Electron mobility in poly(3-hexylthiophene) enhanced by gamma-ray irradiation

Gamma-ray irradiation effects on the photoresponsive thin-film devices based on the regioregular poly(3-hexylthiophene) (RR-P3HT) conjugated polymer have been studied by means of atomic force microscopy, UV–vis absorption, photoluminescence (PL), and time-of-flight measurements. As a result, increased light absorption in the red region and PL quenching induced by the irradiation were observed. Besides, enhancement of the electron/hole mobilities, attributable to improved ordering or increased nanodomain size of the P3HT thin films, was revealed.     

SmS phase transition in thin films prepared by reactive evaporation

Preparation and analysis of thin films containing samarium sulfide (SmS) is presented along with a review of relevant SmS properties. Films were deposited onto unheated substrates by the reactive evaporation of samarium in a backpressure of hydrogen sulfide. This technique yields films that contain significant quantities of impurities; however high-quality SmS crystals are also formed. A phase transition in the SmS crystals was observed both by spectrophotometry and x-ray diffraction. The film optical properties can be modeled with an effective medium calculation. The predicted spectra successfully reproduce the observed qualitative features over a wide range of wavelengths.     

Effect of solvent evaporation on the self‐assembly of poly(3‐hexylthiophene‐2,5‐diyl) and on the film morphology during electrospray deposition

A high‐voltage rectangular pulse was applied to the electro‐spray deposition (ESD) to control the evaporation‐induced self‐assembly of poly(3‐hexylthiophene‐2,5‐diyl) (P3HT). Two groups of P3HT thin films were deposited by a series of high‐voltage rectangular pulses. Compared with the ESD driven by a constant voltage, the pulse‐driven ESD enables to probe the effect of solvent evaporation on the self‐assembly of P3HT molecules. The droplet size and the evaporation of residual solvent in the droplet determine the film morphology. Ultraviolet–visible absorption spectroscopy was used to identify the ordering of P3HT molecules in the films. The self‐assembly of P3HT molecules took place during the solvent evaporation which can be controlled by a combination of the pulse amplitude and the pulse interval. With an appropriate combination of the amplitude and the interval, the ESD produced a P3HT thin film with high chain ordering.

     

The photoemission study of NdNiO3/NdGaO3 thin films, through the metal-insulator transition

The electronic structure of thin films NdNiO₃/NdGaO₃ with various thicknesses (from 17 nm to 150 nm), have been studied by photoemission spectroscopy at 300 K and 169 K. The XPS results are consistent with the literature ab initio calculations of the NdNiO₃ electronic structure. A noticeable variation attributed to the metal-insulator (MI) transition has been found only for the films with relatively high thickness (150 nm). Furthermore, the photoemission spectra and their temperature dependence have been discussed with regard to the results of dc electrical resistivity measurements which also exhibit large thickness dependence. Finally, these new results support a possible large hetero-epitaxial effect on the thinnest sample (17 nm) which could stress the NdNiO₃ structure and consequently makes its electronic structure nearly stabilized.     

P3HT/PMMA双层聚合物电双稳器件的研究

通过逐层旋涂的方法,制备了P3HT(poly(3-hexylthiophene))与PMMA(poly(methylmethacrylate))双层器件,并与二者的共混溶液制备的器件进行了性能对比。利用扫描电镜(SEM)表征了双层器件的横截面形貌;利用电流-电压(I-V)以及电流-读取次数(I-t)测试,测量了两种器件的开关比以及持续时间特性。其中,双层器件具有更好的开关比,可达1×10~3,同时反复读写测试表明器件性能非常稳定。为了解释电双稳现象产生的机理,对双层结构器件的电流-电压曲线进行了线性拟合,利用器件的能级图进行分析,得出了电荷在器件中的传输过程。研究结果表明,可以通过电荷俘获释放理论解释P3HT/PMMA双层器件电双稳特性产生的机理。     

Annealing-free Poly(3-hexylthiophene):[6,6]-phenyl-C61-butyric acid methyl ester-based organic solar cells

We report on the fabrication of efficient annealing-free organic solar cells using co-solvent solution considered as a promising method for low-cost and time-saving manufacturing. Higher device efficiency could be obtained compared to the pure solvent casted device, resulting from the improved crystallinity, optical absorption and transport properties. The power conversion efficiency of 2.8% was obtained, demonstrating the feasibility of achieving low-cost and high-efficiency organic solar cells without any additional treatment and processing additives.     

