Effect of contact geometry on the pull-off force evaluated under high-vacuum and humid atmospheric conditions

The effect of condensed water on pull-off forces under high vacuum (HV) and 0 to 83% relative humidity (RH) N2 atmospheric conditions was evaluated for different contact geometries using atomic force microscopy (AFM). The pull-off force was measured using two types of contact geometry: contact between hemispherical asperities and a flat silicon probe on an AFM cantilever (called a spherical-flat contact) and between a flat silicon substrate and a flat nickel probe on an AFM cantilever (called a flat-flat contact). The hemispherical asperities were fabricated using a focused ion beam (FIB) system, and each peak had a radius of curvature of between 70 and 610 nm. The flat nickel probe was fabricated by friction-induced wear. Measurement results showed that for the spherical-flat contact the pull-off force was proportional to the radius of curvature of the asperity peak and was slightly lower in HV than in humid 14% RH N2. For the flat-flat contact in HV, with increasing contact time, the pull-off force increased in HV but decreased in humid 62 and 83% RH N2. The pull-off force in HV was lower than that in humid N2 when the contact time was less than 10 s but was higher when the contact time was longer than 30 s. The estimated adhesion force based on the Laplace pressure from the contact geometry agreed reasonably well with the measured pull-off force.     

Transport mechanisms in capillary condensation of water at a single-asperity nanoscopic contact

Transport mechanisms involved in capillary condensation of water menisci in nanoscopic gaps between hydrophilic surfaces are investigated theoretically and experimentally by atomic force microscopy (AFM) measurements of capillary force. The measurements showed an instantaneous formation of a water meniscus by coalescence of the water layers adsorbed on the AFM tip and sample surfaces, followed by a time evolution of meniscus toward a stationary state corresponding to thermodynamic equilibrium. This dynamics of the water meniscus is indicated by time evolution of the meniscus force, which increases with the contact time toward its equilibrium value. Two water transport mechanisms competing in this meniscus dynamics are considered: (1) Knudsen diffusion and condensation of water molecules in the nanoscopic gap and (2) adsorption of water molecules on the surface region around the contact and flow of the surface water toward the meniscus. For the case of very hydrophilic surfaces, the dominant role of surface water transportation on the meniscus dynamics is supported by the results of the AFM measurements of capillary force of water menisci formed at sliding tip-sample contacts. These measurements revealed that fast movement of the contact impedes on the formation of menisci at thermodynamic equilibrium because the flow of the surface water is too slow to reach the moving meniscus.     

Direct detection by atomic force microscopy of single bond forces associated with the rupture of discrete charge-transfer complexes

Atomic force microscopy (AFM) was used to measure the chemical binding force of discrete electron donor-acceptor complexes formed at the interface between proximal self-assembled monolayers (SAMs). Derivatives of the well-known electron donor N,N,N',N'-tetramethylphenylenediamine (TMPD) and the electron acceptor 7,7,8,8-tetracyanoquinodimethane (TCNQ) were immobilized on Au-coated AFM tips and substrates by formation of SAMs of N,N,N'-trimethyl-N'-(10-thiodecyl)-1,4-phenylenediamine (I) and bis(10-(2-((2,5-cyclohexadiene-1,4-diylidene)dimalonitrile))decyl) disulfide (II), respectively. Pull-off forces between modified tips and substrates were measured under CHCl(3) solvent. The mean pull-off forces associated with TMPD/TCNQ microcontacts were more than an order of magnitude larger than the pull-off forces for TMPD/TMPD and TCNQ/TCNQ microcontacts, consistent with the presence of specific charge-transfer interactions between proximal TMPD donors and TCNQ acceptors. Furthermore, histograms of pull-off forces for TMPD/TCNQ contacts displayed 70 +/- 15 pN periodicity, assigned to the rupture of individual TMPD-TCNQ donor-acceptor (charge-transfer) complexes. Both the mean pull-off force and the 70 pN force quantum compare favorably with a contact mechanics model that incorporates the effects of discrete chemical bonds, solvent surface tensions, and random contact area variations in consecutive pull-offs. From the 70 pN force quantum, we estimate the single bond energy to be approximately 4-5 kJ/mol, in reasonable agreement with thermodynamic data. These experiments establish that binding forces due to discrete chemical bonds can be detected directly in AFM pull-off measurements employing SAM modified probes and substrates. Because SAMs can be prepared with a wide range of exposed functional groups, pull-off measurements between SAM-coated tips and substrates may provide a general strategy for directly measuring binding forces associated with a variety of simple, discrete chemical bonds, e.g., single hydrogen bonds.     

