共查询到20条相似文献,搜索用时 93 毫秒
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讨论了环氧基材PCB对无铅焊锡装配的适应性、铜竭顶的可靠性,证明双氰胺固化的环氧基材不能适直无铅焊锡装配:酚醛树脂固化的环氧基材有解决此问题可能性,但都是PCB制造商们的技术决窍。 相似文献
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Sn-Cu、Sn-Ag-Cu系无铅钎料的钎焊特性研究 总被引:12,自引:5,他引:12
制备了Sn-0.7Cu、Sn-3.5Ag-0.6Cu钎料,用润湿平衡法测量了钎料对铜的润湿曲线,研究了温度、钎剂活性、钎焊时间对润湿行为的影响,并与Sn-37Pb钎料进行了比较。结果表明:升高温度能显著改善无铅钎料对铜的钎焊性。当温度<270℃时,Sn-0.7Cu的钎焊性明显低于Sn-3.5Ag-0.6Cu钎料;而当温度≥270℃时,两种钎料对铜都会显示较好的润湿性,而Sn-0.7Cu略优于Sn-3.5Ag-0.6Cu钎料。提高钎剂活性能显著增强钎料对铜的润湿性,其卤素离子的最佳质量分数均为0.4%左右。随着浸渍时间的延长,熔融钎料与铜的界面间产生失润现象。无铅钎料的熔点和表面张力较高,是钎焊性较差的根本原因。 相似文献
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自动光学检验设备(AOI)对无铅焊锡的检测 总被引:4,自引:0,他引:4
欧姆龙株式会社 《电子工业专用设备》2003,32(3):62-66
在倡导废除使用环境污染物质铅的进程中,各生产厂家都逐步地开始采用去除了焊锡中铅成分的无铅焊锡。对焊锡无铅化引起外观的变化和特征进行了论述,并说明了无铅化与焊锡外观检测的关系,以及欧姆龙公司在无铅化应用上新开发的功能。 相似文献
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Ce对SnAgCu系无铅焊锡力学性能的影响 总被引:6,自引:0,他引:6
通过向Sn-3Ag-2.8Cu钎料合金中添加微量稀土Ce,利用扫描电子显微镜(SEM)研究了不同稀土含量对Sn-3Ag-2.8Cu合金的力学性能的影响,同时对显微组织进行了分析.实验结果表明,微量的Ce稀土可以显著提高Sn-3Ag-2.8Cu钎料的延伸率、延长其焊接接头在室温下的蠕变断裂寿命,尤其是当稀土的质量分数为0.1%时,其蠕变断裂寿命可以达到Sn-3Ag-2.8Cu钎料的9倍以上,当稀土的质量分数超过0.1%时,接头的蠕变断裂寿命呈下降趋势.综合考虑,最佳的稀土质量分数为0.05%~0.10%. 相似文献
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Wenxing Dong Yaowu Shi Yongping Lei Zhidong Xia Fu Guo 《Journal of Electronic Materials》2009,38(9):1906-1912
In the present work, solidification cracks in Sn-Ag-Cu solder joints were investigated. Experimental results indicate that
solidification cracks existed in significant numbers in the miniature Sn-Ag-Cu solder joints. In order to create solidification
cracks in the miniature solder joints during solidification and evaluate the susceptibility of Sn-Ag-Cu alloys to solidification
cracking, a copper self-restraint specimen was designed, which can simulate the process of solidification crack formation.
The solidification crack susceptibility of the Sn-Ag-Cu solder alloy was evaluated using the total crack length of the solder
joint. In addition, the effect of trace amounts of elemental additions on solidification cracking of Sn-Ag-Cu solder joints
was studied. It was found that adding trace amounts of Ni or Ce could depress the solidification cracks in Sn-3.0Ag-0.5Cu
solder joints. However, P additions aggravated the formation of solidification cracks. 相似文献
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Effect of SiC Nanoparticle Additions on Microstructure and Microhardness of Sn-Ag-Cu Solder Alloy 总被引:1,自引:0,他引:1
In this work, lead-free composite solders were produced by mechanically mixing nominal 20 nm moissanite SiC particles with
Sn-3.8Ag-0.7Cu solder paste. The effects of the amount of SiC addition on the melting behavior, microstructure, and microhardness
of as-solidified composite solders were systematically investigated. In comparison with solder without the addition of SiC
nanoparticles, the subgrain of β-Sn, the intermetallic compounds (IMCs) average grain size and distance decreased significantly
in the composite solder matrix. This was possibly ascribed to the strong adsorption effect and high surface free energy of
the SiC nanoparticles. Our results showed that 0.05 wt.% addition of SiC nanoparticles could improve the microhardness by
44% compared with the noncomposite and that the average grain size and distance changed from 0.5 μm to 0.2 μm and from 0.6 μm to 0.32 μm, respectively. The refined IMCs, acting as a strengthening phase in the solder matrix, enhanced the microhardness of the
composite solders, in good agreement with the prediction of the classic theory of dispersion strengthening. 相似文献
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提出了一种对微电子封装器件中焊点剪切强度进行测试的方法,可有效降低测试误差。利用该方法,对Sn—Ag—Cu无铅焊料分别在Cu基板和Ni-P基板上形成的焊点,经不同的热时效后的剪切强度进行了测量,并对断裂面的微观结构进行了研究。结果表明,新的剪切测试方法误差小,易于实施,焊点剪切强度、断裂面位置与焊料在不同基板界面上金属间化合物的形貌、成分有关。 相似文献
