激光等离子体球面晶体光谱成像

 利用自聚焦原理,研制了一种新型的球面弯晶谱仪。晶体分析器采用云母材料,其弯曲半径为380 mm,布拉格角为51°。利用成像板接收光谱信号,其有效面积为30 mm×80 mm,从等离子体源经晶体到成像板的光程长为980 mm。物理实验在中国工程物理研究院激光聚变研究中心20 J激光装置上进行,入射激光能量为6.78 J,成像板获得了铝激光等离子体X射线的光谱空间分辨信号。球面云母弯晶谱仪的光谱分辨率达到1 000～1 500,在相同环境放置的PET平晶的光谱分辨率为50～100。结果表明：球面弯晶具有较高的光谱分辨率和信噪比,适合于激光等离子体X射线的光谱学研究。     

Pseudo Stark and uniaxial stress splitting of the 6955 Å zero-phonon line in LiF

The spectral resolution of quartz crystals bent to a cylindrical form by means of four rods was investigated with CuKα radiation in a reflection type arrangement. The crystal adjustment was made optically using interference fringes. With the crystal bent to a circular cylinder the deviations from exact focusing inherent to the Johann case could be measured and were found to be in agreement with theory. — Crystals bent to a logarithmic spiral have also been studied. With a 24 mm broad reflecting area (mean radius of curvature 1 m; (13¯40)-plane) an uncorrected full width at half maximum intensity of 0.43 XU or 2.25 eV was observed for the CuKα ₁ line, in agreement with double crystal spectrometer measurements.     

X射线连续谱晶体单色器的分辨率

本文讨论了在连续X射线谱的情况下,例如EXAFS谱时,晶体单色器的能量色差。根据连续谱强度随能量变化很小的特点,将其强度看作一常量,提出了计算平晶及Johann,Johansson弯晶单色器平均分辨率的计算方法。同时也指出了以往文献中关于Johann法反射几何分析的一些不当之处。并证明Johann法能得到比过去人们所估计的好得多的分辨率。 关键词：     

The choice of spectroscopic scheme in x-ray plasma diagnostics

The ray tracing codes for flat, cylindrically bent (Johann horizontal focusing and von Hamos vertical focusing geometry), elliptically and spherically bent crystal spectrometers were developed. The codes, extended by introducing the two-dimensional source and the real shape of single crystal diffraction pattern in dependence on the radius of curvature, contribute to a proper choice of experimental configuration in x-ray plasma diagnostics. A method of ray tracing the von Hamos spectrometer is presented in detail. The use of the ray tracing code to the optimization of the spectroscopic scheme is demonstrated on the analysis of gas-puff z-pinch experiment.     

On the dynamic theory of a focusing Cauchois spectrometer

A dynamic theory of Laue diffraction of X-ray wave from a perfect bent crystal in the Cauchois scheme is presented. The cases of spherically divergent and converging waves are considered. The spectral resolution of a focusing Cauchois spectrometer is estimated.     

Optimization of Device Parameters for Minimizing Spherical Aberration and Astigmatism in Liquid Crystal Microlenses

The aberration properties of liquid crystal (LC) microlenses with various diameters, thicknesses and shapes (circles or ellipses) are evaluated by analyzing fringe patterns generated by interference between ordinary and extraordinary rays. It is found that the astigmatism and the spherical aberration can be minimized by adjusting the ellipticity of the hole pattern and the applied voltage, respectively. Based on the experimental results, we propose a design scheme for minimizing the spherical aberration and astigmatism. It is confirmed that the LC microlens obtained by the proposed design scheme shows a good focusing spot whose value of full width half maximum is close to that of the diffraction limit.     

X射线单色四重聚焦照相机单色器的衍射几何

本文详细分析了不对称Johann型单色器和不对称对数螺线型单色器的衍射几何。给出了计算X射线源焦点到单色器距离L₁、射线源及聚焦线交叉区散焦宽度b₁,b₂的表达式。根据理论分析的结果,在试制聚焦相机时采用了近似不对称Johann型的可调弯曲石英单色器。 关键词：     

量子模型分析激光驻波原子透镜的像差

采用量子模型对近共振激光驻波原子透镜会聚Cr原子束、形成纳米量级光栅结构的物理过程进行数值模拟。为提高原子透镜的成像质量,对各种像差,如衍射像差、球差、色差、及原子束发散角、原子磁支能级、原子同位素等因素引起的像差进行了理论分析。模拟结果表明,相比粒子光学模型,量子模型能更加精确地描述原子会聚结果,且能解释原子在驻波光场中的衍射现象。在各种像差中,原子束发散角是最主要的因素,其影响大于衍射像差、球差、色差。原子的磁支能级、同位素等因素对像差影响很小,可以忽略不计。激光冷却准直原子束的方法可以减小束发散角引起的像差,压缩原子速度Vz分布范围的方法可以减小色差。     

偏心和倾斜光学系统初级象差理论的研究

在共轴光学系统波象差的基础上,推导出了光学元件的偏心和倾斜分别对主要象差的影响.得出了除了球差外,每一种象差由于偏心和倾斜都引入了它同种类的象差;小量的偏心和倾斜并不改变系统的球差的结论;如果球差并不为零,将会产生与象高无关的彗差,即轴向彗差等等.     

