水下高斯界面背向散射超声散斑场的相位奇异

为了精确描述超声散斑场的特性,提出了采用计算机模拟产生超声散斑场的方法.利用模拟产生的高斯相关随机表面,获得了这类表面远场超声散斑场,同时得到了声强分布和相位分布.与实验产生的散斑场进行对比,建立了超声散斑场接收的实验系统,取与计算模拟相同的参数,获得了实验散斑场.通过对比发现:计算机模拟产生的超声散斑场相位存在奇异点,奇异点周围相位分布类似漩涡,计算机模拟产生的散斑场与实验得到的散斑场强度分布相似,强度值比实验产生的散斑场强度大,携带有用信息的高亮散斑较多,暗点较少,更利于研究和分析.     

时间序列散斑干涉场中相位函数的计算

散斑干涉或电子散斑干涉计量应用于连续运动或变形物体时,就会产生一个时变的散斑干涉场,通过摄像系统连续地采集这一时变散斑场,可获得一系列时间序列散斑干涉图,通过对序列散斑图上各点在时间轴上光强值的变化进行分析,提出了一种基于时间序列的分析方法,用以提取干涉场的相位值,进而获得物体全场变形信息。     

高斯相关随机表面及其光散射散斑场的模拟产生和光强概率分析

提出了模拟产生高斯相关随机表面的方法,并模拟产生了这类表面在夫琅禾费面上产生的散斑场.以模拟产生的10000个随机表面作为表面样本系综,对具有不同粗糙度和横向相关长度的表面系综在夫琅禾费面上各点产生的散斑光强系综的概率密度分布进行了分析.发现：(1)散斑场的高斯和非高斯特性在空间上按一定的区域分布,并非整幅散斑图皆为高斯或非高斯散斑;(2)散射表面只包含少数散射颗粒时也可以形成高斯散斑. 关键词：     

高斯型弱散射屏产生的像面散斑场的分布特性研究

弱散射屏产生的远场散斑由一个中央亮斑和一个分布于亮斑周围而与正态散斑类似的散斑结构, 根据弱散射屏远场的散斑图样, 人们假设弱散射屏产生的像面散斑为均匀背景与正态散斑两者相干叠加的结果, 但这种假设与实际像面散斑存在歧异, 基于上述情况, 本文利用4f高通滤波光学成像系统, 研究了高斯型弱散射屏产生的像面散斑场的统计特性, 得出只有表面均方根粗糙度与入射光波的波长相差不多时上述假设才是可行的结论. 关键词： 弱散射屏 f光学成像系统')" href="#">4f光学成像系统 像面散斑     

基于单幅散斑的X射线强度关联缺陷检测方法

采用预置散斑的X射线强度关联成像系统需要采集大量的散斑场,成像时间较长,而单幅散斑场信噪比低,难以单独用于图像重构。然而单幅散斑场中的空间分布信息包含一定的样品结构信息,可以用于样品缺陷快速检测。基于此,提出一种基于单幅预置散斑的缺陷检测方法,该方法将待检测样品探测散斑场与标准样品模拟散斑场的相关性作为样品缺陷的评价标准。同时基于该方法模拟X射线强度涨落二阶自关联检测光路,分析不同信噪比下探测散斑场分布的图像对比度对相关系数的影响。并对比多种细节增强方法,提高检测可靠性。最终结果表明,基于单幅散斑场的方法可以有效地进行样品的快速缺陷检测。     

菲涅耳衍射区和夫琅和费衍射区的动态部分相干光散斑场特性

研究了菲涅耳衍射区和夫琅和费衍射区动态部分相干光散斑的特性.利用部分相干光互强度传播的理论，得出了在部分相干光照明时，由运动散射体产生的动态散斑光强时空交叉的自相关函数的一般形式，并由此得出了散斑沸腾和平移的一般规律.通过适当选择光源和调整光路参数，在实验上得到了菲涅耳和夫琅和费衍射区的部分相干光散斑，对夫琅和费面上的动态部分相干光散斑的平移和沸腾现象进行了定性研究；采用光子计数及数据自动采集的方法，对部分相干光散斑随时间的演化及动态部分相干光散斑的沸腾进行了定量测量.这些实验结果与理论结果相符合. 关键词： 部分相干光动态散斑 时空交叉相关函数 沸腾     

