Analysis of antioxidants in insulation cladding of copper wire: a comparison of different mass spectrometric techniques (ESI–IT,MALDI–RTOF and RTOF–SIMS)

Commercial copper wire and its polymer insulation cladding was investigated for the presence of three synthetic antioxidants (ADK STAB AO412S, Irganox 1010 and Irganox MD 1024) by three different mass spectrometric techniques including electrospray ionization–ion trap–mass spectrometry (ESI–IT–MS), matrix‐assisted laser desorption/ionization reflectron time‐of‐flight (TOF) mass spectrometry (MALDI–RTOF–MS) and reflectron TOF secondary ion mass spectrometry (RTOF–SIMS). The samples were analyzed either directly without any treatment (RTOF–SIMS) or after a simple liquid/liquid extraction step (ESI–IT–MS, MALDI–RTOF–MS and RTOF–SIMS). Direct analysis of the copper wire itself or of the insulation cladding by RTOF–SIMS allowed the detection of at least two of the three antioxidants but at rather low sensitivity as molecular radical cations and with fairly strong fragmentation (due to the highly energetic ion beam of the primary ion gun). ESI–IT‐ and MALDI–RTOF–MS‐generated abundant protonated and/or cationized molecules (ammoniated or sodiated) from the liquid/liquid extract. Only ESI–IT–MS allowed simultaneous detection of all three analytes in the extract of insulation claddings. The latter two so‐called ‘soft’ desorption/ionization techniques exhibited intense fragmentation only by applying low‐energy collision‐induced dissociation (CID) tandem MS on a multistage ion trap‐instrument and high‐energy CID on a tandem TOF‐instrument (TOF/RTOF), respectively. Strong differences in the fragmentation behavior of the three analytes could be observed between the different CID spectra obtained from either the IT‐instrument (collision energy in the very low eV range) or the TOF/RTOF‐instrument (collision energy 20 keV), but both delivered important structural information. Copyright © 2009 John Wiley & Sons, Ltd.     

Cluster TOF‐SIMS imaging of human skin remains: analysis of a South‐Andean mummy sample

A skin sample from a South‐Andean mummy dating back from the XI^th century was analyzed using time‐of‐flight secondary ion mass spectrometry imaging using cluster primary ion beams (cluster‐TOF‐SIMS). For the first time on a mummy, skin dermis and epidermis could be chemically differentiated using mass spectrometry imaging. Differences in amino‐acid composition between keratin and collagen, the two major proteins of skin tissue, could indeed be exploited. A surprising lipid composition of hypodermis was also revealed and seems to result from fatty acids damage by bacteria. Using cluster‐TOF‐SIMS imaging skills, traces of bio‐mineralization could be identified at the micrometer scale, especially formation of calcium phosphate at the skin surface. Mineral deposits at the surface were characterized using both scanning electron microscopy (SEM) in combination with energy‐dispersive X‐ray spectroscopy and mass spectrometry imaging. The stratigraphy of such a sample was revealed for the first time using this technique. More precise molecular maps were also recorded at higher spatial resolution, below 1 µm. This was achieved using a non‐bunched mode of the primary ion source, while keeping intact the mass resolution thanks to a delayed extraction of the secondary ions. Details from biological structure as can be seen on SEM images are observable on chemical maps at this sub‐micrometer scale. Thus, this work illustrates the interesting possibilities of chemical imaging by cluster‐TOF‐SIMS concerning ancient biological tissues. Copyright © 2012 John Wiley & Sons, Ltd.     

Ga‐focused ion beam time‐of‐flight secondary ion mass spectrometer analysis of the grain boundary segregation/precipitation of boron in steel

Ga‐focused ion beam time‐of‐flight secondary ion mass spectrometry (FIB‐TOF‐SIMS) analysis was performed to investigate the grain boundary segregation/precipitation of boron in steel. To overcome the low secondary ion yield from the primary Ga⁺ source and the sensitivity using a high‐resolution Ga‐FIB source, a low energy oxygen ion beam was used prior to the Ga‐FIB‐TOF‐SIMS analysis. As a result, it was found that Ga‐FIB‐TOF‐SIMS is a very powerful tool for mapping boron segregation and/or precipitation in steel with a spatial resolution of ~200 nm. In addition, the results were strongly dependent on the surface composition. Copyright © 2014 John Wiley & Sons, Ltd.     

