Size dependent lattice constant change of thiol self-assembled monolayer modified Au nanoclusters studied by grazing incidence x-ray diffraction

Size and lattice constant of thiol self-assembled monolayer (SAM)-modified gold nanoclusters (GNCs) assembled on Au(111) surfaces after each electrochemical treatment were investigated using grazing incidence x-ray diffraction (GIXRD). When the potential was swept between 0 and 1.3 V (vs. Ag/AgCl), the size and lattice constant of GNCs slightly decreased due to the oxidative desorption of the SAMs. As the number of potential cycles increased, the size of GNCs started to increase due to the aggregation, while the lattice constant continued to decrease due to further desorption of the SAMs from the GNCs. After most of the SAMs were removed from the GNCs, the size and lattice constant monotonically increased with the number of potential cycles. The size dependent lattice constant change was observed when GNCs were smaller than ~ 35 Å.     

Orientation of pentacene molecules on SiO2: from a monolayer to the bulk

Near edge x-ray absorption fine structure (NEXAFS) spectroscopy is used to study the orientation of pentacene molecules within thin films on SiO2 for thicknesses ranging from monolayers to the bulk (150 nm). The spectra exhibit a strong polarization dependence of the pi* orbitals for all films, which indicates that the pentacene molecules are highly oriented. At all film thicknesses the orientation varies with the rate at which pentacene molecules are deposited, with faster rates favoring a thin film phase with different tilt angles and slower rates leading to a more bulklike orientation. Our NEXAFS results extend previous structural observations to the monolayer regime and to lower deposition rates. The NEXAFS results match crystallographic data if a finite distribution of the molecular orientations is included. Damage to the molecules by hot electrons from soft x-ray irradiation eliminates the splitting between nonequivalent pi* orbitals, indicating a breakup of the pentacene molecule.     

Structural studies of ITO films using grazing incidence x-ray diffractometry

Tin doped indium oxide (ITO) films deposited by e-beam evaporation were investigated using grazing incidence x-ray diffractometry (GIXRD). With increasing doping concentration the x-ray peak positions are shifted to lower angles and the line profiles become broader. Rietveld refinements show that tin in small concentrations occupies regular In sites. Line profile analysis reveals that higher tin concentrations cause an increasing of lattice defects, as grain boundaries and microstrains. The results of the structural investigations correlate with resistivity measurements.     

A molecular simulation study of an organosilane self-assembled monolayer/SiO2 substrate interface

The bonding network of an alkylsilane self-assembled monolayer (SAM)SiO(2) substrate interface is investigated by means of canonical Monte Carlo (MC) simulations. SAMSiO(2) systems with different interfacial bonding topologies are sampled by the Metropolis MC method, and the AMBER potential with a newly developed organosilicon parameters are used to obtain an optimized structure with a given bonding topology. The underlying substrates are modeled as hydroxy-terminated (100) or (111) cristobalites. The SAMSiO(2) interface is characterized by a polysiloxane bonding network which comprises anchoring bonds and cross-linking bonds, namely, molecule-substrate and molecule-molecule Si-O-Si bonds, respectively. We show that at thermal equilibrium, the ratio of the number of anchoring bonds to cross-linking bonds decreases as a total Si-O-Si bond density increases, and that nevertheless, number of anchoring bonds always dominate over that of cross-linking bonds. Moreover we show that the total Si-O-Si bond density strongly affects the lateral ordering of the alkylsilane molecules, and that increase in the Si-O-Si bond density disorders the molecular packing. Our results imply that a lab-to-lab variation in the experimentally prepared SAMs can be attributed to different Si-O-Si bond densities at the SAMSiO(2) interface.     

Structural analysis of SiO2 gel films by high energy electron diffraction

The structure of SiO₂ gel-films prepared from acid and basic TEOS solutions is analyzed by high energy transmission electron diffraction method. The Si-O bond length of gel-films is 1.58 to 1.60 Å, which is shorter than that of vitreous silica (1.61 Å) but similar to that of 80 Å thick evaporated a-SiO₂ film. An atomic pair peak with 0.81 Å distance exists on the reduced radial distribution functions of the gel-films, which is believed to be O-H, but being smaller than that of H₂O (0.969 Å).     

Long-range molecular organization of an organic monolayer grafted on a mineral substrate.

Structured and functional materials are of the utmost importance for the development of microelectronic technology. We report on a method to obtain a highly ordered organic molecular layer on a mineral substrate. We took advantage of the regular array of reactive sites present at the single-crystal surface of topaz to perform a liquid-phase silanization reaction. The grazing-incidence diffraction technique was used to characterize the bare and covalently coated surfaces. The ordering of the monomolecular organic layer reproduces the perfect single-crystal structure of the cleaved surface over millimeter distances.     

