Correlating Raman peak shifts with phase transformation and defect densities: a comprehensive TEM and Raman study on silicon

Silicon is the most often used material in micro electromechanical systems (MEMS). Detailed understanding of its mechanical properties as well as the microstructure is crucial for the reliability of MEMS devices. In this paper, we investigate the microstructure changes upon indentation of single crystalline (100) oriented silicon by transmission electron microscopy (TEM) and Raman microscopy. TEM cross sections were prepared by focused ion beam (FIB) at the location of the indent. Raman microscopy and TEM revealed the occurrence of phase transformations and residual stresses upon deformation. Raman microscopy was also used directly on the cross‐sectional TEM lamella and thus microstructural details could be correlated to peak shape and peak position. The results show, however, that due to the implanted Ga⁺ ions in the lamella the silicon Raman peak is shifted significantly to lower wavenumbers. This hinders a quantitative analysis of residual stresses in the lamella. Furthermore, Raman microscopy also possesses the ability to map deformation structures with a lateral resolution in the submicron range. Copyright © 2009 John Wiley & Sons, Ltd.     

FIB快速加工纳米孔点阵的新方法

纳米尺度的点阵在纳米器件和基础科学研究方面都具有非常重要的应用.目前普遍采用的聚焦离子束和电子束曝光技术可以很方便的在衬底上加工纳米量级的微细结构，但大面积的图形加工过程需要花费太多的机时.介绍一种利用设计图形BMP文件的像素点阵和实际加工区域之间的匹配关系，通过聚焦离子束加工获得所需要的纳米孔点阵的新方法.采用这种方法可以在短时间内获得大面积的纳米点阵结构. 关键词： 聚焦离子束 电子束曝光 纳米孔点阵     

Estimation of diffusion coefficient by photoemission electron microscopy in ion-implanted nanostructures

We have fabricated parallel stripes of nanostructures in an n-type Si substrate by implanting 30 keV Ga⁺ ions from a focused ion beam (FIB) source. Two sets of implantation were carried out. In one case, during implantation the substrate was held at room temperature and in the other case at 400 °C. Photoemission electron microscopy (PEEM) was carried out on these samples. The implanted parallel stripes, each with a nominal dimension of 4000 nm × 100 nm, appear as bright regions in the PEEM image. Line scans of the intensities from the PEEM image were recorded along and across these stripes. The intensity profile at the edges of a line scan is broader for the implantation carried out at 400 °C compared to room temperature. From the analysis of this intensity profile, the lateral diffusion coefficient of Ga in silicon was estimated assuming that the PEEM intensity is proportional to Ga concentration. The diffusion coefficient at 400 °C has been estimated to be ∼1.3 × 10⁻¹⁵ m²/s. Across the stripes an asymmetric diffusion profile has been observed, which has been related to the sequence of implantation of these stripes and the associated defect distribution due to lateral straggling of the implanted ions.     

Disturbing interference patterns in femtosecond stimulated Raman microscopy

Femtosecond stimulated Raman microscopy (FSRM) is an upcoming technique in nonlinear microscopy which facilitates rapid chemical mapping. It employs femtosecond white‐light pulses as probe pulses and intense picosecond pulses as pump pulses. Stimulated Raman scattering (SRS) occurs at the focus of a scanning microscope. Chemical constituents in the sample are identified via their Raman signatures. In this article, disturbing interference patterns in FSRM are reported. They are caused by a broadening of the pump pulse due to nonlinear interactions in the focal region of the microscope and reduce the signal‐to‐noise ratio. The properties of these modulations are explored, and the methods to suppress them are presented. Copyright © 2009 John Wiley & Sons, Ltd.     

Focused ion beam treatment of ZnO nanowires in the scanning electron microscope

We investigated vapor phase epitaxy-grown ZnO nanowires on a Si substrate by scanning electron microscopy. These investigations show that there are single nanowires and ensembles of nanowires, among which we found straight and bend, perfect and non-perfect nanowires, as well as nanowires with clean surfaces and surfaces with the dark spots and features. After focused ion beam polishing and milling we found that nanowires are homogeneous. The sizes of the nanowires were determined: the length is about 2–24 μm, and the width and height are about 200–500 nm.     

