Reflectometry technique for studying metal nanolayers on a substrate

A new noncontact technique is proposed for determining the parameters of nanosized metal coatings (absorption coefficients, refractive indices, and thicknesses). It is based on processing the measured angular dependence of the energy reflection coefficient of a polarized laser beam reflected by a thin-film structure surface. Features of determining the parameters of films on silicon substrates have been considered.     

X射线照射Hep-2细胞对其培养基吸收光谱的影响

采用分光光度计分别测量了受不同剂量X射线照射后继续培养48h时的人上皮样喉癌细胞株Hep-2的培养基RPMI1640的紫外吸收光谱,分析了该培养基中蛋白质的紫外吸收特性.结果发现:各组培养基的吸收光谱存在明显的差别,新鲜培养基RPMI1640(10%胎牛血清)233nm处的吸收峰在细胞生长过程中位移至235nm,275nm处的吸收峰位移至278nm.反映出各组培养基中芳香族氨基酸中各种氨基酸如色氨酸、酪氨酸、苯丙氨酸的含量的变化,说明癌细胞在生长过程中对这几种氨基酸的改变不是按等量比的.实验还发现细胞培养基的吸收光谱强度与各剂量组细胞数基本成正相关,进而与细胞所受X射线照射的剂量有内在的联系.这些结果将为利用光谱技术研究人喉癌最佳X射线放射剂量奠定基础.     

Hep-2细胞经X射线照射后其培养基吸收光谱的研究

采用日本岛津UV-3101分光光度计测量了受不同剂量X射线照射后继续培养24,48,72h的人上皮样喉癌细胞株Hep-2的培养基RPMI1640(10%胎牛血清)的紫外吸收光谱,分析了该培养基中蛋白质的紫外吸收特性。结果发现：不同剂量组培养基的吸收光谱存在明显的差别,RPMI1640培养基(10%胎牛血清)原在233 nm处的吸收峰在受照细胞生长过程中位移至235 nm附近, 278 nm处的吸收峰随着细胞培养时间的增加而逐渐变的平滑直至消失;各剂量组细胞培养基吸收光谱强度随时间而增加,在细胞受X射线照射后继续培养24,48h时各组培养基吸收强度均低于空白对照组,但到了第72h时均超过了空白组,这反映了该培养基中芳香族氨基酸中各种氨基酸(如色氨酸、酪氨酸、苯丙氨酸)的含量及比例变化,说明癌细胞在生长过程中对芳香族氨基酸的改变不是按等量比的。这些改变与X射线照射引起Hep-2细胞的凋亡及坏死程度有密切的关系,这将为研究人喉癌最佳X射线放射剂量奠定基础。     

Microwave Reflectometry on HL-2A Tokamak

One of the most important electron density diagnostics, microwave reflectometry, has been developed on many large and medium nuclear fusion devices in recent years . Not only the electron density profiles with high temporal and spatial resolutions, but also the profiles of plasma rotation and turbulence can be obtained with this diagnostic system.     

实现水窗波段X射线激光的途径

研究了类氢、类氦、类锂和类钠离子等四种实现复合机制Ｘ射线激光的方案，对可能实现水窗波段Ｘ射线激光的几种方案比较，分析了其各种的优缺点，并讨论了可能的具体实验方法。     

X射线胶片的脉冲光源响应标定

用ＬＦ－１１激光装置的１．０６μｍ脉冲激光加热Ｃｕ靶产生的Ｌ－壳层线辐射作脉冲Ｘ射线源，在曝光量为（０．０１～１０）－７Ｊ·ｃｍ－２范围内，标定了ＫＯＤＡＫＡＡ－５，ＫＯＤＡＫＳＷＲ和ＵＦＳＨ－Ｏ软Ｘ射线胶片的响应曲线，并与用连续光源标定的进行了对比．结果表明，这三种ｘ射线胶片，在强脉冲光源曝光条件下，都存在着胶片响应互易律失效问题，过去用连续光源标定的响应曲线，在激光等离子体诊断实验中，已经不能采用．     

Reflectometry of absorbing uniaxial multilayer media

A novel reflection technique for index determination of isotropic or uniaxial absorbing multilayer on a lower refractive index substrate is presented. Above the angle of total reflection at the layer-substrate interface characteristic minima occur in the reflectivity which are suitable for high accuracy fitting of the layer parameters. The 4 × 4 transfer matrices of uniaxial multilayer are given for computer evaluation. Refraction index determination of a poled polymeric layer on an indium-tin-oxide coated glass is demonstrated. Advantages of the new method are outlined.     

