共查询到19条相似文献,搜索用时 93 毫秒
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提高原子力显微镜(AFM)成像质量的方法 总被引:1,自引:0,他引:1
针对原子力显微镜AFM不要求样品具有导电性的优点,分析了影响原子力显微镜AFM扫描图像质量的原因及提高AFM成像质量的方法。 相似文献
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扫描隧道显微镜和原子力显微镜 总被引:2,自引:0,他引:2
在微观领域对物质进行观察和研究中,人们发明了各种显微镜。但是光学显微镜由于受到光的波长的限制而无法达到很高的分辨率,X射线衍射技术则要求观察样品必须是晶体,透射电镜则需要对观察样品进行超薄切片。所有这些要求使人们的观察受到了限制,因此人们开始研制更加先进的显微镜。1982年宾尼格、罗雷尔及其同事们成功地研制出世界上第一台扫描隧道显微镜(STM),导致了显微领域中的一场革命,并在它的基础上研制出一系列的扫描探针显微镜,如原子力显微镜、磁力显微镜和激光力显微镜等。STM的出现使人类第一次可以实时地观测单个原子在物质表面的排列状态和与表面电子行为有关的物理性质和化学性质。 相似文献
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原子力与光子扫描隧道组合显微镜 总被引:3,自引:0,他引:3
介绍了超高分辨光于扫描隧遭显微镜(PSTM)的计冗历程,为解决第一代(单光束照明)光千扫捕隧逼显傲镜中存在人为假象和样品光学图像与形貌图像难于分离两个难题,用“对称双光束照明方法消假象,用原子力与光子扫描隧道组合显微镜(AF/PSTM)图像分解方法分离样品光学透过率、折射率与形貌图像。研制成功新一代原子力与光子扫描隧道组合显微镜(AF/PSTM)样机。该样机在一次扫描中已获得两幅原子力显微镜图像(形貌与相位)和两幅光学图像(透过率和折射率),有效地减少了假象,分解了样品光学折射率、透过率与形貌图像。 相似文献
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研制了一种与光学显微镜结合并配置 CCD 监视器的原子力显微镜,可同时获得样品的原子力显微镜图象及光学图象.已能分辨出5纳米的精细结构,最大扫描范围可达2μm.文中给出了本仪器获得的一些样品图象结果. 相似文献
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新型原子力显微镜的研制及其应用 总被引:14,自引:2,他引:14
研制了一种新型卧式原子力显微镜(AFM)系统.本文介绍卧式AFM的工作原理及其简要结构,讨论反馈控制电路系统的优化设计,阐述Windows/Dos兼容的图象扫描、处理和显示软件.基于原子力曲线的测定,利用AFM对纳米金刚石薄膜和多孔氧化铝进行了扫描检测.实验表明,该AFM系统具有十分良好的图象重复性、稳定性和衬比(度),仪器的横向分辨率优于3nm,纵向分辨率可达1nm,最大扫描范围达到5μm×5μm.这些性能为卧式AFM在更广泛的纳米技术领域的应用奠定了基础. 相似文献
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扫描探针显微镜主要包括扫描隧道显微镜和原子力显微镜,其利用尖锐的针尖逐点扫描样品,可在原子和分子尺度上获取表面的形貌和丰富的物性,改变了人们对物质的研究范式和基础认知。近年来,qPlus型高品质因子力传感器的出现将扫描探针显微镜的分辨率和灵敏度推向了一个新的水平,为化学结构、电荷态、电子态、自旋态等多自由度的精密探测和操控提供了前所未有的机会。文章首先简要介绍原子力显微镜的发展历史和基本工作原理,然后重点描述qPlus型原子力显微镜技术的优势及其在单原子、单分子和低维材料体系中的应用,最后展望该技术的未来发展趋势和潜在应用。 相似文献
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用原子力显微镜(AFM)研究了1,2二油酸甘油3磷酸1甘油(DOPG)脂质体胞囊的形态和脂双层膜结构.报道了AFM探针与吸附在氧化硅膜上脂质体的相互作用结果.实验结果表明,在液晶态的DOPG中,AFM图像是一些球形或椭球形颗粒.这些球形或椭球形颗粒与液晶态的DOPG脂质体的结构特性有关.当AFM的探针与脂质体表面相互作用力超过某临界值时,脂质体胞囊破裂,变成脂双层结构.从图上可以看到,第二层的DOPG膜吸附在第一层上,膜的厚度约为5nm.