PVA栅绝缘层浓度对P3HT有机场效应晶体管性能的影响

采用溶液制备法制备了用PVA作为绝缘层、P3HT作为有源层的有机场效应晶体管,,研究了不同浓度PVA栅绝缘层对器件性能的影响。实验结果显示,以质量分数为8%的PVA溶液制备的栅绝缘层具有最好的性能,器件的场效应迁移率为0.31 cm²·V^-1·s^-1,阈值电压为-6 V。进一步分析了PVA栅绝缘层浓度对器件性能提高的原因,结果表明,对于制备溶液化的有机场效应晶体管,选取合适的PVA栅绝缘层浓度非常重要。     

Electrical conduction mechanisms of thermally evaporated 5,10,15, 20-tetraphenyl-21H, 23H-porphine iron (III) chloride thin films

The J–V characteristics of the Au/5,10,15, 20-tetraphenyl-21H, 23H-porphine iron (III) chloride (FeTPPCl)/ITO device exhibits rectifying behavior in the dark which can be explained due to the formation of Schottky barrier at ITO/FeTPPCl junction and the typical junction parameters were estimated in temperatures from 302 to 368 K. The temperature dependence of DC electrical conductivity showed that FeTPPCl films behave as semiconducting materials. These results indicate that the DC electrical conduction is through an activated process having three conduction mechanisms in the investigated range of temperatures. A variable range hopping model, a polaron model and band to band transitions have been used to explain the conduction mechanisms for FeTPPCl films.     

Molecular dynamics in thin films of isotactic poly(methyl methacrylate)

The molecular dynamics in thin films (18 nm-137 nm) of isotactic poly(methyl methacrylate) (i-PMMA) of two molecular weights embedded between aluminium electrodes are measured by means of dielectric spectroscopy in the frequency range from 50 mHz to 10 MHz at temperatures between 273 K and 392 K. The observed dynamics is characterized by two relaxation processes: the dynamic glass transition (α-relaxation) and a (local) secondary β-relaxation. While the latter does not depend on the dimensions of the sample, the dynamic glass transition becomes faster (≤2 decades) with decreasing film thickness. This results in a shift of the glass transition temperature T _g to lower values compared to the bulk. With decreasing film thickness a broadening of the relaxation time distribution and a decrease of the dielectric strength is observed for the α-relaxation. This enables to deduce a model based on immobilized boundary layers and on a region displaying a dynamics faster than in the bulk. Additionally, T _g was determined by temperature-dependent ellipsometric measurements of the thickness of films prepared on silica. These measurements yield a gradual increase of T _g with decreasing film thickness. The findings concerning the different thickness dependences of T _g are explained by changes of the interaction between the polymer and the substrates. A quantitative analysis of the T _g shifts incorporates recently developed models to describe the glass transition in thin polymer films. Received 12 August 2001 and Received in final form 16 November 2001     

重温Pb(ZrxTi1-x)O3铁电薄膜极化疲劳问题

具有ABO3型钙钛矿结构的Pb(ZrxTi1-x)O3 (PZT)展示出良好的铁电极化性能,是使用最广的铁电材料.然而,在将它应用于铁电存储时,PZT薄膜遭遇到极化疲劳问题而被SrBi2Ta2O9 (SBT)等铁电体所替代,这一问题至今未能得到妥善解决.文章首先通过变温极化疲劳实验充分理解PZT极化疲劳的基本过程,然后有针对性地进行材料设计,获得基本无极化疲劳的PZT铁电薄膜.     

