Enhanced scattering from a thin film with one-dimensional disorder

This paper deals with a TE plane wave scattering from a thin film with one-dimensional disorder by means of the stochastic functional approach. The thin film is one-dimensionally inhomogeneous in the horizontal direction with infinite extent, and is homogeneous in the vertical direction with finite thickness. Based on an approximate wavefield representation in terms of a Wiener–Hermite expansion in a preceding paper (Tamura et al., 2004, Waves in Random Media, 14, 435–465), the first- and second-order incoherent scattering cross-sections are presented in explicit forms and scattering properties are discussed. The scattering properties vary entirely with the film thickness. In a case where the thickness is smaller than a few wavelengths in the thin film, enhanced scattering and associated enhanced scattering may appear as sharp peaks or dips on the second-order incoherent scattering distribution if the thin film has guided wave modes. When the thickness becomes sufficiently larger than the wavelength inside the film, a new enhanced scattering phenomenon appears as gentle peaks on the second-order incoherent scattering distribution in four special directions. Such four directions are the directions of forward scattering, specular reflection, backscattering, and the symmetrical direction of forward scattering with respect to the normal of the film surface.The first-order incoherent scattering occurs distinctly in four such directions. Such enhanced scattering is independent of the existence of the guided wave modes inside the thin film, and deeply relates to the structure of the thin film with one-dimensional disorder that has infinite correlation in the vertical direction. For SiC and glass thin films having one-dimensional disorder with a Gaussian correlation and three types of exponential correlation, the first- and second-order incoherent scattering cross-sections are illustrated in figures. The narrow enhanced scattering peaks appear for the glass film in a thin case. The gentle enhanced peaks turn up for both the SiC and glass films in a thick case. Furthermore, the optical theorem is calculated for several cases. It is then found that the error of the optical theorem decreases and the performance of the wavefield is improved by taking into account the second-order incoherent scattering.     

Scalar plane wave scattering from a thin film with two-dimensional fluctuation

This paper deals with a scalar plane wave scattering from a thin film with two-dimensional fluctuation by means of the stochastic functional approach. The refractive index of the thin film is written as a Gaussian random field in the transverse directions with infinite extent, and is invariant in the longitudinal direction with finite thickness. An explicit form of the random wavefield involving effects of multiple scattering is obtained in terms of a Wiener-Hermite expansion under small fluctuation. The first- and second-order incoherent scattering cross-sections are calculated numerically and illustrated in figures. In the incoherent scattering, scattering ring, quasi-anomalous scattering, enhanced scattering and gentle enhanced scattering may occur.     

Scalar plane wave scattering from a thin film with two-dimensional fluctuation∗∗

This paper deals with a scalar plane wave scattering from a thin film with two-dimensional fluctuation by means of the stochastic functional approach. The refractive index of the thin film is written as a Gaussian random field in the transverse directions with infinite extent, and is invariant in the longitudinal direction with finite thickness. An explicit form of the random wavefield involving effects of multiple scattering is obtained in terms of a Wiener–Hermite expansion under small fluctuation. The first- and second-order incoherent scattering cross-sections are calculated numerically and illustrated in figures. In the incoherent scattering, scattering ring, quasi-anomalous scattering, enhanced scattering and gentle enhanced scattering may occur.     

Wave reflection and transmission from a thin film with one-dimensional disorder

This paper deals with a TE plane wave reflection and transmission from a thin film with one-dimensional disorder by means of the stochastic functional approach. The relative permittivity of the thin film is written by a Gaussian random field in the horizontal direction with infinite extent, and is uniform in the vertical direction with finite thickness. Arandomwavefield is obtained in terms of a Wiener-Hermite expansion representation with approximate expansion coefficients (Wiener kernels) under a small fluctuation case. For a SiC thin film and a glass thin film having one-dimensional disorder with Gaussian correlation or an exponential correlation, numerical examples of the first-order incoherent scattering cross section and the optical theorem are illustrated in the figures. It is then found that ripples and four major peaks appear in angular distributions of the incoherent scattering. Such four peaks may occur in the directions of forward scattering, specular reflection, backscattering and in the symmetrical direction of forward scattering with respect to the normal to surface of the thin film. Physical processes that yield such ripples and peaks are discussed.     