Grazing incidence x-ray diffraction analysis of zeolite NaA membranes on porous alumina tubes.

Zeolite NaA-type membranes hydrothermally synthesized on porous alumina tubes, for dehydration process, were characterized by grazing incidence 2 theta scan X-ray diffraction analysis (GIXRD). The fine structure of the membrane was studied fractionally for surface layer and for materials embedded in the porous alumina tube. The thickness of the surface layer on the porous alumina tube in the membranes used in this study was approximately 2-3 microm as determined from transmission electron microscopy with focused ion beam thin-layer specimen preparation technique (FIB-TEM). To discuss the effects of the membrane surface morphology on the GIXRD measurements, CaA-type membrane prepared by ion exchange from the NaA-type membrane and surface-damaged NaA-type membrane prepared by water leaching were also studied. For the original NaA-type membrane, 2 theta scan GIXRD patterns could be clearly measured at X-ray incidence angles (alpha) ranging from 0.1 to 2.0 deg in increments of 0.1 deg. The surface layers of the 2 - 3 microm on the porous alumina tube correspond to the alpha values up to ca. 0.2 deg. For the CaA-type and the surface-damaged NaA-type membranes, however, diffraction patterns from the surface layer could not be successfully detected and the others were somewhat broad. For all the three samples, diffraction intensities of both zeolite and alumina increased with depth (X-ray incidence angle, alpha) in the porous alumina tube region. The depth profile analysis of the membranes based on the GIXRD first revealed that amount of zeolite crystal embedded in the porous alumina tube is much larger than that in the surface layer. Thus, the 2 theta scan GIXRD is a useful method to study zeolite crystal growth mechanism around (both inside and outside) the porous alumina support during hydrothermal synthesis and to study water permeation behavior in the dehydration process.     

Simulation and interpretation of 2D diffraction patterns from self-assembled nanostructured films at arbitrary angles of incidence: from grazing incidence (above the critical angle) to transmission perpendicular to the substrate

A method to calculate the location of all Bragg diffraction peaks from nanostructured thin films for arbitrary angles of incidence from just above the critical angle to transmission perpendicular to the film is reported. At grazing angles, the positions are calculated using the distorted wave Born approximation (DWBA), whereas for larger angles where the diffracted beams are transmitted though the substrate, the Born approximation (BA) is used. This method has been incorporated into simulation code (called NANOCELL) and may be used to overlay simulated spot patterns directly onto two-dimensional (2D) grazing angle of incidence small-angle X-ray scattering (GISAXS) patterns and 2D SAXS patterns. The GISAXS simulations are limited to the case where the angle of incidence is greater than the critical angle (alpha(i) > alpha(c)) and the diffraction occurs above the critical angle (alpha(f) > alpha(c)). For cases of surfactant self-assembled films, the limitations are not restrictive because, typically, the critical angle is around 0.2 degrees but the largest d spacings occur around 0.8 degrees 2theta. For these materials, one finds that the DWBA predicts that the spot positions from the transmitted main beam deviate only slightly from the BA and only for diffraction peaks close the critical angle. Additional diffraction peaks from the reflected main beam are observed in GISAXS geometry but are much less intense. Using these simulations, 2D spot patterns may be used to identify space group, identify the orientation, and quantitatively fit the lattice constants for SAXS data from any angle of incidence. Characteristic patterns for 2D GISAXS and 2D low-angle transmission SAXS patterns are generated for the most common thin film structures, and as a result, GISAXS and SAXS patterns that were previously difficult to interpret are now relatively straightforward. The simulation code (NANOCELL) is written in Mathematica and is available from the author upon request.     

Preparation of a well-defined amino-terminated self-assembled monolayer and copper microlines on a polyimide substrate covered with an oxide nanoskin

