Energy dependence of the ionization probability of sputtered Cu and Ni

Despite its great sensitivity, the usefulness of secondary ion mass spectrometry (SIMS) for many applications has been limited by an inadequate understanding of the probability of sputtering an atom in an ionized state. To determine this ionization probability for clean Cu and Ni surfaces, I have measured the energy distribution of sputtered neutrals and ions by quadrupole mass filtering and retarding potential analysis using potential modulation differentiation. Analysis of sputtered neutrals was accomplished by electron impact ionization. Because the neutrals outnumber the ions by at least two orders of magnitude, the ratio of sputtered ions to neutrals is an accurate measure of the ionization probability. For energies below 20 eV the dependence of the ionization probability on energy goes as P(E) α Eⁿ, where n = 0.65 for clean Cu. The absorption of oxygen on the Cu surface increases the total ion yield while causing a reduction in the value of the exponent n. Similar results are found for nickel, where n = 0.54 for the clean surface.     

Oxygen adsorption on Cu(110): Determination of atom positions with low energy ion scattering

The position of adsorbed oxygen on Cu($\text{1}$10) surfaces was determined with Low Energy Ion Scattering (LEIS). The experiments were performed by bombarding the copper surface at small angles of incidence with low energy Ne⁺ ions (3–5 keV). Measurements of the Ne⁺ ions scattered by adsorbed oxygen showed regular peaks in the azimuthal distribution of the scattered ions due to a shadowing effect. From the symmetry of the azimuthal distributions it follows that the centre of an adsorbed oxygen atom on the Cu(1̄10) surface lies about 0.6 Å below the midpoint between two neighbouring Cu atoms in a 〈001〉 row. A comparison of the azimuthal distributions of Ne⁺ ions scattered from clean Cu surfaces and oxygen-covered Cu surfaces showed that hardly any surface reconstruction had occurred in the oxygen-covered surfaces. The applied method seems to be an appropriate one for locating adsorbed atoms because it uses only simple qualitative considerations about azimuthal distributions of scattered ions.     

New data on the ternary fission of 252Cf from the Gammasphere facility

Ternary fission of ²⁵²Cf was studied at Gammasphere using eight ΔE×E particle telescopes. Helium, beryllium, boron, and carbon light charged particles (LCPs) emitted with kinetic energy more than 9, 21, 26, and 32 MeV, respectively, were identified. The 3368-keV γ transition from the first 2⁺ excited state in ¹⁰Be was found and the population probability ratio N(2⁺)/N(0⁺) = 0.160 ± 0.025 was estimated. No evidence was found for 3368-keV γ rays emitted from a triple molecular state. For the first time, charge distributions are obtained for ternary fission fragments emitted with helium, beryllium, and carbon LCPs.     

On the energy spectra of secondary ions emitted from silicon and graphite single crystals

Secondary ion emission from silicon and graphite single crystals bombarded by argon ions with energies E ₀ varied from 1 to 10 keV at various angles of incidence α has been studied. The evolution of the energy spectra of C⁺ and Si⁺ secondary ions has been traced in which the positions of maxima (E _max) shift toward higher secondary-ion energies E ₁ with increasing polar emission angle θ (measured from the normal to the sample surface). The opposite trend has been observed for ions emitted from single crystals heated to several hundred degrees Centigrade; the E _max values initially remain unchanged and then shift toward lower energies E ₁ with increasing angle θ. It is established that the magnitude and position of a peak in the energy spectrum of secondary C⁺ ions is virtually independent of E ₀, angle α, and the surface relief of the sample (in the E ₀ and α intervals studied). Unusual oscillating energy distributions are discussed, which have been observed for secondary ions emitted from silicon (111) and layered graphite (0001) faces. Numerical simulations of secondary ion sputtering and charge exchange have been performed. A comparison of the measured and calculated data for graphite crystals has shown that C⁺ ions are formed as a result of charge exchange between secondary ions and bombarding Ar⁺ ions, which takes place both outside and inside the target. This substantially differs from the ion sputtering process in metals and must be taken into account when analyzing secondary ion emission mechanisms and in practical applications of secondary-ion mass spectrometry.     

The energy dependence of fusion in the 9Be+28Si system

The angular distributions of the energy spectra of the light charged particles (p, d and α) from the ⁹Be + ²⁸Si reaction have been measured in the energy range 12 ≦ E_lab ≦ 30 MeV. The particle evaporation spectra and the angular distributions were analyzed with a spin dependent statistical model. Angular distributions of ⁹Be ions elastically scattered on ²⁸Si have been measured at the energies 12 MeV, 17 MeV, 23 MeV and 30 MeV and were analysed, together with previously measured cross sections, with the optical model. The fusion cut-off angular momentum l_fus(E), the fusion cross section σ_fus(E) and the ratio σ_fus/σ_R^OM(E) were deduced. The excitation function for fusion was analyzed with the Glas and Mosel model. The parameters obtained from the fusion excitation function were compared with the corresponding ones from the ⁹Be + ²⁸Si optical-model interaction potential.     