参考光干涉提取复振幅的散斑统计函数的实验研究

由散斑场和参考光的干涉图样提取散斑场复振幅、相位和强度的数值分布,并对其统计特性进行实验研究,消除了散斑场强度统计函数特别是概率密度函数的传统测量方法中噪声引起的偏差,并实现了散斑场复振幅和相位统计特性的实验研究.通过对不同散射角处散斑场的研究发现随着散射角度的增大散斑颗粒逐渐呈现出横向展宽的现象,且其平均宽度表现为各向异性,但是其概率密度函数并没有发生变化,与小角度情况一样属于圆形高斯散斑场. 关键词： 散斑 概率密度 干涉     

高能激光自主自适应光学系统及激光散斑效应

设计了高能激光自主自适应光学系统,利用高能激光的主动照明探测方式对目标进行探测。由于接收到的探测回波光场受散斑效应的影响,因此建立了探测系统的物理模型,具体分析散斑效应的影响。通过散斑光强自相关函数,理论上分析确定了散斑的平均尺度;通过部分相干理论,研究了该系统接收面散斑孔径积分场复相关函数并讨论了不同散斑天线尺度比情况下的积分场复相关函数宽度;分析了目标的成像放大率和理想分辨率,讨论了物像尺度与焦平面光斑尺度之间的关系;通过系统的数值仿真,分析了不同尺度散斑对焦平面光斑阵列的影响;叠加大气湍流,确定了散斑场对大气湍流探测的影响。结果表明散斑尺度介于阵列子孔径和大孔径尺度之间为最佳设计,此时较高的位移测量精度和整体探测率可以兼得。     

测量平板玻璃折射率实验中激光散斑削减方法的探究

本文描述了以激光为光源测量平板玻璃折射率实验中成像场产生散斑的现象,并获得了一种简单有效的散斑削减方法.理论上激光经过漫散体后产生微光束干涉场,利用统计学的规律,总结出了散斑元之间对比度的影响因素.实验中,选取动-静毛玻璃对作为削减器件,利用静止漫散体增加入射光的粗糙程度,通过缓慢旋转的运动漫散体,可将散斑对比度降为4%左右,使干涉条纹清晰可见.     

半导体激光器内自混合散斑干涉

在散斑和半导体激光器的自混合干涉理论的基础上,提出了基于法布里一珀罗腔的自混合散斑干涉模型,对粗糙表面产生的激光器内自混合散斑干涉效应(SMSI)进行了详细的理论研究和分析,得到了粗糙腔条件下的激光动力学的数值解。模拟产生了高斯相关随机表面及其在夫琅禾费面上产生的散斑场,以及该散斑场与相干光场叠加所形成的光场,分析了这些情况中光强的统计特征,与已知实验情况进行了对比,模拟结果与已知统计结果相同。给出了粗糙表面运动时激光器输出增益的变化及其概率密度分布。对由于照明宽度和外腔长度的变化而给粗糙表面运动时激光器输出增益变化带来的影响进行了分析。实验结果和模拟结果相符。     

Theoretical study on the statistical properties of phase difference between two interfering speckle fields

The statistical properties of phase difference between two interfering speckle fields are studied theoretically with the general expression of the free standard deviation of the phase difference of speckle fields. The experimental results of the standard deviations of phase difference between two interfering partially developed speckle fields in the diffractive region [Opt. Quantum Electron. 19 (1987) 59] are studied and discussed theoretically with the general expression of the free standard deviation of phase difference of speckle fields. The theoretical standard deviations of phase difference for the case of two interfering fully developed Gaussian speckle fields are compared with that which are numerically calculated from the Gaussian theory.     

Statistical properties of the phase difference between two interfering speckle fields in speckle interferometry

The statistical properties of the phase difference between the two interfering partially correlated and partially developed speckle fields were studied experimentally as a function of the intensity correlation coefficient. The gaussian statistics are assumed for the formation of speckle fields in the diffraction region and the correlation coefficient between the two speckle intensities is used to evaluate the phase difference. The standard deviation of the phase difference can be uniquely determined in the fully developed speckle field from the correlation coefficient of the two speckle intensities. However, it was found in the partially developed speckle field that the standard deviation of the phase difference between the two speckle fields cannot be uniquely determined from the correlation coefficient of the two speckle intensities.     

