无铅焊料十温区回流焊过程的仿真研究

通过对回流焊接工艺参数传输带速度、各个炉区温度设定和焊膏熔化温度曲线的关系研究,建立了大尺寸PCB组件传热过程的数学模型。基于ANSYS平台,模拟了无铅焊料PCB组件在十温区回流焊接过程中的温度场,从而确定了合适的焊接参数。     

无铅回流焊后跨线碳膜裂纹的探讨

针对PCB在过无铅回流焊后跨线位碳膜出现裂纹问题进行分析探讨,通过从调整碳膜参数、不同碳膜厚度对比、不同碳膜性能对比的结果,得出结论:碳膜开裂与油墨性能和设计有直接的关系。最终调整碳膜工艺参数和更改线路设计等方案,能有效改善碳膜裂纹的问题。     

氮气对无铅回流焊温度的影响

氮气属于惰性气体,在焊接中能够提高元件和印制板焊接面的润湿能力,减少氧化程度,加快焊接反应速度.与空气环境中的焊接相比,在氮气环境中焊接,理论上能够降低所需的焊接温度,并维持或提高焊点的质量和可靠性.首先对回流炉内氧气含量进行了标定,进而对氮气环境下焊接温度曲线在焊料液相线上热容量值降低20%时的回流焊接进行了验证,依然达到甚至超过空气焊接下的焊点质量及可靠性指标.     

Sn-3Ag-0.5Cu/Ni微焊点多次回流焊后IMC厚度及组织分析

采用Sn-Ag-Cu焊球(直径200,300,400和500μm),镀Ni盘,研究1,3,5次回流焊条件下焊点的IMC厚度及显微组织与焊球尺寸间的关系。结果表明:对于同一尺寸的焊球,随着回流焊次数的增加,IMC的厚度增大,形状由平直状逐渐过渡为体钎料一侧凹凸不平;在同一回流焊次数下,随着焊球尺寸的增大,IMC厚度减小,形貌相对没有明显差别。IMC的组成成分随着Ni向体钎料方向的不断扩散而从Sn、Ag、Cu合金变成Sn、Ag、Cu、Ni合金,其主要组成部分为(Cu,Ni)6Sn5。     

热循环条件下无铅焊点可靠性的有限元分析

通过有限元数值模拟对Sn3.5Ag0.75Cu无铅焊料焊点的可靠性问题进行了分析。采用统一粘塑性Anand本构方程对焊料焊点结构进行有限元分析,研究焊点在热循环加载过程中的应力应变等力学行为。研究结果表明,在焊点内部焊点与基板结合处的应力较大,而焊点中央的应力较小;焊点在低温阶段的应力最大,在高温阶段应变最大;在升降温阶段的应力应变变化较大,而在保温阶段的应力应变变化较小。     

激光快速成形过程的实时监测与闭环控制

激光快速成形是一个受多因素影响的过程,在开环控制条件下,工艺条件改变时,成形系统不能做出适当地调整,因而无法获得期望的成形效果。为了解决这个问题,国内外研究机构发展了基于实时监测原理的闭环控制系统,通过不断地调整加工工艺,最终获得了几何性能(尺寸精度、表面粗糙度)和力学性能达到设计要求的三维实体零件。本文简要论述了激光快速成形过程的影响因素,并介绍了目前激光快速成形实时监测与闭环控制技术的发展现状,列举了部分监控系统,并对激光快速成形过程的监测与闭环控制系统的进一步发展提出了自己的见解。     

回流焊炉温曲线的管控分析

回流焊温度曲线记录印刷电路板元件焊接过程的温度变化,是元件焊接质量的主要影响因素。针对用测温板获取回流焊温度曲线的影响因素,对测温流程进行潜在失效效应分析,发现利用测温板频繁进行炉温测试具有较高的风险系数。但通过对回焊炉各温区温度的监控与分析,发现回焊炉的制程能力处于优良状态,潜在失效效应的风险系数较低。研究表明,在获取可靠的炉温曲线后,只需要加强炉温监控即可保证焊接质量。     

基于电阻应变临界点的无铅焊点失效分析

利用特制的焊点在线测试系统,测试了不同载荷条件下单个无铅焊点的电阻应变曲线,推导出电阻应变和损伤量之间的定量关系式,分析了焊点失效特性。结果表明:无铅焊点电阻应变曲线包括线性变化区和指数变化区;两个区域临界点处的电阻应变值为0.05左右,临界点至失效的时间约占焊点寿命的20.00%～30.00%;热循环条件下,40℃的电阻应变曲线临界点滞后于125℃的临界点,滞后时间约占焊点寿命的7.50%。     