Time‐of‐flight secondary ion mass spectroscopic characterization of the nitrogen profile of shallow gate oxynitride thermally grown on a silicon substrate

Silicon oxynitride has been used as a shallow gate oxide material for microelectronics and its thickness has been reduced over the years to only a few tens of angstroms due to device size scaling. The nitride distribution and density characteristic in the gate oxide thus becomes imperative for the devices. The shallow depth profiling capability using time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) has huge potential for the nitrogen characterization of the shallow gate oxide film. In this article, both positive and negative spectra of TOF‐SIMS on silicon oxynitride have been extensively studied and it was found that the silicon nitride clusters Si_xN^? (x = 1–4) are able to represent the nitrogen profiles because their ion yields are high enough, especially for the low‐level nitride doping in the oxide, which is formed by the annealing of nitric oxide on SiO₂/Si. The gate oxide thickness measured by the TOF‐SIMS profiling method using ¹⁸O or CsO profile calibration was found to correlate very well with transmission electron microscope measurement. The nitrogen concentration in the gate oxide measured using the TOF‐SIMS method was consistent with the results obtained using the dynamic SIMS method, which is currently applied to relatively thicker oxynitride films. Copyright © 2012 John Wiley & Sons, Ltd.     

Correlative mass spectrometry imaging,applying time‐of‐flight secondary ion mass spectrometry and atmospheric pressure matrix‐assisted laser desorption/ionization to a single tissue section

Rationale

Mass spectrometry imaging (MSI) is a powerful tool for mapping the surface of a sample. Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) and atmospheric pressure matrix‐assisted laser desorption/ionization (AP‐MALDI) offer complementary capabilities. Here, we present a workflow to apply both techniques to a single tissue section and combine the resulting data for the example of human colon cancer tissue.

Methods

Following cryo‐sectioning, images were acquired using the high spatial resolution (1 μm pixel size) provided by TOF‐SIMS. The same section was then coated with a para‐nitroaniline matrix and images were acquired using AP‐MALDI coupled to an Orbitrap mass spectrometer, offering high mass resolution, high mass accuracy and tandem mass spectrometry (MS/MS) capabilities. Datasets provided by both mass spectrometers were converted into the open and vendor‐independent imzML file format and processed with the open‐source software MSiReader.

Results

The TOF‐SIMS and AP‐MALDI mass spectra show strong signals of fatty acids, cholesterol, phosphatidylcholine and sphingomyelin. We showed a high correlation between the fatty acid ions detected with TOF‐SIMS in negative ion mode and the phosphatidylcholine ions detected with AP‐MALDI in positive ion mode using a similar setting for visualization. Histological staining on the same section allowed the identification of the anatomical structures and their correlation with the ion images.

Conclusions

This multimodal approach using two MSI platforms shows an excellent complementarity for the localization and identification of lipids. The spatial resolution of both systems is at or close to cellular dimensions, and thus spatial correlation can only be obtained if the same tissue section is analyzed sequentially. Data processing based on imzML allows a real correlation of the imaging datasets provided by these two technologies and opens the way for a more complete molecular view of the anatomical structures of biological tissues.