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浅谈Sn-Ag-Cu无铅焊料的可靠性 总被引:3,自引:0,他引:3
随着电子组装技术的发展,电子产品在制造过程中使用的焊料也随之更新换代,由原来的使用锡铅焊料改为使用无铅焊料,特别是Sn-Ag-Cu焊料,以满足WEEE和RoHS指令以及其他方面的要求。然而,使用无铅焊料却带来了一系列的问题,这些问题自然影响到产品的可靠性和使用寿命,因此,成为业界最关注的热点问题。文章主要讨论了Sn-Ag-Cu焊料的可靠性等问题。 相似文献
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Christopher Kinney J.W. MorrisJr. Tae-Kyu Lee Kuo-Chuan Liu Jie Xue Dave Towne 《Journal of Electronic Materials》2009,38(2):221-226
The work reported here included preliminary tests on the influence of an imposed current on the creep rate of the Pb-free
solder Sn-Ag-Cu 305 (Sn-3Ag-0.5Cu in wt.%). The samples employed were double-shear specimens that contained paired solder
joints, 400 μm × 400 μm in cross-section, 200 μm in thickness on Cu. Three tests were done. In the first, samples were tested under stress at room temperature with imposed
current densities that ranged from 1 × 103 A/cm2 up to 6.5 × 103 A/cm2. As expected, because of Joule heating, the results show a sharp increase in creep rate with the imposed current density.
A second set of tests was done to determine whether Joule heating fixed the creep rate. The steady-state temperature of the
solder joints was measured under current, and samples were creep-tested at that temperature. Surprisingly, the creep rate
under current was significantly below that measured in isothermal tests at the same temperature. The third set of tests studied
the influence of microstructure. Samples were prepared with three starting microstructures: as cast, thermally aged by long-term
isothermal exposure, and current aged by long-term exposure to a fixed current density. The three microstructures were then
tested with and without current at two ambient temperatures. The different microstructures had very different creep rates
in the absence of current but, surprisingly, imposing a current (5.5 × 103 A/cm2) increased the creep rate by very nearly the same factor (~7×) in every case. Neither of these results is well understood
at this time. 相似文献
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R. Mahmudi A. R. Geranmayeh M. Allami M. Bakherad 《Journal of Electronic Materials》2007,36(12):1703-1710
Creep behavior of cast lead-free Sn-5%Sb solder in unhomogenized and homogenized conditions was investigated by long time
Vickers indentation testing under a constant load of 15 N and at temperatures in the range 321–405 K. Based on the steady-state
power law creep relationship, the stress exponents were found for both conditions of the material. The creep behavior in the
unhomogenized condition can be divided into two stress regimes, with a change from the low-stress regime to the high-stress
regime occurring around 11.7 × 10−4 < (H
V
/E) < 18 × 10−4. The low stress regime activation energy of 54.2 kJ mol−1, which is close to 61.2 kJ mol−1 for dislocation pipe diffusion in the Sn, and stress exponents in the range 5.0–3.5 suggest that the operative creep mechanism
is dislocation viscous glide. This behavior is in contrast to the high stress regime in which the average values of n = 11.5 and Q = 112.1 kJ mol−1 imply that dislocation creep is the dominant deformation mechanism. Homogenization of the cast material resulted in a rather
coarse recrystallized microstructure with stress exponents in the range 12.5–5.7 and activation energy of 64.0 kJ mol−1 over the whole ranges of temperature and stress studied, which are indicative of a dislocation creep mechanism. 相似文献
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在无铅BGA封装工艺过程中,通过不同组分的BGA焊球合金与焊膏合金组合焊接、焊膏助焊剂活性剂不同配比及其不同再流焊接条件等实验,对焊料合金和助焊剂配比、再流焊接峰值温度、再流保温时间等参数变化,以降低BGA焊点空洞缺陷进行了研究。结果表明选用相同或相似的BGA焊球和焊膏合金组合焊接、选用活性强的焊膏、选择焊接保温时间较长均有助于降低BGA焊点空洞缺陷产生的几率和空洞面积,BGA焊点最佳再流焊接峰值温度为240℃,当峰值温度设置为250℃时,BGA焊点产生空洞缺陷几率会比240℃高出25%~30%。 相似文献