连续振动悬臂梁的瞬时三维形貌测量

提出一种连续振动悬臂梁瞬时三维形貌的测量方法。利用影栅云纹法在连续振动悬臂梁表面产生包含有三维形貌信息的云纹,采用准直双光源提高亮度,通过高速摄相机获取随时间变化的一系列变形条纹,利用傅里叶变换方法对序列图像进行处理,采用补零延拓法对数据进行处理,以减小频谱泄漏所引起的相位计算误差。将相位解包裹方法用于动态过程瞬时三维相位场的相位展开中,重建了悬臂梁的瞬时三维形貌,再现了悬臂梁的连续振动过程。     

小波相位解调轮廓术

针对傅里叶变换轮廓术因混频难以准确提取基频的问题,可将小波变换用于三维形貌相位直接解调。对其原理进行了研究,通过编程实现了小波相位解调。取Morlet复小波作为小波母函数,对调制栅线图逐行进行连续小波变换,从各位置的沿尺度方向的小波变换系数幅值的极值中可直接求取对应的相位数据。由于小波函数具有空域_频率两域的局部化特性,因此它对变形栅具有很强的自适应能力。为验证新方法,对其进行了仿真分析,同时还对石膏半球模型和化妆品瓶进行了实际测量,并分别用傅里叶变换和小波变换进行了处理。结果表明,新方法有效地克服了混频的问题,改善了相位解调效果,提高了测量精度,特别适合于复杂物体的形貌测量。     

单幅条纹图相位解调的小波分析方法

相位解调是条纹相位分析的关键问题.本文提出一种应用小波频率估计联合频率导数对变形条纹进行瞬时频率分析,从中提取参考基频,从而依靠单一变形条纹实现相位解调的方法.首先,理论上证明了当变形条纹瞬时频率空间导数等于零,该空间点的瞬时频率等于参考基频频率;其次,引入Gabor小波提取变形条纹的瞬时频率空间分布,利用变形条纹瞬时频率的空间导数分布识别提取参考基频,从而实现相位解调.利用该方法进行了三维形貌测量的实验,结果表明该方法在实现相位解调中效果良好.     

单幅条纹图相位解调的小波分析方法

相位解调是条纹相位分析的关键问题.本文提出一种应用小波频率估计联合频率导数对变形条纹进行瞬时频率分析,从中提取参考基频,从而依靠单一变形条纹实现相位解调的方法.首先,理论上证明了当变形条纹瞬时频率空间导数等于零,该空间点的瞬时频率等于参考基频频率;其次,引入Gabor小波提取变形条纹的瞬时频率空间分布,利用变形条纹瞬时频率的空间导数分布识别提取参考基频,从而实现相位解调.利用该方法进行了三维形貌测量的实验,结果表明该方法在实现相位解调中效果良好.     

小波变换轮廓术在双频光栅条纹中的应用

为了解决非连续物体三维面形测量中所存在的非连续相位解包问题,采用计算机生成的两频率之比为一无理数的电子光栅作为空间载频光栅条纹投影到待测物体表面。另外结合伽博小波变换分析的相位解调原理,在一幅变形双频光栅图像中分析得到两个频率各自所对应的包络相位分布,并且应用钟金钢等所提出的双频条纹查表法进行解包得到确定的调制相位分布。提出的双频光栅-小波变换-查表相位解包法很好地解决了傅里叶变换轮廓术,以及连续相位解包法在非连续物体三维面形测量中所存在的问题。给出了详细完整的理论推导过程、计算机模拟以及实验验证,证实了该方法的可行性。     

基于Mexican hat小波变换的三维轮廓术

为了提高小波变换轮廓术中小波的空域局部化能力, 提出了一种基于Mexican hat小波变换的条纹图处理方法.基于希尔伯特变换得到条纹对应的解析信号, 用Mexican hat小波计算解析信号的连续小波变换, 从小波变换的脊上提取相位信息, 恢复物体高度信息.模拟结果表明, Mexican hat小波变换法在相位快变或突变的区域有更高的相位提取精度, 测量误差可减小0.1～0.5 rad.以人脸石膏像为例, 进行了实验测量.实验结果表明, 在高度不连续或变化剧烈的区域, Mexican hat小波变换法较Morlet小波方法误差传播更小, 精度更高.     