Scattering of low energy Na+ ions from a clean polycrystalline Ag surface

The energy distributions of low energy (E₀ = 0.4–3.2 keV) Na⁺ ions scattered from a clean polycrystalline Ag surface were measured. The angle between the incident beam and the surface was fixed at ψ = 45° while the scattering angle (θ) ranged from 50 to 130°. The cleanliness of the surface during the measurement was maintained by simultaneous deposition of Ag atoms from an effusion source. The obtained distributions considerably differ from the corresponding distributions of noble ions. Firstly, for all measured values of E₀ and θ, an intensive hump is observed in the high energy part of the distribution. In certain cases this hump is transformed into a peak. Secondly, the low energy part of the distribution is very pronounced, especially for higher values of E₀ and θ.     

A quantum-mechanical model for the ionization and excitation of atoms during sputtering

A quantum-mechanical model is developed for the process by which an atom is excited or ionized as it is sputtered from a metal surface. The probability of excitation is given by R = (A/ΔE)²(hv/aΔE)ⁿ, where A is the binding energy of a surface atom before sputtering, v is its average velocity after sputtering, a is the thickness of the surface, and Δ E the excitation energy. For ionization, ΔE = I?φ, with I the ionization energy of the sputtered atom, and φ the work function of tke surface. Available experimental data for ionization are fitted best with a = (1.4 ± 0.3)A?, and n = 2.5 ± 0.3. The model is expected to be applicable to bombarding energies up to about 100 keV.     

O2的化学吸附对2H—MoS2(0001)清洁表面和离子溅射表面电子结构的影响

利用低能N⁺(0.5keV)离子轻微轰击2H-MoS₂(0001)清洁表面,从UPS(HeⅠ,HeⅡ)得到d电子峰向E_F移动,价带顶出现明显的“肩膀”或带尾,它随轰击时间的增加而增强,同时使d_(z²)带变宽。UPS的结果表明,这种表面在室温下有明显的O₂吸附活性,O₂吸附后这个肩膀明显下降。结合XPS,AES和LEED的研究,我们认为这个“肩膀”态与次表面原子层的Mo原子的d电子的暴露和最外表面原子层s原子空位缺陷的产生有关。这些新的表面电子态与加氢脱硫(HDS)催化活性中心有密切的关系。 关键词：     

The theoretical and experimental study of the ionization processes during the low energy ion sputtering

The process by which atoms are ionized as they are sputtered from a metal surface has been analyzed both theoretically and experimentally. In the theoretical part the expressions for ionization coefficient R⁺ of atoms having the ionization energy much larger than the metal work function have been derived using a molecular orbital method. The effect of the level crossing was estimated in an approximate way. In the experimental part the SIMS experiments on clean Ni and Al surfaces and on Ni surface covered with a submonolayer of adsorbed K, Na and Al are reported. It has been found and it is for the first time reported that the energy distribution of ions sputtered from a submonolayer of adatoms is independent of energy (200–2500 eV) and mass (Ar⁺ Xe⁺ of incident ions and depends only upon the adsorption energy of the adatom. The energy distribution of ions sputtered from bulk samples has been found dependent on the primary ion energy. The measurement of the absolute value of R⁺ has shown that there is a strong correlation between the number of the adatom valence d-electrons and the value of R⁺, the value of R⁺ being smaller for atoms with more d-electrons. These experimental data have been compared with the theoretical expressions and the important role of the mechanism which takes into account the bending of the adatom energy level has been assessed.     

Leed,auger, and electron energy loss studies of Ni epitaxially grown on Cu(100)