光学合成孔径成像系统子孔径像差研究

根据波像差理论，推导了光学合成孔径成像系统单个子孔径存在各种像差时波面方差与子孔径数(N)的关系。推导结果表明，piston误差对系统的影响最大，其次是离焦误差、倾斜误差、球差、彗差和像散。运用离焦误差对piston误差、球差和像散进行像差平衡，其效果显著，特别是球差引起的波面方差下降90％。系统各项像差系数随子孔径数的增加而降低;当子孔径数大于6时，各像差系数变化缓慢。根据瑞利判据，计算N(N≤6)个子孔径合成系统的像差允限和相应的3孔径系统的斯特列尔比。     

Nd:YAG晶体板条低透射波前误差加工技术

针对高平均功率固体激光器对Nd:YAG晶体板条的技术需求,进行了Nd:YAG晶体板条低透射波前误差加工技术研究。详细分析了光学加工过程中引起板条端面透射波前畸变的误差来源,并提出工艺技术解决方案。实验结果表明,在板条抛光阶段通过采用合成盘硬抛光工艺以及新的工件装夹技术,能够解决传统板条加工工艺在面形及楔角精度方面可控性差的问题,更容易实现Nd:YAG晶体板条的低透射波前误差加工。对于150mm×30mm×2.5mm规格的Nd:YAG晶体板条元件,端面透射波前畸变PV值达到0.74λ。     

数值模拟抽运分布对端泵激光器晶体热透镜球差的影响

为了研究端面抽运情况下,激光晶体在不同分布的抽运光抽运时热透镜球差的变化,通过对稳态热传导方程和Zernike多项式的求解,建立了热透镜球差与抽运光强度分布的模型,对模型进行了理论分析和仿真研究,并对仿真结果做了进一步理论和仿真分析.结果表明:在相同的抽运功率下,二阶超高斯分布抽运光抽运时球差最大,且随着抽运分布系数k的增大(除高斯分布外)球差逐渐减小;随着抽运功率的增加,抽运分布系数k对球差的影响逐渐加重,且不同分布系数k所产生的球差差距逐渐增大;并对二阶超高斯分布抽运光抽运得到最强激光功率的照射范围进行了理论分析和仿真分析,得知在相同抽运功率下,二阶超高斯分布抽运光得到最强激光功率的范围最宽为0.30—0.63倍高斯半径.     

Conditions for identical position of optimal image plane for axial imaging with different values of f-number

By analysis of the dependence of longitudinal spherical aberration on the numerical aperture, it is possible to find such values of the numerical aperture, where spherical aberration is zero. Such values of the numerical aperture are called correction zones. The work theoretically analyses the described problem and equations are given for wave aberration coefficients using correction zones for spherical aberration of the third and the fifth order. Our work presents an analysis of optimal values of correction zones and an optimal position of the center of the reference sphere based on the variance of wave aberration for the image quality evaluation. Relations are described for calculation of correction zones of an optical system having an identical position of the optimal image plane for two values of the f-number. The analysis of optical systems using correction zones is performed on an example.     

X射线背光成像的实现

为了实现对惯性约束聚变的诊断,获取聚爆过程中高温等离子体X射线能谱信息和内爆靶丸的二维空间分辨信息,利用晶体的布拉格衍射特性设计制作了球面晶体分析器,晶体弯曲半径为125 mm。为了验证球面晶体的空间分辨能力,搭建了背光成像平台进行了背光成像实验,石英球面晶体为衍射核心元件,接收装置IP板得到了Cu靶的二维空间分辨信息,基于石英球面晶体的成像平台得到的空间分辨率约为100 μm。     

一种变曲率面晶体X射线检测技术

在惯性约束聚变光谱诊断物理实验研究中,晶体衍射后X射线光谱信号较弱,需要高收光效率及宽频谱范围的光谱诊断仪器.在传统锥面弯曲晶体基础上提出变曲率弯晶多能点成像技术,该技术具有宽频谱范围、强聚焦能力、高光谱分辨的特点.在晶体衍射成像结构设计中,由于能够确保成像光线的旋转对称性,因此在原理上可消除传统弯晶X射线衍射成像像差.利用研制的变曲率面石英晶体对钛靶X射线源进行X射线聚焦检测,并与同种材料的平面晶体进行收光效率对比,实验结果表明该变曲率面石英晶体的收光效率可以达到平面石英晶体的100倍,检测X射线能量范围为4.51~5.14keV.该晶体谱仪结合X射线条纹相机能够检测宽频谱范围的微弱X射线信号,条纹相机探测面可与晶体检测光路方向垂直布局.     

