Cerium dioxide thin film optical waveguides

Cerium dioxide thin film optical waveguides were fabricated by an RF magnetron sputtering process. The films were deposited on glass substrates and on silicon dioxide layers grown on silicon substrates. Optical loss measurements for the fabricated waveguides are reported. It is seen that the volume losses in the films were fairly high compared with the surface losses.     

Four-fold magnetic anisotropy in a Co film on MgO(0 0 1)

The development of devices based on magnetic tunnel junctions has raised new interests on the structural and magnetic properties of the interface Co/MgO. In this context, we have grown ultrathin Co films (≤30 Å) by molecular-beam epitaxy on MgO(0 0 1) substrates kept at different temperatures (T_S). Their structural and magnetic properties were correlated and discussed in the context of distinct magnetic anisotropies for Co phases reported in the literature. The sample characterization has been done by reflection high energy electron diffraction, magneto-optical Kerr effect and ferromagnetic resonance. The main focus of the work is on a sample deposited at T_S=25 °C, as its particular way of growth has enabled a bct Co structure to settle on the substrate, where it is not normally obtained without specific seed layers. This sample presented the best crystallinity, softer magnetic properties and a four-fold in-plane magnetic anisotropy with Co〈1 1 0〉 easy directions. Concerning the samples prepared at T_S=200 and 500° C, they show fcc and polycrystalline structures, respectively and more intricate magnetic anisotropy patterns.     

Exchange bias and anisotropy in the Fe/KCoF3 structure

A new type of ferromagnet/antiferromagnet structure (Fe/KCoF₃) was deposited by molecular beam epitaxy. Unidirectional and uniaxial anisotropies of 5.1 and 3.4 kA/m were measured at 23 K using ferromagnetic resonance. Magnetization measurements at 5 K showed a hysteresis loop shift of 6 kA/m due to exchange bias. Significant enhancement of four-fold anisotropy was found at low temperatures in the samples with polycrystalline KCoF₃ structure.     

Theoretical investigation of ferromagnetic resonance in a ferromagnetic thin film with external stress anisotropy

We use the ferromagnetic resonance(FMR)method to study the properties of ferromagnetic thin film,in which external stress anisotropy,fourfold anisotropy and uniaxial anisotropy are considered.The analytical expressions of FMR frequency,linewidth and the imaginary part of magnetic susceptibility are obtained.Our results reveal that the FMR frequency and the imaginary part of magnetic susceptibility are distinctly enhanced,and the frequency linewidth or field linewidth are broadened due to a strong external stress anisotropy field.The hard-axis and easy-axis components of magnetization can be tuned significantly by controlling the intensity and direction of stress and the in-plane uniaxial anisotropy field.     

聚二甲基硅氧烷润湿各向异性薄膜

利用模板技术制备了聚二甲基硅氧烷光盘沟槽微结构薄膜,采用电子显微镜对材料进行表征并对薄膜的润湿性各向异性进行了研究.结果表明:刻录可以使光盘沟槽加深,利用聚二甲基硅氧烷复制的薄膜表面具有与光盘基本一致的表面微结构,但沟槽深度比原光盘有所降低.平行沟槽方向的接触角大于与垂直沟槽方向的接触角,具有明显的润湿各向异性.     

铁磁/反铁磁双层薄膜中应力各向异性研究

采用铁磁共振方法,研究了铁磁/反铁磁双层薄膜中交换各向异性和应力各向异性对其物理性质的影响.结果表明,单向各向异性来源于界面交换作用,应力各向异性对材料的磁化难易程度有较大影响.当外磁场方向与应力场方向平行时,应力场的存在将促进该方向的磁化.反之,应力场将会阻碍该方向的磁化.     

Complex anisotropy and magnetization reversal on stepped surfaces probed by the magneto-optical Kerr effect

So-called split hysteresis loops have been measured for ultrathin ferromagnetic films grown on stepped surfaces. Since the shape of the loops is sensitive to the direction in which the magnetic field is applied with respect to the steps, the sample orientation against the field is particularly important. We performed systematic magneto-optical Kerr effect studies for 15 and 58 ML of Fe grown on Au(1,1,13). In view of the complex magnetic anisotropy of such systems we discuss representative hysteresis loops taken at sample orientations misaligned from the field (and laser beam) direction. In particular, the presence of a so-called low field component to the hysteresis loops is discussed and its reversed polarity is explained.     