(CoFe)_(1-x)Ag_x颗粒巨磁电阻薄膜的磁折射效应研究

在线非接触测试巨磁电阻效应对磁电子器件的工业化生产具有重要的意义 .用红外光谱研究了 (CoFe) 1 -xAgx颗粒薄膜的磁折射效应 ,研究表明在红外波段 ,一级近似可以认为巨磁电阻比值与磁折射变化率成正比 ,可以利用磁折射效应作为在线非接触工具测量与自旋散射相关的巨磁电阻效应 .     

Characterization of poly (3-methyl thiophene) thin films prepared by modified chemical bath deposition

Poly (3-methyl thiophene) thin films were prepared by chemical bath deposition technique on glass substrate; the prepared thin films were characterized for structural, morphological and optical properties. The variation in the oxidant concentration has an influence on the properties of the P3MeT thin films. The increase in the oxidant concentration leads to increase in the thickness of the film. The binding energy increases due to increase in oxidation concentration. The P3MeT thin films show smooth surface morphology with increase in oxidant concentration whereas the contact angle of the thin film decreases with increase in oxidant concentration. The optical absorbance of these thin films was found to increase with decrease in the optical band gap due to increase in oxidant concentration.     

异质界面对Ca(Mg1/3Nb2/3)O3/CaTiO3叠层薄膜结构和介电性能的影响

采用异质叠层方式制备出一定厚度的Ca(Mg_1/3Nb_2/3)O₃/CaTiO₃(CMN/CT)叠层薄膜,研究了异质界面对薄膜结构、微观形貌及介电性能的影响及其规律.根据实验测试结果,提出CMN/CT叠层薄膜的模拟等效电路,建立介电常数和介电损耗的理论计算公式.结果表明:CMN/CT异质叠层薄膜具有完全正交钙钛矿结构,结构致密,厚度均匀,薄膜中存在独立的CMN和CT相.异质界面处存在过渡层,随着薄膜中异质界面个数增加,介电常数增大,介电损耗减小.减小界面过渡层的厚度,有利于提高CMN/CT叠层薄膜的介电性能.     

化学溶液法制备的Bi3.25La0.75Ti3O12和Bi3.25Nd0.75Ti3O12薄膜的光学特性

采用化学溶液方法在(111)Pt／Ti/SiO2/Si衬底上制备了Bi3.25La0.75Ti3O12(BLT)和Bi3.25Nd0.75Ti3O12(BNT)薄膜．x射线衍射测试表明，两种薄膜都为单一的层状钙钛矿结构．扫描电子显微镜分析显示，BNT薄膜由大而均匀的棒状晶粒组成，BLT薄膜的组成晶粒则较小．采用紫外一近红外椭圆偏振光谱仪测试了200-100nm波长范围的椭圆偏振光谱，拟合得到薄膜的光学常数(折射率和消光系数)和厚度，确定BLT薄膜的禁带宽度分别为4．30和3．61eV，并采用单电子振子模型分析了薄膜在带间跃迁区的折射率色散关系．     

Anomalous strain effect in heteroepitaxial SrRuO3 films on (111) SrTiO3 substrates

We report comprehensive investigations into the structure of high-quality (111)-oriented SrRuO₃ films on SrTiO₃ substrates to elucidate the effect of (111) heteroepitaxial strain. We found that SrRuO₃ film with a thickness of ～ 40 nm is compressively strained in plane on the substrate with full coherency. Nevertheless, the out-of-plane spacing is almost the same as in the bulk, which is at odds with the conventional paradigm. By probing a series of half-order Bragg reflections using synchrotron-based x-ray diffraction combined with analyses of the scanning transmission electron microscopy images, we discovered that the heteroepitaxial strain is accommodated via significant suppression of the degree of c⁺ octahedral tilting and the formation of three equivalent domain structures on the (111) SrTiO₃ substrate. This anomalous effect sheds light on the understanding of an unconventional paradigm of film-substrate coupling for the (111) heteroepitaxial strain.     