Capillary force in atomic force microscopy

Under ambient conditions, a water meniscus generally forms between a nanoscale atomic force microscope tip and a hydrophilic surface. Using a lattice gas model for water and thermodynamic integration methods, we calculate the capillary force due to the water meniscus for both hydrophobic and hydrophilic tips at various humidities. As humidity rises, the pull-off force rapidly reaches a plateau value for a hydrophobic tip but monotonically increases for a weakly hydrophilic tip. For a strongly hydrophilic tip, the force increases at low humidities (<30%) and then decreases. We show that mean-field density functional theory reproduces the simulated pull-off force very well.     

Origin of adhesion in humid air

The origin of adhesion in humid air is investigated by pull-off force measurements between nanoscale contacts using atomic force microscopes in controlled environments from ultrahigh vacuum through various humidity conditions to water. An equivalent work of adhesion (WOA) model with a simplified interface stress distribution is developed, combining the effects of screened van der Waals and meniscus forces, which describes adhesion in humid air and which self-consistently treats the contact stress and deformation. Although the pull-off force is found to vary significantly with humidity, the equivalent WOA is found to be invariant. Increasing humidity alters the nature of the surface adhesion from a compliant contact with a localized, intense meniscus force to a stiff contact with an extended, weak meniscus force.     

The role of few-asperity contacts in adhesion

The surface roughness of a few asperities and their influence on the work of adhesion is of scientific interest. Macroscale and nanoscale adhesion data have seemingly given inconsistent results. Despite the importance of bridging the gap between the two regimes, little experimental work has been done, presumably due to the difficulty of the experiment needed to determine how small amounts of surface roughness might influence adhesion data lying in between the two scales. To investigate the role of few-asperity contacts in adhesion, the pull-off force was measured between different sized atomic-force microscope (AFM) tips (with different roughnesses) and sample surfaces that had well-controlled material properties. There were seventeen tips of four different types, with radii from 200 nm to 60 microm. The samples were unpatterned single crystal silicon with a chemical silicon dioxide surface resulting from a standard silicon wafer clean. Some of the samples were treated with a few angstroms of vapor deposited diphenylsiloxane. We observed that the uncorrected (for surface roughness) pull-off force was independent of the radius of the AFM tip, which was contrary to all continuum-mechanics model predictions. To explain this behavior, we assumed that the interactions between the AFM tip and sample were additive, material properties were constant, and that the AFM tip, asperities, and sample surfaces were of uniform density. Based on these assumptions, we calculated a simple correction due to the measured root mean square (RMS) surface roughness of the AFM tips. The simple correction for the RMS surface roughness resulted in the expected dependence of the pull-off force on radius, but the magnitudes were higher than expected. Commercial and heat-treated AFM tips have minimal surface roughness and result in magnitudes that are more reliable. The relative uncertainty for the pull-off force was estimated to be 10%. In this paper, we derive how the cantilever and tip parameters contribute to the measured pull-off force and show how the corrected results compare with theory. Although much work is still needed, the work presented here should advance the understanding of adhesion between the macroscale and nanoscale regimes.     

Microscopic origin of the humidity dependence of the adhesion force in atomic force microscopy

Water condenses between an atomic force microscope (AFM) tip and a surface to form a nanoscale bridge that produces a significant adhesion force on the tip. As humidity increases, the water bridge always becomes wider but the adhesion force sometimes decreases. The authors show that the humidity dependence of the adhesion force is intimately related to the structural properties of the underlying water bridge. A wide bridge whose width does not vary much with tip-surface distance can increase its volume as distance is increased. In this case, the adhesion force decreases as humidity rises. Narrow bridges whose width decreases rapidly with increasing tip-surface distance give the opposite result. This connection between humidity dependence of the adhesion force and the structural susceptibility of the water bridge is illustrated by performing Monte Carlo simulations for AFM tips with various hydrophilicities.     