A well-ordered, uniform amino (NH(2))-terminated organosilane self-assembled monolayer (SAM) was prepared on a polyimide (PI) substrate, the surface of which had silica-like reactivity. First, through chemical vapor deposition of 1,3,5,7-tetramethylcyclotetrasiloxane and subsequent photooxidation using 172 nm vacuum ultraviolet light, an extremely thin silicon dioxide (SiO(2)) layer about 1 nm thick, which we call an "oxide nanoskin" (ONS), was prepared on a PI substrate. Due to the presence of this ONS layer, the PI surface's properties became almost identical with those of Si covered with native oxide (SiO(2)/Si) without any marked change in surface morphology, as evidenced by zeta-potential measurements, X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM). Next, this ONS-covered PI (ONS/PI) surface was exposed to vapor of a 12.5 vol % solution of N-(6-aminohexyl)(3-aminopropyl)trimethoxysilane (AHAPS) molecules diluted with absolute toluene. On the basis of contact angle analysis, the surface energy of this AHAPS/ONS/PI sample was mostly consistent with that of a SiO(2)/Si substrate covered with an AHAPS-SAM (AHAPS/SiO(2)/Si). On the other hand, the surface energy of an AHAPS-treated PI (AHAPS/PI) substrate was much smaller than that of the AHAPS/ONS/PI substrate due to insufficient surface coverage by the AHAPS molecules. This was also confirmed by lateral force microscopy using photolithographically micropatterned samples. Fabricated micropatterns composed of AHAPS- and SiO(2)-covered regions were clearly imaged on the AHAPS/ONS/PI substrate through their difference in friction, while the friction contrast of the micropatterned AHAPS/PI substrate was unclear. This marked difference in packing density of the AHAPS molecules had a direct influence on the adsorption behavior of palladium colloids and subsequent electroless plating of copper (Cu). As confirmed by AFM and XPS, metallization proceeded only on the AHAPS-covered regions, while the SiO(2)-covered regions remained free of deposits, resulting in the formation of 10-mum-wide Cu microlines on both samples. However, the plating rate achieved on the AHAPS/ONS/PI substrate was about 4.5 times faster than that on the AHAPS/PI substrate and the pattern resolution was considerably fine.     

Influence of surface morphology on the oxidation of metal electrodes studied by in-situ grazing incidence x-ray diffractometry

The successful application of in-situ grazing incidence x-ray diffractometry (GIXD) for the investigation of oxidation processes at copper electrodes in pH 12 electrolytes is demonstrated. A penetration/escape depth of about 1 μm could be detected for a smooth polycrystalline copper foil and an x-ray incidence angle of 1.7°. Oxide layers generated at overpotentials less than about 0.5 V in respect to the equilibrium formation potentials of Cu₂O or CuO, respectively, showed a dependence of the crystalline oxide formation on the defect density of the copper substrate. Highly disordered ground or polished specimens exhibited an order of magnitude higher GIXD reflexes from crystalline Cu₂O than electrodeposited copper. Beyond overpotentials of 0.5 V, this epitaxial information for the Cu₂O crystal growth became irrelevant. Further, GIXD turned out to be an appropriate tool to monitor atmospheric corrosion processes under thin humidity films with oxygen access. When oxygen diffusion through the polymer window membrane is allowed, oxygen reduction led to the concurrent formation of a crystalline CuO phase coexisting with amorphous Cu(OH)₂ and Cu₂O, though the potential was kept in the region of Cu₂O. Received: 30 July 1997 / Revised: 28 May 1998 / Accepted: 13 July 1998     

Structural characterization of (3-mercaptopropyl)sulfonate monolayer on gold surfaces

We have investigated the structure of (3-mercaptopropyl)sulfonate (MPS) monolayer self-assembled onto gold surfaces by quartz crystal microbalance with energy dissipation monitoring (QCM-D) and various electrochemical methods. QCM-D experiments show that the MPS monolayer behaves as a thin rigid film with a surfacic mass of 166 ng cm(-2). Interfacial capacitance measurements demonstrate that the MPS monolayer is a rather open structure that can be penetrated by the ionic species of the phosphate buffer electrolyte. From MPS reductive desorption experiments, MPS surface concentration corresponds to 4.6 x 10(-10) mol cm(-2), which represents 60% of the coverage reported for a densely packed thiol monolayer. Despite this low packing density, oxidation of catechol is strongly inhibited leading to voltammograms that are free ofdiffusional contribution. This unique behavior has been exploited to show that the MPS monolayer covers the entire gold surface with a surface coverage at least equal to theta = 0.9981, which means a very low number of MPS-free pinholes and/or defects. Kinetics of electron transfer toward soluble redox species has been studied using catechol as a neutral hydrophilic probe, but also ferrocyanide as hydrophilic anion and ferrocenemethanol as neutral hydrophobic molecule. It is proposed that the MPS monolayer provides a high kinetic barrier toward permeation of these species and that electron transfer mainly occurs by electron tunneling through the MPS monolayer.     

无机玻璃Li2O·2SiO2的结构松弛(Ⅰ)——TNM唯象模型描述

简介了结构松弛的主要特点及其唯象Tool-Narayanaswamy-Moynihan(TNM)模型的建立,并用此模型对无机玻璃(Li2O·2SiO2)在不同老化时间及不同老化温度下的结构松弛行为进行了模拟.得到了4个可调参数X、β、△h* 和A,其中β、△h* 和A不随老化温度及老化时间而发生变化,X则随老化时间的增加而增大,随老化温度的降低而降低.     