Annealing effect on ion-beam-sputtered titanium dioxide film

We found that the extinction coefficient of ion-beam-sputtered titanium dioxide films first decreased with increasing annealing temperature then increased drastically when annealing temperature was increased above ~200 degrees C for 24 h of annealing time. The decreasing extinction coefficient with annealing temperature was attributed to a reduction in absorption owing to oxidation of the film by annealing. The film structure remained amorphous to 200 degrees C annealing temperature. The drastic increase of extinction coefficients above ~200 degrees C was associated with the appearance of an anatase polycrystalline structure and was attributed to scattering by the polycrystalline structure. With shorter annealing time the transition temperature from amorphous to polycrystalline anatase was higher. Guidance for reducing the optical loss of laser mirrors is proposed.     

具有条纹磁畴结构的NiFe薄膜的制备与磁各向异性研究

具有条纹磁畴结构的磁性薄膜表现出面内转动磁各向异性,对于解决高频电子器件的方向性问题起着至关重要的作用.本文采用射频磁控溅射的方法,研究了NiFe薄膜的厚度、溅射功率密度、溅射气压等制备工艺参数对条纹磁畴结构、面内静态磁各向异性、面内转动磁各向异性、垂直磁各向异性的影响规律.研究发现,在功率密度15.6 W/cm~2与溅射气压2 mTorr(1 Torr=1.33322×102Pa)下生长的NiFe薄膜,表现出条纹磁畴的临界厚度在250 nm到300 nm之间.厚度为300 nm的薄膜比250 nm薄膜的垂直磁各向异性场增大近一倍,从而磁矩偏离膜面形成条纹磁畴结构,并表现出面内转动磁各向异性.高溅射功率密度可以降低薄膜出现条纹磁畴的临界厚度.在相同功率密度15.6 W/cm~2下生长300 nm的NiFe薄膜,随着溅射气压由2 mTorr增大到9 mTorr,NiFe薄膜的垂直磁各向异性场逐渐由1247.8 Oe(1 Oe=79.5775 A/m)增大到3248.0 Oe,面内转动磁各向异性场由72.5 Oe增大到141.9 Oe,条纹磁畴周期从0.53μm单调减小到0.24μm.NiFe薄膜的断面结构表明柱状晶的形成是表现出条纹磁畴结构的本质原因,高功率密度下低溅射气压有利于柱状晶结构的形成,表现出规整的条纹磁畴结构,高溅射气压会导致柱状晶纤细化,面内转动磁各向异性与面外垂直磁各向异性增强,条纹磁畴结构变得混乱.     

电子束照射LiF薄膜有源沟道的宽带光致发光

用热蒸发在玻璃衬底上制备了多晶LiF薄膜，研究了由电子束照射产生的有源沟道的室温宽带光致发光特性，研究表明，室温下有源沟道F2和F3^ 色心具有较大的光增益和折射率增量，有望实现可见波段的可调谐有源光波导器件。     

Magnetic anisotropy axis reorientation at ultrathin FePt films

Ultrathin FePt films (thickness between 1 nm and 5 nm) were studied for non‐volatile memories applications. The films were magnetron sputtered on monocrystalline MgO?001? substrates at 500 °C. The films are polycrystalline, except the 1 nm thick film which is not continuous. It is shown that films with thickness higher than 2.7 nm have L1₀ structure and perpendicular magnetic anisotropy, while a transition to in‐plane anisotropy occurs for thinner films. The out‐of‐plane coercivity drops from 16 kOe at the thicker film to 0.5 kOe at the thinner one.

Hysteresis cycles of FePt films as a function of film thickness.     

Polarization phase-shifting interferometer by rotating azo-polymer film with photo-induced optical anisotropy

A new type of phase-shifting interferometer was presented by rotating an azo-polymer film with photo-induced optical anisotropy in the light path of orthogonal polarization interferometry. By changing the angle of the optical axis of the azo-polymer film, four phase-shifted fringe patterns were obtained, from which phase difference between orthogonal polarized light could be calculated. The polarization states and the formation of the interferograms were analyzed theoretically using Jones matrix calculations and the experimental verification of the proposed method was also given. This method has a simple optical configuration which utilizes commercially available polarization devices and anisotropic azo-polymer film of low cost. The phase-shifting interferometer also demonstrates a new application of azo-polymer film.     

