入射光的偏振特性对全内反射荧光显微术中荧光激发的影响

基于麦克斯韦的电磁场理论，研究了在全内反射荧光显微术中不同偏振态的入射光所产生的 不同偏振的隐失场以及对不同取向的荧光分子荧光发射的影响.理论分析结果表明，p偏振的 入射场将产生椭圆偏振的隐失场，s偏振的入射场将产生s偏振的隐失场.随着荧光分子三维 取向的不同，这两种隐失场的激发荧光效率也将不同，由此引起荧光发射强度的各向异性分 布.据此特性，可以实现对膜表面分子三维取向的成像. 关键词： 全内反射 荧光显微术 隐失波 偏振态     

偏心环状干涉条纹对成像的影响

 讨论了由激光束生成的环状干涉条纹用于目标成像的原理和使用匹配滤波器的处理方法，推导得出相应的点扩展函数(PSF)。模拟计算了主旁瓣峰值比和偏心量与相位量的关系，分析了偏心量对成像质量的影响。结果表明，适当的偏心量有利于提高环状干涉条纹成像的分辨率，又不致于产生对点扩展函数有影响的旁瓣。     

双半透镜干涉场的研究

基于波前分析和基尔霍夫衍射积分式,导出了在会聚球面波照射下圆孔或半圆孔菲涅耳衍射场沿轴的复振幅分布,特别关注其相位分布,给出了像点两侧对称点之间的相位差公式,结果表明过像点的相位变化是连续的.进而将这些结果应用于双半透镜装置,即梅斯林干涉实验,分别两种情况(即焦距相等而物距不等和物距相等而焦距不等)给出了分别由单个半透镜产生的两个衍射场之间的相位差公式和相应的干涉强度公式.结果表明,这两个衍射场沿轴的有效相位差未必是0,亦未必是π,还可能出现锯齿型的反复变化.本研究为正确地分析双半透镜产生的两个衍射场之间的干涉场提供了一个可靠的理论途径.     

X射线成像的一种点扩展函数模型

X射线成像系统可以通过其点扩展函数来表行,其点扩展函数分为一次射线点扩展函数和散射点扩展函数两部分。在分析点扩展函数各个影响因素的基础上,建立了以物体厚度、物体到探测器距离以及成像几何设置为参量的解析模型。利用该模型推导出了特定入射射线能谱和射线源到探测器距离情况下散射比的计算公式。它是以物体厚度和物体到探测器距离为变量的函数。在利用实验数据对模型参量进行最优估计的基础上,利用散射比实验验证了模型的正确性。为散射和几何不清晰度的消除提供了一种实用的模型依据。     

高效双螺旋点扩展函数相位片的设计与实验研究

双螺旋点扩展函数具有随离焦连续旋转变化的特性, 结合单分子定位方法可用于厚样品三维超分辨成像及分子定位追踪研究. 但双螺旋点扩展函数不足之处是光能利用率低, 对于光子数受限的荧光显微成像而言其应用受限. 本文通过对双螺旋点扩展函数在空域、频域和拉盖尔-高斯模式面等三个不同域中进行约束优化. 模拟结果表明, 优化后的双螺旋点扩展函数的光能效率提高了30多倍. 同时, 基于最优设计方案制备了相位片, 并实验验证了该设计的正确性. 与文献报道相比较, 本文结果在成像深度和光能利用率方面都有所改善. 关键词： 双螺旋点扩展函数 超分辨成像 轴向定位 优化算法     

中子针孔成像点扩展函数模拟研究

应用Geant4系统对中子针孔成像的点扩展函数进行了模拟研究.建立了点扩展函数的数学模型,并将其分布图像与能量沉积数据的分布图像作了比较,可看出点扩展函数与能量沉积数据吻合得较好.研究结果表明,在一定偏移量范围内,拟合得到的点扩展函数更好,能得到较好的图像分辨率.通过对不同入射能量在一定偏移量入射下的点扩展函数讨论认为,入射能量增大虽然会增强图像的对比度,但会降低分辨率.     