Studies on the statistical properties of phase difference of speckle fields

According to the relations between the phase and the complex speckle amplitude, a phase angle is constructed to estimate the free standard deviation of phase difference of speckle fields. The relative accurate amending expression of evaluating the free standard deviation of phase difference is derived for the Gaussian speckle fields. The statistical properties of phase difference are studied for the Gaussian speckle fields of diffraction fields. The theoretical values of the free standard deviation of phase difference for the case of fully developed speckle fields are compared with the numerical values of the free standard deviation which are calculated from the Gaussian theory of the fully developed speckle fields.     

Digital phase stepping speckle interferometry

A variation of electronic speckle pattern interferometry (ESPI) is presented whereby phase fringes are produced in contrast to speckle correlation fringes. Digital phase stepping speckle interferometry uses a phase measurement technique developed for holographic interferometry, which involves phase shifting of the reference beam in a conventional speckle interferometer. Saw-tooth phase fringes are produced by subtracting the phases of the speckle fields before and after object deformation in a digital frame store. This enables the sign of the deformation to be distinguished. After application of a special low-pass digital filter, the phase fringes are of adequate quality to be counted automatically.     

Noise reduction in electronic speckle pattern interferometry fringes by merging orthogonally polarised speckle fields

The noise in sawtooth fringes generated by electronic speckle pattern interferometry (ESPI) is investigated. When deformations of depolarising objects are studied, the scattered object light can be decomposed into two orthogonal linearly polarised speckle patterns which are partially decorrelated. Their correlation coefficient decreases with increasing depolarisation coefficient of the object. By suitable merging of the phase distributions of these two speckle fields on the basis of a modulation depth analysis, the rms phase error in the ESPI sawtooth fringes can be reduced significantly.     

Singularities in speckled speckle

Speckle patterns produced by random optical fields with two (or more) widely different correlation lengths exhibit speckle spots that are themselves highly speckled. Using computer simulations and analytic theory we present results for the point singularities of speckled speckle fields, namely, optical vortices in scalar (one polarization component) fields and C points in vector (two polarization components) fields. In single correlation length fields both types of singularities tend to be more or less uniformly distributed. In contrast, the singularity structure of speckled speckle is anomalous; for some sets of source parameters vortices and C points tend to form widely separated giant clusters, for other parameter sets these singularities tend to form chains that surround large empty regions. The critical point statistics of speckled speckle is also anomalous. In scalar (vector) single correlation length fields phase (azimuthal) extrema are always outnumbered by vortices (C points). In contrast, in speckled speckle fields, phase extrema can outnumber vortices and azimuthal extrema can outnumber C points by factors that can easily exceed 10(4) for experimentally realistic source parameters.     

A more accurate method of evaluating the standard deviation of speckle phase

A phase angle is constructed to estimate the standard deviation of speckle phase. The relative accurate amending expression of the standard deviation of speckle phase is derived according to the statistical properties of speckle phase of the fully developed speckle fields. The theoretical values of standard deviation are compared with that which are calculated from the Gaussian theory of the speckle field. The theoretical results are compared and discussed with respect to the experimental results of Kadono et al.     

Enhanced deterministic phase retrieval using a partially developed speckle field

A technique for enhanced deterministic phase retrieval using a partially developed speckle field (PDSF) and a spatial light modulator (SLM) is demonstrated experimentally. A smooth test wavefront impinges on a phase diffuser, forming a PDSF that is directed to a 4f setup. Two defocused speckle intensity measurements are recorded at the output plane corresponding to axially-propagated representations of the PDSF in the input plane. The speckle intensity measurements are then used in a conventional transport of intensity equation (TIE) to reconstruct directly the test wavefront. The PDSF in our technique increases the dynamic range of the axial intensity derivative for smooth phase objects, resulting in a more robust solution to the TIE. The SLM setup enables a fast and accurate recording of speckle intensity. Experimental results are in good agreement with those obtained using the iterative phase retrieval and digital holographic methods of wavefront reconstruction.     

The roughness dependence of partially developed,monochromatic speckle patterns

The theory of partially developed speckle patterns is reviewed. Exact solutions for the speckle contrast as function of surface roughness are calculated for two different surface models. A linear approximation for small roughnesses is found to be valid if the phase deviations due to roughness are less than one. Applications to surface roughness measurements are discussed.