SSX—1型实用扫描隧道显微镜

本文综述了能够直接观察到单个原子的场离子显微镜、透射电子显微镜、扫描隧道显微镜，报告了ＳＳＸ－１ 型实用扫描隧道显微镜主要特点与改进之处，和开展扫描隧道显微学研究所取得一些结果．     

扫描探针显微镜在工业产品检测中的应用前景

讨论了扫描探针显微镜（ＳＰＭ）的应用领域和ＳＰＭ的发展现状，重点探讨了国产ＳＰＭ应用于信息产业、能源产业以及航空航天等工业领域中高新技术产品质量检测的存在、的问题、以及应用的前景。     

扫描力显微镜研究进展

在讨论扫描力显微镜基本原理基础上，详细介绍了近期ＳＦＭ成像模式和技术的发展以及它们在表面研究中的应用。     

显微镜概述

 人类总要不断探索微观领域的秘密,要亲眼见到超微尺度的自然现象,显微镜是人们所能依赖的最好工具。在历史的长河中,显微镜经历了光学显微镜,电子显微镜,扫描隧道显微镜,扫描探针显微镜的漫长历程。由于显微镜的研制也曾造就了四位诺贝尔物理奖得主,显微镜促进了科学技术的发展,特别早期对生物医学领域做出重要贡献,而科学技术的发展及理论突破又是产生更新型显微镜的温床和催化剂。一、光学显微镜人类对于生物微观世界的认识,有着一段漫长的历史,与显微镜的发明与改进密切相关。     

等离子喷涂陶瓷涂层的声学显微象

木文应用了声学显微镜分析了等离子喷涂陶瓷涂层(Metco 136F,Metco 80NS,国产Al_2O_3)于磨削加工和摩擦试验后的表面及内部结构特征。结果表明,声学显微镜能无破坏地观察材料内部的紧密度、空穴、变形、缺陷、裂纹等,反映了材料的力学象。这是传统的光学显微镜、扫描电子显微镜无法相比的。声学显微镜与光学显微镜、扫描电子显微镜配合,必将使材料科学的研究进入一个新的时代。     

STM的同胞兄弟--原子力显微镜(AFM)

介绍了在扫描隧道显微镜（ＳＴＭ）基础上发展起来的原子力显微镜（ＡＦＭ）的工作原理、关键部分、工作模式及其应用。     

扫描隧道显微镜研究银的表面结构和凝聚行为

采用扫描隧道显微镜详细研究了银胶的表面结构和ＮａＣｌ对其凝聚状态的影响，并与透射电子显微镜的结果进行了比较。结果表明 胶颗粒表面原子处于有序与无序状态之间，部分原子以聚集体的形式存在，另一部分原子则处于松散状态。     

扫描隧道显微镜对表面科学的巨大推动

扫描隧道显微镜问世于８０年代初，并以前所未有的直观性揭示了研究多年而未获答案的Ｓｉ（１１１）７×７表面结构，从而引起了包括表面科学家在内的科技界的极大兴趣。在此之前，用于表面科学研究的方法虽不计其数，但能像扫描隧道显微镜那样可给出表面的原子分辨实空间像，能对表面作局域、动态、多功能研究，甚至可以兼作表面制备的方法却几乎没有．文章通过我们近年来研究中的一些实例说明了扫描隧道显微镜对表面科学的巨大推动。     

光放大方法及其应用

介绍了光放大的实验原理，阐述了光放大原理在万有引力实验和扫描探针显微镜中的应用。     

扫描隧道显微术最新进展与原子搬迁

自从扫描隧道显微镜问世以来，已陆续发展了一系列新型扫描探针显微仪器，如原子力显微镜、磁力显微镜、摩擦力显微镜等等，这些显微仪器不仅能以极高分辨率研究样品表面的形貌和物理化学性质，而且最近几年还被成功地用于操纵单个的原子和分子，文章着重介绍了ＳＴＭ在这方面的进展情况。     

采用Ag+离子与TiF6光学玻璃内的K+或Na+离子交换产生高折射率梯度剖面分布

本文介绍了TiF₆光学玻璃的制作。研究了这种玻璃内的K⁺或Na⁺离子与Ag⁺离子交换。使用双光束干涉法观测了干涉纹、并用电子探针扫描电镜测量了Ag⁺、K⁺和Na⁺离子的浓度分布,还着重研究了离子交换后的玻璃裂纹和着色问题。最后,对结果作了讨论。     

ZnS:Cu电致发光粉的粒度分布和形貌

本文用透射电镜、扫描电镜、沉降法粒度仪和光学显微图象自动分析仪等不同方法测量并研究了ZnS:Cu电致发光粉粒度分布和原料ZnS粒度分布的关系,找出了粒度分布规律,并对比了这几种测量方法.本文还研究了该发光粉在880℃灼烧制备时,发光粉晶粒的初期生长形貌.发现晶粒生长有二个过程,首先在初始2-3分钟内迅速结成晶粒,然后以较慢速度长大.     