Simulations of nanotribology with realistic probe tip models

We present the results of massively parallel molecular dynamics simulations aimed at understanding the nanotribological properties of alkylsilane self-assembled monolayers (SAMs) on amorphous silica. In contrast to studies with opposing flat plates, as found in the bulk of the simulation literature, we use a model system with a realistic AFM tip (radius of curvature ranging from 3 to 30 nm) in contact with a SAM-coated silica substrate. We compare the differences in response between systems in which chains are fully physisorbed, fully chemisorbed, and systems with a mixture of the two. Our results demonstrate that the ubiquitous JKR and DMT models do not accurately describe the contact mechanics of these systems. In shear simulations, we find that the chain length has minimal effects on both the friction force and coefficient. The tip radius affects the friction force only (i.e., the coefficient is unchanged) by a constant shift in magnitude due to the increase in pull-off force with increasing radius. We also find that at extremely low loads, on the order of 10 nN, shearing from the tip causes damage to the physisorbed monolayers by removal of molecules.     

Cleaning and hydrophilization of atomic force microscopy silicon probes

The silicon surface of commercial atomic force microscopy (AFM) probes loses its hydrophilicity by adsorption of airborne and package-released hydrophobic organic contaminants. Cleaning of the probes by acid piranha solution or discharge plasma removes the contaminants and renders very hydrophilic probe surfaces. Time-of-flight secondary-ion mass spectroscopy and X-ray photoelectron spectroscopy investigations showed that the native silicon oxide films on the AFM probe surfaces are completely covered by organic contaminants for the as-received AFM probes, while the cleaning methods effectively remove much of the hydrocarbons and silicon oils to reveal the underlying oxidized silicon of the probes. Cleaning procedures drastically affect the results of adhesive force measurements in water and air. Thus, cleaning of silicon surfaces of the AFM probe and sample cancelled the adhesive force in deionized water. The significant adhesive force values observed before cleaning can be attributed to formation of a bridge of hydrophobic material at the AFM tip-sample contact in water. On the other hand, cleaning of the AFM tip and sample surfaces results in a significant increase of the adhesive force in air. The presence of water soluble contaminants at the tip-sample contact lowers the capillary pressure in the water bridge formed by capillary condensation at the AFM tip-sample contact, and this consequently lowers the adhesive force.     

Comment on ‘Nanoscale water capillary bridges under deeply negative pressure’ [Chem. Phys. Lett. 451 (2008) 88]

Yang et al. reported pull-off force measurements between an atomic force microscope tip and a silicon wafer. They deduced the pressure of liquid water inside the capillary bridge formed in humid air. They claimed that their ‘research shows that nanoscale water capillary bridges are metastable and have absolutely negative pressure approaching the limit of stability for water’ (around −200 MPa at room temperature). Indeed, pressures reaching −160 MPa were reported, establishing a world record. However, we show that the bridges are not metastable, that the analysis used suffers from internal inconsistency, and that several assumptions made are questionable.     

Effects of contact geometry on pull-off force measurements with a colloidal probe

This paper examines the effects of contact geometry on the pull-off (adhesion) force between a glass sphere (colloidal probe) and a silicon wafer in an environment with controlled relative humidity. An atomic force microscope is used to measure the pull-off force between the colloidal probe and the sample mounted at different tilt angles. The results show that the measured pull-off force is very sensitive to the tilt angle. Through the use of a newly developed direct scanning method, the exact contact geometry is determined for the zero-tilt angle case. The obtained digital image is then rotated to determine the contact geometry for the cases with other tilt angles. A detailed examination of the contact geometry, along with a magnitude analysis of the capillary force, suggests that the adhesion is most likely dominated by the capillary force from the meniscus formed between the probe and the sample. The strong dependence of the adhesion on the tilt angle may result from the change of meniscus dimensions associated with the probe-sample separation, which in turn is controlled by the highest peak on the probe sphere. Our observation emphasizes the combined role of microsurface shape near the contact and nanoroughness within the contact in determining the colloidal probe pull-off force and also microadhesion force in general.     

Surface properties of oxidized LDPE by scanning force microscopy with chemically modified probes

