低杂波电流驱动下HT-7超导托卡马克逃逸电子行为

 HT-7托卡马克的逃逸电子诊断系统由CdTe,BGO,Na三种探测器组成,可以用来观测逃逸电子撞击托卡马克第一壁材料产生的硬X射线轫致辐射,它的能量响应范围是0.3~1.5 MeV。结合电子回旋辐射、中子等诊断手段,研究了HT-7超导托卡马克在低杂波电流驱动下的逃逸电子行为。实验结果显示：高功率低杂波的关断和低功率低杂波的投入都会增强逃逸电子的产生,但是如果低杂波可以将等离子体环电压降低到逃逸的阈值电场以下,低杂波的投入就可以抑制电子的逃逸。逃逸电子的产生还和低杂波功率有着密切的关系,可以通过控制低杂波的投入和关断的时刻以及改变低杂波功率来抑制逃逸电子的产生。     

HT-7 Tokamak离子回旋波和低杂波等离子体逃逸电子行为研究

HT-7 Tokamak拥有离子回旋波(ICRF)和低杂波(LHW)两套加热系统.ICRF主要对加热离子有比较好的加热效果,LHW则主要是通过电子Landau阻尼加热电子.除此之外,在ICRF和LHW协同加热的条件下,可以对等离子体产生更有效的加热效果,增加等离子体的聚变反应截面,增加聚变中子产额.本文报道了LHW对改善ICRF和等离子体耦合的重要作用,ICRF和LHW加热等离子体中电子温度随时间的演化过程,计算了放电过程中电子逃逸的阈值能量,分析了逃逸电子的产生过程,以及放电过程中的中子产额.研究结果发     

Investigation of fast pitch angle scattering of runaway electrons in the EAST tokamak

This paper reports that an experimental investigation of fast pitch angle scattering(FPAS) of runaway electrons in the EAST tokamak has been performed.From the newly developed infrared detector(HgCdTe) diagnostic system,the infrared synchrotron radiation emitted by relativistic electrons can be obtained as a function of time.The FPAS is analysed by means of the infrared detector diagnostic system and the other correlative diagnostic systems(including electron-cyclotron emission,hard x-ray,neutrons).It is found that the intensity of infrared synchrotron radiation and the electron-cyclotron emission signal increase rapidly at the time of FPAS because of the fast increase of pitch angle and the perpendicular velocity of the energetic runaway electrons.The Parail and Pogutse instability is a possible mechanism for the FPAS.     

Investigation of the effect of electron cyclotron heating on runaway generation in the KSTAR tokamak

Wave enhanced runaway generation is expected to play an important role in the conversion of plasma current into runaway current during major disruptions. The fast electrons created by electron cyclotron heating (ECH) were used to study this issue in KSTAR. It is found that the fast electrons driven by ECH can enhance runaway production in the flat top phase with high loop voltage. The runaway current in disruptions was not enhanced by the ECH produced fast electron population due to the strong magnetic fluctuations which inhibited the generation of runaway electrons. It is found that a complete loss of existing REs during thermal quench has occurred in KSTAR limiter configuration discharges.     

Runaway electron generation decrease during a major disruption by limiter biasing in tokamaks

The high-energy current of runaway electrons during a major disruption in tokamak reactors can cause serious damage to the first wall of the reactors and reduce their life time. Therefore, finding a method to minimize runaway electron generation during a major disruption is much needed. Tokamak limiter biasing is one of the methods that can be used for controlling the radial electric field and can induce a transition to an improved confinement state. This paper attempts to examine the effect of limiter biasing on the generation of runaway electrons during a major disruption. To do so, a horizontal biased limiter placed on the tokamak was used. Main parameters such as plasma current, loop voltage, emitted hard X-ray intensity, magnetohydrodynamic (MHD) oscillation and H_α radiation and spectrum of hard X-rays, in the presence and absence of negative and positive limiter biasing, were measured. The results show that the application of limiter biasing during a major disruption can reduce runaway electron generation.     

纳秒脉冲气体放电中逃逸电子束流的研究

经典的放电理论(Townsend和流注理论)不能很好地解释纳秒脉冲放电中的现象,近年来基于高能量电子逃逸击穿的纳秒脉冲气体放电理论研究受到广泛关注,有研究发现,高能逃逸电子是纳秒脉冲气体放电中的新特征参数,本文研制了用于测量纳秒脉冲放电中逃逸电子束流的收集器,并对脉宽3—5ns、上升沿1.2—1.6 n8激励的大气压纳秒脉冲气体放电中逃逸电子束流进行了测量,收集器采用类似法拉第杯的原理,利用金属极收集纳秒脉冲放电中的高能电子,并转换为电信号后由示波器采集,为了获得更好的逃逸电子束流波形,对逃逸电子束流收集器进行了优化设计,提高了收集器的阻抗匹配特性,基于上述的逃逸电子束流收集器,研究了纳秒脉冲气体放电中逃逸电子的特征,实验结果表明,所设计的收集器可以有效地测量到逃逸电子束流,改进设计后收集器测得的逃逸电子柬流的时间分辨率和幅值均得到提高,施加电压约80 kV时,大气压空气中的逃逸电子束流幅值可达160 mA,脉宽小于1ns,多个脉冲激励放电的结果表明逃逸电子束流收集器具有较好的可靠性,其瞬态响应与时间分辨率比较稳定。     