VC＋＋环境下激光共焦扫描显微镜的成像实现

讨论激光共焦扫描显微镜在VC＋＋环境下的图像实现过程及处理方法。     

Resolution of a scanning electron microscope: 1. Current state of the problem

Known methods for determining the resolution of a scanning electron microscope are discussed. It is shown that none of them can unambiguously characterize the scanning electron microscope.     

Measurement of electron density distribution in the probe of a low voltage SEM

A method for measuring the electron density distribution in the probe of a low voltage scanning electron microscope is described. It is shown that the focused electron probe of an S 4800 scanning electron microscope at the electron energy of 200 eV has a Gaussian shape of the electron density with the effective diameter of the probe of 20 nm.     

Secondary electron emission yield from vertical graphene nanosheets by helicon plasma deposition

The secondary electron emission yields of materials depend on the geometries of their surface structures.In this paper,a method of depositing vertical graphene nanosheet(VGN)on the surface of the material is proposed,and the secondary electron emission(SEE)characteristics for the VGN structure are studied.The COMSOL simulation and the scanning electron microscope(SEM)image analysis are carried out to study the secondary electron yield(SEY).The effect of aspect ratio and packing density of VGN on SEY under normal incident condition are studied.The results show that the VGN structure has a good effect on suppressing SEE.     

INVESTIGATION ON THE STRUCTURE AND ELECTRIC PROPERTIES OF BUCKY ONIONS

Bucky onions were fabricated by the DC discharge method and their behaviors and electric properties on Highly Oriented Pyrolytic Graphite (HOPG) were studied by using an atomic force microscope (AFM), a scanning tunneling microscope (STM) and a transmission electron microscope (TEM). Small-sized Bucky onions demonstrated the properties of semiconductors and as the size increased their metallicity became stronger. AFM and STM images revealed the tendency of Bucky onions to form dimers.     

激光水下扫描成像系统的图像修正机理

同步扫描系统可以克服后向散射，但同时也产生了两种非线性，一是扫描线速度的非线性，一是由于距离对光能衰减造成的非线性，两种非线性都需要修正，本文从原理上讨论水下激光成像时能量衰减的修正原理与修正方法，并给出仿真结果。     

Imaging of Norway spruce early somatic embryos with the ESEM,Cryo-SEM and laser scanning microscope

This article describes the surface structure of Norway spruce early somatic embryos (ESEs) as a typical culture with asynchronous development. The microstructure of extracellular matrix covering ESEs were observed using the environmental scanning electron microscope as a primary tool and using the scanning electron microscope with cryo attachment and laser electron microscope as a complementary tool allowing our results to be proven independently. The fresh samples were observed in conditions of the air environment of the environmental scanning electron microscope (ESEM) with the pressure from 550 Pa to 690 Pa and the low temperature of the sample from −18 °C to −22 °C. The samples were studied using two different types of detector to allow studying either the thin surface structure or material composition. The scanning electron microscope with cryo attachment was used for imaging frozen extracellular matrix microstructure with higher resolution. The combination of both electron microscopy methods was suitable for observation of “native” plant samples, allowing correct evaluation of our results, free of error and artifacts.     

Serial sectioning methods for 3D investigations in materials science

A variety of methods for the investigation and 3D representation of the inner structure of materials has been developed. In this paper, techniques based on slice and view using scanning microscopy for imaging are presented and compared. Three different methods of serial sectioning combined with either scanning electron or scanning ion microscopy or atomic force microscopy (AFM) were placed under scrutiny: serial block-face scanning electron microscopy, which facilitates an ultramicrotome built into the chamber of a variable pressure scanning electron microscope; three-dimensional (3D) AFM, which combines an (cryo-) ultramicrotome with an atomic force microscope, and 3D FIB, which delivers results by slicing with a focused ion beam. These three methods complement one another in many respects, e.g., in the type of materials that can be investigated, the resolution that can be obtained and the information that can be extracted from 3D reconstructions. A detailed review is given about preparation, the slice and view process itself, and the limitations of the methods and possible artifacts. Applications for each technique are also provided.