Nickel was epitaxially deposited onto a clean, flat Cu(100) surface. Low energy electron diffraction I(E) curves were recorded for 0.6, 1.1, and 2.7 monolayer (ML) Ni coverage. Multilayer relaxation was considered in theoretical calculations, which were compared with experiment by means of the R|ΔE| factor. The estimated relaxations of the first and second interlayer spacings are estimated to be − 2% and + 1.5% for clean Cu(100), − 2% and − 1.5% for 1 ML Ni coverage, relative to the bulk Cu interlayer spacing of 1.81 Å, and −1% and 0% for 3 ML Ni coverage, relative to the bulk Ni spacing of 1.76 Å. Decreasing the surface Debye temperature of the Ni layer to 268 K from the bulk value of 440 K improves the agreement between theory and experiment. The optimum inner potential values are − 9 and − 10 eV for clean Cu(100) and Ni on Cu(100), respectively. Auger electron spectroscopy was used to determine the thickness of the Ni films, and LEED indicates layer-by-layer growth until about 4 layers, when the LEED spots begin to spread, indicating island formation. Electron energy loss spectra were obtained with primary electron energies of 150 and 300 eV. The 3p core ionization transition was clearly observed after 0.5 ML Ni coverage. Peaks at 3.8 and 7.5 eV for clean Cu are ascribed to interband transitions, and shift to higher energy with Ni coverage. Peaks at 10 and 16 eV for clean Cu (ascribed to an interband transition and a surface plasmon, respectively) disappear with Ni coverage. Bulk plasmon peaks at 19 and 27 eV remain unshifted with Ni coverage. The effect of 0.9 and 1.3 ML Ni coverage of Cu(100) on the chemisorption of Co and oxygen was also studied. The behavior of the surface towards oxygen chemisorption was similar to that of the pure Ni surface. For a large exposure of oxygen (50 L and more) the EEL and Auger spectra are very similar to those observed for NiO. In the case of CO, for submonolayer Ni coverage, the surface shows a more Cu-like behavior, while for larger Ni coverage (a monolayer and more) there is a great similarity with the behavior of the pure Ni(100) surface.     

Systematic study of the product((E(2_2~+)/E(2_1~+)) * B(E2)↑) through the asymmetric rotor model

A systematic study of the product((E(2_2~+)/E(2_1~+))*B(E2)↑) is carried out in the major shell space Z=50-82,N=82-126 within the framework of the asymmetric rotor model where the asymmetry parameter γ0reflects change in the nuclear structure.A systematic study of the product((E(2+)/E(2+))*B(E2)↑) with neutron number N is also discussed.The product((E(2_2~+)/E(2_1~+))*B(E2)↑) provides a direct correlation with the asymmetry parameter γ0.The effect of subshells is visible in Ba-Gd nuclei with N 82,but not in Hf-Pt nuclei with N 104.We study,for the first time,the dependency of the product((E(2_2~+)/E(2_1~+))*B(E2)↑) on the asymmetry parameterγ0.     

Evaluation of plasmon-loss spectra of molybdenum using elastic-peak electron spectroscopy

Plasmon-loss spectra of clean polycrystalline molybdenum surfaces have been determined in the primary energy range E_p = 50–3000 eV. Spectra a distributions (nonderivative mode). A simplified model is described for evaluating plasmon-loss spectra using elastic-peak electron spectroscopy, as de of elastically reflected electrons is determined by integrating the N(E) spectrum of secondary and backscattered electrons. The ratio of the ar (23–24 eV) to that of the elastic peak is Pλ, the product of the probability for creating a volume plasmon loss and the inelastic mean free pat second plasmon-loss peak is (Pλ)². Evaluation of our experimental plasmon-loss spectra gives Pλ = 0.4–0.5 for E_p > 500 eV. Th constitutes ～50% of all losses determining the IMFP, interband loss processes being important in the remainder. For the low energy range, E_p found. For E_p < 100 eV, no volume plasmon-loss peak could be detected in our N(E) spectra. The simplified model proves to be valid fo plasmon-loss peak (11–12 eV), i.e., such that N_pls/N_e ? 10^?2. Some results are presented concerning surface plasmon losses as molybdenum surface.     

Distribution d'énergie des électrons secondaires émis par InP et GaP soumis à un bombardement d'ions Ar de 40 keV

The energy distributions N(E) of secondary electrons emitted from GaP and InP samples bombarded with 40 keV Ar⁺ ions have been studied by a retarding potential method and an electronic derivation. The spectra show beyond an intensive peak developed at 2 eV, a detailed spectrum between 80 and 140 eV. The analysis of this spectrum reveales Auger electrons corresponding to L₂₃(P) VV and L₂₃M_IV–V(Ga) V [or L₂₃(P) N_IV-V(In) V] transitions; moreover, peaks due to plasmon excitations and d band excitations can be distinguished.     

Features of the energy distribution of secondary particles upon the ion bombardment of graphite

The secondary emission of carbon atoms from the (0001) plane of graphite nanocrystallites bombarded with argon ions with energies of 1 and 10 keV and the incidence angle α = 45° is investigated. The unusual oscillating energy distributions of secondary C⁺ ions with main maxima E _max in the range of 40–60 eV and peaks corresponding to the energies E ₁ ≈ 20, 30, 70, 80, and 100 eV have been revealed. The C⁺ ion yield decreases, the energy spectrum increases, and the maximum E _max shifts to larger energies E ₁ with increasing emission angle (with respect to the normal to the surface). The secondary-ion emission from the (0001) face of graphite is numerically simulated with allowance for the charge exchange of secondary ions to obtain a qualitative explanation of the observed results.     