Neutron Reflectometry Studies of ZnO Films

Textured Al-doped ZnO films are studied using neutron reflectometry. The films are quasiperiodic structures with a period of several nanometers. The films are inhomogeneous in a surface layer with a thickness of 10–20 nm.     

Carbon Nanostructures on a Semiconductor Substrate

Physics of the Solid State - The analytical expressions for the density of states and the occupation numbers are obtained for simple models of carbon nanostructures (graphene–boron nitride...     

基于非线性频率调制的光脉冲压缩反射测量方案

为了克服线性调频技术中的旁瓣过高的缺点,提出一种基于非线性调频技术的光脉冲压缩反射仪方案.将非线性调频脉冲信号通过单边带调制器调制到光信号上,并将光电探测器接收到的瑞利散射、端面反射等信号和该非线性调频脉冲信号进行匹配滤波,得到脉冲压缩曲线.理论、数值仿真和实验证明了非线性调频技术能有效抑制光脉冲压缩反射仪中的旁瓣.实验结果表明,使用相干长度为2km的光源,该方案的测量距离可达5.4km、空间分辨率达16.5cm、非线性调频的旁瓣抑制比比线性调频高5.8dB.     

Properties of a Miniature X-Ray Source

A miniature X-ray source, based on a small vacuum discharge, is studied. It was designed to be of small size and low cost. The electrical characteristics are given. Evidence of pinches is shown even with kiloampere pulses. The size and the reproducibility of the source are estimated by radiography: the source diameter and its excursion are certainly smaller than 50 ?m. The total energy scales as V4 and is independent of Z, the anode atomic number. The spectrum is studied by the absorption method. The temperature varies in the range 7-10 keV.     

Magnetoelectronic Instability of Graphene on a Ferromagnetic Substrate

JETP Letters - The shape of the coherent population trapping resonance in optically thin cells with antirelaxation coating of the walls has been determined by solving the quantum kinetic equation...     

Microfocus X-Ray Tubes with a Silicon Autoemission Nanocathode as an X-Ray Source

To develop nanostructures with extremely low spatial resolution (to 10 nm and below), a new concept of the use of arrays of microfocus X-ray tubes based on field emission silicon nanocathodes is proposed. A new λ-tunable microfocus source of X-ray radiation, based on a thinfilm transmission target with field emission nanocathode with tunable wavelength, is proposed. The possibility of decreasing the exposed area size to 20 nm and smaller by varying the tube blocking voltage is shown. The use of these X-ray sources opens a new way of developing maskless X-ray lithography.     

二维点阵的软X射线衍射实验研究

以光刻胶作为探测器,用3.2nm的X射线进行了二维点阵测试样品的软X射线衍射实验,记录了探测器和样品间隔分别为0、2mm和80mm时的图像,并用光学显微镜放大观察。实验结果表明,探测器记录的图像与探测 和样品之间的距离有关,即随探测器和样品之间距离的变化而变化。这与理论模拟的结果一致。     

基于螺旋平行传输线的时域反射监测技术研究

针对山体滑坡、泥石流等岩土灾害,通过基于螺旋平行传输线的TDR(Time-Domain Reflectometry)技术,设计出的窄脉冲发生电路,返回波信号调理电路和高速采样模块,运用等效采样法,实现了信号的采集,完成了时域反射监测仪器系统,并对反射波形进行了实时对比研究; 将螺旋平行传输线埋入山体,当山体内部发生形变,引起螺旋平行传输线相应拉伸,拉伸点的特性阻抗随之变化,运用TDR技术对螺旋平行传输线进行测量分析,可得螺旋平行传输线变形数据,相应的反映了山体表面的变形;反射波形的实时对比研究表明,将时域反射技术应用于螺旋平行传输线形变监测行之有效且效果明显.     

