共查询到8条相似文献,搜索用时 15 毫秒
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This article reports an experimental study on copper–water nanofluid flow inside plain and perforated channels. The effects of flow rate and nanoparticle concentration on the heat transfer and pressure drop are studied. It is found that the perforated channel has a remarkable heat transfer enhancement of 24.6%. Furthermore, by using the copper–water nanofluid instead of the base fluid, the heat transfer coefficient as well as pressure drop are increased for both plain and perforated channels. A noticeable thermal performance factor of 1.34 is obtained for the simultaneous utilization of both the heat transfer enhancement techniques considered in this article. 相似文献
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In this article, thermal and hydrodynamic performances of a miniature tangential heat sink are investigated experimentally by using Al2O3–H2O and TiO2–H2O nanofluids. The effects of flow rate and volume concentration on the thermal performance have been investigated for the Reynolds number range of 210 to 1,100. Experimental results show that the average convective heat transfer coefficient increases 14 and 11% and the bottom temperature of the heat sink decreases 2.2°C and 1.6°C by using Al2O3–H2O and TiO2–H2O nanofluid instead of pure distilled water, respectively. 相似文献
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Knyazev Yu. V. Chumakov A. I. Dubrovskiy A. A. Semenov S. V. Yakushkin S. S. Kirillov V. L. Martyanov O. N. Balaev D. A. 《JETP Letters》2019,110(9):613-617
JETP Letters - Nuclear γ-resonance experiments with energy and time resolved detection are carried out with ϵ-F2O3 nanoparticles and a 57Co(Rh) laboratory Mössbauer source of γ... 相似文献
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Physics of the Solid State - The effect of La concentration on the kinetic character of the induced phase transition in PbMg1/3Nb2/3O3–25PbTiO3 ferroceramics is studied. Below the... 相似文献
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Microstructure Study on Heterostructures of AIInGaN/GaN/Al2O3 by Using Rutherford Backscattering/Channelling and XRD 下载免费PDF全文
A quaternary AlInGaN layer is grown by metal-organic chemical vapour deposition on a sapphire (0001) substrate with a thick (〉 1μm) GaN intermediate layer. The compositions of In and A1 are determined by Rutherford backscattering (RBS). The low ratio between the channelling yield and random yield according to the spectra of RBS/C (χmin = 1.44%) means that the crystal quality of the AllnGaN film is perfect. The perpendicular and the parallel elastic strain of the AIlnGaN layer, e^⊥=-0.15% and e^//= 0.16%, respectively, are derived using a combination of XRD and RBS/channelling. 相似文献
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Physics of the Solid State - In this work, we study the electrical conductivity behaviors on the both sides of the metal-insulator transition (MIT) in RexSi1 – x amorphous... 相似文献