In this article, we present the results of a study on the surface properties of chromic acid-oxidized low-density polyethylene (LDPE) by scanning force microscopy (SFM) and contact angle measurements. LDPE films were surface modified by a chromic acid treatment with subsequent annealing in argon and reconstruction in boiling water as described by Rasmussen, Stedronsky, and Whitesides [J. Am. Chem. Soc., 99 , 4736 (1977)]. The LDPE oxidation in chromic acid was monitored in situ by contact mode SFM. Initially stacks of lamellae became exposed, and at later stages a granular morphology was observed. By tapping mode SFM, the sample roughness was shown to increase during the first 10 min of oxidation from initially ca. 20 nm to ca. 50 nm. Gold-coated SFM probes (tips) functionalized with self-assembled monolayers were used to determine the pull-off force characteristics in ethanol. Variations in the contact area between SFM tips and polymer surfaces that exposed sharp crystalline features were shown to obscure the results of pull-off force measurements. However, on annealed and subsequently reconstructed samples with lower roughness, the results of force measurements correlated well with the measured contact angles. Over the range of surface energies studied, the normalized pull-off force between carboxylic acid-modified tips and these smooth samples was shown to depend approximately linearly on the cosine of the contact angle. © 1998 John Wiley & Sons, Inc. J. Polym. Sci. B Polym. Phys. 36: 2483–2492, 1998     

Dynamics of a disturbed sessile drop measured by atomic force microscopy (AFM)

A new method for studying the dynamics of a sessile drop by atomic force microscopy (AFM) is demonstrated. A hydrophobic microsphere (radius, r ～ 20-30 μm) is brought into contact with a small sessile water drop resting on a polytetrafluoroethylene (PTFE) surface. When the microsphere touches the liquid surface, the meniscus rises onto it because of capillary forces. Although the microsphere volume is 6 orders of magnitude smaller than the drop, it excites the normal resonance modes of the liquid interface. The sphere is pinned at the interface, whose small (<100 nm) oscillations are readily measured with AFM. Resonance oscillation frequencies were measured for drop volumes between 5 and 200 μL. The results for the two lowest normal modes are quantitatively consistent with continuum calculations for the natural frequency of hemispherical drops with no adjustable parameters. The method may enable sensitive measurements of volume, surface tension, and viscosity of small drops.     

Micro-wilhelmy and related liquid property measurements using constant-diameter nanoneedle-tipped atomic force microscope probes

The micro-Wilhelmy method is a well-established method of determining surface tension by measuring the force of withdrawing a tens of microns to millimeters in diameter cylindrical wire or fiber from a liquid. A comparison of insertion force to retraction force can also be used to determine the contact angle with the fiber. Given the limited availability of atomic force microscope (AFM) probes that have long constant diameter tips, force-distance (F-D) curves using probes with standard tapered tips have been difficult to relate to surface tension. In this report, constant diameter metal alloy nanowires (referred to as "nanoneedles") between 7.2 and 67 microm in length and 108 and 1006 nm in diameter were grown on AFM probes. F-D and Q damping AFM measurements of wetting and drag forces made with the probes were compared against standard macroscopic models of these forces on slender cylinders to estimate surface tension, contact angle, meniscus height, evaporation rate, and viscosity. The surface tensions for several low molecular weight liquids that were measured with these probes were between -4.2% and +8.3% of standard reported values. Also, the F-D curves show well-defined stair-step events on insertion and retraction from partial wetting liquids, compared to the continuously growing attractive force of standard tapered AFM probe tips. In the AFM used, the stair-step feature in F-D curves was repeatably monitored for at least 0.5 h (depending on the volatility of the liquid), and this feature was then used to evaluate evaporation rates (as low as 0.30 nm/s) through changes in the surface height of the liquid. A nanoneedle with a step change in diameter at a known distance from its end produced two steps in the F-D curve from which the meniscus height was determined. The step features enable meniscus height to be determined from distance between the steps, as an alternative to calculating the height corresponding to the AFM measured values of surface tension and contact angle. All but one of the eight measurements agreed to within 13%. The constant diameter of the nanoneedle also is used to relate viscous damping of the vibrating cantilever to a macroscopic model of Stokes drag on a long cylinder. Expected increases in drag force with insertion depth and viscosity are observed for several glycerol-water solutions. However, an additional damping term (associated with drag of the meniscus on the sidewalls of the nanoneedle) limits the sensitivity of the measurement of drag force for low-viscosity solutions, while low values of Q limit the sensitivity for high-viscosity solutions. Overall, reasonable correspondence is found between the macroscopic models and the measurements with the nanoneedle-tipped probes. Tighter environmental control of the AFM and treatments of needles to give them more ideal surfaces are expected to improve repeatability and make more evident subtle features that currently appear to be present on the F-D and Q damping curves.     

