Atomic-scale contrast mechanism in atomic force microscopy

We present numerical results for the ground state and low-lying excited states of theS=1 antiferromagnetic Heisenberg chain with exchange and single-ion anisotropy for free boundary conditions and up to 16 spins. The excitation spectrum in the Néel and Haldane phases is interpreted successfully in terms of domain walls (i.e. solitons) only. We present evidence that the transition between these two phases is characterized by the condensation of the lowest soliton modes. The difference between periodic and open boundary conditions, in particular the relevance of open boundary conditions for numerical calculations on finite chains, is discussed.     

Mechanism of contrast formation in atomic force microscopy in water

We use computer modeling to investigate the mechanism of atomic-scale corrugation in frequency-modulation atomic force microscopy imaging of inorganic surfaces in solution. Molecular dynamics simulations demonstrate that the forces acting on a microscope tip result from the direct interaction between a tip and a surface, and forces entirely due to the water structure around both tip and surface. The observed force depends on a tip structure and is a balance between largely repulsive potential energy changes as the tip approaches and the entropic gain when water is sterically prevented from occupying sites near the tip and surface.     

Material anisotropy revealed by phase contrast in intermittent contact atomic force microscopy

Phase contrast in intermittent-contact atomic force microscopy (AFM) reveals in-plane structural and mechanical properties of polymer monolayers. This is surprising, because measurements of nanoscale in-plane properties typically require contact mode microscopies. Our measurements are possible because the tip oscillates not just perpendicular but also parallel to the sample surface along the long axis of the cantilever. This lateral tip displacement is virtually universal in AFM, implying that any oscillating-tip AFM technique is sensitive to in-plane material properties.     

Chaos in atomic force microscopy

Chaotic oscillations of microcantilever tips in dynamic atomic force microscopy (AFM) are reported and characterized. Systematic experiments performed using a variety of microcantilevers under a wide range of operating conditions indicate that softer AFM microcantilevers bifurcate from periodic to chaotic oscillations near the transition from the noncontact to the tapping regimes. Careful Lyapunov exponent and noise titration calculations of the tip oscillation data confirm their chaotic nature. AFM images taken by scanning the chaotically oscillating tips over the sample show small, but significant metrology errors at the nanoscale due to this "deterministic" uncertainty.     

原子力显微术轻敲模式中探针样品接触过程及相位衬度研究

借助简单的有阻尼受迫振子模型，研究了原子力显微术轻敲模式中探针与样品接触时间t_c、样品的表面形变D_z和相位衬度对探针设置高度z_c及样品杨氏模量E_s的依赖关系.结果发现,t_c与D_z均随E_s及z_c的增大而减小，同时探针与样品作用过程伴随很小的能量耗散.对轻敲过程中相移量φ的研究表明，E_s较大的样品有较小的φ，且φ随 关键词： 原子力显微术 轻敲模式 相位衬度     

Adhesion hysteresis in dynamic atomic force microscopy

The effects of adhesion hysteresis in the dynamic‐dissipation curves measured in amplitude‐modulation atomic force microscopy are discussed. Hysteresis in the interaction forces is shown to modify the dynamics of the cantilever leading to different power dissipation curves in the repulsive and attractive regimes. Experimental results together with numerical simulations show that power dissipation, as measured in force microscopy, is not always proportional to the energy dissipated in the tip–sample interaction process. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Time-frequency modeling of atomic force microscopy

Atomic force microscopy is modeled in the time-frequency phase space. In this phase space it is equivalent to a succession of temporal lenses and free spaces which includes a temporal fractional Fourier device. Then, the Wigner transform and its second order moments are introduced to model the atomic force microscopy as a detector of ultrafast electrical signals.     

Theory of multifrequency atomic force microscopy

We develop a theory that explains the origin of the high force sensitivity observed in multifrequency force microscopy experiments. The ability of the microscope to extract complementary information on the surface properties is increased by the simultaneous excitation of several flexural cantilever modes. The force sensitivity in multifrequency operation is about 0.2 pN. The analytical model identifies the virial and the energy dissipated by the tip-surface forces as the parameters responsible for the material contrast. The agreement obtained among the theory, experiments and numerical simulations validates the model.     

原子力显微术研究进展

原子力显微术是微纳米尺度实空间形貌成像与结构表征的关键技术之一。近些年,原子力显微术衍生发展出了一系列令人瞩目的功能化探测模式和新技术。文章从以下两个方面论述了原子力显微术的前沿进展：(1)原子力显微术的功能化探测模式及其在微纳米尺度物性研究与测量以及微纳加工等领域的应用;(2)原子力显微术自身在更高精度、更高分辨率、更快速度、更多功能等方面的进展及在基础和应用研究领域中的应用。文章还展望了原子力显微术的下一步发展方向和正在不断扩展的研究领域。     

Factors affecting phase and height contrast of diblock copolymer PS-b-PEO thin films in dynamic force mode atomic force microscopy

Asymmetric PS-b-PEO block copolymer exhibits well-ordered cylindrical morphology with nanoscale domain sizes due to microphase separation. Since the PS and PEO blocks have large stiffness difference, this polymer system represents an ideal candidate for studies of the phase contrast behavior in atomic force microscopy (AFM). In this paper, PS-b-PEO films are investigated under different scanning conditions using two different atomic force microscopes. It is found that the phase contrast of the film can be well described in terms of energy dissipation, though the exact phase image may also depend on the scanning parameters (e.g., the repulsive versus attractive regimes) as well as the settings of the microscope. Height variation on sample surface does not have significant effect on phase contrast. However, in order to obtain true topography of the polymer film, care has to be taken to avoid damage to the sample by AFM. Under certain conditions, true topography can be obtained during the first scan in spite of the surface-damaging forces are used.     