TM plane wave scattering and diffraction from a randomly rough half-plane: (part II) An evaluation of the diffraction kernel

In a previous paper (part I), it has been shown that a random wavefield from a randomly rough half-plane for a TM plane wave incidence is written in terms of a Wiener-Hermite expansion with three types of Fourier integrals. This paper studies a concrete representation of the random wavefield by an approximate evaluation of such Fourier integrals, and statistical properties of scattering and diffraction. For a Gaussian roughness spectrum, intensities of the coherent wavefield and the first-order incoherent wavefield are calculated and shown in figures. It is then found that the coherent scattering intensity decreases in the illumination side, but is almost invariant in the shadow side. The incoherent scattering intensity spreads widely in the illumination side, and have ripples at near the grazing angle. Moreover, a major peak at near the antispecular direction, and associated ripples appear in the shadow side. The incoherent scattering intensity increases rapidly at near the random half-plane. These new phenomena for the incoherent scattering are caused by couplings between TM guided waves supported by a slightly random surface and edge diffracted waves excited by a plane wave incidence or by free guided waves on a flat plane without any roughness.     

Numerical, analytical, and experimental studies of scattering from very rough surfaces and backscattering enhancement

This paper Presents numerical simulations, theoretical analysis, and millimeter wave experiments for scattering from one-dimensional very rough surfaces. First, numerical simulations are used to investigate the effects of roughness spectrum, height variation, interface medium, polarization, and incident angle on the backscattering enhancement. The enhanced backscattering due to rough surface scattering is divided into two cases; the RMS height close to a wavelength and RMS slope close to unity, and RMS height much smaller than a wavelength with surface wave contributions. Results also show that the enhancement is sensitive to the roughness spectrum. Next, a theory based on the first- and second-order Kirchhoff approximation modified with angular and propagation shadowing is developed. The theoretical solutions provide a physical explanation of backscattering enhancement and agree well with the numerical results. In addition to the scattering of a monochromatic wave, the analytical results of the broadening and lateral spreading of a pulsed beam wave scattering from rough surfaces are also discussed. Finally, the existence of backscattering enhancement from one-dimensional very rough conducting surfaces with exact Gaussian statistics and Gaussian roughness spectrum is verified by a millimeter-wave experiment. Experimental results which show enhanced backscattering for both TE and TM polarizations for different angles of incidence are presented.     

Numerical,analytical, and experimental studies of scattering from very rough surfaces and backscattering enhancement

Abstract

This paper Presents numerical simulations, theoretical analysis, and millimeter wave experiments for scattering from one-dimensional very rough surfaces. First, numerical simulations are used to investigate the effects of roughness spectrum, height variation, interface medium, polarization, and incident angle on the backscattering enhancement. The enhanced backscattering due to rough surface scattering is divided into two cases; the RMS height close to a wavelength and RMS slope close to unity, and RMS height much smaller than a wavelength with surface wave contributions. Results also show that the enhancement is sensitive to the roughness spectrum. Next, a theory based on the first- and second-order Kirchhoff approximation modified with angular and propagation shadowing is developed. The theoretical solutions provide a physical explanation of backscattering enhancement and agree well with the numerical results. In addition to the scattering of a monochromatic wave, the analytical results of the broadening and lateral spreading of a pulsed beam wave scattering from rough surfaces are also discussed. Finally, the existence of backscattering enhancement from one-dimensional very rough conducting surfaces with exact Gaussian statistics and Gaussian roughness spectrum is verified by a millimeter-wave experiment. Experimental results which show enhanced backscattering for both TE and TM polarizations for different angles of incidence are presented.     