A method of correlative light and electron microscopy for yeast cells

Correlative light and electron microscopy (CLEM) is a method of imaging in which the same specimen is observed by both light microscopy and electron microscopy. Specifically, CLEM compares images obtained by light and electron microscopy and makes a correlation between them. After the advent of fluorescent proteins, CLEM was extended by combining electron microscopy with fluorescence microscopy to enable molecular-specific imaging of subcellular structures with a resolution at the nanometer level. This method is a powerful tool that is used to determine the localization of specific molecules of interest in the context of subcellular structures. Knowledge of the localization of target proteins coupled with the functions of the structures to which they are localized yields valuable information about the molecular functions of these proteins. However, this method has been mostly applied to adherent cells due to technical difficulties in immobilizing non-adherent target cells, such as yeasts, during sample preparation. We have developed a method of CLEM applicable to yeast cells. In this report, we detail this method and present its extension to Live CLEM. The Live CLEM method enabled us to link the dynamic properties of molecules of interest to cellular ultrastructures in the yeast cell. Since yeasts are premier organisms in molecular genetics, combining CLEM with yeast genetics promises to provide important new findings for understanding the molecular basis of the function of cellular structures.     

Origin of spectral interferences in femtosecond stimulated Raman microscopy

In femtosecond stimulated Raman microscopy (FSRM), a spectrally narrow (Raman pump) pulse and a broad (Raman probe) laser pulse are employed to generate the Raman spectra of microscopic objects. The resulting spectra exhibit, in addition to the Raman bands, spectral modulations of comparable amplitude. Here a model is devised that attributes these modulations to a four‐wave mixing (FWM) process. Two light fields of the probe pulse and one field of the pump pulse serve as input fields. The resulting FWM field experiences a heterodyne amplification by the probe field. Simulations based on this model reproduce the appearance of the spectral modulations. Furthermore, the amplitude of the modulations exhibits dependences on the energies of pump and probe pulses as well as on the nonlinear refractive index n₂, which are in line with the model. Copyright © 2011 John Wiley & Sons, Ltd.     

A novel combinative Raman and SEM mapping method for the detection of exfoliation of graphite in electrodes at very positive potentials

The random exfoliation at very positive potentials (>5 V vs Li/Li⁺) of graphite (used as a conductive component in positive electrodes of lithium‐ion batteries) was investigated with in situ Raman microscopy and post mortem scanning electron microscopy (SEM). A novel semiautomated computational method for the data analysis of both characterization methods was developed to correlate Raman and SEM information with good lateral resolution, in order to locate exfoliated graphite particles. Proof is given that the exfoliating particles detected via the semiautomatic in situ Raman microscopy mappings correctly describes exfoliated areas, as confirmed via post mortem SEM pictures. Copyright © 2011 John Wiley & Sons, Ltd.     

光导中喇曼放大实验的观察

本文报道了光导中单束激光无聚焦多次反射激励喇曼介质H_2,使得同步入射的H_2的斯托克斯种子光得到耦合放大,放大系数大于2,并且光束质量明显提高     

Identification of pigments from the Shrine of Kaiping Diaolou by micro‐Raman spectroscopy

Shrines (or altars) are constructed in China for worshiping ancestors, Bodhisattva, and God of Wealth. In this work, pigments from the shrine of Kaiping Diaolou tower were analyzed by micro‐Raman spectroscopy, in conjunction with other analytical methods including scanning electron microscopy (SEM) with energy dispersive X‐ray spectroscopy (EDX) and X‐ray fluorescence (XRF). Paintings of the shrine were composed of 2–3 pigment layers and the total thickness was determined as about 200–300 µm by optical microscopy and SEM, indicating the fine painting skills applied in the construction of the shrine. The green pigments on the surface layer of the green fragment were identified as a mixture of lead phthalocyanine (PbPc) and cornwallite (Cu₅(AsO₄)₂(OH)₄) by XRF and micro‐Raman spectroscopy with two different excitation wavelengths (488 and 785 nm). Underneath the green layer, red and yellow ochre were found. The pigments on the surface layer of red and blue fragments were identified as hematite (Fe₂O₃) and lazurite or synthetic ultramarine [(Na₈(Al₆Si₆O₂₄)S₃)], respectively. Finally, the pigments under the two surface layers were identified by EDX and micro‐Raman spectroscopy as chromium oxide (Cr₂O₃), gypsum (CaSO₄·2H₂O) and calcite (CaCO₃). Copyright © 2011 John Wiley & Sons, Ltd.     

Raman spectroscopy and microscopy of individual cells and cellular components

Raman spectroscopy provides the unique opportunity to nondestructively analyze chemical concentrations in individual cells on the submicrometer length scale without the need for optical labels. This enables the rapid assessment of cellular biochemistry inside living cells, and it allows for their continued analysis. Here, we review recent developments in the analysis of single cells, subcellular compartments, and chemical imaging based on Raman spectroscopy. Spontaneous Raman spectroscopy provides for the full spectral assessment of cellular biochemistry, while coherent Raman techniques, such as coherent anti‐Stokes Raman scattering is primarily used as an imaging tool comparable to confocal fluorescence microscopy. These techniques are complemented by surface‐enhanced Raman spectroscopy, which provides higher sensitivity and local specificity, and also extends the techniques to chemical indicators, i.e. pH sensing. We review the strengths and weaknesses of each technique, demonstrate some of their applications and discuss their potential for future research in cell biology and biomedicine.     