     

超高硫煤有机相中的元素硫与铁复合物的证据

运用高性能静态二次离子质谱从中国贵州（六枝）超高硫原煤有机相中观测到元素硫与铁的复合组成离子,由此,首次以确切的实验证据了过去关于煤中可能存在铁－硫复合结构的理论推测,同时本工作还表明,所采用的超高灵敏度和微区离子探针分析方法,适于今后进一步探讨硫及其它有害元素在煤中的复杂化学赋存状态。     

Macromolecular Surface Design: Photopatterning of Functional Stable Nitrile Oxides

The efficient trapping of photogenerated thioaldehydes with functional shelf‐stable nitrile oxides in a 1,3‐dipolar cycloaddition is a novel and versatile photochemical strategy for polymer end‐group functionalization and surface modification under mild and equimolar conditions. The modular ligation in solution was followed in detail by electrospray ionization mass spectrometry (ESI‐MS). X‐ray photoelectron spectroscopy (XPS) was employed to analyze the functionalized surfaces, whereas time‐of‐flight secondary‐ion mass spectrometry (ToF‐SIMS) confirmed the spatial control of the surface functionalization using a micropatterned shadow mask. Polymer brushes were grown from the surface in a spatially confined regime by surface‐initiated atom transfer radical polymerization (SI‐ATRP) as confirmed by TOF‐SIMS, XPS as well as ellipsometry.     

A discussion on mass resolution in secondary ion mass spectrometry

Mass resolution is a very important parameter for mass spectrometry. It is necessary to compare the mass resolution between the newly developed TOF-SIMS and the conventionally high-performance magnetic SIMS. However, the definitions of mass resolution for these two types of instruments are quite different. Whether it is possible to compare mass resolution and how to do such comparison is a challenge. This problem was raised officially during the 2012 ISO/TC 201 meeting at Tampa, Florida, the United States and the long-term cooperation with ISO started afterwards. The definition of mass resolution is one of the most important and fundamental problems for mass spectrometry and should attract significant attention. Here, some detail discussions on mass resolution as well as the related experimental studies in the past few years, including the collaborations with ISO/TC 201/SC6 and SC1 are summarized. This summary covers the common problem for almost all the current existing and still used definitions of mass resolution. A reasonable new definition for mass resolution considering the peak shape or resolution function has been proposed, which has also been confirmed by using experimental studies of the mass resolution comparison between TOF and magnetic SIMS. This study lays a foundation for the future mass resolution comparisons between different mass spectrometry.     

In situ SIMS analysis and reactions of surfaces prepared by soft landing of mass-selected cations and anions using an ion trap mass spectrometer

Mass-selected polyatomic cations and anions, produced by electrosonic spray ionization (ESSI), were deposited onto polycrystalline Au or fluorinated self-assembled monolayer (FSAM) surfaces by soft landing (SL), using a rectilinear ion trap (RIT) mass spectrometer. Protonated and deprotonated molecules, as well as intact cations and anions generated from such molecules as peptides, inorganic catalysts, and fluorescent dyes, were soft-landed onto the surfaces. Analysis of the modified surfaces was performed in situ by Cs⁺ secondary ion mass spectrometry (SIMS) using the same RIT mass analyzer to characterize the sputtered ions as that used to mass select the primary ions for SL. Soft-landing times as short as 30 s provided surfaces that yielded good quality SIMS spectra. Chemical reactions of the surfaces modified by SL were generated in an attached reaction chamber into which the surface was transferred under vacuum. For example, a surface on which protonated triethanolamine had been soft landed was silylated using vapor-phase chlorotrimethylsilane before being returned still under vacuum to the preparation chamber where SIMS analysis revealed the silyloxy functionalization. SL and vapor-phase reactions are complementary methods of surface modification and in situ surface analysis by SIMS is a simple way to characterize the products produced by either technique.     