托卡马克等离子体电流爬升阶段逃逸电子行为

 分析了电流爬升阶段等离子体密度和电流爬升率对逃逸电子行为的影响,研究了低杂波辅助电流驱动条件下的逃逸电子辐射行为。结果发现：电流爬升阶段等离子体密度的大小严重影响了电流爬升阶段甚至电流平顶阶段逃逸电子的行为,较低的等离子体密度将会导致放电过程中比较强的逃逸电子辐射;低能逃逸电子辐射随着电流爬升率的增大而增强;低杂波辅助电流爬升可以有效地节约装置的伏秒数;降低放电过程中的环电压,可有效抑制逃逸电子的产生。     

HT-7托卡马克等离子体密度调制实验中的逃逸电子行为

在HT-7托卡马克的等离子体密度调制实验中,通过对欧姆和低杂波电流驱动两种放电条件下等离子体逃逸电子辐射行为的研究,验证了非准稳态等离子体中逃逸电子的产生机制,研究了欧姆和低杂波电流驱动两种放电条件下的大量充气对等离子体整体约束性能的影响。研究结果发现:放电过程中额外的大量工作气体的充入使等离子体偏离了准稳态,逃逸电子初级产生机制和次级产生机制准稳态的假设条件被打破,这时候需要利用非准稳态条件下修正后的逃逸电子归一化阈值速度来解释逃逸电子的辐射行为; 同时也发现放电过程中额外的大量工作气体的充入将使等离子体的整体约束性能变差。     

等离子体中充入工作气体抑制电子逃逸行为分析

利用NaI闪烁体探测器组成的伽马射线探测系统和BF₃正比计数管、³He正比计数管和ZnS闪烁体探测器组成的中子探测系统,研究了欧姆放电平稳阶段充入工作气体后对逃逸电子产生过程的影响.实验结果表明:在欧姆放电平稳阶段充入工作气体严重影响了逃逸电子行为,充入的工作气体能有效抑制逃逸电子的产生.     

等离子体中充入工作气体抑制电子逃逸行为分析

利用NaI闪烁体探测器组成的伽马射线探测系统和BF3 正比计数管、3He正比计数管和ZnS闪烁体探测器组成的中子探测系统,研究了欧姆放电平稳阶段充入工作气体后对逃逸电子产生过程的影响。实验结果表明：在欧姆放电平稳阶段充入工作气体严重影响了逃逸电子行为,充入的工作气体能有效抑制逃逸电子的产生。     

提高等离子体密度抑制逃逸电子束不稳定性的实验研究

利用ECE电子回旋辐射和Ha线辐射等托卡马克物理诊断系统,研究了Slide-away放电过程中提高等离子体密度对非麦克斯维尔分布的逃逸电子所激发的逃逸电子束不稳定性影响作用.实验结果表明:在Slide-away放电模式下,提高等离子体密度能有效抑制逃逸电子束的不稳定性.     

提高等离子体密度抑制逃逸电子束不稳定性的实验研究

利用ECE电子回旋辐射和Ha线辐射等托卡马克物理诊断系统,研究了Slide-away放电过程中提高等离子体密度对非麦克斯维尔分布的逃逸电子所激发的逃逸电子束不稳定性影响作用。实验结果表明：在Slide-away放电模式下,提高等离子体密度能有效抑制逃逸电子束的不稳定性。     

Observation of Runaway Electron Behaviour During Disruptions in LHCD Discharges in the HT‐7 Tokamak

Production of runaway electrons during disruptions has been observed in the HT‐7 Tokamak. The runaway current plateaus, which can carry part of the pre‐disruptive current, are observed in lower‐hybrid current drive (LHCD) limiter discharges. It is found that the runaway current can mitigate the disruptions effectively. We can use gas puffing to increase the line‐averaged density to restrain the runaway electrons and rebuild the plasmas after the disruptions. Detailed observations are presented on the runaway electrons generated following disruptions in the HT‐7 tokamak discharges. The results indicate that the magnetic oscillations play a significant role in the loss of runaway electrons in disruptions. There are two important preconditions to rebuild plasmas by runaway electrons after the disruptions. One of them are weak magnetic oscillations; another one are LHWs (lower‐hybrid waves) (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