SiO2 surface defect centers studied by AES

A theoretical model is proposed on how a Si dangling bond associated with an oxygen vacancy on a SiO₂ surface (E_s′ center) should be observed by Auger electron spectroscopy (AES). The Auger electron distribution N_A(E) for the L₂₃VV transition band is calculated for a stoichiometric SiO₂ surface, and for a SiO_x surface containing Si-(e^?O₃) coordinations. The latter is characterized by an additional L₂₃VD transition band, where D is the energy level of the unpaired electron e^?. The theoretical N_A(E) spectra are compared with experimental N(E) spectra for a pristine, and for an electron radiation damaged quartz surface. Agreement with the theoretical model is obtained if D is assumed to lie ≈2 eV below the conduction band edge. This result shows that AES is uniquely useful in revealing the absolute energy level of localized, occupied surface defect states. As the L₂₃VD transition band (main peak at 86 eV) cannot unambiguously be distinguished from a SiSi₄ coordination L₂₃VV spectrum (main peak at 88 eV), supporting evidence is presented as to why we exclude a SiSi₄ coordination for our particular experimental example. Application of the Si-(e^?O₃) model to the interpretation of SiO₂Si interface Auger spectra is also discussed.     

Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

A method for postionization in the course of ion sputtering that is based on surface ionization of the sputtered particles is developed. The estimations show that the method allows a significant increase in the sensitivity of the secondary-ion mass spectrometry for several elements. Nonadditive increase in the sputtering coefficient of indium is experimentally studied using the surface-ionization method of postionization when the number of atoms in projectile clusters Bi _m ⁺ (m = 1–7) increases at energies 2–10 keV. Such a scheme for the detection of neutral particles can be used in alternative methods for the surface analysis, in particular, laser evaporation of surface and electron-stimulated desorption.     

The effect of resonances in 8Be on α-α bremsstrahlung

The effect of the quadrupole transition between the ⁸Be 4⁺(11.4 MeV) and 2⁺(2.9 MeV) states is included in low energy α-α bremsstrahlung (E_1ab < 30 MeV). In the equal-angle Harvard geometry this dominates for θ < 30°, and so enables an estimate to be made of B(E2, 4⁺ → 2⁺, ⁸Be). The problem of non-coplanarity is also discussed.     

The polarized proton capture reaction 7Li(d, γ)8Be in the energy range from 380 to 960 keV

The polarized proton capture in ⁷Li was used to study the reaction mechanism and to obtain spectroscopic information on the ⁸Be nucleus. Gamma-ray angular distributions of the analyzing power were measured as a function of proton energy from E_p = 380–960 keV with three Ge(Li) detectors simultaneously. The excitation functions of the cross section and the analyzing power are strongly energy dependent. The data were analyzed unambiguously and represented by three R-matrix elements, two M1 and one E1. The energy dependence of the two M1 matrix elements agrees with the well-known two 1⁺ resonances at E_x = 17.642 and 18.157 MeV. The energy dependence of the E1 matrix element shows a smooth background presumably caused by a direct-capture mechanism, and furthermore, a resonant contribution, which is a significant suggestion of a new 1^? state in the ⁸Be system at E_x = 17.70 MeV with a width of Γ_p = 180 keV.     

Mechanism of the 12C(11B,15N)8Be reaction and 8Be + 15N optical-model potential

Angular distributions of the ¹²C( ¹¹B, ¹⁵N) ⁸Be reaction were measured at the energy E_lab(¹¹B) = 49 MeV for the transitions to the ground and 2.94 MeV (2⁺) excited state of ⁸Be and to the ground and 5.270 MeV (5/2⁺) + 5.299 MeV (1/2⁺), 6.324 MeV (3/2^-), 7.155 MeV (5/2⁺) + 7.301 MeV (3/2⁺), 7.567 MeV (7/2⁺) excited states of ¹⁵N. The data were analyzed by the coupled-reaction-channel method. The elastic, inelastic scattering and one- and two-step transfers were included in the coupling scheme. The data of the ¹²C( ¹¹B, ⁸Be) ¹⁵N reaction at E_cm = 9.4-17.8 MeV known from the literature, were also included in the analysis. The mechanism of the ¹²C( ¹¹B, ¹⁵N) ⁸Be reaction and the optical-model potential parameters for the ¹⁵N + ⁸Be channel were deduced. The energy dependence of the optical-model parameters for the ¹⁵N + ⁸Be channel was obtained.