超声分子束研究激光诱导Cl2和Ta表面反应动态学

本文研究了在三种不同波长的脉冲激光(365 nm, 560 nm和1064 nm)辐照下超声Cl_2分子束与多晶Ta表面的化学反应动态学. 由四极质谱和飞行时间增(TOF)测定了产物的质量分布和速度分布. 该反应的主要产物为TaCl, TaCl_2, TaCl_3及TaCl_4; 它们的TOF谱都可用Maxwell-Boltzmann分布拟合, 所得的平动温度分别在500 K—1500 K范围内. 测定了各种产物相对产率与激光能量密度和入的Cl_2分子平动能的关系. 此外, 对此气-固表面反应的机理进行了讨论。     

Identification of a lipid‐related peak set to enhance the interpretation of TOF‐SIMS data from model and cellular membranes

Principal component analysis (PCA) of time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) data enables differentiating structurally similar molecules according to linear combinations of multiple peaks in their spectra. However, in order to use PCA to correctly identify variations in lipid composition between samples, the discrimination achieved must be based on chemical differences that are related to the lipid species, and not sample‐associated contamination. Here, we identify the positive‐ion TOF‐SIMS peaks that are related to phosphatidylcholine lipid headgroups and tail groups by PCA of spectra acquired from lipid isotopologs. We demonstrate that restricting PCA to a contaminant‐free lipid‐related peak set reduces the variability in the spectra acquired from lipid samples that is due to contaminants, which enhanced differentiating different lipid standards, but adversely affected the contrast in PC scores images of phase‐separated lipid membranes. We also show that PCA of a restricted data set consisting of the peaks related to lipids and amino acids increases the likelihood that the discrimination of TOF‐SIMS data acquired from intact cells is based on differences in the lipids and proteins on the cell surface, and not sample‐specific contamination without compromising sample discrimination. We expect that the lipid‐related peak database established herein will facilitate interpreting the TOF‐SIMS data and PCA results from studies of both model and cellular membranes, and enhance identifying the origins of the peaks that contribute to discriminating different types of cells. Copyright © 2011 John Wiley & Sons, Ltd.     

Time-of-flight secondary ion mass spectrometry, fluorescence microscopy and scanning electron microscopy: combined tools for monitoring the process of patterning and layer-by-layer assembly of synthetic and biological materials

We have employed time-of-flight secondary ion mass spectrometry (TOF SIMS), fluorescence microscopy and scanning electron microscopy (SEM) to monitor the immobilization of biotinylated shell-crosslinked nanoparticles (SCKs) on biotin/streptavidin-functionalized, UV-photopatterned self-assembled monolayers (SAMs). TOF SIMS and fluorescence microscopy images showed that the streptavidin was immobilized primarily in the biotin-functionalized SAM areas. Biotinylated SCKs underwent both streptavidin-biotin recognition and electrostatic interactions to the underlying substrate. Upon adsorption, the biotinylated SCKs deformed significantly; their cross-sectional diameter increased by approximately 36% from 65+/-7 nm to 90+/-2 nm. Using the SCK contact area, we estimate that one SCK was bound between one and five streptavidin proteins. These data suggest that functionalized SCKs can be employed as biomolecule mimics to investigate the factors that control biomolecule adsorption on functionalized surfaces.     

Low‐density polyethylene films doped with europium(III) complex: their properties and applications

Light‐converting polyethylene film containing europium(III) complex with phenanthroline was manufactured under an extrusion process. The film was characterized first by means of time‐of‐flight secondary‐ion‐mass spectrometry (TOF‐SIMS), ultraviolet‐visible‐infrared (UV‐vis‐IR) spectroscopy, then a study of excitation and luminescence spectra, quantum yield and lifetime of luminescence. The quantum yield of luminescence was measured as 5±2%, and the lifetime of luminescence was determined about 470 μsec. TOF‐SIMS surface mapping showed the uniform distribution of europium(III) over the film. Visualization of strong picosecond UV laser beams through the use of the developed film has been demonstrated. Copyright © 2004 John Wiley & Sons, Ltd.     