干涉条纹场成像的目标重建

分析环状条纹干涉成像的信号提取方式,用计算机模拟目标二维图像的重建方式,研究干涉环中心在照明场中心的位置对点扩展函数的影响,并用实验论证上述影响。     

干涉高斯光诱导的表面等离子激元驻波场的分析

考虑到实际入射光强的空间分布不均匀,基于Kretschmann模型并采用角谱方法分析模拟了两束高斯光干涉诱导表面等离子激元(SPP)驻波场。与理想平面波不同,高斯光诱导的SPP干涉条纹幅值大小不等,分布复杂,这表明光强空间非均匀程度会严重地影响到曝光深度的分布。还分析了金属薄膜的厚度、损耗以及光刻胶的介电常数对SPP驻波场的影响,并得出不恰当的金属板厚和细微损耗都会极大削弱SPP驻波场,而如果光刻胶的介电常数过大则有可能产生不了表面等离子体共振的结论。     

激光驱动飞片的线面成像VISAR测速技术

以激光驱动飞片速度场诊断为例,展示线面同时成像任意反射面速度干涉仪(VISAR)技术在超高速碰撞研究中的应用前景。将传统VISAR改为成像干涉结构,用变像管扫描相机和高速光电分幅相机分别记录作为信号载体的梳状干涉条纹随时间的变化,实现靶面一条线上各点速度历程和多个时刻二维靶面上所有点速度相对分布的测量。所研制的线面同时成像VISAR具有10μm的空间分辨和约15m/s的速度分辨能力。用其测量了激光驱动铝膜飞片的速度场,直观给出飞片的演化发展过程。实验结果表明,线面同时成像VISAR技术可以为激光驱动飞片、超高速碰撞等领域的理论研究和数值模拟提供有效比对实验数据。     

对光声成像系统中声透镜的二元声学研究

基于二元声学的方法提出了一种折射／衍射混合声透镜设计方案,该声透镜在对光声信号进行二维成像时体现出了极大的优越性,与单声透镜相比,除了有实时成像、成像焦深较大且可以利用时间分辨技术实现层析成像的优点外,还可以利用二元声学透镜独特的色散特性校正单声透镜的轴向色差,可以极大提高成像的分辨力。通过计算机模拟了有一定带宽的点声源通过该声透镜像面上的点扩展函数,与经单声透镜的结果比较,可以看出点扩展函数弥散斑得到明显改善,极大地消除色差对成像质量的影响。     

Extended resolution wide-field optical imaging: objective-launched standing-wave total internal reflection fluorescence microscopy

Standing-wave total-internal-reflection fluorescence (SW-TIRF) microscopy uses a super-diffraction-limited standing evanescent wave to extract the high-spatial-frequency content of an object through a diffraction-limited optical imaging system. The effective point-spread function is better than a quarter of the emission wavelength. With a 1.45 numerical aperture objective and 532 nm excitation wavelength, a Rayleigh resolution of approximately 100 nm can be achieved, which is better than twice the resolution of conventional TIRF microscopy. This first experimental realization of SW-TIRF in an objective-launched geometry demonstrates the potential for extended resolution imaging at high speed by using wide-field microscopy.     

Structured illumination in total internal reflection fluorescence microscopy using a spatial light modulator

In wide-field fluorescence microscopy, illuminating the specimen with evanescent standing waves increases lateral resolution more than twofold. We report a versatile setup for standing-wave illumination in total internal reflection fluorescence microscopy. An adjustable diffraction grating written on a phase-only spatial light modulator controls the illumination field. Selecting appropriate diffraction orders and displaying a sheared (tilted) diffraction grating allows one to tune the penetration depth in very fine steps. The setup achieves 91 nm lateral resolution for green emission.     

Lateral resolution enhancement with standing evanescent waves

A high-resolution fluorescence microscopy technique has been developed that achieves a lateral resolution of better than one sixth of the emission wavelength (FWHM). By use of a total-internal-reflection geometry, standing evanescent waves are generated that spatially modulate the excitation of the sample. An enhanced two-dimensional image is formed from a weighted sum of images taken at different phases and directions of the standing wave. The performance of such a system is examined through theoretical calculations of both the point-spread function and the optical transfer function.     