A correlative optical microscopy and scanning electron microscopy approach to locating nanoparticles in brain tumors

The growing use of nanoparticles in biomedical applications, including cancer diagnosis and treatment, demands the capability to exactly locate them within complex biological systems. In this work a correlative optical and scanning electron microscopy technique was developed to locate and observe multi-modal gold core nanoparticle accumulation in brain tumor models. Entire brain sections from mice containing orthotopic brain tumors injected intravenously with nanoparticles were imaged using both optical microscopy to identify the brain tumor, and scanning electron microscopy to identify the individual nanoparticles. Gold-based nanoparticles were readily identified in the scanning electron microscope using backscattered electron imaging as bright spots against a darker background. This information was then correlated to determine the exact location of the nanoparticles within the brain tissue. The nanoparticles were located only in areas that contained tumor cells, and not in the surrounding healthy brain tissue. This correlative technique provides a powerful method to relate the macro- and micro-scale features visible in light microscopy with the nanoscale features resolvable in scanning electron microscopy.     

Characterization of different substrates for Raman spectroscopic imaging of eukaryotic cells

For Raman spectroscopic analyses of the cells and other biological samples, the choice of the right substrate material is very important to avoid loss of information in characteristic spectral features because of competing background signals. In the current study, Raman spectroscopy is used to characterize several potential Raman substrates. Raman vibrational bands of the substrate material are discussed. The surface topography is analyzed by atomic force microscopy, and the root mean square surface roughness values are reported. Biocompatibility of the substrates is tested with Hep G2 cells evaluating cellular morphology as well as live/dead staining. Calcium fluoride, silicon, fused silica, borofloat glass, and silicon nitride membranes support cell growth and adherence. Silicon, borofloat glass, and fused silica give rise to Raman signals in the region of interest. Calcium fluoride substrate (UV grade) is suitable for Raman spectroscopic investigation of living cells. Nickel foil is suitable substrate for Raman spectroscopic investigation but cellular adherence and viability depend on the quality of the foil. Silicon nitride membranes coated with nickel chrome is a suitable Raman substrate in closed microfluidic systems. Copyright © 2016 John Wiley & Sons, Ltd.     

Metal–Polymer Hybrid Nanoparticles for Correlative High‐Resolution Light and Electron Microscopy

The combination of fluorescence microscopy and electron microscopy promises a deeper insight into the ultrastructural features of cell organelles, e.g., after drug administration. Both methods complement each other and provide, as a correlative approach, a keen insight into the fate of nanoparticles within the cell. Moreover, it represents a promising tool to determine alterations of the cellular environment as a response to particle uptake. However, the availability of suitable correlative markers is mandatory for such correlative approaches. In this contribution, the utilization of poly(ethylene imine) based metal–polymer hybrid particles labeled with small gold nanoparticles and Rhodamine B facilitating the observation of the particles by means of fluorescence as well as by transmission electron microscopy is suggested. Correlative light and electron microscopy is used to study uptake and intracellular fusion processes of endosomal/lysosomal structures.     

超衍射极限相干反斯托克斯拉曼散射显微成像技术中空心光束的形成

空心光束的质量是超衍射极限相干反斯托克斯拉曼散射显微成像技术中决定成像质量的一个至关重要的因素. 本文基于菲涅耳衍射理论,分析了螺旋相位片法产生空心光束的物理机理,并且模拟了不同的入射条件对产生的空心光束的影响. 模拟结果表明:波长与相位片中心波长匹配且光强呈圆对称分布的高斯光垂直入射到相位片上,当高斯光束中心与相位片中心完全对准时,可获得较理想的空心光束;入射光光强分布的圆对称性以及入射光中心与相位片中心的对准程度都会影响产生的空心光束的强度分布;同时,高斯光束小角度倾斜入射时,空心光的强度分布仍呈圆对称,却在观察面发生一定的位移;此外,入射光中心波长偏离相位片中心波长不大时,对产生的空心光束的强度分布几乎没有影响. 上述分析结果对用于超衍射相干反斯托克斯拉曼散射显微成像技术中理想空心光束的获取具有重要的指导意义. 关键词： 空心光束 超衍射极限 相干反斯托克斯拉曼散射 螺旋相位片     