Reduction of matrix effects in TOF‐SIMS analysis by metal‐assisted SIMS (MetA‐SIMS)

We investigated reduction of the matrix effect in time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) analysis by the deposition of a small amount of metal on the sample surfaces (metal‐assisted SIMS or MetA‐SIMS). The metal used was silver, and the substrates used were silicon wafers as electroconductive substrates and polypropylene (PP) plates as nonelectroconductive substrates. Irganox 1010 and silicone oil on these substrates were analyzed by TOF‐SIMS before and after silver deposition. Before silver deposition, the secondary ion yields from the substances on the silicon wafer and PP plate were quite different due to the matrix effect from each substrate. After silver deposition, however, both ion yields were enhanced, particularly the sample on the PP plate, and little difference was seen between the two substrates. It was therefore found that the deposition of a small amount of metal on the sample surface is useful for reduction of the matrix effect. By reducing the matrix effect using this technique, it is possible to evaluate from the ion intensities the order of magnitude of the quantities of organic materials on different substrates. In addition, this reduction technique has clear utility for the imaging of organic materials on nonuniform substrates such as metals and polymers. MetA‐SIMS is thus a useful analysis tool for solving problems with real‐world samples. Copyright © 2005 John Wiley & Sons, Ltd.     

Time‐of‐flight secondary ion mass spectrometry and gas chromatography–mass spectrometry studies of alkanethiol self‐assembled monolayers on nanoporous gold surfaces

The dimerization of alkanethiol mixtures (hexanethiol, octanethiol, and dodecanethiol) to form self‐assembled monolayers (SAMs) from headspace on nanoporous gold surfaces was studied for the first time using gas chromatography (GC/MS) and time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS). The nanoporous gold surfaces were obtained by an acidic etching of a 585‐gold alloy. Field emission scanning electron microscopy (FE‐SEM) was utilized to study the change of the surface geometry and porosity of the gold surfaces before and after etching. Alkanethiols were deposited from the vapor phase above the thiol solutions (headspace) on nanoporous gold plates and nanoporous gold solid‐phase vmicroextraction (SPME) fibers. The nanoporous gold substrates were analyzed by TOF‐SIMS and GC/MS, respectively. The TOF‐SIMS spectra exhibited various gold–sulfur ion clusters and specific peaks related to the adsorption of thiols such as deprotonated monomers, thiolate–Au, dimers (e.g., dialkyl sulfides–Au and dialkyl disulfides–Au). The GC/MS analysis of headspace extractions of alkanethiol mixtures by nanoporous gold SPME fibers showed a high extraction efficiency of alkanethiol, dialkyl sulfide, and dialkyl disulfide when compared with the commercial SPME fibers (DVB‐CAR‐PDMS and CAR‐PDMS). Different GC/MS optimization factors were studied including the extraction time and desorption temperature.     

Quantitative SIMS depth profiling of Al in AlGaN/AlN/GaN HEMT structures with nanometer‐thin layers

The possibilities of quantitative secondary ion mass spectrometry (SIMS) depth profiling of Al in AlxGa1 ? xN/AlN/GaN transistor heterostructures are shown. Using a series of test structures for a TOF.SIMS‐5 time‐of‐flight mass spectrometer, we obtained a refined linear calibration dependence of the secondary‐ion yield on the composition ×, namely, Y(CsAl+)/Y(CsGa+) = K × x/(1 ? x), with a high linear correlation coefficient, Rl = 0.9996, which permits quantitative SIMS analysis of relatively thick AlGaN barrier layers. The method of profile reconstruction with allowance for the main artifacts of ion sputtering has been first applied for the analysis of GaN/AlGaN/AlN/GaN high electron mobility transistor structure. This method permits to perform quantitative analysis of the thickness and composition of a nanometer‐thin AlN sublayer and to estimate the measurement error. For the structure being studied, the AlN sublayer is 1.2 ± 0.2 nm thick. Copyright © 2016 John Wiley & Sons, Ltd.     