Enhanced transmission through randomly rough surfaces

We present an experimental and theoretical study of two enhancement effects that occur in the transmission of light through a thin metal film whose illuminated surface is a one-dimensional random surface while its back surface is planar. The first is a well defined peak in the antispecular direction in the angular distribution of the intensity of the incoherent component of the transmitted light (enhanced transmission). The second is an additionally well defined peak in the forward direction in the angular distribution of the intensity of the incoherent component of the transmitted light, when the illuminated surface is not only randomly rough but has even symmetry as well (enhanced refraction). A fully automated bidirectional reflectometer has been used to measure the intensity of the incoherent component of He-Ne laser light transmitted through gold and silver films of these two types and the results are compared with the predictions of theoretical calculations of the enhancement effects.     

Dynamic anisotropy and heterogeneity of polystyrene thin films as studied by inelastic neutron scattering

We studied the dynamic anisotropy and heterogeniety of polystyrene thin films in glassy state with inelastic neutorn scattering. Adjusting the scattering vector to the directions parallel and perpendicular to the film surface, we observed the elastic scattering intensities as a function of temperature. It was found for the 200 A film that the elastic intesity decreased with increasing temperature more rapidly in the perpendicular direction than in the pararell direction, showing the higher mobility in the perpendicular direction. However, such dynamical anisotropy was not observed in the 1000 A film. The decrease in the mobility was observed with the film thickness in both the directions. These results were explained in terms of an interface hard layer. We also evelauated the dynamical heterogeniety from the non-Gaussian parameter A0, which increased with decreasing the film thickness, showing the increase in the dynamical heterogeneity. Assuming a simple bi-layer model consisting of the interface hard layer and the bulk-like layer, we analyzed the thickness dependence of the non-Gaussian parameter A0 and the mean square displacement (u2) to find that the hard layer has a thickness of approximately 130 A and a mean square displacement of approximately 0.018 A2 at 230 K.     

Enhanced transmission through randomly rough surfaces

Abstract

We present an experimental and theoretical study of two enhancement effects that occur in the transmission of light through a thin metal film whose illuminated surface is a one-dimensional random surface while its back surface is planar. The first is a well defined peak in the antispecular direction in the angular distribution of the intensity of the incoherent component of the transmitted light (enhanced transmission). The second is an additionally well defined peak in the forward direction in the angular distribution of the intensity of the incoherent component of the transmitted light, when the illuminated surface is not only randomly rough but has even symmetry as well (enhanced refraction). A fully automated bidirectional reflectometer has been used to measure the intensity of the incoherent component of He-Ne laser light transmitted through gold and silver films of these two types and the results are compared with the predictions of theoretical calculations of the enhancement effects.     

Enhanced backscattering and transmission of light from random surfaces on semi-infinite substrates and thin films

The enhanced backscattering of light from a random surface is manifested by a well defined peak in the retro-reflection direction in the angular distribution of the intensity of the incoherent component of the light scattered from such a surface. In this paper we present several new theoretical and experimental results bearing on the conditions under which enhanced backscattering occurs, and the way in which this phenomenon depends on the nature of the random surface roughness, both in the case that the random surface bounds a semi-infinite scattering medium and in the case that it bounds a film, either free-standing or on a reflecting substrate. In addition, we present new results on the transmission of light through thin metallic films bounded by random surfaces, which display the phenomenon of enhanced transmission, namely a well defined peak in the antispecular direction in the angular distribution of the intensity of the incoherent component of the light transmitted through such films.     

Enhanced backscattering and transmission of light from random surfaces on semi-infinite substrates and thin films

Abstract

The enhanced backscattering of light from a random surface is manifested by a well defined peak in the retro-reflection direction in the angular distribution of the intensity of the incoherent component of the light scattered from such a surface. In this paper we present several new theoretical and experimental results bearing on the conditions under which enhanced backscattering occurs, and the way in which this phenomenon depends on the nature of the random surface roughness, both in the case that the random surface bounds a semi-infinite scattering medium and in the case that it bounds a film, either free-standing or on a reflecting substrate. In addition, we present new results on the transmission of light through thin metallic films bounded by random surfaces, which display the phenomenon of enhanced transmission, namely a well defined peak in the antispecular direction in the angular distribution of the intensity of the incoherent component of the light transmitted through such films.     

