. A specific feature of these structures is that the plastically relaxed (buffer) InGaAs layer has the density of threading dislocations on a level of 10⁵–10⁶ cm⁻². These dislocations penetrate into the strained Ge layer to become sources of both 60° and 90° (edge) misfit dislocations (MDs). Using the transmission electron microscopy, both MD types have been found at the Ge/InGaAs interface. It has been shown that the presence of threading dislocations inherited from the buffer layer in a tensile-strained Ge film favors the formation of edge dislocations at the Ge/InGaAs interface even in the case of small elastic deformations in the strained film. Possible mechanisms of the formation of edge MDs have been considered, including (i) accidental collision of complementary parallel 60° MDs propagating in the mirror-tilted {111} planes, (ii) induced nucleation of a second 60° MD and its interaction with the primary 60° MD, and (iii) interaction of two complementary MDs after a cross-slip of one of them. Calculations have demonstrated that a critical layer thickness (h _c ) for the appearance of edge MDs is considerably smaller than h _c for 60° MDs.     

Excitation energy dependence of the optical properties of InGaAs/GaAs quantum well heterostructures

Il Nuovo Cimento D - We report an experimental study on a large set of InGaAs/GaAs quantum well structures by means of continuous-wave photoluminescence and photoluminescence excitation. The...     

Dependence of the heavy-hole exciton reduced mass on quantum-well size in InGaAs/GaAs heterostructures

We present low temperature photoluminescence investigations of the exciton ground state of In_0.14Ga_0.86As/GaAs quantum wells (QW) in the presence of pulsed magnetic fields up to 50 T. The exciton in-plane reduced mass and the heavy-hole in-plane mass are determined from the best fit of theoretical calculations to the magnetic field dependence of PL peaks. When the QW thickness decreases, their masses increases due to valence-band mixing effect.     

Effect of hydrogen on modulation-doped AlGaAs/InGaAs/GaAs heterostructures: a photoluminescence study

The effect of hydrogen on donors and interface defects in silicon modulation doped Al_xGa_1−xAs/In_yGa_1−yAs/GaAs heterostructures has been investigated by photoluminescence (PL). Hydrogenation was carried out on two sets of samples, one set consists of high quality pseudomorphic heterostructures and another set having partially lattice relaxed structures prone to the defects. On exposure of high quality pseudomorphic structures to hydrogen plasma above 150 °C, a significant blue shift in the PL peak positions as well as bandwidth narrowing is observed. This indicates, the reduction in two-dimensional electron gas in the In_yGa_1−yAs quantum well due to hydrogen passivation of silicon donors in the Al_xGa_1−xAs supply layer. The reactivation of the donors is observed upon annealing the hydrogenated sample for 1 h at 250 °C under hydrogen ambient. Another interesting feature is a significant improvement in the PL of lattice-relaxed structures upon hydrogenation of the samples above 250 °C, which is attributed to the hydrogen passivation of interface defects due to the misfit dislocations.     

Formation of spin light-emitting diodes based on InGaAs/GaAs heterostructures containing ferromagnetic inclusions

The electroluminescence of light-emitting diodes based on heterostructures with InGaAs quantum wells and a delta 〈Mn〉 doped layer in the GaAs barrier is studied. It is shown that the diodes emit circularly polarized light with the degree of polarization depending on the applied magnetic field and on temperature. We assume that the temperature dependences of the degree of polarization are determined by a change in the mutual position of energy levels of Mn ions in the delta layer and of holes in a quantum well.     

Catastrophic degradation of pulsed lasers based on AlGaAs/InGaAs/GaAs heterostructures with electron-beam pumping

Catastrophic degradation of pulsed lasers based on InGaAs/AlGaAs/GaAs structures with different design of the active domain with transverse pumping by the electron beam at T = 300 K is studied. In lasers based on structures with a InGaAs single quantum well and with seven quantum wells, the maximal values of pulsed power are 70–90 and 10–20 W, respectively.     

Emitting heterostructures with a bilayer InGaAs/GaAsSb/GaAs quantum well and a GaMnAs ferromagnetic layer

The radiative and magnetic properties of novel heterostructures with a bilayer InGaAs/GaAsSb/GaAs quantum well and a GaMnAs ferromagnetic layer are studied. The circular polarization of electroluminescent radiation is observed at temperatures from 10 to 160 K. The magnetic field dependences of the degree of circular polarization are nonlinear with a hysteresis loop at temperatures from 10 to 50 K, and they become linear at higher temperatures. The magnitude of polarization at the saturation magnetization of GaMnAs in the 2000 Oe field remains at the level of ~0.2%.     

