共查询到19条相似文献,搜索用时 62 毫秒
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平行板电容器是静电学重要的演示仪器之一。用它除可研究平行板电容器的特性C=K εS/d外。还可以通过平行板建立电场,在平行电场中研究静电学中的静电力、电势、带电粒子在电场中的运动、避雷针模型等学生认为比较抽象的问题,给静电学中 相似文献
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平行板电容器的电容是高中物理电学部分的重要演示实验.教材中的探究方案只能定性研究,且理解难度大,实验效果不明显.为解决以上问题设计了简单稳定且能定量探究平行板电容器电容决定因素的实验装置.实验装置采用单面覆铜板作为电容器极板,利用A4纸或塑料文件夹做电介质,通过实验探究得出平行板电容器电容与极板正对面积成正比,与极板间... 相似文献
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利用复数坐标系上的保角变换和利用势的拉普拉斯方程分别讨论了带有半圆柱形凸出疤和半球形占出疤两种有缺陷的平行板电容器的电场分布,进而得出一些有益的结论。 相似文献
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正方形平行板电容器的边缘效应:谈物理模型实用化 总被引:4,自引:0,他引:4
本文利用复变函数中施瓦兹(Schwarz)变换所表达的“无限大”方形平行板电容器的复势W平面与复数坐标。平面的变换关系,研究“无限大”方形平行板电容器的边缘效应,得出“无限大”方形平行板电容器的电容公式.计算出因忽略方形平板边缘效应所造成的相对误差与克希霍夫圆形平板电容公式所对应的相对误差非常接近. 相似文献
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讨论了平行板电容器储存的电场能和电势能, 以及带电粒子飞入两板间电场及在电场中偏转过程中能
量的转化情况, 也讨论了电势能及其变化 相似文献
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有缺陷的平行板电容器内的电场 总被引:2,自引:0,他引:2
利用复数坐标系上的保角变换和利用势的拉普拉斯方程分别讨论了带有半圆柱形凸出疤和半球形凸出疤两种有缺陷的平行板电容器内的电场分布,进而得出一些有益的结论 相似文献
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The roll bonding technique is one of the most widely used methods to produce metal laminate sheets. Such sheets offer interesting research opportunities for both scientists and engineers. In this paper, we report on an experimental investigation of the ‘thickness effect’ during laminate rolling for the first time. Using a four-high multifunction rolling mill, Cu/Al/Cu laminate sheets were fabricated with a range of thicknesses (16, 40, 70 and 130 μm) of the Al layer. The thickness of the Cu sheets was a constant 300 μm. After rolling, TEM images show good bonding quality between the Cu and Al layers. However, there are many nanoscale pores in the Al layer. The fraction of nanoscale pores in the Al layer increases with a reduction in the Al layer thickness. The finite element method was used to simulate the Cu/Al/Cu rolling process. The simulation results reveal the effect of the Al layer thickness on the deformation characteristics of the Cu/Al/Cu laminate. Finally, we propose that the size effect of the Al layer thickness during Cu/Al/Cu laminate rolling may offer a method to fabricate ‘nanoporous’ Al sandwich laminate foils. Such foils can be used in electromagnetic shielding of electrical devices and noisy shielding of building. 相似文献
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Xia Lei Zhong Kai Song Yang Lu Xin Xu Lü-Shun Yan Yan Li Hong-Dong Yuan Fang-Li Jiang Jian-Zhong Yu Da-Peng Zhang Shu-Lin 《中国物理 B》2012,21(9):97801-097801
A comprehensive study on Raman spectroscopy with different excitation wavelengths, sample sizes, and sample shapes for optic phonons (OPs) and acoustic phonons (APs) in polar and non-polar nano-semiconductors has been performed. The study affirms that the finite size effect does not appear in the OPs of polar nano-semiconductors, while it exists in all other types of phonons. The absence of the FSE is confirmed to be originated from the long-range Fröhlich interaction and the breaking of translation symmetry. The result indicates that the Raman spectra of OPs cannot be used as a method to characterize the scale and crystalline property of polar nano-semiconductors. 相似文献
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介绍了变阻抗线的工作原理,给出了类Blumlein线结构变阻抗线的倍压特性,变阻抗线能够实现能量的完全传输,输出电压为输入电压的(n+1)/2倍;以平板结构为例研究了变阻抗线中的阻抗偏差问题:传输线实际阻抗较理论设计值偏大,各级的偏差基本在20%以内;通过电磁仿真研究了三级类Blumlein线结构变阻抗线中各级阻抗偏差对于倍压系数的影响,在阻抗偏差范围内,倍压系数随着阻抗的增大而减小,倍压系数在1.9~2.1范围内,给出倍压系数受各级阻抗偏差的影响规律;设计了三级类Blumlein线结构平板传输线进行实验,输出电压为3833 V,与理论设计相符。 相似文献
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It has been reported previously that, for single and polycrystalline copper (fcc), the indentation size effect and the grain size effect (GSE) can be combined in a single length-scale-dependent deformation mechanism linked to a characteristic length-scale calculable by a dislocation-slip-distance approach (X. D. Hou and N. M. Jennett, ‘Application of a modified slip-distance theory to the indentation of single-crystal and polycrystalline copper to model the interactions between indentation size and structure size effects,’ Acta Mater., Vol. 60, pp. 4128–4135, 2012). Recently, we identified a ‘lateral size effect (LSE)’ in scratch hardness measurements in single crystal copper, where the scratch hardness increases when the scratch size is reduced (A. Kareer, X. D. Hou, N. M. Jennett and S. V. Hainsworth ‘The existence of a lateral size effect and the relationship between indentation and scratch hardness’ Philos. Mag. published online 24 March 2016). This paper investigates the effect of grain size on the scratch hardness of polycrystalline copper with average grain sizes between 1.2 and 44.4 μm, when using a Berkovich indenter. Exactly the same samples are used as in the indentation investigation by Hou et al. (‘Application of a modified slip-distance theory to the indentation of single-crystal and polycrystalline copper to model the interactions between indentation size and structure size effects,’ Acta Mater., Vol. 60, pp. 4128–4135, 2012). It is shown that, not only does the scratch hardness increase with decreasing grain size, but that the GSE and LSE combine in reciprocal length (as found previously for indentation) rather than as a superposition of individual stresses. Applying the same (as indentation) dislocation-slip-distance-based size effect model to scratch hardness yielded a good fit to the experimental data, strongly indicating that it is the slip-distance-like combined length-scale that determines scratch hardness. A comparison of the fit parameters obtained by indentation and scratch on the same samples is made and some distinct differences are identified. The most striking difference is that scratch hardness is over four times more sensitive to grain size than is indentation hardness. 相似文献