Compton Scattering of Attosecond X-Ray Pulses on a Hydrogen Atom

The Compton scattering of attosecond X-ray pulses on a hydrogen atom has been studied theoretically in terms of the spectral angular scattering probability during the action of a pulse. The dependence of scattering on the carrier frequency, pulse duration, and scattering angle has been analyzed. It has been shown that the probability of the process at certain parameters of the problem is a nonlinear function of the pulse duration.     

Limitations of the Fluorination of Graphene on a Substrate

The experimentally observed incomplete fluorination of graphene (CF _x , x ≤ 0.2?0.3) on a smooth substrate has been explained. It has been shown that fluorine atoms are covalently attached primarily to scanty folds or to defects of graphene on one of its free sides.     

Langmuir单分子膜的动态稳定性:

应用KSV LB－5000型Langmuir膜天平的VISCOS模式,对硬脂酸和19,21－二炔二十二碳酸（DDA）单分子膜在有无亚相离子、不同目标膜坟、不同膜障振动频率和不同温度下的动态稳定性作了研究。实验表明,单分子膜的目标膜压越低,膜障交变振动的频率越低,单分子膜越稳定,亚相中加有金属正离子对单分子膜的动态稳定性也有利。     

Electrostatic and Structural Effects at the Adsorption of Polylysine on the Surface of the DMPS Monolayer

JETP Letters - The effect of the adsorption of a polypeptide on the lateral interaction of dimyristoylphosphatidylserine molecules in different phase states on the surface of a 10 mM KCl aqueous...     

基于锥形单玻璃管X射线聚焦镜表征X射线光源参数

X射线光源的焦斑尺寸和焦深对X射线光谱学,尤其是对于微区X射线衍射与荧光分析等领域十分重要的参数。如何高效而准确的表征这些参数对于X射线光源的应用和发展至关重要。现有的光源参数表征方法,尤其在表征微焦斑光源的参数时,都存在自身的局限性。锥形单玻璃管X射线聚焦镜是一种常用的X射线聚焦器件。根据锥形单玻璃管X射线聚焦镜滤波特性和几何特点,分析得到聚焦镜的聚焦光能量上限的大小受到光源焦斑尺寸的影响,提出这个能量上限与光源尺寸和光源到聚焦镜入口的距离之间的数学关系。设计了一种基于锥形单玻璃管X射线聚焦镜的表征X射线光源参数的方法。对锥形单玻璃管X射线聚焦镜的参数进行测量和确定后,将聚焦镜放置要测量的光源前,与光源形成聚焦光路。在光路准直并确保只有在聚焦镜内发生单次全反射的X射线射出聚焦镜的情况下,通过改变聚焦镜与光源焦斑距离并利用能谱探测系统来探测聚焦光并得到多个对应的聚焦光能谱。对所得能谱进行计算与分析,得到各能谱中的能量最大值,即聚焦光的能量上限。利用聚焦光能量上限、光源焦斑尺寸和光源到聚焦镜的距离之间的关系并结合线性拟合法,可同时得到光源焦斑尺寸和焦深。选用制造商给出焦斑尺寸约60 μm,焦深为20 mm的微焦斑钼靶光源作为测量对象,利用基于锥形单玻璃管X射线聚焦镜的表征方法测量的结果为焦斑尺寸为60.1 μm,焦深为19.7 mm。用小孔成像法表征该光源焦斑尺寸为60.3 μm,焦深为20.1 mm。相较于现有的方法,基于锥形单玻璃管X射线聚焦镜的表征X射线光源参数方法对表征微焦斑光源有一定优势,对表征高能X射线光源有潜在发展和利用价值。