球面晶体分析器在X射线成像诊断中的研究

 为诊断激光等离子体X射线,研制了基于Bragg衍射原理的球面弯曲晶体。球面晶体可提高空间分辨、光谱分辨及立体角收集辐射能力。实验采用球面弯曲石英晶体作为分析器,X射线成像板作为成像器件,利用X射线衍射仪铬靶 Kα单色谱成像,验证了0.2 mm间隔双丝的单能像,球面弯晶具有较高的光谱分辨力和信噪比,谱分辨力可达1 000,聚光效率在同样距离条件下比平晶分析器高一个数量级以上。     

Laue弯晶聚焦特性的光线追迹研究

由于可有效降低高热负载的影响, Laue弯晶是插入件辐射高通量密度硬X射线(30 keV以上)聚焦、 准直和单色化的最有效的光学元件.研究其聚焦光学特性,对发展高性能、高稳定的Laue弯晶单色器具有重要意义. 采用自行发展的光线追迹软件较为系统地研究了Laue弯晶的聚焦特性, 分析了入射光性质及弯晶参数对聚焦光斑、焦距、发散度等主要光学参数的影响. 结果表明,衍射能量越高,聚焦光斑越小,并趋于稳定值;弯曲半径越小,聚焦光斑越小, 并在其达到一阈值时得到聚焦光斑的极小值,之后随着弯曲半径的变小,由于像差等因素的影响, 聚焦光斑反而变大;晶体越厚,聚焦光斑越大,呈线性正比关系.对于衍射光发散度, 其随着衍射能量的增大而变小,并趋于稳定值;其与晶体曲率呈线性正比关系. 同时通过研究得到弯晶各参数的合理选择范围.     

On 2D Focusing of X rays Bragg-diffracted by a biaxially bent crystal

2D focusing of an X-ray wave Bragg-diffracted by a biaxially bent crystal is considered in terms of quasi-back diffraction scattering in the meridional plane. Analytical expressions for the focusing geometrical condition in the meridional plane and for the spatial distribution of the wave intensity in the same plane in the neighborhood of the point source image are derived. They differ from those currently available from the theory.     

Dynamical chaos and stochastic mechanism of high-energy negatively charged particle deflection by bent crystals

Deflection of high-energy negatively charged particles in straight and bent crystals through multiple scattering by crystal atomic strings was considered for the case in which the initial angle between the particle momentum and one of the main crystallographic axes was approximately four critical angles of axial channeling. It was shown that in a bent crystal with a small crystal thickness, when the crystal bend was less than the beam incidence angle, the beam deflected in the direction opposite to the direction of the crystal bend. At larger crystal thicknesses, the large part of the beam starts to deflect in the direction of the crystal bend. In addition, there is a group of particles that follow the crystal axis bend in the angular region of approximately the critical angle of axial channeling with respect to the current direction of the crystal axis. It was shown that in all of these deflection processes, the periodicity of the location of atomic strings in the crystal does not influence the angular distributions of scattered particles. This fact is connected with the effect of dynamical chaos in particle motion in the periodical field of bent crystal atomic strings. It was also shown that observed in a recent CERN experiment effect of beam deflection, when the angle between the initial particle momentum and the crystal axis was approximately four critical angles of axial channeling, is due to peculiarities of the stochastic multiple scattering of particles by bent crystal atomic strings. These peculiarities are connected with the effect of dynamical chaos in particle motion in crystals.     

Correction of aberration for a high-resolution electron hologram by means of the amplitude contrast criterion of image wave

In order to further improve the resolution for a high-resolution electron hologram, the aberration working on the hologram must be corrected. Since it is rather difficult to precisely control aberration coefficients in the experimental stage, we proposed an amplitude contrast D criterion of imaging wave to determine the working aberration from the hologram itself. In the determination or correction of the aberration, we assume a symmetrical aberration function is parameterized only by a spherical aberration coefficient and a defocus value. First, D is calculated from a holographically reconstructed imaging wave of YBa(2)Cu(3)O(7-x) for each combination of these parameters. The working aberration on the imaging wave is determined from the combination of the parameters by noting the maximum or minimum D of the imaging wave at some specifically chosen thickness regions. The theoretical validity for the D criterion is then proved with three-beam dynamical diffraction formula. Finally, the 'experimental' examination for the D criterion is successfully performed on the reconstructed image wave for the Sigma=9 interface structure of a wedge-shaped silicon sample.