无铅倒装焊点的热应力与湿热应力分析

板上倒装芯片（FCOB）作为一种微电子封装结构形式得到了广泛的应用。微电子塑封器件中常用的聚合物因易于吸收周围环境中的湿气而对封装本身的可靠性带来很大影响。文章采用有限元软件分析了潮湿环境下板上倒装芯片下填充料在湿敏感元件实验标准MSL-1条件下（85℃／85％RH、168h）的潮湿扩散分布,进而分别模拟计算出无铅焊点的热应力与湿热应力,并加以分析比较。论文的研究成果不仅对于塑封电子元器件在潮湿环境中的使用具有一定的指导意义,而且对于FCOB器件在实际应用中的焊点可靠性问题具有一定的参考价值。     

基于热疲劳状态监测的PCB无铅焊点可靠性研究

以PCB片式电阻器件无铅焊点为研究对象,开展与有铅焊点剪切力-热疲劳状态比较试验研究。采用了伪失效寿命比较方法,获得了有限周期温度冲击下的焊点剪切力试验数据,采用非线性最小二乘法进行剪切力数据的曲线拟合。结果表明,封装尺寸是影响焊点热疲劳性能的重要因素。在1 500个有限周期内,无铅焊点的热疲劳性能优于有铅焊点。     

SnAgCu无铅焊膏用活性物质研究

以SnAgCu无铅焊膏铺展性能为主要指标,通过回流焊接实验,对用于助焊剂的17种有机酸活性物质进行了筛选。选取两种性能较好的有机酸配成复合活性物质,并对该活性物质的组成进行优化。用湿热试验测试焊后残留物的腐蚀性。结果表明:以羧基官能团比例为3:7的丁二酸和一元酸A混合物作为活性物质,并添加质量约0.66%的乙醇胺调整酸度,得到了pH值约为3的助焊剂;此助焊剂性能优良,可使焊点铺展率达到84%。使用含有此助焊剂的焊膏,采用回流焊接工艺在PCB板上贴装片式元件,所得焊点光亮饱满,且焊后残留物无腐蚀性,可以实现免清洗。     

SnAgCu无铅焊膏用溶剂的优化研究

以SnAgCu无铅焊膏铺展性能和焊点形貌作为评价的主要指标,通过回流焊接实验,对常用于焊膏的10种溶剂进行了单一溶剂优选,并对两种性能较好的溶剂进行复配优化研究.结果表明:A醇、二缩三乙二醇和B醚作为单一溶剂时焊膏的润湿性较好、焊点外形较饱满,铺展率都大于83%;A醇和B醚按质量比3:2复配时得到的焊膏铺展率达到93%...     

低银无铅焊膏板级封装工艺和焊点可靠性试验

针对低Ag无铅焊膏的市场需求,研究开发了一种适用于99.0Sn0.3Ag0.7Cu低Ag无铅焊膏用松香型无卤素助焊剂(WTO—LF3000),配制了相应的无铅焊膏(WTO—LF3000—SAC0307),并对其板级封装工艺适应性及焊点可靠性进行了考察,用测试后样品的电气可靠性作为接头可靠性评价条件。结果表明:所开发的低Ag无铅焊膏熔点和润湿性符合产品实际要求。配制的焊膏印刷质量良好,焊点切片观察其孔隙率<25%,满足行业标准IPC—A—610D之要求。样品分别经跌落、震动和温度循环试验后,无焊点脱落等现象,电气功能正常。     

无铅钎料焊点界面与剪切行为的研究

研究了三种不同合金钎料回流时间和老化时间对焊点界面行为和剪切性能的影响。结果表明:回流时间和老化对金属间化合物的生长和剪切力有相似的影响;焊后界面处和焊料中均有明显的金属间化合物;随着回流时间和老化时间的延长,金属间化合物生长明显。层厚不断增大;界面形貌从长针状转变成扇贝状,并且齿高减小;合金成分对剪切力影响不明显。在中速应变率下,剪切力减小。Sn-3.5Ag显现出较好的剪切性能,剪切力为77~82 N。     