Local thermal conductivity of polycrystalline AlN ceramics measured by scanning thermal microscopy and complementary scanning electron microscopy techniques

The local thermal conductivity of polycrystalline aluminum nitride (AlN) ceramics is measured and imaged by using a scanning thermal microscope (SThM) and complementary scanning electron microscope (SEM) based techniques at room temperature. The quantitative thermal conductivity for the AlN sample is gained by using a SThM with a spatial resolution of sub-micrometer scale through using the 3ω method. A thermal conductivity of 308 W/m·K within grains corresponding to that of high-purity single crystal AlN is obtained. The slight differences in thermal conduction between the adjacent grains are found to result from crystallographic misorientations, as demonstrated in the electron backscattered diffraction. A much lower thermal conductivity at the grain boundary is due to impurities and defects enriched in these sites, as indicated by energy dispersive X-ray spectroscopy.     

Enhanced Raman Scattering of Elliptical Laser beam in a Collisional Plasma

This paper presents the Enhanced Raman scattering of a elliptical laser beam in a collisional plasma. We have considered the mechanism of non‐uniform heating of carriers along the wave‐front, which is important in collisional plasma. The nonlinearity arising through non‐uniform heating leads to redistribution of carriers, which modifies the background plasma density profile in a direction transverse to pump beam axis. This modification in density effects the incident laser beam, plasma wave and back‐scattered beam. Non‐linear differential equations for the beam width parameters of pump laser beam, plasma wave and back‐scattered beam are set up and solved numerically. Numerical results predict the effect of self‐focusing of waves on the back‐scattered beam (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Synthetic organic pigments in contemporary Balinese painting: a Raman microscopy study

The colour palette from two 20th century and one 21st century Indonesian paintings from the island of Bali was determined by Raman microscopy. There is very little information concerning the artistic techniques from this region of the world and the influences in materials introduced by western artists. The most interesting finding of our study was the increasing substitution of natural pigments by modern synthetic organic pigments. The findings were also compared with samples of representative pigments commonly used by Bali artists, donated by a renowned Balinese painter. Raman microscopy, combined with Fourier transform infrared spectroscopy, high‐performance liquid chromatography and μ‐EDXRF, was able to separate the different components on several colours, and to identify both synthetic organic pigments and inorganic components. Three azo pigments from the diarylide subclass, PY 83, PY 55 and PO 16, were identified on the yellow, brown, red and orange colours. A copper phthalocyanine blue PB 15:x and a basic dye BB 26 were responsible for the blue colours, the former admixed with ultramarine blue. Goethite was sometimes introduced to create the green colour. Two other basic dyes, BY2 and PG 4, were the main chromophores of the yellow and green samples of local pigments. The inorganic pigments comprised bone white, bone black, carbon‐based black pigment, haematite, goethite, vermilion, ultramarine blue and anatase. Finally, the ground layer of all the paintings was identified as rice starch, with a double function of a white pigment. Copyright © 2012 John Wiley & Sons, Ltd.     

Dopant profiling in silicon nanowires measured by scanning capacitance microscopy

Silicon nanowires (SiNWs) with axial doping junctions were synthesized via the Au‐catalyzed vapor–liquid–solid growth method with the use of HCl. In this work, dopant profiling from three axially doped SiNWs with p–i, p–n and n–i–p junctions were investigated using both scanning electron microscopy (SEM) and scanning capacitance microscopy (SCM). It turns out that observed doping contrasts in SEM are also affected by the surface roughness and sample charging. In contrast, SCM allows us to delineate with sub‐10 nm resolution the electrical junctions and provides a relative value of the doping concentration in each segment of the NW. SCM clearly evidences the expected doping regions within these SiNWs thanks to the addition of HCl during the growth that strongly prevents shell overgrowth. (© 2014 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

A unique approach to accurately measure thickness in thick multilayers

X‐ray optics called multilayer Laue lenses (MLLs) provide a promising path to focusing hard X‐rays with high focusing efficiency at a resolution between 5 nm and 20 nm. MLLs consist of thousands of depth‐graded thin layers. The thickness of each layer obeys the linear zone plate law. X‐ray beamline tests have been performed on magnetron sputter‐deposited WSi₂/Si MLLs at the Advanced Photon Source/Center for Nanoscale Materials 26‐ID nanoprobe beamline. However, it is still very challenging to accurately grow each layer at the designed thickness during deposition; errors introduced during thickness measurements of thousands of layers lead to inaccurate MLL structures. Here, a new metrology approach that can accurately measure thickness by introducing regular marks on the cross section of thousands of layers using a focused ion beam is reported. This new measurement method is compared with a previous method. More accurate results are obtained using the new measurement approach.