Magnetic characterization of Bi2FeMnO6 film grown on (100) SrTiO3 substrate

Single phase Bi₂FeMnO₆ films on (100) SrTiO₃ substrate were fabricated using a pulsed laser deposition method through optimization of the preparation conditions. The magnetic moment is 0.30μ_B at 5 K in the magnetic field of 1 T, indicating that B site cations of Fe and Mn are disordered in the sample. The zero‐field‐cooling (ZFC) and field‐cooling (FC) magnetization curves measured from 2 K to 400 K coincide at 360 K. This is consistent with the observation that hysteresis disappears at 360 K, revealing the antiferromagnetic transition at this temperature. A spin‐glass‐like behaviour was observed at low temperature (～100 K) with a cusp of 25 K. Mn shows multiple valence states in the film. It is possibly because Mn²⁺ and Mn⁴⁺ could decrease the Jahn–Teller effect from Mn³⁺ in the film which results in less lattice distortion. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Mapping of the electronic work function anisotropy of RF sputtered molybdenum thin film electrodes for piezoelectric devices

Amplitude modulated Kelvin probe force microscopy was performed on molybdenum (Mo)-thin films deposited on Si(001) substrates by RF magnetron sputtering. Evolution of film microstructure from amorphous to crystalline was observed with increasing RF power from 25 W to 200 W. Spatial mapping of work function across the film surface revealed that the Mo-thin film deposited at 200 W possesses an average work function ~4.94 ± 0.06 eV while higher values were observed at lower RF powers. The genesis of distinct periodic changes in work function is attributed to the formation of the surface dipole layer associated with the adsorbates of different polarities (O₂⁻/OH⁻ or H⁺). A phenomenological model is also presented to elucidate their effect.     

Origin of perpendicular magnetic anisotropy and evolution of magnetic domain structure of amorphous Pr-TM-B (TM=Fe, Co) films

In this study, the deposition pressure dependence of the compositional ratio, magnetic domain structure, and perpendicular magnetic anisotropy (PMA) of B-containing PrFe- and PrCo-based films, which are rare-earth-transition-metal (RE-TM) films, was investigated. PrFe- and PrCo-based films were fabricated by magnetron sputtering. The film compositions were controlled in a wide range by varying the deposition pressure. On the basis of experimental results, the residual stress of the films was considered to be the possible origin of their PMA. The films showed strong magneto-optical effects over the entire wavelength range of 300-750 nm. Because of the excellent magnetic and magneto-optical (MO) properties of the films, they have high potential for MO applications at wavelengths of red and blue lasers.     

Magnetic properties of Pr-Fe-B/Mn films with perpendicular anisotropy

The influence of a Mn layer on the magnetic properties of sputtered Pr-Fe-B/Mn films with Cu spacer layer has been investigated for various Mn layer thicknesses. The Pr-Fe-B/Mn films all possess perpendicular anisotropy. An enhancement of the intrinsic coercivity _iH_c is observed for suitable Mn layer thickness and _iH_c exhibits an oscillatory dependence on the thickness of the Mn layer with a period of about 60 nm. The average size of the columnar Pr₂Fe₁₄B grains is about 100 nm. A highest _iH_c value of 22.1 kOe and an optimal (BH)_max value of 18.2 MGOe are reported for these Pr-Fe-B/Mn films.     

Tilt-insensitive film thickness measurement using a double twin-path interferometer

A lock-in amplifier detection method for measuring the film thickness on a flat substrate has been developed by using a common-path interferometer. The signal due to the film thickness has been obtained without it being affected by the tilting of the substrate. The sensitivity was better than 0.5 nm.     

多晶薄膜屈服强度的一个模型

从位错运动的应力功和应变能关系导出了附着在基体上并有钝化层薄膜的屈服强度公式.该式表明多晶薄膜的屈服强度由两个影响因子（晶粒取向和位错类型）和三个强化因子（钝化层强化，基体强化和晶粒强化）确定.和已报道的实验结果基本一致表明了该模型的合理性. 关键词： 多晶薄膜 屈服强度     

Enhancement of ferromagnetic resonance in Al_2O_3-doped Co_2FeAl Heusler alloy film prepared by oblique sputtering

Large and variable in-plane uniaxial magnetic anisotropy in a nanocrystalline(Co2FeAl)97.8(Al2O3)2.2soft magnetic thin film is obtained by an oblique sputtering method without being induced by magnetic field or post annealing. The in-plane uniaxial magnetic anisotropy varies from 50 Oe to 180 Oe(1 Oe = 79.5775 A·m-1) by adjusting the sample’s position. As a result, the ferromagnetic resonance frequency of the film increases from 1.9 GHz to 3.75 GHz.