基于并行小波变换的快速三维面形测量技术

为了提高小波变换三维面形测量技术中相位信息的解调速度,依据不同的并行计算原理,提出两种基于并行一维连续小波变换的光学条纹图快速解调方法。利用多核CPU运算平台进行了计算机模拟和实验,结果表明并行一维连续小波变换光学条纹图相位解调方法相比于串行一维连续小波变换光学条纹图相位解调方法,在精度不变的同时计算速度显著提高:对850pixel×1000pixel大小实测条纹图像解调速度提高了7.5倍。并行一维连续小波变换相位解调方法为小波变换三维面形测量技术在实时/瞬态过程三维面形测量中的应用奠定了基础。     

小波变换轮廓术的测量范围研究

利用小波“脊”处的小波系数来提取变形条纹中的相位信息可以在很大程度上抑制条纹图中有用的基频分量与零频和其它谐波频率分量的混叠,弥补了傅里叶变换轮廓术的不足。从离散信号频域分析角度,推导了变形条纹小波变换的频谱描述形式,讨论了其测量范围,包括结构条件和抽样条件。结果表明,只有在无周期内瞬时频谱混叠,即任意位置处物体瞬时高度变化满足h/xx=b<1/3条件时,和不存在抽样引起的周期间瞬时频谱混叠的抽样条件下(即一个周期内的抽样点数m≥4时),小波变换轮廓术才能正确恢复被测物体的三维面型。计算机模拟和实验验证了该结论。     

二维实小波变换在空间载频条纹相位分析中的应用

将二维实小波变换和希尔伯特变换相结合应用到空间载频条纹相位分析中。首先对载频条纹进行希尔伯特变换构造解析信号,然后对其解析信号进行二维实小波变换,提取小波脊处对应的小波变换系数的相位信息即可得到有效的物体高度调制信息。给出了详细的理论分析。计算机模拟和实验表明当条纹中相位存在突变和快变的区域时,采用二维实小波变换比一维实小波和复小波提取相位精度更高,即使在存在噪声污染的情况下也表现出良好的可靠性,体现出了二维实小波提取相位的优势。     

基于光学三维形貌数字重建的不规则表面的参数测量

针对不规则形状物体表面参数测量困难的问题,提出了一种利用光学三维形貌数字重建技术来获取待测物体表面三维数字信息的方法。首先利用傅里叶变换得到反映三维物体表面高度的相位数据,在计算机中重建三维待测物体,然后再利用Matlab软件编写面向用户的人机交互界面,通过计算机鼠标指定待测量的表面区域,最后运用Matlab软件对鼠标所指定区域的三维数字信息进行处理,根据几何关系计算出指定区域的表面积、两点间的曲线长度等参数,实现人机交互式的非接触测量。     

Wavelet analysis of digital shearing speckle patterns with a temporal carrier

Shearography is an optical technique allows direct measurement of deflection derivatives. This paper presents a novel temporal phase analysis technique based on wavelet transform when shearography is applied to measure a continuously deforming object. A series of shearing speckle patterns is captured by a high-speed camera during the deformation. To avoid the phase ambiguity problem, a temporal carrier is generated by a piezoelectrical transducer (PZT) stage in one beam of the modified Michelson interferometer. The intensity variation of each pixel on recorded images is then analyzed along time axis by a robust mathematical tool - complex Morlet wavelet transform. After the temporal carrier is removed, the absolute phase change representing the first-order derivative of the continuous deformation is obtained without the need of temporal or spatial phase unwrapping process. The results obtained by wavelet transform are compared with those from temporal Fourier transform.     