关键词:
原子力显微镜
脂质体
纳米结构 相似文献
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Masayuki Abe Takayuki Uchihashi Masahiro Ohta Hitoshi Ueyama Yasuhiro Sugawara Seizo Morita 《Optical Review》1997,4(1):A232-A235
Using the noncontact mode atomic force microscope (AFM) with frequency modulation detection method, force gradient acting
on the AFM tip induced by the evanescent field was measured in a high vacuum. Exponential distance dependence of the force
gradient by the evanescent field was successfully measured for the first time. Decay lengths of the force gradient were estimated
to be 40±3 nm and 43±3 nm for Ar and He-Ne lasers, respectively, and independent of wavelength within the experimental error.
The minimum detectable force was estimated to be about 0.1 pN. There was a tendency for the measured decay length to become
shorter at a distance less than z=10 nm in many cases. The force gradient induced by the evanescent field inp-polarization was larger than that ins-polarization.
This paper was originally presented at the first Asia-Pacific Workshop on Near Field Optics, which was held on August 17 and
18, 1996 at Seoul Education and Culture Center, Seoul, Korea, organized by the Condensed Matter Research Institute, Seoul
National University. 相似文献
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原子力显微镜(AFM)的微探针系统是典型的微机械构件,它在接触扫描过程处于耦合变形状态.采用数值模拟方法探究恒力模式下探针耦合变形对微观扫描力信号、微观形貌信号的影响.研究表明,AFM的恒力模式扫描中,法向扫描力并不是恒定大小,与轴向扫描力存在耦合作用,在粗糙峰峰值增加阶段,二力均增加;在粗糙峰峰值减小阶段,二力均减小;该耦合作用随形貌坡度、针尖长度等增加而加强.微观形貌的测试信号和横向扫描侧向力信号受探针耦合变形影响较小,但侧向力与形貌斜率密切相关,且其极值点与形貌极值点存在位置偏差,这些结果均与原子力
关键词:
原子力显微镜
探针悬臂梁
耦合变形
扫描力 相似文献
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单电子自旋极有可能发展成为未来信息学的基础。以电子自旋为核心的新型单分子或单原子器件将最终成为基本信息单元,基于单电子的自旋态将有可能构筑未来量子计算机的量子比特。但是,如何实现对单个电子自旋及其相干态和纠缠态的测量和控制,目前仍然是一个很大的挑战。作为调控单个电子自旋的重要实验手段,电子自旋共振扫描隧道显微镜的发展一直备受关注。文章简要介绍了电子自旋共振扫描隧道显微镜的基本概念,阐述了其发展历史和最新进展,归纳了机理探索的研究成果,论述了该设备研发面临的挑战与对策,并对未来的发展和应用做了展望。 相似文献
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Lipid membrane: inelastic deformation of surface structure by an atomic force microscope 总被引:2,自引:0,他引:2
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The stability of the 1,2-Dioleoyl-sn-Glycero-3-[phospho-rac-1-Glycerol-Na] liposome in the liquid crystalline state have been investigated using an atomic force microscope (AFM). We have observed the inelastic deformation of the sample surface. The AFM tip causes persistent deformation of the surface of the lipid membrane, in which some of the lipid molecules are eventually pushed or dragged by the AFM tip. The experiment shows how the surface structure of the lipid membrane can be created by the interaction between the AFM tip and lipid membrane. When the operating force exceeds 10-8 N, it leads to large deformations of the surface. A square region of about 1×1μm2 is created by the scanning probe on the surface. When the operating force is between 10-11N and 10-8N, it can image the topography of the surface of the lipid membrane. The stability of the sample is related to the concentration of the medium in which the sample is prepared. 相似文献
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Tip cleaning and sharpening processes for noncontact atomic force microscope (AFM) operated in ultrahigh vacuum (UHV) were carried out and evaluated by a scanning Auger microscope (SAM) with a field emission electron gun and a noncontact AFM in UHV combined with a scanning tunneling microscope and a field emission microscope. The cantilever used in this study was piezoresistive, which can be heated by passing a current through the resistive legs of the cantilever. As a pretreatment, the tip was irradiated with ultraviolet light in oxygen to remove carbon contaminants. It was heated at about 750°C to form a clean oxide layer in oxygen of 5×10−5 Torr in an SAM chamber. The desorption of the layer can make a remained tip apex sharper by heating under electron beam irradiation. A thermally oxidized layer was also eliminated by HF etching to sharpen the tip apex. The procedures are useful to obtain a well-defined Si tip suitable for a noncontact AFM. 相似文献