Structural and electrical properties of SrTiO3 thin films as insulator of metal-ferroelectric-insulator-semiconductor （MFIS） structures

SrTiO₃ (STO) thin films were deposited on p-Si(100) substrates at various substrate temperatures from 300℃ to 700℃ by radio frequency (RF) magnetron sputtering technique. Their structure and electrical properties were investigated. It was found that the transition from amorphous phase to polycrystalline phase occurred at the substrate temperatures 300--400℃. Their crystallinity became better when the substrate temperatures further increased. The dielectric and leakage current measurements were carried out by using the Si/STO/Pt metal--insulator--semiconductor (MIS) structures at room temperature. It was found that the fixed charge density decreased and both the interface trap density and the dielectric constant increased when the substrate temperatures were increased. The leakage current mechanisms for STO MIS structures with STO films prepared at 700℃ followed the space charge limited current (SCLC) under the low applied electric field and the Poole--Frenkel emission under the high one. In addition, the resistivity for films prepared at 700℃ was higher than 10¹¹\Omega \cdot cm under the voltage lower than 10V (corresponding to the electric field of 1.54\times 10³kV\cdotcm^-1). It suggested that the STO films prepared at 700℃ were suitable for acting as the insulator of metal--ferroelectric--insulator--semiconductor (MFIS) structures.     

Optical study of Ba(Mn_xTi_(1-x)O_3) thin films by spectroscopic ellipsometry

Stoichiometric Ba(Mn_xTi_(1-x)O_3) (BMT)thin films with various values of x were deposited on Si(111)substrates by the sol-gel technique.The influence of Mn content on the optical properties was studied by spectroscopic ellipsometry(SE)in the UV–Vis–NIR region.By fitting the measured ellipsometric parameter(Ψand)with a four-phase model(air/BMT+voids/BMT/Si(111)),the key optical constants of the thin films have been obtained.It was found that the refractive index n and the extinction coefficient k increase with increasing Mn content due to the increase in the packing density.Furthermore,a strong dependence of the optical band gap Egon Mn/Ti ratios in the deposited films was observed,and it was inferred that the energy level of conduction bands decreases with increasing Mn content.     

Correlation of structure and spin–phonon coupling in (La,Nd) doped BiFeO3 films

We studied the effect of structural change on the spin–phonon coupling in doped BiFeO₃ (BFO) films (Bi_0.8La_0.1Nd_0.1FeO₃) grown on SrTiO₃ (001) substrate. The temperature‐dependent Raman studies show phonon anomalies in the vicinity of magnetic ordering temperature T_N owing to the spin–phonon coupling. Doped films exhibit strong anomalies in the line widths of Raman bands around T_N revealing the presence of strong spin–lattice coupling. The modification in structure as a result of A‐site doping in BFO films plays an important role in controlling the nature of spin–phonon coupling. Copyright © 2014 John Wiley & Sons, Ltd.     

面心立方(001)方向AB合金薄膜表面层的有序无序相变

采用平均场近似方法对两组元面心立方合金薄膜的有序无序相转变过程进行模拟计算，结果表明，合金薄膜的有序无序相变受薄膜层数奇偶性的影响.薄膜层数奇偶性不同，会导致薄膜具有不同的相结构和热力学性质.在弱表面偏析作用下，对于偶数层薄膜，由于薄膜边界对称性破缺，对应体组分x=0.5的化学势区间，偶数层薄膜有序无序相变过程中出现了中间温度相和浸润现象.而奇数层薄膜的有序无序相变类似体材料的相变.在强表面偏析作用下，由于受表面偏析作用和有限尺寸效应影响，对应体组分x=0.5的化学势区间，奇数层薄膜中出现AB(AB)关键词： 合金薄膜 有序无序相变 浸润现象 准热力学相变