Continual deformation analysis with scanning phase method and time sequence phase method in temporal speckle pattern interferometry

If a laser beam illuminates a continual deformation object surface, it will lead to a temporal speckle pattern on the observation plane. Recording this time-dependent speckle pattern the deformation of the surface of an object can be obtained. Two methods, scanning phase method (SPM) and time sequence phase method (TSPM), have been introduced for measuring the displacement caused by the deformation in temporal speckle pattern interferometry (TSPI). Their principle is that by capturing a series of speckle interference patterns related to the object deformations, the fluctuations in the intensity of the interference patterns can be obtained. Through scanning these fluctuations and estimating both the average intensity and modulation of the temporal speckle interference patterns, the phase maps for whole-field displacements are calculated. In this way one is capable of quantitatively measuring continual displacements simply using a conventional electronic speckle pattern interferometry (ESPI) system without phase shifting or a carrier. The elaboration on the new methods is given in this paper and experiments are performed to demonstrate their performance with a conventional ESPI system.     

时间序列散斑干涉技术研究及应用

当用相干激光照射在一个连续位移或变形的漫射物体表面时,在与参考光形成干涉的接收面上即产生一随时间变化的散斑干涉场通过对这一干涉场的时间域进行分析,可实现时变位移场的定量检测本文介绍了基本时间序列散斑干涉场的扫描相位方法和时间序列相位法的相位函数解调原理,探讨了它们的计量特性,并将其用于火箭固体燃料性能的检测.     

时间序列散斑干涉场中相位函数的计算

散斑干涉或电子散斑干涉计量应用于连续运动或变形物体时,就会产生一个时变的散斑干涉场,通过摄像系统连续地采集这一时变散斑场,可获得一系列时间序列散斑干涉图,通过对序列散斑图上各点在时间轴上光强值的变化进行分析,提出了一种基于时间序列的分析方法,用以提取干涉场的相位值,进而获得物体全场变形信息。     

Shape measurement by multi-illumination method in digital holographic interferometry

In this paper, temporal phase unwrapping and short time Fourier transform (STFT) are proposed for shape measurement of an object with height steps by digital holographic interferometry (DHI). A series of digital holograms is recorded with a high-speed CCD camera using a multi-illumination method. Each pixel is processed along the time axis independently of other pixels. Two novel methods are proposed to process the wrapped phase maps: the first method is based on complex phasor (CP) and temporal phase unwrapping, and the second method is based on CP and STFT. In the STFT method, continuous phase maps are obtained by integration of the exacted instantaneous frequency. The continuous phase map can characterize the profile of the object with height steps. An experiment is conducted to verify the validity of the proposed methods.     

Determination of curvature and twist by digital shearography and wavelet transforms

A new technique based on digital shearography for determining the transient curvature and twist of a continuously deforming object from a series of speckle patterns is presented. The intensity variation of each pixel is analyzed along the time axis by using a complex Morlet wavelet transform. The absolute sign of the phase variation is determined by introduction of a temporal carrier when the speckle patterns are captured by a high-speed camera. A high-quality spatial distribution of the deflection derivative is extracted at any instant without the need for temporal or spatial phase unwrapping. The continuous Haar wavelet transform is subsequently processed as a differentiation operator to reconstruct the instantaneous curvature and twist of a continuously deforming object.     

Application of wavelet transform to 3D shape measurement

A new method for analyzing the phase distributions of deformed grating images on the surface of three-dimensional (3D) object to obtain its shape information has been presented. In the conventional technique, Fourier transform profilometry (FTP), there is an intrinsic problem of extracting the fundamental frequency component if the deformation of the grating pattern is either considerable or complicated, which will definitely bring bad influence to the analysis' accuracy. That means FTP is not appropriate to deal with the complex surfaces of 3D objects. The approach that we here introduce to solve this problem is to utilize Gabor wavelet transform (GWT), a tool excelling for its multiresolution in time-frequency domain, to analyze the phase distributions.     

Investigation of a dual-layer structure using vertical scanning interferometry

This paper proposes a method based on white light vertical scanning interferometry (VSI) to investigate a dual-layer structure. The optical arrangement is based on a modified Michelson interferometer that utilizes a reference beam and two object beams. Each object beam interferes with the reference beam and produces an interferogram. A series of interferograms are obtained on a dual-layer structure and the thickness of each layer is obtained. A continuous wavelet transform (CWT) is used to extract the envelope of each interferogram in order to determine the peak intensity that provides an indication of each layer's boundary. Tests are conducted on a semiconductor wafer and a micro-gear made of polymeric material deposited on a metal substrate. Results show that the proposed method has a good potential for investigating a dual-layer micro-structure.