High-speed atomic force microscopy with phase-detection

In order to improve the scanning speed of tapping mode AFM, we have studied the phase-detection mode AFM with a high frequency (1.5 MHz) cantilever. The phase shifts versus tip-sample distance with different types of samples including polymer, semiconductor, and graphite were measured and the interaction forces were analyzed. It was found that the phase shift in repulsive region is nearly linear as a function of distance, which can be used for feedback control in general, except that some blunt tips cause reversed polarity of phase shift due to excessive energy dissipation. High-speed image with scan rate of 100 Hz was obtained which were controlled with phase shift as a feedback signal.     

原子力显微镜在轻敲模式下的动力学模型

基于Hamaker假设、Lennard-Jones势能定律及经典弹性理论建立了一种新型的球体与平面黏着接触的弹性模型，该模型显示黏着力在原子力显微镜(AFM)针尖趋近和撤离样品表面，即加载和卸载的两个过程中存在黏着滞后现象，表明了AFM在轻敲工作模式中存在能量耗散.同时，根据所建的黏着接触弹性模型，建立了AFM在轻敲工作模式下的动力学模型，研究了AFM在轻敲工作模式下的振动幅度、相位差及耗散功率随针尖与样品表面间距的变化规律，仿真结果与现有的实验结果相一致.     

Dynamics of tip-substrate interactions in atomic force microscopy

Dynamical interactions between a scanning tip and a silicon substrate are investigated using molecular dynamics simulations of both the constant-height and constant-force scan modes. Localized temporary and permanent modifications of the substrate occur, depending on tip-substrate-strate separation and scan geometry. Implications for resolving structural and force characteristics in scanning tip spectroscopies, employing atomically sharp as well as large ordered of disordered tips are discussed.     

Equilibrium capillary forces with atomic force microscopy

We present measurements of equilibrium forces resulting from capillary condensation. The results give access to the ultralow interfacial tensions between the capillary bridge and the coexisting bulk phase. We demonstrate this with solutions of associative polymers and an aqueous mixture of gelatin and dextran, with interfacial tensions around 10 microN/m. The equilibrium nature of the capillary forces is attributed to the combination of a low interfacial tension and a microscopic confinement geometry, based on nucleation and growth arguments.     

General theory of amplitude-modulation atomic force microscopy

We present a general analytical theory that enables one to determine accurately the unknown tip-sample interactions from the experimental measurement of the amplitude and phase of the oscillating tip in amplitude-modulation atomic force microscopy (AM-AFM). We apply the method to the known Lennard-Jones-type forces and find excellent agreement with the reconstructed results. AM-AFM, widely used in air and liquid, is now not only an imaging tool but also a quantitative force measurement tool.     

Tarantula hemocyanins imaged by atomic force microscopy

Individual 4 x 6-meric tarantula hemocyanins and dissociation products were imaged by AFM in the non-contact mode. Although the resolution was low, the hexamers and topological arrangement within the oligomers can be seen. However, the relative humidity seems to affect the height profiles.     

原子力显微镜在生物物理领域的新应用

介绍了原子力显微镜在生物物理领域的最新应用:蛋白质去折叠、DNA拉伸、生物膜受力,通过分析实验得到的力谱,可以获取关于蛋白质、DNA、生物膜结构信息.原子力显微镜不仅能反映测量体系的力学性质,由于其具有独特的时间、空间分辨及实时成像,因而能提供更多信息.     

New control methodology of microcantilevers in atomic force microscopy

We apply an external feedback control technique to vibrating microcantilevers in atomic force microscopy. Here we have no difficulty in getting information on periodic orbits required for application of the external feedback control unlike controlling chaos since stable orbits are used as reference ones. This approach enables us not only to control vibrations of the cantilevers but also to measure the sample surfaces (surface topographies) simultaneously. The efficiency and validity of our approach is demonstrated by numerical simulations and a theoretical analysis with the assistance of numerical computations.     

Features in atomic force microscopy studies of dielectric surfaces

To improve the accuracy of AFM measurements in air and the reproducibility of results, a clean room-based metrological facility has been designed and built. The main function of the facility is to control temperature and humidity in an operation zone in various combinations and to maintain them with high accuracy. Measurements under controlled conditions are particularly important for dielectric materials. It has been shown that special procedures allow one to avoid disturbances caused by static charges on the surface under study, i.e., to remove the already accumulated charge and prevent its appearance during experiments. The use of the proposed procedures makes it possible to adequately study the features of the dielectric surface relief at micro-and nanoscale levels.     

Adaptive semi-empirical model for non-contact atomic force microscopy

Non-contact atomic force microscope is a powerful tool to investigate the surface topography with atomic resolution. Here we propose a new approach to estimate the interaction between its tips and samples, which combines a semi-empirical model with density functional theory (DFT) calculations. The generated frequency shift images are consistent with the experiment for mapping organic molecules using CuCO, Cu, CuCl, and CuO_x tips. This approach achieves accuracy close to DFT calculation with much lower computational cost.