Determination of CoSi2 self-aligned nanostructures with grazing incidence X-ray absorption spectroscopy

Self-aligned nanostructures (SAN) made by reacting Co nanoparticles with crystalline Si substrates at high temperatures were studied with grazing incidence X-ray absorption spectroscopy (GI-XAS). The results from extended X-ray absorption fine structure (EXAFS) analysis and X-ray absorption near-edge spectroscopy (XANES) were used to identify SAN as crystalline CoSi2. Theoretical calculations of EXAFS and XANES spectra of several crystalline cobalt silicides were performed with the FEFF8 package. On the basis of these studies, the SAN samples were determined to contain nearly pure CoSi2.     

Synthesis of SiO2-TiO2 binary composites with cellulose as the substrate

A procedure for the synthesis of the SiO₂-TiO₂ binary material was developed. The procedure includes the formation of the silica matrix by impregnating cellulose plates with tetraethoxysilane followed by hydrolysis of the organometallic compound and burning-out of the cellulose constituent; activation of silica with HF; and deposition of titanium dioxide on the surface of the silica matrix by impregnating it with a solution of tetrabutoxytitanium, which is hydrolyzed in water-ammonia atmosphere. The physicochemical properties of the obtained material were studied.     

Grazing incidence X-ray photoemission spectroscopy of SiO2 on Si

We have applied grazing incidence X-ray photoemission spectroscopy to the determination of the thickness of SiO₂ layers on Si, as well as surface carbon that is present. The measurements take advantage of the different optical constants of the layers. X-rays incident on the surface at grazing angle undergo total external reflection, where the fields in each layer are subject to highly non-linear changes as a function of incidence angle. X-ray photoemission excited by these fields gives information on atomic species, chemical state, and layer thickness. Simultaneous fits are made to the photoemission spectra in each layer. The method is illustrated for a thermally grown oxide layer and a native oxide on Si.     

Influence of monolayer state on spectroscopy and photoisomerization of an amphiphilic styryl-pyridinium dye on a solid substrate

The spectroscopy and photochromic properties of transferred monolayers of the amphiphilic styryl-pyridinium dye 4-(3',4'-dimethoxystyryl)-N-octadecylpyridinium perchlorate (DMPOP) were studied at different conditions during their transfer. The emission maxima of the monolayers transferred from the air-water interface in the liquid-expanded phase are strongly dependent on the surface pressure applied during the transfer process, even at values when the area per molecule is 2-3 times larger than the area occupied by a chromophore. In monolayers transferred from the liquid-condensed phase, the presence of a different kind of aggregates was observed. The fluorescence emission properties of the monolayers can be reversibly modulated by photoinduced E-Z isomerization. A blue shift up to 72 nm in the emission maximum, depending on the transfer conditions of the films, can be obtained by irradiation with blue light, and partially recovered (a red shift of up to 26 nm) with UV radiation. The rate at which the first process (E-->Z) takes place is drastically reduced in monolayers transferred from the liquid-condensed phase as compared to those transferred from the liquid-expanded one. However, the rate of the reverse reaction (Z-->E) is not significantly altered. These properties make DMPOP a promising material for the preparation of Langmuir-Blodgett films, whose properties can be effectively controlled by the transfer conditions and subsequently optically modulated, for potential applications as photonics devices for data storage.     

Unique photoemission from single-layer graphene on a SiO2 layer by a substrate charging effect

Single-layer graphene (SLG) shows an anomalously large surface charging effect during scanning photoelectron microscopy (SPEM), which is distinguished from bi-layer graphene (BLG). The different behaviour is believed due to a different screening effect for SLG and BLG.     

Micropatterning of copper on a poly(ethylene terephthalate) substrate modified with a self-assembled monolayer

We have developed a technique for the site-selective electroless deposition of Cu on poly(ethylene terephthalate) (PET) substrate modified with an organic self-assembled monolayer (SAM). The PET substrate was first modified with a silica-like layer by being dip-coated in an acetone solution of 3-aminopropyltrimethoxysilane and treated with UV light. The PET substrate was further modified with thiol groups using a 3-mercaptopropyltrimethoxysilane-SAM and then irradiated by UV light through a photomask to prepare thiol-group regions and OH-group regions. Cu was then deposited on only the thiol-group regions of the substrate by electroless deposition in a neutral solution with no catalysts by using dimethylamineborane as a reducing reagent. This site-selective deposition process can control the deposition conditions by an organic thin film fabricated on a surface-modified PET substrate, and thus can be applied to other low heat-resistant substrates.     

Synthesis and characterization by IR spectroscopy and x-ray diffraction of a quinazoline-complex of dibutyldichlorotin(IV)

The synthesis, the X-ray analysis and the IR spectrum of the complex SnBu₂Cl₂(AIP) [AIP = 2-(2′-pyridyl)-3-(N-2-picolylimino)-4-oxo-l,2,3,4 - are reported. The coordination polyhedron can be described as a distorted pentagonal bipyramid. The AIP molecule behaves as a terdentate ONN donor ligand, with the N atoms involved in two equational weaker interactions with respect to the O atom.