Characteristics of the Sn-Pb eutectic solder bump formed via fluxless laser reflow soldering

In an attempt to develop a fluxless reflow solder bumping process, the effects of processing variables, which include energy input rate and time, and the shape of solder disk on the microstructure of the solder/Cu pad interface and the shear strength of the joints were investigated. It was demonstrated that a proper combination of the variables could lead to the formation of a spherical solder bump with shear strength comparable to that formed via the conventional reflow soldering process. In addition, the kinetics of Cu pad dissolution into the solder during laser heating was modeled numerically to elucidate intermetallic formation mechanism at the solder/Cu pad interface. Jointly appointed by CAAM at POSTECH     

湿热环境下倒装焊无铅焊点的可靠性

对板上倒装芯片底充胶进行吸湿实验,并结合有限元分析软件研究了底充胶在湿敏感元件实验标准MSL—1条件下吸湿和热循环阶段的解吸附过程,测定了湿热环境对Sn3.8Ag0.7Cu焊料焊点可靠性的影响,并用蠕变变形预测了无铅焊点的疲劳寿命。结果表明:在湿热环境下,底充胶材料内部残留的湿气提高了焊点的应力水平。当分别采用累积蠕变应变和累积蠕变应变能量密度寿命预测模型时,无铅焊点的寿命只有1740和1866次循环周期。     

In-situ observation and simulation of the solidification process in soldering a small outline package with the Sn-Ag-Cu lead-free alloy

The formation process of solidification defects in solder fillet of circuit boards with a small outline package (SOP) soldered with Sn-3wt.%Ag-0.5wt.%Cu has been examined primarily by using an in-situ observation system and solidification simulation software. The lead frames of the SOP are two kinds of materials: Cu and Fe-42wt.%Ni (42 alloy). Microstructural observations were made of the SOP solder joints using metallographic cross sections. The β-Sn dendrite structure in the solder fillet of a SOP with 42-alloy lead frames is larger than that of a Cu lead frame. This is attributed to the slower cooling speed of the 42-alloy lead-frame SOP than that of the Cu lead-frame SOP. The solidification of a SOP joint is not uniform and locally time dependent. The solder surface of the slowly cooled region of the 42-alloy lead-frame SOP exhibited shrinkage voids and a rough surface because of the coarsening of the dendrite structure. According to the simulation of the solidification process, the relationship between the solidification process and formation characteristics of solidification defects for a SOP joint can be clarified.     

无铅的锡-银-铜焊料的发展——第二代低银含量SnAgCu体系

概要地评述了无铅焊料中低银含量的锡-银-铜（SnAgCu）体系的发展方向。由于高银含量的锡-银-铜（SnAgCu）体系存在着成本高和耐跌落（摔）性差的问题,它将被低银含量的锡-银-铜（SnAgCu）体系所取代。在低银含量的锡-银-铜（SnAgCu）体系中加入某些微量添加剂可以达到锡-铅焊料的性能水平。     

Influence of flux on wetting behavior of lead-free solder balls during the infrared-reflow process

The effects of two different fluxes (A6 and B6) on the wetting performance of Sn-3.5Ag-0.5Cu lead-free solder balls were investigated during the reflow process. Solder ball wetting behavior in real time via an optical microscope coupled with a video recorder during the reflow process was studied. The lead-free solder balls started to melt and wet at 210°C by using A6, which is 8°C lower than the melting point (218°C) of the solder material used. The wetting performance of the lead-free solder ball was dramatically enhanced by using A6. The wettability test indicated that the height of the solder ball after the reflow process with flux A6 was significantly lower than that with B6. It was found that strong fluxing capability caused these phenomena.     

Effects of reflow on wettability, microstructure and mechanical properties in lead-free solders

Solder joints used in electronic applications undergo reflow operations. Such operations can affect the solderability, interface intermetallic layer formation and the resultant solder joint microstructure. These in turn can affect the overall mechanical behavior of such joints. In this study the effects of reflow on solderability and mechanical properties were studied. Nanoindentation testing (NIT) was used to obtain mechanical properties from the non-reflow (as-melted) and multiple reflowed solder materials. These studies were carried out with eutectic Sn-3.5Ag solders, with or without mechanically added Cu or Ag reinforcements, using Cu substrates. Microstructural analysis was carried out on solder joints made with the same solders using copper substrate.