Rupture kinetics of liquid bridges during a pulling process: a kinetic density functional theory study

Capillary bridge is a common phenomenon in nature and can significantly contribute to the adhesion of biological and artificial micro- and nanoscale objects. Especially, it plays a crucial role in the operation of atomic force microscopy (AFM) and influences in the measured force. In the present work, we study the rupture kinetics and transition pathways of liquid bridges connecting an AFM tip and a flat substrate during a process of pulling the tip off. Depending on thermodynamic conditions and the tip velocity, two regimes corresponding to different transition pathways are identified. In the single-bridge regime, the initial equilibrium bridge persists as a single one during the pulling process until the liquid bridge breaks. While, in the multibridge regime the stretched liquid bridge transforms into an intermediate state with a collection of slender liquid bridges, which then break gradually during the pulling process. Moreover, the critical rupture distance at which the bridges break changes with the tip velocity and thermodynamic conditions, and its maximum value occurs near the boundary between the single-bridge regime and the multibridge regime, where the longest range capillary force is produced. In this work, the effects of tip velocity, tip size, tip-fluid interaction, and humidity on rupture kinetics and transition pathways are also systematically studied.     

Experimental studies on the applicability of the Kelvin equation to highly curved concave menisci

The thermodynamic properties of liquids trapped in microscopic pores are described in theory by the Kelvin equation, which relates the equilibrium meniscus curvature to the relative vapor pressure. We report here two series of experiments designed to test the validity of the Kelvin equation by direct measurement of the mean radius of curvature of the surface of cyclohexane condensed between crossed mica cylinders. In one series of experiments, the relative vapor pressure of the volatile cyclohexane was controlled by mixing it with a relatively involatile solute (n-dodecane or n-hexadecane). We found that the mean radius of curvature rapidly reached that predicted by the Kelvin equation at each relative vapor pressure of the volatile liquid, but that there was also a slow, but continuous, accumulation of the “involatile” solute at the point of condensation as the system approached true equilibrium. Such accumulation of very low vapor pressure materials may be one factor responsible for the discordant results reported by earlier workers. We find that the process of impurity buildup is complex, and suggest that studies of real porous systems may be affected by accumulation of “involatile” impurities through the vapor phase and by surface diffusion. The other series of experiments was designed to eliminate the impurity problem by maintaining the vapor pressure by temperature control of the pure liquid. The results from this series of experiments were not time dependent, and no evidence of contamination was found. The measured radii were within ±6% of those predicted by the Kelvin equation, for radii in the range 4–20 nm. We conclude that the thermodynamic basis of the Kelvin equation is valid in principle for menisci with radii as low as 4 nm.     

Refractive index of thin, aqueous films between hydrophobic surfaces studied using evanescent wave atomic force microscopy

We have studied the refractive index of a thin aqueous film between microscopic hydrophobic surfaces using evanescent wave atomic force microscopy (EW-AFM). An evanescent wave, generated at a solid-liquid interface, is scattered by AFM tips or glass particles attached to AFM cantilevers. The scattering of this wave is used to determine the refractive index as a function of separation between these surfaces. Measurements were performed on surfaces that were rendered hydrophobic with octadecyltrichlorosilane, which produces solid-water contact angles in excess of 90 degrees. For AFM tips, the average refractive index in the thin film was always equal to that of water when the film was thicker than approximately 100 nm. At smaller separations, the refractive index was always greater than or equal to that of water. This is inconsistent with the formation of air or vapor films and consistent with a small amount of organic material between the surfaces. For colloidal spheres (R approximately 10 microm), we were not able to detect changes in the refractive index of the thin film between the sphere and plate.     

Compositional Mapping of Polymer Surfaces by Chemical Force Microscopy Down to the Nanometer Scale: Reactions in Block Copolymer Microdomains

The laterally resolved analysis of the chemical surface composition of surface-treated block copolymers by atomic force microscopy (AFM) pull-off force mapping in the force volume (FV) mode and the automated analysis of the FV data is discussed. Poly(tert-butyl acrylate) (PtBA) microdomains residing in a polystyrene (PS) matrix at the surface of cyclohexane-treated polystyrene-block-poly(tert-butyl acrylate) (PtBA-b-PS) block copolymer thin films were domain-selectively deprotected, activated and chemically modified, as also shown by fluorescence microscopy. AFM pull-off force mapping in conjunction with an automated analysis of the data provided real space evidence for the successful conversion of reactive esters located in the PtBA domains and showed that AFM and related approaches, such as chemical force microscopy (CFM), can indeed contribute to assess changes in heterogeneous surface chemical composition of polymers down to sub-50 nm length scales.