Second harmonic generation of light in the Kretschmann attenuated total reflection geometry in the presence of surface roughness

Abstract

Using a computer simulation approach we study the generation of second harmonic light in reflection and in transmission in the Kretschmann attenuated total reflection geometry. In this geometry a thin metal film is deposited on the planar base of a dielectric prism, through which p-polarized light is incident on the film. The back surface of the film, which separates the film from vacuum, is a one-dimensional, randomly rough surface, whose generators are normal to the plane of incidence of the light. The nonlinearity responsible for the second harmonic generation is assumed to arise at the prism-metal and metal–vacuum interfaces, and thus enters the problem only through the boundary conditions at these interfaces at the harmonic frequency. The source terms entering these boundary conditions are obtained from the solutions of the corresponding scattering and transmission problems at the fundamental frequency. It is found that a peak in the angular dependence of the intensity of both the transmitted and reflected second harmonic light occurs in the directions normal to the mean scattering surface, in addition to an enhanced backscattering peak in the retroreflection direction. The enhanced transmission peak occurs in the non-radiative region, and therefore cannot be observed in the far field.     

Scattering from very rough metallic and dielectric surfaces: a theory based on the modified Kirchhoff approximation

This paper presents a theory of scattering from very rough metallic and dielectric surfaces using the first- and second-order Kirchhoff approximations (KA) modified with the angular and propagation shadowing. The shadowing functions limit the single and double scattered waves which are illuminated and not shadowed by the surface. The theoretical results are compared with the Monte Carlo simulations showing the range of validity of the theory. The theory is applicable to the range where the RMS height is close to a wavelength and the RMS slope is close to unity, and the second medium is lossy. The second-order scattering includes two waves travelling in opposite directions on the surface, giving a physical explanation of the enhanced backscattering.     

Scanning tunneling spectroscopy of Ag films: the effect of periodic versus quasiperiodic modulation

By using scanning tunneling spectroscopy to probe a silver thin film that contains both periodic and quasiperiodic modulation, and by using Fourier analysis, we unravel the influences of individual Fourier components of the scattering potential (periodic versus quasiperiodic) on the electronic structure of a one-dimensional quasiperiodically modulated thin Ag film. Along the periodically modulated direction, a Bragg reflection-induced energy gap is observed in k space. On the other hand, the exotic E vs k spectrum with many minigaps was observed along the quasiperiodic direction.     

Coherent and incoherent scattering from tilled soil surfaces

A recent experimental study by Wegmuller et al. has reported on directional backscattering patterns in the Synthetic Aperture Radar (SAR) response of bare or sparsely vegetated agricultural soils that require a better understanding of scattering from tilled soils. Shin and Kong modeled the latter as quasi-periodic rough surfaces and showed that the total backscatter consists of three terms, one due to the coherent field and the other two arising from the incoherent scattered field. However, all the simulations reported by Shin and Kong are only concerned with one of the terms contributing to the incoherent scattering and could not predict highly directional backscattering patterns. In this context, the objective of this work is: (1) to extend the Shin–Kong model in order to compute in a finite form all the coherent and incoherent terms; (2) to describe the case of quasi-periodic rough surfaces having quasi-parallel row directions. Results indicate that the new model can predict very narrow (i.e. a few tenths of a degree angular aperture) backscatter peaks when the wave incidence plane is quasi-orthogonal to the row tillage direction. More generally, the paper's results point to the importance of anisotropic tillage patterns in modulating the radar backscatter in the entire azimuthal plane.     

显微拉曼研究外延生长的BaTiO_(3-x)薄膜的结构相变与结构动力学(英文)

我们用显微拉曼、卢瑟福背散射谱、X射线散射和非对称摇摆等实验手段研究了在1 0 - 2 到1 0 - 5帕氧气压下用激光分子束外延技术生长的BaTiO3-x薄膜的结构动力学特性。测量结果表明生长氧压越低,晶格常数c和c/a越大,晶格常数a稍微减小,晶胞体积变大。随着生长氧压的减小,薄膜中氧含量减小。在3 0×1 0 - 5帕氧气压下生长的薄膜中氧缺陷可达0 48,但是样品的四方相结构可以很好的维持。显微拉曼研究进一步确定了样品都是四方相结构。另外,在BaTiO2 52 薄膜的拉曼光谱中发现高频段有两个新峰,其可能是由于氧缺陷导致的二级拉曼散射引起的。随着生长氧压的减小,拉曼峰向低频移动,表明薄膜中的应力减小。同时,拉曼峰变宽,这可能是由于氧缺陷导致的结构畸变引起的。由于在薄膜中存在二维张应力,BaTiO3单晶样品中的结构相变特征在我们的样品中从78到5 5 0K的温度范围内不存在。     