Quasiparticle interference of C2-symmetric surface states in a LaOFeAs parent compound

We present scanning tunneling microscopy studies of the LaOFeAs parent compound of iron pnictide superconductors. High resolution spectroscopic imaging reveals strong standing wave patterns induced by quasiparticle interference of two-dimensional surface states. Fourier analysis shows that the distribution of scattering wave vectors exhibits pronounced twofold (C(2)) symmetry, strongly reminiscent of the nematic electronic state found in CaFe(1.94)Co(0.06)As(2). The implications of these results to the electronic structure of the pnictide parent states will be discussed.     

基于周期结构负反射的远场增强成像研究

远场高分辨率成像是近几年来声学和光学领域的研究焦点之一, 倏逝波无法在介质中传播成为将高分辨率成像带入远场的最大困难.本文提出了一种均匀排列的散射钢柱构成的超构散射体成像方式, 利用周期结构负反射现象将倏逝波信息转化为可传播波来增强成像.有限元数值模拟被用来研究和验证该方案的可行性, 结果显示波长3.4 mm的声波可以在20 cm外的远场获得大约0.6个波长的成像分辨能力. 通过减小散射体的晶格常数有希望达到更高分辨率成像.     

表面等离子体平面金属透镜及其应用

由于衍射极限的存在,传统光学透镜成像分辨率理论上只能达到入射光波长的一半。通过恢复和增强携带物体细部特征信息的高频倏逝波,基于表面等离子体的平面金属透镜有望突破这种光学衍射极限,实现超分辨成像。本文对平面薄膜式与纳米结构式两类平面金属透镜进行了综述,详细介绍了若干典型平面金属透镜的结构设计、工作机理及其聚焦性能,并对其特点与存在的问题进行了分析与讨论。由于光波在金属中传播时存在一定损耗,如何更高效地增强高频倏逝波信号并转换成传播波,使其参与成像,以更好地实现远场超分辨成像,以及如何进一步增大近场超高分辨率聚焦光斑焦深以及减小远场聚焦光斑尺寸,是表面等离子体平面金属透镜进一步研究的重点。     

Subwavelength imaging enhancement through a three-dimensional plasmon superlens with rough surface

In this Letter we investigate the subwavelength imaging of a three-dimensional plasmon superlens based on the full vector wave simulations of optical wave propagation and transmission. The optical transfer functions are computed. Comparisons are made between the results of lenses with flat and periodic/random rough surfaces. We also study the problem of practical imaging system geometry using laser as an illumination source. Results show that the lens with periodic or random roughness can reduce the field interference effects, and provide improved focus on the transmission field and the Poynting flux. We illustrate that the subwavelength roughness in a plasmon lens can enhance the image resolution over a flat lens for both matched and unmatched permittivity conditions. The enhancement of resolution occurs because the introduced subwavelength roughness can amplify the evanescent wave components and suppress the surface plasmon resonance peaks.     

Quantitative amplitude and phase measurement by use of a heterodyne scanning near-field optical microscope

A coherent photon scanning tunneling microscope is presented. The setup employs heterodyne interferometry, allowing both the phase and the amplitude of the optical near field to be measured. Experimental results of measurements on a standing evanescent wave reveal the high resolution that is obtainable with such an approach. In fact we have measured the amplitude and the phase of the near field, with a resolution of 1.6 nm between sample points.     

Subdiffraction light focusing on a grating substrate

We describe a way to generate subdiffraction light spots that can be moved over a surface without resorting to near-field manipulation, nonlinear effects, or negative index materials. We use a periodically patterned substrate that converted efficiently, through scattering, the impinging propagative waves into evanescent ones. Then we optimize the wave front of the incident propagative beam so that the grating-scattered evanescent waves interfere constructively at the focal point. Numerical simulations show that focus spots as small as one-sixth of a wavelength can be obtained at any point on the substrate. One foreseen application is high resolution surface imaging.