Characterization of traditional Korean lacquers using surface analytical techniques

Traditional Korean lacquer films, such as Otchil and Hwangchil, are natural paints extracted from Rhus vernicifera and Dendropanax morbifera trees that grow in the eastern part and on the west and south coast of the Korean Peninsula, respectively. Rhus lacquer has a black color, and Hwangchil has a transparent gold color and a rich camphoric perfume (benzoin). These lacquers have been used since ancient times. In this study, analytical techniques, such as Fourier transform infrared (FT‐IR) spectroscopy, X‐ray photoelectron spectroscopy (XPS), and time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS), were used to study the traditional Rhus lacquer and Hwangchil films, avoiding time‐consuming and destructive extraction procedures. To compare the Rhus and Hwangchil lacquers, reference lacquer films were prepared using Rhus and Dendropanax saps. These films were then analyzed using FT‐IR, XPS, and TOF‐SIMS. After establishing the methodology using the reference lacquer films, surface analytical techniques were applied to two different plates painted by an artist. The results suggest that FT‐IR, XPS, and TOF‐SIMS are simple and complementary analytical techniques for the discrimination of old lacquer films. Copyright © 2015 John Wiley & Sons, Ltd.     

Ultrasound‐assisted oxidation of tungsten in oxygen plasma: the early stages of the oxide film growth

The effect of ultrasonic vibrations applied in situ on the formation of W–WO interface during the exposure of a pure tungsten foil to a low‐temperature oxygen plasma is investigated by photoelectron spectroscopy (XPS) and time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS). The tungsten surface was exposed to oxygen plasma at different time intervals and the evolution of the interface formation was studied by angle‐resolved XPS. We show that oxidation without ultrasonic vibrations leads to the formation of a thin oxide film whose growth kinetics is governed by an island growth mechanism. On the other hand, oxide growth in the presence of ultrasonic treatment (UST) appears to follow a layer‐by‐layer growth mode with a distinctly sharper W–WO interface. TOF‐SIMS analysis in this case revealed a reduced amount of water bonded in the film, which suggests an increase in the film's packing density. Copyright © 2006 John Wiley & Sons, Ltd.     

Static SIMS studies of fatty alcohols,amines and esters on gold and aluminium–magnesium alloy surfaces

Static secondary ion mass spectrometry was used to study the chemical reactions and lateral distributions of fatty amines, alcohols and esters spin coated onto gold surfaces and commercial aluminium–magnesium (Al–Mg) alloy surfaces, cleaned using UV–ozone. The aim of this study is to develop an understanding of the interactions of model lubricants with metal surfaces, such as gold and aluminium. This static SIMS study of organic thin films has been able to identify specific reaction products on the aluminium surface for each functional group. This work demonstrates that organic molecules with alcohol, ester and amine functional groups undergo specific chemical reactions with oxidized Al–Mg alloy surfaces. For example, films composed of the fatty alcohol dodecanol were observed to emit monomers, dimers and trimers with discrete distributions. In addition, negative secondary ion mass spectra indicate that a surface carboxylate is formed from the alcohol. The formation of carboxylate reaction products was confirmed by Fourier transform infrared spectroscopy. On Al–Mg alloy surfaces, a direct interaction with the amine and aluminium oxide surface is observed by the detection of a molecular ion that corresponds to the mass of dodecylamine and AlO^?, characteristic of aluminium oxide. Ethyl laurate was shown to eliminate the ethyl group, leaving the laurate anion. This study demonstrates the ability of time‐of‐flight (ToF) SIMS to discriminate and detect chemical reaction products formed between model lubricant molecules and metal surfaces. As a result of this study, the use of ToF‐SIMS to identify reaction products of model lubricants can be extended to provide a better understanding of the interactions of lubricants and metal surfaces at high temperatures and pressures that more closely resemble the conditions encountered in industrial rolling processes. Copyright © 2005 John Wiley & Sons, Ltd.     

Microanalysis Using Secondary Ion Mass Spectrometry

Secondary ion mass spectrometry (SIMS) has inherent features of high sensitivity, great dynamic range, and capability to provide spatially resolved chemical information making it well suited for trace and microanalysis of diverse materials. The various SIMS methods used to derive the boron distribution in hepatoma cells, to investigate the intcr-iayer reactions in multi-layer ceramic structural materials, and to evaluate the effects of fabrication on microstructural and functional properties in semiconductor devices, are presented to illustrate possible roles of SIMS in microanalysis.