Multiple-scaling methods for Monte Carlo simulations of radiative transfer in cloudy atmosphere

Two multiple-scaling methods for Monte Carlo simulations were derived from integral radiative transfer equation for calculating radiance in cloudy atmosphere accurately and rapidly. The first one is to truncate sharp forward peaks of phase functions for each order of scattering adaptively. The truncated functions for forward peaks are approximated as quadratic functions; only one prescribed parameter is used to set maximum truncation fraction for various phase functions. The second one is to increase extinction coefficients in optically thin regions for each order scattering adaptively, which could enhance the collision chance adaptively in the regions where samples are rare. Several one-dimensional and three-dimensional cloud fields were selected to validate the methods. The numerical results demonstrate that the bias errors were below 0.2% for almost all directions except for glory direction (less than 0.4%) and the higher numerical efficiency could be achieved when quadratic functions were used. The second method could decrease radiance noise to 0.60% for cumulus and accelerate convergence in optically thin regions. In general, the main advantage of the proposed methods is that we could modify the atmospheric optical quantities adaptively for each order of scattering and sample important contribution according to the specific atmospheric conditions.     

Investigation of interface roughness cross-correlation properties of optical thin films from total scattering losses

The interface roughness and interface roughness cross-correlation properties affect the scattering losses of high-quality optical thin films. In this paper, the theoretical models of light scattering induced by surface and interface roughness of optical thin films are concisely presented. Furthermore, influence of interface roughness cross-correlation properties to light scattering is analyzed by total scattering losses. Moreover, single-layer TiO₂ thin film thickness, substrate roughness of K9 glass and ion beam assisted deposition (IBAD) technique effect on interface roughness cross-correlation properties are studied by experiments, respectively. A 17-layer dielectric quarter-wave high reflection multilayer is analyzed by total scattering losses. The results show that the interface roughness cross-correlation properties depend on TiO₂ thin film thickness, substrate roughness and deposition technique. The interface roughness cross-correlation properties decrease with the increase of film thickness or the decrease of substrates roughness. Furthermore, ion beam assisted deposition technique can increase the interface roughness cross-correlation properties of optical thin films. The measured total scattering losses of 17-layer dielectric quarter-wave high reflection multilayer deposited with IBAD indicate that completely correlated interface model can be observed, when substrate roughness is about 2.84 nm.     

Multiple scattering in the high-frequency limit with second-order shadowing function from 2D anisotropic rough dielectric surfaces: I. Theoretical study

In this paper the first- and second-order Kirchhoff approximation is applied to study the backscattering enhancement phenomenon, which appears when the surface rms slope is greater than 0.5. The formulation is reduced to the geometric optics approximation in which the second-order illumination function is taken into account. This study is developed for a two-dimensional (2D) anisotropic stationary rough dielectric surface and for any surface slope and height distributions assumed to be statistically even. Using the Weyl representation of the Green function (which introduces an absolute value over the surface elevation in the phase term), the incoherent scattering coefficient under the stationary phase assumption is expressed as the sum of three terms. The incoherent scattering coefficient then requires the numerical computation of a ten- dimensional integral. To reduce the number of numerical integrations, the geometric optics approximation is applied, which assumes that the correlation between two adjacent points is very strong. The model is then proportional to two surface slope probabilities, for which the slopes would specularly reflect the beams in the double scattering process. In addition, the slope distributions are related with each other by a propagating function, which accounts for the second-order illumination function. The companion paper is devoted to the simulation of this model and comparisons with an 'exact' numerical method.