超晶格中GaAs/InGaAs界面与InGaAs/GaAs界面的特性差异

In_xGa_1-xAs缓冲层上生长In_yGa_1-yAs/GaAs超晶格（x＜y）．阱层处于压缩应变，垒层处于伸张应变，其厚度均小于Mathews-Blakeslee（M-B）平衡理论计算的临界厚度．透射电子显微镜及俄歇电子能谱、二级离子质谱测试发现，GaAs/In_yGa_1-yAs界面铟组分过渡区比In_yGa_1-yAs/GaAs界面铟组 关键词：     

Combined cross-sectional STM/AFM in liquid: Study of InGaAs/GaAs heterostructures with quantum wells and dots

Combined scanning tunneling and atomic force microscopy (STM/AFM) of cross-sectional cleavages in a protective liquid medium (oil) is applied to study InGaAs/GaAs heterostructures with quantum wells and dots. It is shown that the quantum wells and dots can be visualized on cleavages in both AFM and STM modes and to measure the current-voltage characteristics of the contact between an AFM probe and the cleavage surface.     

Time-resolved screening of the piezoelectric field in InGaAs/GaAs V-shaped quantum wires of variable profile

InGaAs/GaAs V-shaped quantum wires grown in grooves with either (111) or (411) sidewalls have been studied by ps-transient photoluminescence as a function of the excitation intensity. The optical nonlinearity associated with the screening of the internal piezoelectric field is temporally monitored by the blue shift of the spectrally resolved photoluminescence, occurring in the first 150 ps after the laser pulse, followed by a red shift at longer delays. Such an energy shift strongly depends on the photoexcited carrier density and reaches a maximum value of about 14 meV in the (411) wires. Despite their larger piezoelectric field, we observe a smaller energy shift in wires with (111) sidewalls, due to the enhanced confinement which localizes the wire wavefunction at the bottom of the groove. The observed energy shifts are consistent with the theoretical calculation of the polarization charge density induced by the strain via the piezoelectric effect.     

Temperature dependence of the circular polarization of electroluminescence from spin-polarized light-emitting diodes based on InGaAs/GaAs heterostructures

The temperature dependence of the circular polarization degree of the electroluminescence from light-emitting diodes based on InGaAs/GaAs-quantum-well (QW) heterostructures with a closely located ferromagnetic Mn δ layer is investigated. It is found that the Mn δ layer ferromagnetically affects holes in the QW. This effect is characterized by spin polarization of the holes and the appearance of circularly polarized emission components under electroluminescence conditions. It is demonstrated that the ferromagnetic properties of a δ layer can be studied by analyzing the QW luminescence. The Curie temperatures of the ferromagnetic system are determined using the results of investigations.     

Cyclotron masses in InGaAs/GaAs superlattices and InGaAs/AlAs superlattices

Cyclotron resonance (CR) measurements have been carried out to evaluate the effective mass of electron in (InGaAs)_n/(GaAs)_nsuperlattices (SLs) and (InGaAs)_n/(AlAs)_nSLs. To clarify the dependence of cyclotron mass on the monolayer numbern , we measured CR signals using pulsed high-magnetic fields up to 150 T and a far-infrared laser. We found clear cyclotron resonances in the transmission of 10.6 μ m at 75 T at room temperature in (InGaAs)_n/(GaAs)_nSLs and little dependence on the monolayer number n in the SLs. However, for (InGaAs)_n/(AlAs)_nSLs, a large dependence of cyclotron mass on the monolayer number n was observed. We consider that these dependencies are related to the difference between the barrier height in the SLs and the influence of nonparabolicity on the conduction subbands in the SLs.     

Properties of MnSb/GaAs heterostructures

MnSb layers are deposited on GaAs(100) via the laser ablation of Mn and Sb targets. The magnetic field dependences of the transverse Kerr effect display magnetic anisotropy and magnetization jumps. Measurements of the Hall effect reveal a hysteresis loop at temperatures of up to 300 K.