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用NaI闪烁体探测器组成的逃逸电子诊断系统和CdTe半导体探测阵列组成的快电子轫致辐射诊断系统,研究了一定等离子体密度条件下低杂波功率和等离子体电流对逃逸产生的影响以及一定低杂波功率下等离子体密度对逃逸电子产生的不同作用效果。根据实验数据计算了HT-7装置等离子体中电子逃逸的阈值电场和一定放电条件下电子逃逸的阈值能量。     

AC operation and runaway electron behaviour in HT-7 tokamak

Operation of HT-7 tokamak in a multicycle alternating square wave plasma current regime is reported. A set of AC operation experiments, including LHW heating to enhance plasma ionization during the current transition and current sustainment, is described. The behaviour of runaway electrons is analysed by four HXR detectors tangentially viewing the plasma in the equatorial plane, within energy ranges 0.3--1.2~MeV and 0.3--7~MeV, separately. High energy runaway electrons (\sim MeV) are found to circulate predominantly in the opposite direction to the plasma current, while the number of low energy runaway electrons (\sim tens to hundreds of keV) circulating along the plasma current is comparable to that in the direction opposite to the plasma current. AC operation with lower hybrid current drive (LHCD) is observed to have an additional benefit of suppressing the runaway electrons if the drop of the loop voltage is large enough.     

HL－1装置放电中限制器上的硬X射线发射

观察了在ＨＬ－１装置放电电流上升段、坪区和下降部分由逃逸电子引起的硬Ｘ射线发射模式；硬Ｘ射线发射与破裂、ｍ＝２，３扰动、环电压尖峰、ＩＯＣ放电和超热电子辐射等的关系。给出了３００－３０８ｍｓ间硬Ｘ射线的闪烁脉冲幅度谱，最大能量为６．６ＭｅＶ．     

逃逸电子和不稳定性波反常多普勒共振实验研究

利用电子回旋辐射诊断系统并结合其他相关诊断研究了HL-2A托卡马克中逃逸电子与波间的反常多普勒共振作用.结果显示:欧姆放电下提高等离子密度能抑制逃逸电子束的不稳定性,但等离子密度的再次降低导致逃逸电子又会激发不稳定性波,并耦合不稳定性波发生二次反常多普勒共振作用.利用统计方法分析了HL-2A上不同放电阶段逃逸电子反常多普勒共振阈值(ωpe/ωce)区间大致都在0.17-0.54范围内.此共振机制导致逃逸电子在速度空间被波散射,平行能量转化到垂直能量,pitch角增加,同步辐射功率增强,逃逸电子能量限制在反常多普勒效应的阈值能量附近.基于反常多普勒共振的逃逸抑制能有效减轻逃逸电子对装置第一壁的损坏.     

HT-7托卡马克等离子体slide-away放电研究

在HT-7托卡马克上,只在等离子体放电击穿阶段充气,击穿后关闭充气阀门,让装置内真空室器壁的出气维持放电的进行,通过密度衰减实现了slide-away放电.实验分析了不同等离子体电流平台下的slide-away放电模式的密度阈值,以及相同充气量的条件下放电等离子体电流对实现slide-away放电的影响.研究了slide-away放电模式下密度提升对等离子体放电状态的影响.结果发现,slide-away放电模式下的密度提升使得H_a线辐射强度增强,等离子体中超热电子的约束性能变差,等离子体芯部的超热电子减少,高能逃逸电子厚靶轫致辐射增加. 关键词： slide-away放电 托卡马克 等离子体 逃逸电子     

托卡马克中等离子体频率附近的增强辐射现象

实验提出托卡马克中的等离子体频率附近的增强辐射现象与高能逃逸电子有关,但是辐射的机制尚未完全弄清。本文讨论了两种可能的机制。一种是诱发辐射,这是来自逃逸电子与波的反常迴旋共振。另一种是自发辐射,主要来自契仑柯夫共振。前者要求逃逸电子的能量比后者为大,因此,自发辐射理论更引人注意。在很宽的参数变化范围内对辐射率作了数值计算。对于等离子体频率大于迴旋频率的情况也作了讨论。 关键词：     

纳秒脉冲下高能量快电子逃逸过程的计算

基于快电子的逃逸击穿机理将是一种能解释纳秒脉冲高过电压倍数下气体放电现象的理论，对高能量快电子的逃逸运动、碰撞电离引导电子崩的发展等进行了分析，并根据电子能量与阻力关系式，对电子的俘获或逃逸过程进行了计算.结果表明外加场强越高，更多的电子能逃逸，逃逸的能量阈值越低，气压对电子的逃逸过程影响也较大.同时也定性描述了纳秒脉冲下逃逸击穿放电过程. 关键词： 气体放电 快电子 逃逸击穿 纳秒脉冲